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| 2025 | IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025 |
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| 2025 | Making IJTAG Address Physical-World Digital and Mixed-Signal Test Challenges. Hans Martin von Staudt, Jeff Rearick, Michael Laisne |
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| 2025 | Push-on mating 57- to 81- GHz mm-Wave interface with high repeatability for ATE application. Minoru Iida, Norio Kobayashi, Hideki Shirasu, Masayuki Nakamura |
| 2025 | QuEST: Quantitative Entropy based Security and Trojan Detection Framework for Confidentiality Verification. Jiaming Wu, Domenic Forte |
| 2025 | SMART: Scalable and Modular Architecture for Routing-Aware Testing of Fan-out Wafer-Level Packages Partho Bhoumik, Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2025 | STARTS: Simulation Traits Assisted Random Test Selection for Multiprocessor Verification. Li Zhou, Menglong Lu, Li Luo, Jianfeng Zhang, Junbo Tie |
| 2025 | Scan Chain Diagnosis in Advanced Process Nodes: The Art of Balancing Resolution, Repairability, and Cost. Sandeep Kumar Goel, Ankita Patidar, Yue Tian, Frank Lee |
| 2025 | Scan Strategies for High Quality Latch Array Testing. Bin Du, Nehal Patel, Yerong Chen, Jeremy Chin, Katherine Tian |
| 2025 | Scan Test for 99% Defect Coverage of R-2R DACs. Stephen Sunter, Krzysztof Jurga |
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| 2025 | Silicon Photonic Test-Point Selection by Integrating Design Parameters with Hypergraph Partitioning. Lawrence M. Schlitt, Pratishtha Agnihotri, Priyank Kalla, Steve Blair |
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| 2025 | Thermal Management in System Level Test: Analysis of existing solutions and an introduction to advanced liquid cooled memory solutions. Sridutt Tummalapalli, Srinath Reddy Yerakondappagari |
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