| 2024 | A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. Stephan Eggersglüß, Andreas Glowatz |
| 2024 | A Fast and Efficient Graph-Based Methodology for Cell-Aware Model Generation. Gianmarco Mongelli, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel |
| 2024 | A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction. Mehul D. Shroff, Nguyen Nguyen, Kiran Sunny Thota |
| 2024 | A Robust On-Chip Sensor for Online Monitoring of BTI-Induced Aging in Integrated Circuits. Daniel Adjei, Emmanuel Nti Darko, Degang Chen |
| 2024 | A Scalable & Cost Efficient Next-Gen Scan Architecture: Streaming Scan Test via NVIDIA MATHS. Kunal Jain Mangilal, Mahmut Yilmaz, Vishal Agarwal, Shantanu Sarangi, Kaushik Narayanun |
| 2024 | A graph-based algorithm for NVM address decoders testing. Pierre Scaramuzza, Thomas Kern, Matteo Coppetta, Alessandro Grossi, Rudolf Ullmann |
| 2024 | AI-Enabled Board Level Vibration Testing: Unveiling The Physics of Degradation. Varun Thukral, Chen He, Rebecca Chen, Letian Zhang, Romuald Roucou, Michiel van Soestbergen, Jeroen J. M. Zaal, Rene Rongen, Willem D. van Driel, G. Q. Zhang |
| 2024 | Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage. Wu-Tung Cheng, Manish Sharma, Xin Yang, Artur Stelmach, Szczepan Urban, Jakub Janicki, Preston McWithey |
| 2024 | Boost CPU Turbo Yield Utilizing Explainable Artificial Intelligence. C. W. Lin, P. C. Tsao, Ross Lee, Khim Koh, Y. J. Ting, Jennifer Hsiao, C. T. Lai, T. H. Lee |
| 2024 | Cross-Layer Reliability Evaluation of In-Memory Similarity Computation. Ali Nezhadi, Mahta Mayahinia, Mehdi B. Tahoori |
| 2024 | Defect Analysis for FeFETs using a Compact Model. Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty |
| 2024 | Defects, Fault Modeling, and Test Development Framework for FeFETs. Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui |
| 2024 | Delay Monitoring Under Different PVT Corners for Test and Functional Operation. Hari Addepalli, Jiezhong Wu, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski |
| 2024 | Design-for-Test for Silicon Photonic Circuits. Pratishtha Agnihotri, Priyank Kalla, Steve Blair |
| 2024 | Deterministic In-Fleet Scan Test for a Cloud Computing Platform. Dan Trock, Subramanian Mahadevan, Nilanjan Mukherjee, Lee Harrison, Janusz Rajski, Jerzy Tyszer |
| 2024 | Diagnosis of Defects on Global Signals. Xinyang Zhao, Baohua Wang, Yin Zhang, Weiming Zhang, Xiaotian Ding, Yu Huang |
| 2024 | Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. Jaehoon Lee, HyeonUk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim |
| 2024 | Digital Scan and ATPG for Analog Circuits. Stephen Sunter, Krzysztof Jurga |
| 2024 | E-SCOUT: Efficient-Spatial Clustering-based Outlier Detection through Telemetry. Eduardo Ortega, Jonti Talukdar, Woohyun Paik, Fei Su, Rita Chattopadhyay, Krishnendu Chakrabarty |
| 2024 | Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-constrained IoT Edge Devices. Geancarlo Abich, Ricardo Augusto da Luz Reis, Luciano Ost |
| 2024 | Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor. Suriyaprakash Natarajan, Chaitali S. Oak, Vijay Kakollu, Nipun Chaplot, Soham Roy, Apurva Lonkar, Gerardo J. Perfecto Reyes |
| 2024 | Efficient Built-In Self-Test Scheme for Inter-Die Interconnects of Chiplet-Based Chips. Yi-Chun Huang, Pei-Yun Lin, Jin-Fu Li, Hong-Siang Fu, Yung-Ping Lee |
| 2024 | Electrical Stimulus Based Calibration of MEMS Accelerometer. Ishaan Bassi, Sule Ozev |
| 2024 | Enhancing Functional Verification with Dynamic Instruction Generation by Exploiting Processor Runtime States. Anlin Liu, Tianyao Lu, Yuhao Xi, Yangfan Liu, Peng Liu |
| 2024 | Evaluating Vulnerability of Chiplet-Based Systems to Contactless Probing Techniques. Aleksa Deric, Kyle Mitard, Shahin Tajik, Daniel E. Holcomb |
| 2024 | FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks. Hossein Pourmehrani, Javad Bahrami, Parsa Nooralinejad, Hamed Pirsiavash, Naghmeh Karimi |
| 2024 | From Hybrid to Integrated: The Evolution of DFT Integration in SoC Design at Intel. Brian Pajak, Pankaj Pant, Vidya Neerkundar |
| 2024 | Functional State Extraction using Scan DFT. Ilya Wagner, Pankaj Pant, Arani Sinha |
| 2024 | Functionally-Possible Gate-Exhaustive Bridging Faults. Irith Pomeranz |
| 2024 | Generation and Quality Evaluation of Synthetic Process Control Monitoring Data. Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2024 | Handling Die-to-Die I/O Pads for 3DIC Interconnect Tests. Sandeep Kumar Goel, Moiz Khan, Ankita Patidar, Frank Lee, Vuong Nguyen, Bharath Shankaranarayanan, Doo Kim, Manish Arora |
| 2024 | High-Bandwidth IJTAG over SSN. Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-François Côté, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim |
| 2024 | IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024 |
| 2024 | Identifying Undetectable Defects Using Equivalence Checking. Lars Hedrich, Inga Abel, Jaafar Mejri, Vladimir A. Zivkovic |
| 2024 | LESER-2: Detailed Consideration in Latch Design under Process Migration for Prevention of Single-Event Double-Node Upsets. Alan S.-M. Liu, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh |
| 2024 | Locked-by-Design: Enhancing White-box Logic Obfuscation with Effective Key Mutation. Leon Li, Alex Orailoglu |
| 2024 | MBIST-based MRAM defect screening for safety-critical applications. Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2024 | Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2024 | Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard. Sandeep Kumar Goel, Ankita Patidar, Moiz Khan, Frank Lee, Anshuman Chandra, Martin Keim, Naim Lemar, Jonathan Gaudet, Quoc Phan, Vidya Neerkundar |
| 2024 | Power-Aware Test Scheduling for Memory BIST. Albert Au, Michal Kçpinski, Makary Orczyk, Artur Pogiel |
| 2024 | Predictive Testing for Aging in SRAMs and Mitigation. Yunkun Lin, Mingye Li, Sandeep Gupta |
| 2024 | Probe Card Ground Noise Canceling Circuit. Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi, ChanYeol Park, Sunyong Park, Woonphil Yang |
| 2024 | Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | SEC-CiM: Selective Error Compensation for ReRAM-based Compute-in-Memory Ashish Reddy Bommana, Farshad Firouzi, Chukwufumnanya Ogbogu, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty |
| 2024 | SECT-HI: Enabling Secure Testing for Heterogeneous Integration to Prevent SiP Counterfeits. Galib Ibne Haidar, Md Sami Ul Islam Sami, Jingbo Zhou, Kimia Zamiri Azar, Mark Tehranipoor, Farimah Farahmandi |
| 2024 | Safety-Guided Test Generation for Structural Faults. Xuanyi Tan, Dhruv Thapar, Deepesh Sahoo, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Rubin A. Parekhji |
| 2024 | Scalable BIST for Linearity Testing of Sigma-Delta Modulators. Krishna Pramod Madabhushi, Trevor LaBanz, Sudip Dandnaik, Eslam Hag |
| 2024 | Scan SerDes Saurabh Upadhyay, Ahmet Tokuz |
| 2024 | Short Paper: Bus-based Packetized Scan Architecture Trade-offs for Heterogeneous Multi-Core SoCs. Hiroyuki Iwata, Mahmoud AbdAlwahab, Ron Press, Ohki Sugiura |
| 2024 | Small-Bridging-Fault-Aware Built-In-Self-Repair for Cycle-Based Interconnects in a Chiplet Design Using Adjusted Pulse-Vanishing Test. Chi Lai, Shi-Yu Huang |
| 2024 | TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering. Suhasini Komarraju, Mohamed Mejri, Abhijit Chatterjee, Suriyaprakash Natarajan, Prashant Goteti |
| 2024 | Test Data Encryption with a New Stream Cipher. Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak |
| 2024 | Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2024 | Toward Fault-Tolerant Applications on Reconfigurable Systems-on-Chip. Corrado De Sio, Luca Sterpone |
| 2024 | Towards Machine-Learning-based Oracle-Guided Analog Circuit Deobfuscation. Dipali Jain, Guangwei Zhao, Rajesh Datta, Kaveh Shamsi |
| 2024 | Unsupervised Learning Provides Intelligence for Testing Hard to Detect Faults. Soham Roy, Vishwani D. Agrawal |
| 2024 | Virtual Test Development Using Pre-Silicon Verification Environment. E. Aderholz, Q. Atol, B. Baptist, R. Holzner, R. Ignacio, V. Kamanuri, A. Kun, K. Ma, B. Mariacher, O. Pfabigan, A. Przybilla, D. Samardzic, F. Schlagbauer, M. Schleicher, J. P. Valiente, E. Vargas, K. Vinod, O. Zikulnig |
| 2024 | WM-Graph: Graph-Based Approach for Wafermap Analytics. Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang |
| 2024 | Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant. Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao |
| 2024 | Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification. Abhishek Kumar Mishra, Suman Kumar, Anush Niranjan Lingamoorthy, Anup Das, Nagarajan Kandasamy |
| 2024 | qFD: Coherent and Depolarizing Fault Diagnosis for Quantum Processors. Yen-Wei Li, Cheng-Yun Hsieh, Meng-Chen Wu, James Chien-Mo Li |