| 2023 | A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation. Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora |
| 2023 | A Full-Stack Approach for Side-Channel Secure ML Hardware. Anuj Dubey, Aydin Aysu |
| 2023 | A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy. Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Oussama Laouamri, Naveen Khanna, Jeff Mayer, Nilanjan Mukherjee |
| 2023 | ARC-FSM-G: Automatic Security Rule Checking for Finite State Machine at the Netlist Abstraction. Rasheed Kibria, Farimah Farahmandi, Mark Tehranipoor |
| 2023 | Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim |
| 2023 | Analysis and Characterization of Defects in FeFETs. Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty |
| 2023 | Biochip-PUF: Physically Unclonable Function for Microfluidic Biochips. Navajit Singh Baban, Ajymurat Orozaliev, Yong-Ak Song, Urbi Chatterjee, Sankalp Bose, Sukanta Bhattacharjee, Ramesh Karri, Krishnendu Chakrabarty |
| 2023 | Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines. Irith Pomeranz |
| 2023 | Device-Aware Test for Ion Depletion Defects in RRAMs. Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis. Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava |
| 2023 | Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data. Yuxuan Yin, Rebecca Chen, Chen He, Peng Li |
| 2023 | Enabling In-Field Parametric Testing for RISC-V Cores. Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori |
| 2023 | Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits. Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu |
| 2023 | Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information. Ching-Min Liu, Chia-Heng Yen, Shu-Wen Lee, Kai-Chiang Wu, Mango Chia-Tso Chao |
| 2023 | Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures. Dimitris Gizopoulos, George Papadimitriou, Odysseas Chatzopoulos |
| 2023 | GPU-Based Concurrent Static Learning. Huaxiao Liang, Xiaoze Lin, Liyang Lai, Naixing Wang, Yu Huang, Fei Yang, Yuxin Yang |
| 2023 | Global Control Signal Defect Diagnosis in Volume Production Environment. Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski |
| 2023 | High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns. Zhe-Jia Liang, Yu-Tsung Wu, Yun-Feng Yang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li |
| 2023 | IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat. Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang |
| 2023 | IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023 |
| 2023 | Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars. Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev |
| 2023 | Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning. Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato, Michihiro Shintani |
| 2023 | Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction. Yunfei Gu, Xingyu Wang, Zixiao Chen, Chentao Wu, Xinfei Guo, Jie Li, Minyi Guo, Song Wu, Rong Yuan, Taile Zhang, Yawen Zhang, Haoran Cai |
| 2023 | Laser Fault Injection Vulnerability Assessment and Mitigation with Case Study on PG-TVD Logic Cells. Ryan Holzhausen, Tasnuva Farheen, Morgan Thomas, Nima Maghari, Domenic Forte |
| 2023 | Logic Test Vehicles for High Resolution Diagnosis of Systematic FEOL/MEOL Yield Detractors. Yinxuan Lyu, Liangliang Yu, Pengju Li, Junlin Huang |
| 2023 | Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion. Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Shuhei Yamamoto, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi |
| 2023 | Low cost production scan chain test for compression based designs. Bharath Nandakumar, Sameer Chillarige |
| 2023 | Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing. Nadun Sinhabahu, Katherine Shu-Min Li, Sying-Jyan Wang, J. R. Wang, Matt Ho |
| 2023 | Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | Maximizing Stress Coverage by Novel DFT Techniques and Relaxed Timing Closure. Arani Sinha, Glenn Colón-Bonet, Michael Fahy, Pankaj Pant, Haijing Mao, Akhilesh Shukla |
| 2023 | Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz |
| 2023 | Method for Adjusting Termination Resistance Using PMU in DC Test. Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi |
| 2023 | Method for Diagnosing Channel Damage Using FPGA Transceiver. Seongkwan Lee, Jun Yeon Won, Cheolmin Park, Minho Kang, Jaemoo Choi |
| 2023 | New Algorithm for Fast and Accurate Linearity Testing of High-Resolution SAR ADCs. Aswin R |
| 2023 | Novel Methodology to Optimize TAT and Resource Utilization for ATPG Simulations for Large SoCs. Sudhakar Kongala, Anuj Gupta, Yash Walia, Sahil Jain |
| 2023 | OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems. Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2023 | Predicting the Resolution of Scan Diagnosis. Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza |
| 2023 | Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors. Julia Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel |
| 2023 | Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs. Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh |
| 2023 | Recognizing Wafer Map Patterns Using Semi-Supervised Contrastive Learning with Optimized Latent Representation Learning and Data Augmentation. Zihu Wang, Hanbin Hu, Chen He, Peng Li |
| 2023 | Robust Pattern Generation for Small Delay Faults Under Process Variations. Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2023 | SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2023 | Simply-Track-and-Refresh: Efficient and Scalable Rowhammer Mitigation. Eduardo Ortega, Tyler K. Bletsch, Biresh Kumar Joardar, Jonti Talukdar, Woohyun Paik, Krishnendu Chakrabarty |
| 2023 | Towards Robust Deep Neural Networks Against Design-Time and Run-Time Failures. Yu Li, Qiang Xu |
| 2023 | Transitioning eMRAM from Pilot Project to Volume Production. Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim |
| 2023 | Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation. Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech |
| 2023 | Utilizing ECC Analytics to Improve Memory Lifecycle Management. Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures. Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen |
| 2023 | Welcome Message ITC 2023. Li-C. Wang, Jeff Rearick |