| 2022 | 4.5 Gsps MIPI D-PHY Receiver Circuit for Automatic Test Equipment. Seongkwan Lee, Cheolmin Park, Minho Kang, Jun Yeon Won, HyungSun Ryu, Jaemoo Choi, Byunghyun Yim |
| 2022 | A Comprehensive Learning-Based Flow for Cell-Aware Model Generation. P. D'Hondt, Aymen Ladhar, Patrick Girard, Arnaud Virazel |
| 2022 | A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability. Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Fernando Fernandes dos Santos, Matteo Sonza Reorda, Paolo Rech |
| 2022 | A Novel Protection Technique for Embedded Memories with Optimized PPA. Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian |
| 2022 | A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data. Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann |
| 2022 | A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications. Kazuya Loki, Yasuyuki Kai, Kohei Miyase, Seiji Kajihara |
| 2022 | ADWIL: A Zero-Overhead Analog Device Watermarking Using Inherent IP Features. Upoma Das, Md Rafid Muttaki, Mark Tehranipoor, Farimah Farahmandi |
| 2022 | AI-Driven Assurance of Hardware IP against Reverse Engineering Attacks. Prabuddha Chakraborty, Swarup Bhunia |
| 2022 | Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui |
| 2022 | Accurate Failure Rate Prediction Based on Gaussian Process Using WAT Data. Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Michihiro Shintani |
| 2022 | Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators. Takumi Uezono, Yi He, Yanjing Li |
| 2022 | An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan |
| 2022 | An innovative Strategy to Quickly Grade Functional Test Programs. Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | Analyzing the Electromigration Challenges of Computation in Resistive Memories. Mahta Mayahinia, Mehdi B. Tahoori, Manu Perumkunnil, Kristof Croes, Francky Catthoor |
| 2022 | Application of Sampling in Industrial Analog Defect Simulation. Mayukh Bhattacharya, Beatrice Solignac, Michael Dürr |
| 2022 | Automatic Structural Test Generation for Analog Circuits using Neural Twins. Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty |
| 2022 | Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products. Esteban Garita-Rodríguez, Renato Rimolo-Donadio, Rafael Zamora-Salazar |
| 2022 | Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos |
| 2022 | Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking. Soyed Tuhin Ahmed, Mehdi B. Tahoori |
| 2022 | Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs. Khader S. Abdel-Hafez, Michael Dsouza, Likith Kumar Manchukonda, Elddie Tsai, Karthikeyan Natarajan, Ting-Pu Tai, Wenhao Hsueh, Smith Lai |
| 2022 | Compression-Aware ATPG. Xing Wang, Zezhong Wang, Naixing Wang, Weiwei Zhang, Yu Huang |
| 2022 | Configurable BISR Chain For Fast Repair Data Loading. Wei Zou, Benoit Nadeau-Dostie |
| 2022 | DEFCON: Defect Acceleration through Content Optimization. Suriyaprakash Natarajan, Abhijit Sathaye, Chaitali Oak, Nipun Chaplot, Suvadeep Banerjee |
| 2022 | DFT-Enhanced Test Scheme for Spin-Transfer-Torque (STT) MRAMs. Ze-Wei Pan, Jin-Fu Li |
| 2022 | DIST: Deterministic In-System Test with X-masking. Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak |
| 2022 | DeepTPI: Test Point Insertion with Deep Reinforcement Learning. Zhengyuan Shi, Min Li, Sadaf Khan, Liuzheng Wang, Naixing Wang, Yu Huang, Qiang Xu |
| 2022 | Defect-Directed Stress Testing Based on Inline Inspection Results. Chen He, Paul Grosch, Onder Anilturk, Joyce Witowski, Carl Ford, Rahul Kalyan, John C. Robinson, David W. Price, Jay Rathert, Barry Saville, Dave Lee |
| 2022 | Diagnosing Double Faulty Chains through Failing Bit Separation. Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern |
| 2022 | Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks. Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2022 | Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning. Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang |
| 2022 | Enhanced Data Pattern to Detect Defects in Flash Memory Address Decoder. Weng Joe Soh, Chen He |
| 2022 | Error Model (EM) - A New Way of Doing Fault Simulation. Nirmal R. Saxena, Atieh Lotfi |
| 2022 | Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies. Sam M.-H. Hsiao, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen |
| 2022 | Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2022 | Fault Modeling and Testing of Memristor-Based Spiking Neural Networks. Kuan-Wei Hou, Hsueh-Hung Cheng, Chi Tung, Cheng-Wen Wu, Juin-Ming Lu |
| 2022 | Fault Resilience Techniques for Flash Memory of DNN Accelerators. Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase |
| 2022 | Fault-coverage Maximizing March Tests for Memory Testing. Feng Yun, Yunkun Lin, Lou Yunfei, Lei Gao, Vaibhav Gera, Boxuan Li, Vennela Chowdary Nekkanti, Aditya Rajendra Pharande, Kunal Sheth, Meghana Thommondru, Guizhong Ye, Sandeep Gupta |
| 2022 | Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories. Shyue-Kung Lu, Shi-Chun Tseng, Kohei Miyase |
| 2022 | GreyConE: Greybox Fuzzing + Concolic Execution Guided Test Generation for High Level Designs. Mukta Debnath, Animesh Basak Chowdhury, Debasri Saha, Susmita Sur-Kolay |
| 2022 | Hardware Root of Trust for SSN-basedDFT Ecosystems. Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak |
| 2022 | High Speed IO Access for Test forms the foundation for Silicon Lifecycle Management. Amit Pandey, Brendan Tully, Karthikeyan Natarajan |
| 2022 | High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100. Hans Martin von Staudt, Franz Schuler, Rohitaswa Bhattacharya, Justin Wei-Lin Cheng, Cheng-Da Huang, Parker Chih-Chun Chen |
| 2022 | IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022 |
| 2022 | IEEE P1687.1: Extending the Network Boundaries for Test. Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo |
| 2022 | Improvements in Automated IC Socket Pin Defect Detection. Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao |
| 2022 | Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method. Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao |
| 2022 | Improving structural coverage of functional tests with checkpoint signature computation. Benjamin Niewenhuis, Devanathan Varadarajan |
| 2022 | In search of Vmin for dynamic power managmenet and reliable operation in mission mode. Firooz Massoudi |
| 2022 | In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre |
| 2022 | Industry Evaluation of Reversible Scan Chain Diagnosis. Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson |
| 2022 | Just-Enough Stress Test for Infant-Mortality Screening Using Speed Binning. Chen-Lin Tsai, Shi-Yu Huang |
| 2022 | Language Driven Analytics for Failure Pattern Feedforward and Feedback. Min Jian Yang, Yueling Zeng, Li-C. Wang |
| 2022 | Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test. Ankush Srivastava, Jais Abraham |
| 2022 | Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity |
| 2022 | ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits. Jun-Yang Lei, Abhijit Chatterjee |
| 2022 | ML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption. Wei-Chen Lin, Chun Chen, Chao-Ho Hsieh, James Chien-Mo Li, Eric Jia-Wei Fang, Sung S.-Y. Hsueh |
| 2022 | Modeling Challenge Covariances and Design Dependency for Efficient Attacks on Strong PUFs. Hongfei Wang, Wei Liu, Hai Jin, Yu Chen, Wenjie Cai |
| 2022 | Multi-die Parallel Test Fabric for Scalability and Pattern Reusability. Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas |
| 2022 | Neural Fault Analysis for SAT-based ATPG. Junhua Huang, Hui-Ling Zhen, Naixing Wang, Hui Mao, Mingxuan Yuan, Yu Huang |
| 2022 | New R&R Methodology in Semiconductor Manufacturing Electrical Testing. Lorella Bordogna, Fabio Brembilla, Alberto Pagani, Marco Spinetta |
| 2022 | Next Generation Design For Testability, Debug and Reliability Using Formal Techniques. Sebastian Huhn, Rolf Drechsler |
| 2022 | Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen |
| 2022 | Optimization of Tests for Managing Silicon Defects in Data Centers. David P. Lerner, Benson Inkley, Shubhada H. Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven |
| 2022 | PEPR: Pseudo-Exhaustive Physically-Aware Region Testing. Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton |
| 2022 | PPA Optimization of Test Points in Automotive Designs. Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis, Satish Ravichandran |
| 2022 | Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC. Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi |
| 2022 | RCANet: Root Cause Analysis via Latent Variable Interaction Modeling for Yield Improvement. Xiaopeng Zhang, Shoubo Hu, Zhitang Chen, Shengyu Zhu, Evangeline F. Y. Young, Pengyun Li, Cheng Chen, Yu Huang, Jianye Hao |
| 2022 | RIBoNN: Designing Robust In-Memory Binary Neural Network Accelerators. Shamik Kundu, Akul Malhotra, Arnab Raha, Sumeet Kumar Gupta, Kanad Basu |
| 2022 | RTL-FSMx: Fast and Accurate Finite State Machine Extraction at the RTL for Security Applications. Rasheed Kibria, M. Sazadur Rahman, Farimah Farahmandi, Mark Tehranipoor |
| 2022 | Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security. Franco Stellari, Peilin Song |
| 2022 | Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus. Farrokh Ghani Zadegan, Zilin Zhang, Kim Petersén, Erik Larsson |
| 2022 | Runtime Fault Diagnostics for GPU Tensor Cores. Saurabh Hukerikar, Nirmal R. Saxena |
| 2022 | Scaling physically aware logic diagnosis to complex high volume 7nm server processors. Bharath Nandakumar, Madhur Maheshwari, Sameer Chillarige, Robert Redburn, Jeff Zimmerman, Nicholai L'Esperance, Edward Dziarcak |
| 2022 | Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks. Yan-Fu Chen, Duo-Yao Kang, Kuen-Jong Lee |
| 2022 | TAMED: Transitional Approaches for LFI Resilient State Machine Encoding. Muhtadi Choudhury, Minyan Gao, Shahin Tajik, Domenic Forte |
| 2022 | Test Generation for an Iterative Design Flow with RTL Changes. Jerin Joe, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski |
| 2022 | Testing of Analog Circuits using Statistical and Machine Learning Techniques. Supriyo Srimani, Hafizur Rahaman |
| 2022 | The Impact of On-chip Training to Adversarial Attacks in Memristive Crossbar Arrays. Bijay Raj Paudel, Spyros Tragoudas |
| 2022 | Transforming an $n$-Detection Test Set into a Test Set for a Variety of Fault Models. Irith Pomeranz |
| 2022 | Transient Fault Pruning for Effective Candidate Reduction in Functional Debugging. Dun-An Yang, Jing-Jia Liou, Harry H. Chen |
| 2022 | Understanding Vmin Failures for Improved Testing of Timing Marginalities. Adit D. Singh |
| 2022 | Unsupervised Learning-based Early Anomaly Detection in AMS Circuits of Automotive SoCs. Ayush Arunachalam, Athulya Kizhakkayil, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Robert Jin, Fei Su, Kanad Basu |
| 2022 | Using Custom Fault Models to Improve Understanding of Silicon Failures. Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan |
| 2022 | Virtual Prototyping: Closing the digital gap between product requirements and post-Si verification. Thomas Nirmaier, Manuel Harrant, Marc Huppmann, Wendy You, Georg Pelz |
| 2022 | Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai |
| 2022 | Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information. Yiwen Liao, Raphaël Latty, Paul R. Genssler, Hussam Amrouch, Bin Yang |
| 2022 | Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test. Nadun Sinhabahu, Katherine Shu-Min Li, Jian-De Li, J. R. Wang, Sying-Jyan Wang |
| 2022 | Zero Trust Approach to IC Manufacturing and Testing. Brian Buras, Constantinos Xanthopoulos, Ken Butler, Jason Kim |