| 2020 | A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang |
| 2020 | A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns. Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar |
| 2020 | A Unified Method of Designing Signature Analyzers for Digital and Mixed-Signal Circuits Testing. Vadim Geurkov, Lev Kirischian |
| 2020 | A Weak Asynchronous RESet (ARES) PUF Using Start-up Characteristics of Null Conventional Logic Gates. Sreeja Chowdhury, Rabin Yu Acharya, William Boullion, Andrew Felder, Mark Howard, Jia Di, Domenic Forte |
| 2020 | Advanced Outlier Detection Using Unsupervised Learning for Screening Potential Customer Returns. Hanbin Hu, Nguyen Nguyen, Chen He, Peng Li |
| 2020 | Assuring Security and Reliability of Emerging Non-Volatile Memories. Mohammad Nasim Imtiaz Khan, Swaroop Ghosh |
| 2020 | At-speed DfT Architecture for Bundled-data Design. Ricardo Aquino Guazzelli, Laurent Fesquet |
| 2020 | Automated Assertion Generation from Natural Language Specifications. Steven J. Frederiksen, John Aromando, Michael S. Hsiao |
| 2020 | Automated Socket Anomaly Detection through Deep Learning. Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal |
| 2020 | Automating Design For Yield: Silicon Learning to Predictive Models and Design Optimization. Srikanth Venkataraman, Pongpachara Limpisathian, Pascal Meinerzhagen, Suriyaprakash Natarajan, Eric Yang |
| 2020 | Avionics Simulation Environment. Hüseyin Sagirkaya, Gökhan Durgun |
| 2020 | BISTLock: Efficient IP Piracy Protection using BIST. Siyuan Chen, Jinwook Jung, Peilin Song, Krishnendu Chakrabarty, Gi-Joon Nam |
| 2020 | Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing. Hiroaki Itsuji, Takumi Uezono, Tadanobu Toba, Kojiro Ito, Masanori Hashimoto |
| 2020 | Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks. Md Imran Momtaz, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2020 | Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs. Sang-Uck Ahn, Beom-Kyu Seo, Hyun-Woo Kim, Yeoun-Sook Shin, Hyung-Tae Kim, Ghil-Geun Oh, Young-Dae Kim |
| 2020 | Cross-PUF Attacks on Arbiter-PUFs through their Power Side-Channel. Trevor Kroeger, Wei Cheng, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi |
| 2020 | Data-driven fault model development for superconducting logic. Mingye Li, Fangzhou Wang, Sandeep Gupta |
| 2020 | Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections. Muslum Emir Avci, Sule Ozev |
| 2020 | Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan |
| 2020 | Digital Design Techniques for Dependable High Performance Computing. Sarah Azimi, Luca Sterpone |
| 2020 | FAT: Training Neural Networks for Reliable Inference Under Hardware Faults. Ussama Zahid, Giulio Gambardella, Nicholas J. Fraser, Michaela Blott, Kees A. Vissers |
| 2020 | Fail Memory Configuration Set for RA Estimation. Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong |
| 2020 | Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces. Haiying Ma, Ligang Lu, Haitao Qian, Jing Han, Xin Wen, Fanjin Meng, Rahul Singhal, Martin Keim, Yu Huang, Wu Yang |
| 2020 | Fast EVM Tuning of MIMO Wireless Systems Using Collaborative Parallel Testing and Implicit Reward Driven Learning. Suhasini Komarraju, Abhijit Chatterjee |
| 2020 | Flip-flops fanout splitting in scan designs. Maxim Ladnushkin |
| 2020 | Functional Criticality Classification of Structural Faults in AI Accelerators. Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty |
| 2020 | Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded Processor. Vijay Kiran Kalyanam, Eric Mahurin, Michael Spence, Jacob A. Abraham |
| 2020 | Hardware IP Protection Using Logic Encryption and Watermarking. Rajit Karmakar, Santanu Chattopadhyay |
| 2020 | High Defect-Density Yield Learning using Three-Dimensional Logic Test Chips. Zeye Liu, R. D. Shawn Blanton |
| 2020 | High Speed Serial Links Risk Assessment in Industrial Post-Silicon Validation Exploiting Machine Learning Techniques. Cesar A. Sánchez-Martínez, Paulo López-Meyer, Esdras Juárez-Hernández, Aaron Desiga-Orenday, Andrés Viveros-Wacher |
| 2020 | IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020 |
| 2020 | IJTAG Through a Two-Pin Chip Interface. Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-François Côté, Givargis Danialy, Martin Keim, Lori Schramm |
| 2020 | Improved Chain Diagnosis Methodology for Clock and Control Signal Defect Identification. Bharath Nandakumar, Sameer Chillarige, Anil Malik, Atul Chabbra, Nicholai L'Esperance, Robert Redburn |
| 2020 | Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices. Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne |
| 2020 | Introduction to Quantum Computation Reliability. Mitchell A. Thornton |
| 2020 | Knowledge Transfer for Diagnosis Outcome Preview with Limited Data. Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton |
| 2020 | LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution. Qicheng Huang, Chenlei Fang, R. D. Shawn Blanton |
| 2020 | Learning A Wafer Feature With One Training Sample. Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa |
| 2020 | Logic Fault Diagnosis of Hidden Delay Defects. Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen |
| 2020 | MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda |
| 2020 | Machine Intelligence for Efficient Test Pattern Generation. Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |
| 2020 | Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors. Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero |
| 2020 | Memory repair logic sharing techniques and their impact on yield. Benoit Nadeau-Dostie, Luc Romain |
| 2020 | Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients. Rafael B. Schvittz, Paulo F. Butzen, Leomar S. da Rosa |
| 2020 | Modeling Accuracy of Wideband Power Amplifiers with Memory effects via Measurements. Wei Gao, Tao Jing |
| 2020 | Modeling Novel Non-JTAG IEEE 1687-Like Architectures. Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick |
| 2020 | Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. David Brauchler, Jennifer Dworak |
| 2020 | New Perspectives on Core In-field Path Delay Test. Riccardo Cantoro, Dario Foti, Sandro Sartoni, Matteo Sonza Reorda, Lorena Anghel, Michele Portolan |
| 2020 | Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test. Youngsu Oh, Dongmin Han, Byeongseon Go, Seungtaek Lee, Woosik Jeong |
| 2020 | On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors. Richard Bramley, Yanxiang Huang, Guangshan Duan, Nirmal R. Saxena, Paul Racunas |
| 2020 | Online Fault Detection in ReRAM-Based Computing Systems by Monitoring Dynamic Power Consumption. Mengyun Liu, Krishnendu Chakrabarty |
| 2020 | Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada |
| 2020 | Proactive Supply Noise Mitigation with Low-Latency Minor Voltage Regulator and Lightweight Current Prediction. Jun Chen, Masanori Hashimoto |
| 2020 | Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2020 | Rapid PLL Monitoring By A Novel min-MAX Time-to-Digital Converter. Wei-Hao Chen, Chu-Chun Hsu, Shi-Yu Huang |
| 2020 | Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage. Marampally Saikiran, Mona Ganji, Degang Chen |
| 2020 | SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2020 | SPARTA: A Laser Probing Approach for Trojan Detection. Andrew Stern, Dhwani Mehta, Shahin Tajik, Farimah Farahmandi, Mark Tehranipoor |
| 2020 | Schmitt Trigger-Based Key Provisioning for Locking Analog/RF Integrated Circuits. Adriana C. Sanabria-Borbon, Nithyashankari Gummidipoondi Jayasankaran, Sir Yee Lee, Edgar Sánchez-Sinencio, Jiang Hu, Jeyavijayan (JV) Rajendran |
| 2020 | Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks. Natalia Lylina, Ahmed Atteya, Chih-Hao Wang, Hans-Joachim Wunderlich |
| 2020 | Selecting Close-to-Functional Path Delay Faults for Test Generation. Irith Pomeranz |
| 2020 | Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs. Jean-François Côté, Mark Kassab, Wojciech Janiszewski, Ricardo Rodrigues, Reinhard Meier, Bartosz Kaczmarek, Peter Orlando, Geir Eide, Janusz Rajski, Glenn Colón-Bonet, Naveen Mysore, Ya Yin, Pankaj Pant |
| 2020 | Stress, Test, and Simulation of Analog IOs on Automotive ICs. Chen He, Stephen Traynor, Gayathri Bhagavatheeswaran, Hector Sanchez |
| 2020 | Test Challenges of Intel IA Cores. Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin |
| 2020 | Test and Diagnosis Solution for Functional Safety. M. Casarsa, Gurgen Harutyunyan, Yervant Zorian |
| 2020 | TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning. Leon Li-Yang Chen, Katherine Shu-Min Li, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee |
| 2020 | Unleashing the Power of Anomaly Data for Soft Failure Predictive Analytics. Fei Su, Prashant Goteti, Min Zhang |
| 2020 | Unsupervised Root-Cause Analysis for Integrated Systems. Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2020 | Using Volume Cell-aware Diagnosis Results to Improve Physical Failure Analysis Efficiency. Hanson Peng, Mao-Yuan Hsia, Man-Ting Pang, I.-Y. Chang, Jeff Fan, Huaxing Tang, Manish Sharma, Wu Yang |
| 2020 | Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In. Chen He, Yanyao Yu |
| 2020 | X-Tolerant Tunable Compactor for In-System Test. Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak |
| 2020 | qATG: Automatic Test Generation for Quantum Circuits. Chen-Hung Wu, Cheng-Yun Hsieh, Jiun-Yun Li, James Chien-Mo Li |