| 2019 | 17th IEEE East-West Design and Test Symposium. Yervant Zorian, Vladimir Hahanov, Svetlana Chumachenko, Eugenia Litvinova |
| 2019 | A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips. Andrea Floridia, Davide Piumatti, Annachiara Ruospo, Ernesto Sánchez, Sergio de Luca, Rosario Martorana |
| 2019 | A Framework for Design of Self-Repairing Digital Systems. Jingchi Yang, David C. Keezer |
| 2019 | A Hybrid Space Compactor for Adaptive X-Handling. Mohammad Urf Maaz, Alexander Sprenger, Sybille Hellebrand |
| 2019 | A Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces. Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida |
| 2019 | A New Test Method for the Large Current Magnetic Sensors. Toshiyuki Omuro, Shigeo Nakamura Surname, Takashi Kimura, Kiyokawa Omuro |
| 2019 | Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers. Chen He |
| 2019 | An Adaptive Approach to Minimize System Level Tests Targeting Low Voltage DVFS Failures. Adit D. Singh |
| 2019 | An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test. Seyed Nima Mozaffari, Bonita Bhaskaran, Kaushik Narayanun, Ayub Abdollahian, Vinod Pagalone, Shantanu Sarangi, Jonathon E. Colburn |
| 2019 | An Overview of the International Microprocessor/ SoC Test, Security and Validation (MTV)Workshop. Magdy Abadir, Sohrab Aftabjahani |
| 2019 | An Overview of the International Verification and Security Workshop (IVSW). Magdy Abadir, Sohrab Aftabjahani |
| 2019 | Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen |
| 2019 | Applications of Hierarchical Test. Kelly Ockunzzi, Richard Grupp, Brion Keller, Mark Taylor, Sreekanth Pai, Greeshma Jayakumar |
| 2019 | Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2019 | Armenia: Communicating to World Community in Electronic Test and Design. Samvel K. Shoukourian, Yuri Shoukourian, Vladimir Sahakyan |
| 2019 | Asian Test Symposium - Past, Present and Future -. Michiko Inoue, Xiaowei Li, Cheng-Wen Wu |
| 2019 | Breaking Analog Locking Techniques via Satisfiability Modulo Theories. Nithyashankari Gummidipoondi Jayasankaran, Adriana C. Sanabria-Borbon, Amr Abuellil, Edgar Sánchez-Sinencio, Jiang Hu, Jeyavijayan Rajendran |
| 2019 | Built-in self-test and self-calibration for analog and mixed signal circuits. Tao Chen, Degang Chen |
| 2019 | Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology. Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee |
| 2019 | Characterization of Locked Combinational Circuits via ATPG. Danielle Duvalsaint, Xiaoxiao Jin, Benjamin Niewenhuis, R. D. (Shawn) Blanton |
| 2019 | China Test Conference (CTC) - Extending the Global Test Forum to China. Huawei Li, Xiaowei Li, Yinhe Han |
| 2019 | Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation. Irith Pomeranz |
| 2019 | DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips. Ahmed M. Y. Ibrahim, Hans G. Kerkhoff |
| 2019 | Deploying A Machine Learning Solution As A Surrogate. Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa |
| 2019 | Device-Aware Test: A New Test Approach Towards DPPB Level. Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | Effectively Using Machine Learning to Expedite System Level Test Failure Debug. Luis D. Rojas, Kevin Hess, Christina Carter-Brown |
| 2019 | Efficiency Measurement Method for Fully Integrated Voltage Regulators used in 4 Gerhard Schrom, Michael J. Hill, Sarath Makala, Ravi Sankar Vunnam, Arun Krishnamoorthy, Ryan Ferguson |
| 2019 | Efficient Analog Defect Simulation. Stephen Sunter |
| 2019 | FAE: Autoencoder-Based Failure Binning of RTL Designs for Verification and Debugging. Cheng-Hsien Shen, Aaron C.-W. Liang, Charles C.-H. Hsu, Charles H.-P. Wen |
| 2019 | FPGA Bitstream Security: A Day in the Life. Adam Duncan, Fahim Rahman, Andrew Lukefahr, Farimah Farahmandi, Mark Tehranipoor |
| 2019 | Fault Recovery in Micro-Electrode-Dot-Array Digital Microfluidic Biochips Using an IJTAG NetworkBehaviors. Zhanwei Zhong, Krishnendu Chakrabarty |
| 2019 | Fault-Tolerant Neuromorphic Computing Systems. Arjun Chaudhuri, Mengyun Liu, Krishnendu Chakrabarty |
| 2019 | Hardware Fault Tolerance for Binary RRAM Crossbars. Arjun Chaudhuri, Bonan Yan, Yiran Chen, Krishnendu Chakrabarty |
| 2019 | High Quality Test Methodology for Highly Reliable Devices. Hao Chen, Mincent Lee, Liang-Yen Chen, Min-Jer Wang |
| 2019 | IEEE European Test Symposium (ETS). Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena-Ioana Vatajelu |
| 2019 | IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR). Szilárd Enyedi, Liviu Miclea |
| 2019 | IEEE International Symposium on Hardware Oriented Security and Trust (HOST): Past, Present, and Future. Domenic Forte, Swarup Bhunia, Ramesh Karri, Jim Plusquellic, Mark Tehranipoor |
| 2019 | IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019 |
| 2019 | IEEE Std. P1687.1: Translator and Protocol. Erik Larsson, Prathamesh Murali, Gani Kumisbek |
| 2019 | Improving Test Chip Design Efficiency via Machine Learning. Zeye Liu, Qicheng Huang, Chenlei Fang, R. D. (Shawn) Blanton |
| 2019 | International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Zoran Stamenkovic, Alberto Bosio, György Cserey, Ondrej Novák, Witold A. Pleskacz, Lukás Sekanina, Andreas Steininger, Goran Stojanovic, Viera Stopjaková |
| 2019 | International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia. Kuen-Jong Lee, Shi-Yu Huang, Huawei Li, Tomoo Inoue, Yervant Zorian |
| 2019 | Is Backside the New Backdoor in Modern SoCs?: Invited Paper. Nidish Vashistha, M. Tanjidur Rahman, Olivia P. Paradis, Navid Asadizanjani |
| 2019 | Iterative Test Generation for Gate-Exhaustive Faults to Cover the Sites of Undetectable Target Faults. Irith Pomeranz |
| 2019 | Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation. Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2019 | Machine Learning-Based Automatic Generation of eFuse Configuration in NAND Flash Chip. Jisuk Kim, Jinyub Lee, Sungjoo Yoo |
| 2019 | Machine Learning-Based DFT Recommendation System for ATPG QOR. Apik Zorian, Basim Shanyour, Milir Vaseekar |
| 2019 | Memory FIT Rate Mitigation Technique for Automotive SoCs. Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian |
| 2019 | Methodology of Generating Timing-Slack-Based Cell-Aware Tests. Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao |
| 2019 | Multi-cell characterization: Developing robust cells and abstraction for Rapid Single Flux Quantum (RSFQ) Logic. Fangzhou Wang, Sandeep Gupta |
| 2019 | On Freedom from Interference in Mixed-Criticality Systems: A Causal Learning Approach. Fei Su, Prashant Goteti, Min Zhang |
| 2019 | Optimized Physical DFT Synthesis of Unified Compression and LBIST for Automotive Applications. Christos Papameletis, Vivek Chickermane, Brian Foutz, Sarthak Singhal, Krishna Chakravadhanula |
| 2019 | Overall Strategy for Online Clock System Checking Supporting Heterogeneous Integration. Wei Chu, Shi-Yu Huang |
| 2019 | Programmable Daisychaining of Microelectrodes for IP Protection in MEDA Biochips. Tung-Che Liang, Krishnendu Chakrabarty, Ramesh Karri |
| 2019 | Recycled Analog and Mixed Signal Chip Detection at Zero Cost Using LDO Degradation. Sreeja Chowdhury, Fatemeh Ganji, Troy Bryant, Nima Maghari, Domenic Forte |
| 2019 | Reliability Modeling and Mitigation for Embedded Memories. Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | Resiliency of automotive object detection networks on GPU architectures. Atieh Lotfi, Saurabh Hukerikar, Keshav Balasubramanian, Paul Racunas, Nirmal R. Saxena, Richard Bramley, Yanxiang Huang |
| 2019 | Safety Design of a Convolutional Neural Network Accelerator with Error Localization and Correction. Zheng Xu, Jacob Abraham |
| 2019 | Security Compliance Analysis of Reconfigurable Scan Networks. Natalia Lylina, Ahmed Atteya, Pascal Raiola, Matthias Sauer, Bernd Becker, Hans-Joachim Wunderlich |
| 2019 | Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL. Aleksa Damljanovic, Artur Jutman, Michele Portolan, Ernesto Sánchez, Giovanni Squillero, Anton Tsertov |
| 2019 | SoC Security Verification using Property Checking. Nusrat Farzana, Fahim Rahman, Mark Tehranipoor, Farimah Farahmandi |
| 2019 | Structural Test and Functional Test for Digital Acoustofluidic Biochips. Zhanwei Zhong, Haodong Zhu, Peiran Zhang, Tony Jun Huang, Krishnendu Chakrabarty |
| 2019 | Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion. Kosuke Ikeda, Keith Schaub, Ira Leventhal, Yiorgos Makris, Constantinos Xanthopoulos, Deepika Neethirajan |
| 2019 | Test Time and Area Optimized BrST Scheme for Automotive ICs. Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki |
| 2019 | TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning. Andrew Yi-Ann Huang, Katherine Shu-Min Li, Cheng-Yen Tsai, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Xu-Hao Jiang, Leon Chou, Chen-Shiun Lee |
| 2019 | Testing Computation-in-Memory Architectures Based on Emerging Memories. Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil |
| 2019 | Testing of Neuromorphic Circuits: Structural vs Functional. Anteneh Gebregiorgis, Mehdi Baradaran Tahoori |
| 2019 | The Challenges of Implementing an MBIST Interface: A Practical Application. Teresa McLaurin, Rob Knoth |
| 2019 | Time-Slicing Soft Error Resilience in Microprocessors for Reliable and Energy-Efficient Execution. Yi He, Yanjing Li |
| 2019 | Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques. Stephan Eggersglüß |
| 2019 | VIPER: A Versatile and Intuitive Pattern GenERator for Early Design Space Exploration. Gaurav Rajavendra Reddy, Mohammad-Mahdi Bidmeshki, Yiorgos Makris |
| 2019 | Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses. Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich |
| 2019 | Virtual Memory Structures Facilitating Memory BIST Insertion In Complex SoCs. Tal Kogan, Yehonatan Abotbol |