| 2018 | A New Technique to Generate Test Sequences for Reconfigurable Scan Networks. Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero |
| 2018 | A PVT-Resilient No-Touch DFT Methodology for Prebond TSV Testing. Sourav Das, Fei Su, Sreejit Chakravarty |
| 2018 | A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces. Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida |
| 2018 | Access-Time Minimization in the IEEE 1687 Network Using Broadcast and Hardware Parallelism. Zhanwei Zhong, Guoliang Li, Qinfu Yang, Krishnendu Chakrabarty |
| 2018 | Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides |
| 2018 | Advanced Uniformed Test Approach For Automotive SoCs. Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian |
| 2018 | An Autonomous System View To Apply Machine Learning. Li-C. Wang |
| 2018 | An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. Tien-Phu Ho, Eric Faehn, Arnaud Virazel, Alberto Bosio, Patrick Girard |
| 2018 | An Effective Methodology for Automated Diagnosis of Functional Pattern Failures to Support Silicon Debug. Pallav Gupta |
| 2018 | Analysis of Process Variations, Defects, and Design-Induced Coupling in Memristors. Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2018 | Artificial Neural Network Based Test Escape Screening Using Generative Model. Michihiro Shintani, Michiko Inoue, Yoshiyuki Nakamura |
| 2018 | Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips. Ling Zhang, Zipeng Li, Krishnendu Chakrabarty |
| 2018 | Case Study and Advanced Functional Safety Solution for Automotive SoCs. M. Casarsa, Gurgen Harutyunyan |
| 2018 | Concept Recognition in Production Yield Data Analytics. Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa |
| 2018 | DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski |
| 2018 | Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian |
| 2018 | Design Automation for Intelligent Automotive Systems. Shuyue Lan, Chao Huang, Zhilu Wang, Hengyi Liang, Wenhao Su, Qi Zhu |
| 2018 | Detection of Low Power Trojans in Standard Cell Designs using Built-in Current Sensors. Basim Shanyour, Spyros Tragoudas |
| 2018 | Deterministic Stellar BIST for In-System Automotive Test. Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer |
| 2018 | EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs. Andrew Stern, Ulbert Botero, Bicky Shakya, Hao-Ting Shen, Domenic Forte, Mark Tehranipoor |
| 2018 | Electrical Modeling of STT-MRAM Defects. Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui |
| 2018 | Fast and accurate linearity test for DACs with various architectures using segmented models. Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen |
| 2018 | Fault Tolerance for RRAM-Based Matrix Operations. Mengyun Liu, Lixue Xia, Yu Wang, Krishnendu Chakrabarty |
| 2018 | Fine-Grained Adaptive Testing Based on Quality Prediction. Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu |
| 2018 | Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run. Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy |
| 2018 | Hardware Dithering: A Run-Time Method for Trojan Neutralization in Wireless Cryptographic ICs. Christiana Kapatsori, Yu Liu, Angelos Antonopoulos, Yiorgos Makris |
| 2018 | Hardware IP Trust Validation: Learn (the Untrustworthy), and Verify. Tamzidul Hoque, Jonathan Cruz, Prabuddha Chakraborty, Swarup Bhunia |
| 2018 | Hypercompression of Test Patterns. Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang |
| 2018 | IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018 |
| 2018 | IJTAG Integrity Checking with Chained Hashing. Senwen Kan, Jennifer Dworak |
| 2018 | Improving Analog Functional Safety Using Data-Driven Anomaly Detection. Fei Su, Prashant Goteti |
| 2018 | Improving Diagnosis Efficiency via Machine Learning. Qicheng Huang, Chenlei Fang, Soumya Mittal, R. D. Shawn Blanton |
| 2018 | Improving Diagnosis Resolution and Performance at High Compression Ratios. Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula |
| 2018 | Improving Power, Performance and Area with Test: A Case Study. Teresa L. McLaurin, Ignatius P. Lawrence |
| 2018 | Influence-Directed Explanations for Deep Convolutional Networks. Klas Leino, Shayak Sen, Anupam Datta, Matt Fredrikson, Linyi Li |
| 2018 | Lightweight Timing Channel Protection for Shared DRAM Controller. Ying Wang, Wen Li, Huawei Li, Xiaowei Li |
| 2018 | Machine Learning for Yield Learning and Optimization. Yibo Lin, Mohamed Baker Alawieh, Wei Ye, David Z. Pan |
| 2018 | Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2018 | On Close-to-Functional Test Sequences. Irith Pomeranz |
| 2018 | On New Class of Test Points and Their Applications. Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2018 | On the use of Bayesian Networks for Resource-Efficient Self-Calibration of Analog/RF ICs. Martin Andraud, Laura Isabel Galindez Olascoaga, Yichuan Lu, Yiorgos Makris, Marian Verhelst |
| 2018 | On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs. Leonidas Katselas, Alkis A. Hatzopoulos, Hailong Jiao, Christos Papameletis, Erik Jan Marinissen |
| 2018 | Online Scan Diagnosis : A Novel Approach to Volume Diagnosis. I-De Huang, Pallav Gupta, Loganathan Lingappan, Vijay Gangaram |
| 2018 | Optimizing the Use of Simulations for Commissioning with Systems Engineering Principles and Objective Analysis. Trevor Ault |
| 2018 | Polynomial Chaos modeling for jitter estimation in high-speed links. Majid Ahadi Dolatsara, Huan Yu, Jose Ale Hejase, Wiren Dale Becker, Madhavan Swaminathan |
| 2018 | Pre-silicon Formal Verification of JTAG Instruction Opcodes for Security. Nicole Fern, Kwang-Ting (Tim) Cheng |
| 2018 | Production Tests Coverage Analysis in the Simulation Environment. Niveditha Manjunath, Dieter Haerle, Stephen Sabanal, Herbert Eichinger, Hermann Tauber, Andreas Machne, Christian Manthey, Mikko Vaananen, Radu Grosu, Dejan Nickovic |
| 2018 | Safe AI for CPS (Invited Paper). Nathan Fulton, André Platzer |
| 2018 | Scalable Hardware Trojan Activation by Interleaving Concrete Simulation and Symbolic Execution. Alif Ahmed, Farimah Farahmandi, Yousef Iskander, Prabhat Mishra |
| 2018 | Self-Learning Health-Status Analysis for a Core Router System. Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2018 | Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits. Erik Jan Marinissen, Ferenc Fodor, Arnita Podpod, Michele Stucchi, Yu-Rong Jian, Cheng-Wen Wu |
| 2018 | Test methodology for PCHB/PCFB Asynchronous Circuits. Ting-Yu Shen, Chia-Cheng Pai, Tsai-Chieh Chen, James Chien-Mo Li, Samuel Pan |
| 2018 | Test of Supply Noise for Emerging Non-Volatile Memory. Mohammad Nasim Imtiaz Khan, Swaroop Ghosh |
| 2018 | Testing Resistive Memories: Where are We and What is Missing? Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2018 | TimingSAT: Decamouflaging Timing-based Logic Obfuscation. Meng Li, Kaveh Shamsi, Yier Jin, David Z. Pan |
| 2018 | Total Critical Area Based Testing. Friedrich Hapke, Peter C. Maxwell |
| 2018 | Towards Provably Secure Logic Locking for Hardening Hardware Security Dissertation Summary: IEEE TTTC E.J. McCluskey Doctoral Thesis Award Competition. Muhammad Yasin, Ozgur Sinanoglu |
| 2018 | Transmitter and Receiver Equalizers Optimization Methodologies for High-Speed Links in Industrial Computer Platforms Post-Silicon Validation. Francisco E. Rangel-Patino, José Ernesto Rayas-Sánchez, Nagib Hakim |
| 2018 | Variation-Aware Hardware Trojan Detection through Power Side-channel. Fakir Sharif Hossain, Michihiro Shintani, Michiko Inoue, Alex Orailoglu |
| 2018 | XLBIST: X-Tolerant Logic BIST. Peter Wohl, John A. Waicukauski, Gregory A. Maston, Jonathon E. Colburn |