| 2014 | 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014 |
| 2014 | A Tag based solution for efficient utilization of efuse for memory repair. Harsharaj Ellur, Kalpesh Shah |
| 2014 | A built-in self-test circuit for jitter tolerance measurement in high-speed wireline receivers. Myeong-Jae Park, Jaeha Kim |
| 2014 | A diagnosis-friendly LBIST architecture with property checking. Sarvesh Prabhu, Vineeth V. Acharya, Sharad Bagri, Michael S. Hsiao |
| 2014 | A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs. Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow |
| 2014 | A novel RF self test for a combo SoC on digital ATE with multi-site applications. Chun-Hsien Peng, ChiaYu Yang, Adonis Tsu, Chung-Jin Tsai, Yosen Chen, C.-Y. Lin, Kai Hong, Kaipon Kao, Paul C. P. Liang, Chao Long Tsai, Charles Chien, H. C. Hwang |
| 2014 | A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time. Bruce Querbach, Rahul Khanna, David Blankenbeckler, Yulan Zhang, Ronald T. Anderson, David G. Ellis, Zale T. Schoenborn, Sabyasachi Deyati, Patrick Chiang |
| 2014 | A self-tuning architecture for buck converters based on alternative test. Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee |
| 2014 | A tale of two lives: Under test and in the wild. Bianca Schroeder |
| 2014 | A test probe for TSV using resonant inductive coupling. Rashid Rashidzadeh, Iftekhar Ibne Basith |
| 2014 | ATE and test equipment vendors; Hardware not software. Mark Roos |
| 2014 | Achieving extreme scan compression for SoC Designs. Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane |
| 2014 | An efficient diagnosis-aware pattern generation procedure for transition faults. Kuen-Jong Lee, Cheng-Hung Wu |
| 2014 | Analog fault models: Back to the future? Mani Soma |
| 2014 | Analysis and test of the effects of single event upsets affecting the configuration memory of SRAM-based FPGAs. Luca Cassano |
| 2014 | Analytical MRAM test. Raphael Robertazzi, Janusz Nowak, Jonathan Sun |
| 2014 | At-speed capture power reduction using layout-aware granular clock gate enable controls. Raashid Shaikh, Pradeep Wilson, Khushboo Agarwal, H. V. Sanjay, Rajesh Tiwari, Kaushik Lath, Srivaths Ravi |
| 2014 | Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler |
| 2014 | Big data and test. Anne Gattiker |
| 2014 | Board manufacturing test correlation to IC manufacturing test. C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy |
| 2014 | Board security enhancement using new locking SIB-based architectures. Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter |
| 2014 | Challenges of testing 100M chips. Sajjad Pagarkar |
| 2014 | Clustering-based failure triage for RTL regression debugging. Zissis Poulos, Andreas G. Veneris |
| 2014 | Collaboration and teamwork obstacles. Wesley Smith |
| 2014 | Comparing the effectiveness of cache-resident tests against cycleaccurate deterministic functional patterns. Sankar Gurumurthy, Mustansir Pratapgarhwala, Curtis Gilgan, Jeff Rearick |
| 2014 | Compositional verification using formal analysis for a flight critical system. Guillaume Brat |
| 2014 | Concerns over predictability of supply and quality. Carl Bowen |
| 2014 | Counterfeit IC detection using light emission. Peilin Song, Franco Stellari, Alan J. Weger |
| 2014 | Delivering security by design in the Internet of Things. Bill Curtis |
| 2014 | Design and test of analog circuits towards sub-ppm level. Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen |
| 2014 | Design, technology and yield in the post-moore era. Greg Yeric |
| 2014 | Design, test & repair methodology for FinFET-based memories. Yervant Zorian |
| 2014 | DfST: Design for secure testability. Samah Mohamed Saeed |
| 2014 | Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. Erik Jan Marinissen, Bart De Wachter, Ken Smith, Jorg Kiesewetter, Mottaqiallah Taouil, Said Hamdioui |
| 2014 | Divide and conquer diagnosis for multiple defects. Shih-Min Chao, Po-Juei Chen, Jing-Yu Chen, Po-Hao Chen, Ang-Feng Lin, James Chien-Mo Li, Pei-Ying Hsueh, Chun-Yi Kuo, Ying-Yen Chen, Jih-Nung Li |
| 2014 | Dynamic microgrids - A potential solution for enhanced resiliency in distribution systems. Mani Vadari |
| 2014 | EAGLE: A regression model for fault coverage estimation using a simulation based metric. Shahrzad Mirkhani, Jacob A. Abraham |
| 2014 | Efficient RAS support for die-stacked DRAM. Hyeran Jeon, Gabriel H. Loh, Murali Annavaram |
| 2014 | Efficient SAT-based ATPG techniques for all multiple stuck-at faults. Masahiro Fujita, Alan Mishchenko |
| 2014 | Efficient testing of hierarchical core-based SOCs. Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, Akhil Garg, Richard Schoonover, James Sage, Don Pearl, Thomas J. Snethen |
| 2014 | Emulation and its connection to test. Kenneth Larsen |
| 2014 | Energy-secure computer architectures. Pradip Bose |
| 2014 | Error prediction and detection methodologies for reliable circuit operation under NBTI. Julio Vazquez Hernandez |
| 2014 | FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich |
| 2014 | Fast BIST of I/O Pin AC specifications and inter-chip delays. Stephen Sunter, Saghir A. Shaikh, Qing Lin |
| 2014 | Fast co-test of linearity and spectral performance with non-coherent sampled and amplitude clipped data. Li Xu, Degang Chen |
| 2014 | Fault sharing in a copy-on-write based ATPG system. X. Cai, Peter Wohl, Daniel Martin |
| 2014 | Feature engineering with canonical analysis for effective statistical tests screening test escapes. Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng |
| 2014 | IC laser trimming speed-up through wafer-level spatial correlation modeling. Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris |
| 2014 | Improving test compression with scan feedforward techniques. Sreenivaas S. Muthyala, Nur A. Touba |
| 2014 | Interposer test: Testing PCBs that have shrunk 100x. T. M. Mak |
| 2014 | Intra-die process variation aware anomaly detection in FPGAs. Youngok K. Pino, Vinayaka Jyothi, Matthew French |
| 2014 | Isometric test compression with low toggling activity. Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang |
| 2014 | Knowledge discovery and knowledge transfer in board-level functional fault diagnosis. Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2014 | Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase |
| 2014 | Logic characterization vehicle design for maximal information extraction for yield learning. Ronald D. Blanton, Ben Niewenhuis, Carl Taylor |
| 2014 | Low cost back end signal processing driven bandwidth interleaved signal acquisition using free running undersampling clocks and mixing signals. Nicholas Tzou, Debesh Bhatta, Abhijit Chatterjee |
| 2014 | Low-cost phase noise testing of complex RF ICs using standard digital ATE. Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre |
| 2014 | Low-distortion signal generation for ADC testing. Fumitaka Abe, Yutaro Kobayashi, Kenji Sawada, Keisuke Kato, Osamu Kobayashi, Haruo Kobayashi |
| 2014 | Managing signal, power and thermal integrity for 3D integration. Madhavan Swaminathan |
| 2014 | Market opportunities and testing challenges for millimeter-wave radios and radars. Brian A. Floyd |
| 2014 | Massive signal tracing using on-chip DRAM for in-system silicon debug. Sergej Deutsch, Krishnendu Chakrabarty |
| 2014 | Microgrids as a resiliency resource. Kevin Schneider |
| 2014 | Mitigating voltage droop during scan with variable shift frequency. John Schulze, Ryan Tally |
| 2014 | On the testing of hazard activated open defects. Chao Han, Adit D. Singh |
| 2014 | On-chip constrained random stimuli generation for post-silicon validation using compact masks. Xiaobing Shi, Nicola Nicolici |
| 2014 | Optimizing redundancy design for chip-multiprocessors for flexible utility functions. Da Cheng, Sandeep K. Gupta |
| 2014 | Practical random sampling of potential defects for analog fault simulation. Stephen Sunter, Krzysztof Jurga, Peter Dingenen, Ronny Vanhooren |
| 2014 | Process defect trends and strategic test gaps. Paul G. Ryan, Irfan Aziz, William B. Howell, Teresa K. Janczak, Davia J. Lu |
| 2014 | Protecting against emerging vmin failures in advanced technology nodes. J. K. Jerry Lee, Amr Haggag, William Eklow |
| 2014 | Read disturb fault detection in STT-MRAM. Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori |
| 2014 | Recruiting distributed resources for grid resilience: The need for transparency. Alexandra von Meier |
| 2014 | Redundancy architectures for channel-based 3D DRAM yield improvement. Bing-Yang Lin, Wan-Ting Chiang, Cheng-Wen Wu, Mincent Lee, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang |
| 2014 | Robustness of TAP-based scan networks. Farrokh Ghani Zadegan, Gunnar Carlsson, Erik Larsson |
| 2014 | Security solutions in the first-generation Zynq All-Programmable SoC. Steve Trimberger |
| 2014 | Soft error resiliency characterization and improvement on IBM BlueGene/Q processor using accelerated proton irradiation. Chen-Yong Cher, K. Paul Muller, Ruud A. Haring, David L. Satterfield, Thomas E. Musta, Thomas Gooding, Kristan D. Davis, Marc Boris Dombrowa, Gerard V. Kopcsay, Robert M. Senger, Yutaka Sugawara, Krishnan Sugavanam |
| 2014 | Software in a hardware view: New models for HW-dependent software in SoC verification and test. Carlos Villarraga, Bernard Schmidt, Binghao Bao, Rakesh Raman, Christian Bartsch, Thomas Fehmel, Dominik Stoffel, Wolfgang Kunz |
| 2014 | Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris |
| 2014 | Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills. Masahiro Ishida, Takashi Kusaka, Toru Nakura, Satoshi Komatsu, Kunihiro Asada |
| 2014 | Systematic approach for trim test time optimization: Case study on a multi-core RF SOC. Rajesh Mittal, Mudasir Kawoosa, Rubin A. Parekhji |
| 2014 | Teaching an old dog new tricks: Views on the future of mixed-signal IC design. Boris Murmann |
| 2014 | Test pattern generation in presence of unknown values based on restricted symbolic logic. Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker |
| 2014 | Test-mode-only scan attack and countermeasure for contemporary scan architectures. Samah Mohamed Saeed, Sk Subidh Ali, Ozgur Sinanoglu, Ramesh Karri |
| 2014 | Testing silicon TV tuners on ATE without TV signal generator. Y. Fan, A. Verma, J. Janney, S. Kumar |
| 2014 | The case for analyzing system level failures using structural patterns. Harry H. Chen |
| 2014 | The desire-friction ratio of Adaptive test. Stacy Ajouri |
| 2014 | The importance of DFX, a foundry perspective. Saman Adham, Jonathan Chang, Hung-Jen Liao, John Hung, Ting-Hua Hsieh |
| 2014 | Thermal-aware mobile SoC design and test in 14nm finfet technology. Bong Hyun Lee |
| 2014 | Top ten challenges in Big Data security and privacy. Praveen K. Murthy |
| 2014 | Trading-off on-die observability for cache minimum supply voltage reduction in system-on-chip (SoC) processors. Keith A. Bowman, Alex Park, Venkat Narayanan, Francois Atallah, Alain Artieri, Sei Seung Yoon, Kendrick Yuen, David Hansquine |
| 2014 | Vesuvius-3D: A 3D-DfT demonstrator. Erik Jan Marinissen, Bart De Wachter, Stephen O'Loughlin, Sergej Deutsch, Christos Papameletis, Tobias Burgherr |
| 2014 | Wafer Level Chip Scale Package copper pillar probing. Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang |
| 2014 | Welcome message. Michael Purtell, Subhasish Mitra |
| 2014 | Yield and performance improvement through technology-design co-optimization in advanced technology nodes. Yue Liang |
| 2014 | Yield optimization using advanced statistical correlation methods. Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |