| 2013 | 12Gbps SerDes Jitter Tolerance BIST in production loopback testing with enhanced spread spectrum clock generation circuit. Yi Cai, Liming Fang, Ivan Chan, Max Olsen, Kevin Richter |
| 2013 | 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013 |
| 2013 | 30-Gb/s optical and electrical test solution for high-volume testing. Daisuke Watanabe, Shin Masuda, Hideo Hara, Tsuyoshi Ataka, Atsushi Seki, Atsushi Ono, Toshiyuki Okayasu |
| 2013 | A circular pipeline processing based deterministic parallel test pattern generator. Kuen-Wei Yeh, Jiun-Lang Huang, Hao-Jan Chao, Laung-Terng Wang |
| 2013 | A design-for-reliability approach based on grading library cells for aging effects. Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy |
| 2013 | A distributed-multicore hybrid ATPG system. X. Cai, Peter Wohl |
| 2013 | A functional test of 2-GHz/4-GHz RF digital communication device using digital tester. Kiyotaka Ichiyama, Masahiro Ishida, Kenichi Nagatani, Toshifumi Watanabe |
| 2013 | A graph-theoretic approach for minimizing the number of wrapper cells for pre-bond testing of 3D-stacked ICs. Mukesh Agrawal, Krishnendu Chakrabarty |
| 2013 | A novel test structure for measuring the threshold voltage variance in MOSFETs. Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada |
| 2013 | A pattern mining framework for inter-wafer abnormality analysis. Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2013 | ATE test time reduction using asynchronous clock period. Praveen Venkataramani, Vishwani D. Agrawal |
| 2013 | Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping. Siva Sudani, Li Xu, Degang Chen |
| 2013 | Adaptive testing - Cost reduction through test pattern sampling. Matt Grady, Bradley Pepper, Joshua Patch, Michael Degregorio, Phil Nigh |
| 2013 | Advanced method to refine waveform smeared by jitter in waveform sampler measurement. Hideo Okawara |
| 2013 | AgentDiag: An agent-assisted diagnostic framework for board-level functional failures. Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu |
| 2013 | An enhanced procedure for calculating dynamic properties of high-performance DAC on ATE. Ming Lu |
| 2013 | Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults. Mahesh Prabhu, Jacob A. Abraham |
| 2013 | BA-BIST: Board test from inside the IC out. Zoe Conroy, Alfred L. Crouch |
| 2013 | Best paper award winners. Z. Yu, D. Chen |
| 2013 | Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. Ke Huang, John M. Carulli, Yiorgos Makris |
| 2013 | Delay testing and characterization of post-bond interposer wires in 2.5-D ICs. Shi-Yu Huang, Li-Ren Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2013 | Design rule check on the clock gating logic for testability and beyond. Kun-Han Tsai, Shuo Sheng |
| 2013 | Diagnosis and Layout Aware (DLA) scan chain stitching. Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan |
| 2013 | Differential scan-path: A novel solution for secure design-for-testability. Salvador Manich, Markus S. Wamser, Oscar M. Guillen, Georg Sigl |
| 2013 | Don't forget to lock your SIB: Hiding instruments using P16871. Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton |
| 2013 | EDT bandwidth management - Practical scenarios for large SoC designs. Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles |
| 2013 | Early-life-failure detection using SAT-based ATPG. Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker |
| 2013 | FPGA-based universal embedded digital instrument. Joshua Ferry |
| 2013 | Fault diagnosis of TSV-based interconnects in 3-D stacked designs. Janusz Rajski, Jerzy Tyszer |
| 2013 | Fault mitigation strategies for CUDA GPUs. Stefano Di Carlo, Giulio Gambardella, Ippazio Martella, Paolo Prinetto, Daniele Rolfo, Pascal Trotta |
| 2013 | Fault modeling and diagnosis for nanometric analog circuits. Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir |
| 2013 | High sensitivity test signatures for unconventional analog circuit test paradigms. Suraj Sindia, Vishwani D. Agrawal |
| 2013 | In-system diagnosis of RF ICs for tolerance against on-chip in-band interferers. Naoya Azuma, T. Makita, S. Ueyama, Makoto Nagata, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Satoshi Tanaka, Masahiro Yamaguchi |
| 2013 | Keynote address thursday: Efficient resilience in future systems: Design and modeling challenges. Pradip Bose |
| 2013 | Keynote address tuesday: Challenges in mobile devices: Process, design and manufacturing. Kwang-Hyun Kim |
| 2013 | Keynote address wednesday: Compute continuum and the nonlinear validation challenge. John D. Barton |
| 2013 | Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures. Hongyan Zhang, Lars Bauer, Michael A. Kochte, Eric Schneider, Claus Braun, Michael E. Imhof, Hans-Joachim Wunderlich, Jörg Henkel |
| 2013 | On the generation of compact test sets. Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Chen Wang |
| 2013 | On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | PADRE: Physically-Aware Diagnostic Resolution Enhancement. Yang Xue, Osei Poku, Xin Li, Ronald D. Blanton |
| 2013 | Performance enhancement of a WCDMA/HSDPA+ receiver via minimizing error vector magnitude. Wei Gao, Chris Liu |
| 2013 | Practical methods for extending ATE to 40 and 50Gbps. David C. Keezer, Carl Edward Gray, Te-Hui Chen, Ashraf Majid |
| 2013 | Predicting system-level test and in-field customer failures using data mining. Harry H. Chen, Roger Hsu, PaulYoung Yang, J. J. Shyr |
| 2013 | Process monitoring through wafer-level spatial variation decomposition. Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2013 | RF MEMS switches for Wide I/O data bus applications. Michael B. Cohn, Kaosio Saechao, Michael Whitlock, Daniel Brenman, Wallace T. Tang, Robert M. Proie |
| 2013 | Representative critical-path selection for aging-induced delay monitoring. Farshad Firouzi, Fangming Ye, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori |
| 2013 | SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states. Ben Niewenhuis, Ronald D. Blanton, Mudit Bhargava, Ken Mai |
| 2013 | Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study. Yanjing Li, Eric Cheng, Samy Makar, Subhasish Mitra |
| 2013 | SmartScan - Hierarchical test compression for pin-limited low power designs. Krishna Chakravadhanula, Vivek Chickermane, Don Pearl, Akhil Garg, R. Khurana, Subhasish Mukherjee, P. Nagaraj |
| 2013 | Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case study. Sandeep Kumar Goel, Saman Adham, Min-Jer Wang, Ji-Jan Chen, Tze-Chiang Huang, Ashok Mehta, Frank Lee, Vivek Chickermane, Brion L. Keller, Thomas Valind, Subhasish Mukherjee, Navdeep Sood, Jeongho Cho, Hayden Hyungdong Lee, Jungi Choi, Sangdoo Kim |
| 2013 | Test data analytics - Exploring spatial and test-item correlations in production test data. Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler |
| 2013 | Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations. Degang Chen, Zhongjun Yu, Krunal Maniar, Mojtaba Nowrozi |
| 2013 | Test-yield improvement of high-density probing technology using optimized metal backer with plastic patch. Sen-Kuei Hsu, Hao Chen, Chung-Han Huang, Der-Jiann Liu, Wei-Hsun Lin, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang |
| 2013 | The implementation and application of a protocol aware architecture. Timothy D. Lyons, George Conner, John Aslanian, Shawn Sullivan |
| 2013 | Theory, model, and applications of non-Gaussian probability density functions for random jitter/noise with non-white power spectral densities. Daniel Chow, Masashi Shimanouchi, Mike Peng Li |
| 2013 | Towards data reliable crossbar-based memristive memories. Amirali Ghofrani, Miguel Angel Lastras-Montaño, Kwang-Ting Cheng |
| 2013 | True non-intrusive sensors for RF built-in test. Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir |
| 2013 | Two-level compression through selective reseeding. Peter Wohl, John A. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, Jonathon E. Colburn |
| 2013 | Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs. Sergej Deutsch, Krishnendu Chakrabarty, Erik Jan Marinissen |
| 2013 | VLSI testing based security metric for IC camouflaging. Jeyavijayan Rajendran, Ozgur Sinanoglu, Ramesh Karri |
| 2013 | Welcome message. Gordon W. Roberts, Rob Aitken |
| 2013 | Zero-overhead self test and calibration of RF transceivers. Afsaneh Nassery, Jae Woong Jeong, Sule Ozev |