| 2012 | "Managing process variance in analog designs". Eugene R. Atwood |
| 2012 | 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012 |
| 2012 | 8Gbps CMOS pin electronics hardware macro with simultaneous bi-directional capability. Shoji Kojima, Yasuyuki Arai, Tasuku Fujibe, Tsuyoshi Ataka, Atsushi Ono, Ken-ichi Sawada, Daisuke Watanabe |
| 2012 | A built-in self-test scheme for 3D RAMs. Yun-Chao You, Che-Wei Chou, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu |
| 2012 | A design flow to maximize yield/area of physical devices via redundancy. Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta |
| 2012 | A digital method for phase noise measurement. Allan Ecker, Kenneth Blakkan, Mani Soma |
| 2012 | A dynamic programming solution for optimizing test delivery in multicore SOCs. Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty |
| 2012 | A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation. Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue |
| 2012 | A frequency measurement BIST implementation targeting gigahertz application. Matthieu Dubois, Emeric de Foucauld, Christopher Mounet, Serigne Dia, Cedric Mayor |
| 2012 | A memory yield improvement scheme combining built-in self-repair and error correction codes. Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang |
| 2012 | A unified method for parametric fault characterization of post-bond TSVs. Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter |
| 2012 | Adaptive test selection for post-silicon timing validation: A data mining approach. Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng |
| 2012 | Algorithm for dramatically improved efficiency in ADC linearity test. Zhongjun Yu, Degang Chen |
| 2012 | An ATE architecture for implementing very high efficiency concurrent testing. Takahiro Nakajima, Takeshi Yaguchi, Hajime Sugimura |
| 2012 | An experiment of burn-in time reduction based on parametric test analysis. Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2012 | Are industrial test problems real problems? I thought research has resolved them all! Xinli Gu |
| 2012 | Are the IC guys helping or hindering board test? Zoe Conroy |
| 2012 | Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction. Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage |
| 2012 | BS 1149.1 extensions for an online interconnect fault detection and recovery. Somayeh Sadeghi Kohan, Majid Namaki-Shoushtari, Fatemeh Javaheri, Zainalabedin Navabi |
| 2012 | Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers |
| 2012 | Calibration of a flexible high precision Power-On Reset during production test. Gerald Hilber, Dominik Gruber, Michael Sams, Timm Ostermann |
| 2012 | Capacitive sensing testability in complex memory devices. Kenneth P. Parker |
| 2012 | Cell-aware Production test results from a 32-nm notebook processor. Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski |
| 2012 | DART: Dependable VLSI test architecture and its implementation. Yasuo Sato, Seiji Kajihara, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue, Yukiya Miura, Satosni Untake, Takumi Hasegawa, Motoyuki Sato, Kotaro Shimamura |
| 2012 | DC temperature measurements for power gain monitoring in RF power amplifiers. Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà |
| 2012 | Design validation of RTL circuits using evolutionary swarm intelligence. Min Li, Kelson Gent, Michael S. Hsiao |
| 2012 | DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks. Sergej Deutsch, Brion L. Keller, Vivek Chickermane, Subhasish Mukherjee, Navdeep Sood, Sandeep Kumar Goel, Ji-Jan Chen, Ashok Mehta, Frank Lee, Erik Jan Marinissen |
| 2012 | Driver sharing challenges for DDR4 high-volume testing with ATE. Jose Moreira, Marc Moessinger, Koji Sasaki, Takayuki Nakamura |
| 2012 | Event-driven framework for configurable runtime system observability for SOC designs. Jong Chul Lee, Faycel Kouteib, Roman Lysecky |
| 2012 | Experiences with non-intrusive sensors for RF built-in test. Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma |
| 2012 | FALCON: Rapid statistical fault coverage estimation for complex designs. Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow |
| 2012 | FPGA-based synthetic instrumentation for board test. Igor Aleksejev, Artur Jutman, Sergei Devadze, Sergei Odintsov, Thomas Wenzel |
| 2012 | Functional test content optimization for peak-power validation - An experimental study. Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang |
| 2012 | Functional test of small-delay faults using SAT and Craig interpolation. Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, Bernd Becker |
| 2012 | Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee |
| 2012 | How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? Phil Nigh |
| 2012 | Hybrid selector for high-X scan compression. Peter Wohl, John A. Waicukauski, Frederic Neuveux, Jonathon E. Colburn |
| 2012 | Impact of Radial defect clustering on 3D stacked IC yield from wafer to wafer stacking. Eshan Singh |
| 2012 | Improved volume diagnosis throughput using dynamic design partitioning. Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware |
| 2012 | Improving test compression by retaining non-pivot free variables in sequential linear decompressors. Sreenivaas S. Muthyala, Nur A. Touba |
| 2012 | In-system constrained-random stimuli generation for post-silicon validation. Adam B. Kinsman, Ho Fai Ko, Nicola Nicolici |
| 2012 | Integrated optimization of semiconductor manufacturing: A machine learning approach. Nathan Kupp, Yiorgos Makris |
| 2012 | Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling. Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee |
| 2012 | Low power programmable PRPG with enhanced fault coverage gradient. Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski |
| 2012 | Low power test application with selective compaction in VLSI designs. Dariusz Czysz, Janusz Rajski, Jerzy Tyszer |
| 2012 | Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization. Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee |
| 2012 | Low-power SRAMs power mode control logic: Failure analysis and test solutions. Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | Making predictive analog/RF alternate test strategy independent of training set size. Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell |
| 2012 | Methodology for fault grading high speed I/O interfaces used in complex Graphics Processing Unit. Animesh Khare, P. Kishore, S. Reddy, K. Rajan, A. Sanghani |
| 2012 | Modeling, verification and pattern generation for reconfigurable scan networks. Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2012 | Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter. David C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo |
| 2012 | On efficient silicon debug with flexible trace interconnection fabric. Xiao Liu, Qiang Xu |
| 2012 | On modeling faults in FinFET logic circuits. Yuxi Liu, Qiang Xu |
| 2012 | On pinpoint capture power management in at-speed scan test generation. Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang |
| 2012 | On-chip diagnosis for early-life and wear-out failures. Matthew Beckler, R. D. (Shawn) Blanton |
| 2012 | On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing. Weichi Ding, Mingde Pan, Wilson Wong, Daniel Chow, Mike Peng Li, Sergey Y. Shumarayev |
| 2012 | Packet-based JTAG for remote testing. Michele Portolan |
| 2012 | Power integrity control of ATE for emulating power supply fluctuations on customer environment. Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada |
| 2012 | RNA: Advanced phase tracking method for digital waveform reconstruction. Takashi Ito, Hideo Okawara, Jinlei Liu |
| 2012 | Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements. Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor |
| 2012 | Real-time testing method for 16 Gbps 4-PAM signal interface. Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu |
| 2012 | Root cause identification of an hard-to-find on-chip power supply coupling fail. Franco Stellari, Thomas Cowell, Peilin Song, Michael Sorna, Zeynep Toprak Deniz, John F. Bulzacchelli, Nandita A. Mitra |
| 2012 | Scan test of die logic in 3D ICs using TSV probing. Brandon Noia, Shreepad Panth, Krishnendu Chakrabarty, Sung Kyu Lim |
| 2012 | Screening customer returns with multivariate test analysis. Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2012 | Spatial estimation of wafer measurement parameters using Gaussian process models. Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris |
| 2012 | Systematic defect screening in controlled experiments using volume diagnosis. B. Seshadri, P. Gupta, Y. T. Lin, Bruce Cory |
| 2012 | Test/ATE vision 2020 - Entrepreneurship in test CEO panel. Ken Lanier |
| 2012 | Testing high-frequency and low-power designs: Do the standard rules and tools apply? Scott Davidson |
| 2012 | Testing strategies for a 9T sub-threshold SRAM. Hao-Yu Yang, Chen-Wei Lin, Hung-Hsin Chen, Mango Chia-Tso Chao, Ming-Hsien Tu, Shyh-Jye Jou, Ching-Te Chuang |
| 2012 | The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor. Teresa L. McLaurin, Frank Frederick, Rich Slobodnik |
| 2012 | Vulnerability-based Interleaving for Multi-Bit Upset (MBU) protection in modern microprocessors. Michail Maniatakos, Maria K. Michael, Yiorgos Makris |