| 2008 | "Plug & Test" at System Level via Testable TLM Primitives. Homa Alemzadeh, Stefano Di Carlo, Fatemeh Refan, Paolo Prinetto, Zainalabedin Navabi |
| 2008 | 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008 Douglas Young, Nur A. Touba |
| 2008 | A Cost Analysis Framework for Multi-core Systems with Spares. Saeed Shamshiri, Peter Lisherness, Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng |
| 2008 | A Field Analysis of System-level Effects of Soft Errors Occurring in Microprocessors used in Information Systems. Syed Zafar Shazli, Mohammed A. Abdul-Aziz, Mehdi Baradaran Tahoori, David R. Kaeli |
| 2008 | A Generic Framework for Scan Capture Power Reduction in Test Compression Environment. Xiao Liu, Feng Yuan, Qiang Xu |
| 2008 | A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. Olivier Ginez, Jean-Michel Portal, Hassen Aziza |
| 2008 | A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2008 | A Hybrid A/D Converter with 120dB SNR and -125dB THD. Mamoru Tamba |
| 2008 | A Low-Cost Programmable Memory BIST Design for Multiple Memory Instances. Chung-Fu Lin, Chia-Fu Huang, De-Chung Lu, Chih-Chiang Hsu, Wen-Tsung Chiu, Yu-Wei Chen, Yeong-Jar Chang |
| 2008 | A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG. Akinori Maeda |
| 2008 | A New Language Approach for IJTAG. Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook |
| 2008 | A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa |
| 2008 | A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang |
| 2008 | A Novel Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths. Jeremy Lee, Mohammad Tehranipoor |
| 2008 | A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs. Vivek Chickermane, Patrick R. Gallagher Jr., James Sage, Paul Yuan, Krishna Chakravadhanula |
| 2008 | A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories in SOCs. Tsu-Wei Tseng, Jin-Fu Li |
| 2008 | A Study of Outlier Analysis Techniques for Delay Testing. Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang |
| 2008 | A Tutorial on STDF Fail Datalog Standard. Ajay Khoche, Phil Burlison, John Rowe, Glenn Plowman |
| 2008 | Achieving Zero-Defects for Automotive Applications. Rajesh Raina |
| 2008 | Align-Encode: Improving the Encoding Capability of Test Stimulus Decompressors. Ozgur Sinanoglu |
| 2008 | An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements. Kelageri Nagaraj, Sandip Kundu |
| 2008 | An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis. Xiaochun Yu, Ronald D. Blanton |
| 2008 | An Efficient Secure Scan Design for an SoC Embedding AES Core. Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park |
| 2008 | An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test. David C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid |
| 2008 | Analysis of Retention Time Distribution of Embedded DRAM - A New Method to Characterize Across-Chip Threshold Voltage Variation. Wei Kong, Paul C. Parries, G. Wang, Subramanian S. Iyer |
| 2008 | Architecture for Testing Multi-Voltage Domain SOC. Laurent Souef, Christophe Eychenne, Emmanuel Alie |
| 2008 | Augmenting Boundary-Scan Tests for Enhanced Defect Coverage. Dayton Norrgard, Kenneth P. Parker |
| 2008 | Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment. Jose Moreira, Heidi Barnes, Hiroshi Kaga, Michael Comai, Bernhard Roth, Morgan Culver |
| 2008 | Boundary-Scan Testing of Power/Ground Pins. Kenneth P. Parker, Neil G. Jacobson |
| 2008 | Bridging the gap between Design and Test Engineering for Functional Pattern Development. Ernst Aderholz, Heiko Ahrens, Michael Rohleder |
| 2008 | Built-in Self-Calibration of On-chip DAC and ADC. Wei Jiang, Vishwani D. Agrawal |
| 2008 | Built-in Self-Test and Fault Diagnosis for Lab-on-Chip Using Digital Microfluidic Logic Gates. Yang Zhao, Tao Xu, Krishnendu Chakrabarty |
| 2008 | CONCAT: CONflict Driven Learning in ATPG for Industrial designs. Surendra Bommu, Kameshwar Chandrasekar, Rahul Kundu, Sanjay Sengupta |
| 2008 | Capture and Shift Toggle Reduction (CASTR) ATPG to Minimize Peak Power Supply Noise. Hsiu-Ting Lin, Jen-Yang Wen, James Li, Ming-Tung Chang, Min-Hsiu Tsai, Sheng-Chih Huang, Chili-Mou Tseng |
| 2008 | Computing at the Crossroads (And What Does it Mean to Verification and Test?). Jan M. Rabaey |
| 2008 | DFT Architecture for Automotive Microprocessors using On-Chip Scan Compression supporting Dual Vendor ATPG. Heiko Ahrens, Rolf Schlagenhaft, Helmut Lang, V. Srinivasan, Enrico Bruzzano |
| 2008 | DFT Implementationis for Striking the Right Balance between Test Cost and Test Quality for Automotive SOCs. Amit Dutta, Srinivasulu Alampally, V. Prasanth, Rubin A. Parekhji |
| 2008 | DFX of a 3 Ishwar Parulkar, Sriram Anandakumar, Gaurav Agarwal, Gordon Liu, Krishna Rajan, Frank Chiu, Rajesh Pendurkar |
| 2008 | Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs. Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Georg Mueller |
| 2008 | Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits. Waleed K. Al-Assadi, Sindhu Kakarla |
| 2008 | Detection and Diagnosis of Static Scan Cell Internal Defect. Ruifeng Guo, Liyang Lai, Yu Huang, Wu-Tung Cheng |
| 2008 | Detection of Internal Stuck-open Faults in Scan Chains. Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2008 | Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects. Fei Wang, Yu Hu, Huawei Li, Xiaowei Li, Jing Ye, Yu Huang |
| 2008 | Diagnosis of Logic-to-chain Bridging Faults. Wei-Chih Liu, Wei-Lin Tsai, Hsiu-Ting Lin, James Chien-Mo Li |
| 2008 | Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains. Jing Ye, Fei Wang, Yu Hu, Xiaowei Li |
| 2008 | Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained. Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir |
| 2008 | Direct Cell-Stability Test Techniques for an SRAM Macro with Asymmetric Cell-Bias-Voltage Modulation. Akira Katayama, Tomoaki Yabe, Osamu Hirabayashi, Yasuhisa Takeyama, Keiichi Kushida, Takahiko Sasaki, Nobuaki Otsuka |
| 2008 | Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs. Ho Fai Ko, Adam B. Kinsman, Nicola Nicolici |
| 2008 | EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2008 | Efficient High-Speed Interface Verification and Fault Analysis. Thomas Nirmaier, Jose Torres Zaguirre, Eric Liau, Wolfgang Spirkl, Armin Rettenberger, Doris Schmitt-Landsiedel |
| 2008 | Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann |
| 2008 | Embedded Power Delivery Decoupling in Small Form Factor Test Sockets. Omer Vikinski, Shaul Lupo, Gregory Sizikov, Chee Yee Chung |
| 2008 | Embedded Testing in an In-Circuit Test Environment. John Malian, Bill Eklow |
| 2008 | Engineering Test Coverage on Complex Sockets. Myron Schneider, Ayub Shafi |
| 2008 | Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar |
| 2008 | External Loopback Testing Experiences with High Speed Serial Interfaces. Anne Meixner, Akira Kakizawa, Benoit Provost, Serge Bedwani |
| 2008 | Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng |
| 2008 | FPGA Time Measurement Module: Preliminary Results. William J. Bowhers |
| 2008 | Fabrication Defects and Fault Models for DNA Self-Assembled Nanoelectronics. Vincent Mao, Chris Dwyer, Krishnendu Chakrabarty |
| 2008 | Failing Frequency Signature Analysis. Jaekwang Lee, Edward J. McCluskey |
| 2008 | Finding Power/Ground Defects on Connectors - Case Study. Steve Hird, Reggie Weng |
| 2008 | Frequency and Power Correlation between At-Speed Scan and Functional Tests. Shlomi Sde-Paz, Eyal Salomon |
| 2008 | Functional Test and Speed/Power Sorting of the IBM POWER6 and Z10 Processors. Tung N. Pham, Frances Clougherty, Gerard Salem, James M. Crafts, Jon Tetzloff, Pamela Moczygemba, Timothy M. Skergan |
| 2008 | Generating Test Signals for Noise-Based NPR/ACPR Type Tests in Production. Sadok Aouini, Gordon W. Roberts |
| 2008 | Hardware Overhead Reduction for Memory BIST. Masayuki Arai, Kazuhiko Iwasaki, Michinobu Nakao, Iwao Suzuki |
| 2008 | Hardware-based Error Rate Testing of Digital Baseband Communication Systems. Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn |
| 2008 | Having FUN with Analog Test. Robert A. Pease |
| 2008 | High Test Quality in Low Pin Count Applications. Jayant D'Souza, Subramanian Mahadevan, Nilanjan Mukherjee, Graham Rhodes, Jocelyn Moreau, Thomas Droniou, Paul Armagnat, Damien Sartoretti |
| 2008 | High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2008 | IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores. Geng-Ming Chiu, James Chien-Mo Li |
| 2008 | IEEE 1500 Core Wrapper Optimization Techniques and Implementation. Brendan Mullane, Michael Higgins, Ciaran MacNamee |
| 2008 | IEEE P1581 drastically simplifies connectivity test for memory devices. Heiko Ehrenberg |
| 2008 | Implementation Update: Logic Mapping On SPARC- Microprocessors. Anjali Vij, Richard Ratliff |
| 2008 | Implicit Identification of Non-Robustly Unsensitizable Paths using Bounded Delay Model. Dheepakkumaran Jayaraman, Edward Flanigan, Spyros Tragoudas |
| 2008 | Improving the Accuracy of Test Compaction through Adaptive Test Update. Sounil Biswas, Ronald D. Blanton |
| 2008 | Increasing Scan Compression by Using X-chains. Peter Wohl, John A. Waicukauski, Frederic Neuveux |
| 2008 | Integration of Hardware Assertions in Systems-on-Chip. Jeroen Geuzebroek, Bart Vermeulen |
| 2008 | Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects. Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor |
| 2008 | Is It Cost-Effective to Achieve Very High Fault Coverage for Testing Homogeneous SoCs with Core-Level Redundancy? Lin Huang, Qiang Xu |
| 2008 | Jitter and Signal Integrity Verification for Synchronous and Asynchronous I/Os at Multiple to 10 GHz/Gbps. Mike Peng Li |
| 2008 | Jitters in high performance microprocessors. T. M. Mak |
| 2008 | Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model. Scott Davidson |
| 2008 | Launch-on-Shift-Capture Transition Tests. Intaik Park, Edward J. McCluskey |
| 2008 | Leveraging IEEE 1641 for Tester-Independent ATE Software. Bethany Van Wagenen, Jon Vollmar, Dan Thornton |
| 2008 | Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation. Le Jin |
| 2008 | Low Energy On-Line SBST of Embedded Processors. Andreas Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
| 2008 | Low Power Scan Shift and Capture in the EDT Environment. Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
| 2008 | Low Power Test. Swapnil Bahl, Rajiv Sarkar, Akhil Garg |
| 2008 | Low cost testing of multi-GBit device pins with ATE assisted loopback instrument. William Fritzsche, Asim E. Haque |
| 2008 | Managing Test in the End-to-End, Mega Supply Chain. Mike Lydon |
| 2008 | Measurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications. Thomas P. Warwick, Gustavo Rivera, David Waite, James Russell, Jeffrey Smith |
| 2008 | Modeling Test Escape Rate as a Function of Multiple Coverages. Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena |
| 2008 | NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure. Armin Alaghi, Mahshid Sedghi, Naghmeh Karimi, Zainalabedin Navabi |
| 2008 | Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes. Brian Moore, Marc Mangrum, Chris Sellathamby, Md. Mahbub Reja, T. Weng, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky |
| 2008 | Observations of Supply-Voltage-Noise Dispersion in Sub-nsec. Kan Takeuchi, Genichi Tanaka, Hiroaki Matsushita, Kenichi Yoshizumi, Yusaku Katsuki, Takao Sato |
| 2008 | Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler |
| 2008 | On Accelerating Path Delay Fault Simulation of Long Test Sequences. I-De Huang, Yi-Shing Chang, Suriyaprakash Natarajan, Ramesh Sharma, Sandeep K. Gupta |
| 2008 | On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Yiorgos Makris |
| 2008 | On-chip Programmable Capture for Accurate Path Delay Test and Characterization. Rajeshwary Tayade, Jacob A. Abraham |
| 2008 | On-chip Timing Uncertainty Measurements on IBM Microprocessors. Robert L. Franch, Phillip J. Restle, James K. Norman, William V. Huott, Joshua Friedrich, R. Dixon, Steve Weitzel, K. van Goor, Gerard Salem |
| 2008 | On-line Failure Detection in Memory Order Buffers. Javier Carretero, Xavier Vera, Pedro Chaparro, Jaume Abella |
| 2008 | Optical Diagnostics for IBM POWER6- Microprocessor. Peilin Song, Stephen Ippolito, Franco Stellari, John Sylvestri, Tim Diemoz, George Smith, Paul Muench, Norm James, Seongwon Kim, Hector Saenz |
| 2008 | Optimized Circuit Failure Prediction for Aging: Practicality and Promise. Mridul Agarwal, Varsha Balakrishnan, Anshuman Bhuyan, Kyunglok Kim, Bipul C. Paul, Wenping Wang, Bo Yang, Yu Cao, Subhasish Mitra |
| 2008 | Optimized EVM Testing for IEEE 802.11a/n RF ICs. Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler |
| 2008 | Overview of IEEE P1450.6.2 Standard; Creating CTL Model For Memory Test and Repair. |
| 2008 | Overview of a High Speed Top Side Socket Solution. John Stewart, Temitope Animashaun |
| 2008 | Parametric Testing of Optical Interfaces. Brice Achkir, Pavel Zivny, Bill Eklow |
| 2008 | Peak Power Reduction Through Dynamic Partitioning of Scan Chains. Sobeeh Almukhaizim, Ozgur Sinanoglu |
| 2008 | Platform Independent Test Access Port Architecture. Arie Margulis, David Akselrod, Tim Wood, Sopho Metsis |
| 2008 | Power Distribution Failure Analysis Using Transition-Delay Fault Patterns. Junxia Ma, Jeremy Lee, Mohammad Tehranipoor |
| 2008 | Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks. Benoit Nadeau-Dostie, Kiyoshi Takeshita, Jean-Francois Cote |
| 2008 | Problems Using Boundary-Scan for Memory Cluster Tests. Bradford G. Van Treuren, Chen-Huan Chiang, Kenneth Honaker |
| 2008 | Production Multivariate Outlier Detection Using Principal Components. Peter M. O'Neill |
| 2008 | RTL Error Diagnosis Using a Word-Level SAT-Solver. Saeed Mirzaeian, Feijun (Frank) Zheng, Kwang-Ting (Tim) Cheng |
| 2008 | Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase |
| 2008 | Robust Design-for-Productization Practices for High Quality Automotive Products. Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello |
| 2008 | SAT-based State Justification with Adaptive Mining of Invariants. Weixin Wu, Michael S. Hsiao |
| 2008 | SOC Test Optimization with Compression-Technique Selection. Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty |
| 2008 | Scan Based Testing of Dual/Multi Core Processors for Small Delay Defects. Adit D. Singh |
| 2008 | SoC Test Architecture Design and Optimization Considering Power Supply Noise Effects. Feng Yuan, Qiang Xu |
| 2008 | SoC Yield Improvement: Redundant Architectures to the Rescue? Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2008 | Solder Bead on High Density Interconnect Printed Circuit Board. Brandon Chu |
| 2008 | Solving In-Circuit Defect Coverage Holes with a Novel Boundary Scan Application. Dave F. Dubberke, James J. Grealish, Bill Van Dick |
| 2008 | Statistical Yield Modeling for Sub-wavelength Lithography. Aswin Sreedhar, Sandip Kundu |
| 2008 | System JTAG Initiative Group Advancements. Bradford G. Van Treuren |
| 2008 | Test Access Mechanism for Multiple Identical Cores. Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield |
| 2008 | Test Generation for Interconnect Opens. Xijiang Lin, Janusz Rajski |
| 2008 | Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study. Che-Jen Jerry Chang, Takeo Kobayashi |
| 2008 | Test-Access Solutions for Three-Dimensional SOCs. Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie |
| 2008 | Testing Methodology of Embedded DRAMs. Chi-Min Chang, Mango Chia-Tso Chao, Rei-Fu Huang, Ding-Yuan Chen |
| 2008 | Testing Techniques for Hardware Security. Mehrdad Majzoobi, Farinaz Koushanfar, Miodrag Potkonjak |
| 2008 | The Advantages of Limiting P1687 to a Restricted Subset. Jason Doege, Alfred L. Crouch |
| 2008 | The Economics of Harm Prevention through Design for Testability. Louis Y. Ungar |
| 2008 | The Importance of Functional-Like Access for Memory Test. Jonathan Phelps, Chuck Johnson, Corey Goodrich, Aman Kokrady |
| 2008 | The Test Features of the Quad-Core AMD Opteron- Microprocessor. Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja |
| 2008 | This is a Test: How to Tell if DFT and Test Are Adding Value to Your Company. Jeff Rearick |
| 2008 | Time-dependent Behaviour of Full Open Defects in Interconnect Lines. Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
| 2008 | Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi |
| 2008 | Transition Test on UltraSPARC- T2 Microprocessor. Liang-Chi Chen, Paul Dickinson, Prasad Mantri, Murali M. R. Gala, Peter Dahlgren, Subhra Bhattacharya, Olivier Caty, Kevin Woodling, Thomas A. Ziaja, David Curwen, Wendy Yee, Ellen Su, Guixiang Gu, Tim Nguyen |
| 2008 | Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard. Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li |
| 2008 | Unraveling Variability for Process/Product Improvement. Anne Gattiker |
| 2008 | Using Implications for Online Error Detection. Kundan Nepal, Nuno Alves, Jennifer Dworak, R. Iris Bahar |
| 2008 | VAST: Virtualization-Assisted Concurrent Autonomous Self-Test. Hiroaki Inoue, Yanjing Li, Subhasish Mitra |
| 2008 | VLSI Test Exercise Courses for Students in EE Department. Satoshi Komatsu |
| 2008 | Wafer-Level Characterization of Probecards using NAC Probing. Gyu-Yeol Kim, Eon-Jo Byunb, Ki-Sang Kang, Young-Hyun Jun, Bai-Sun Kong |
| 2008 | Wireless Test Structure for Integrated Systems. Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard |