| 2005 | "Driver on a floppy" delivery of ATE instrumentation software. Dan Proskauer |
| 2005 | A 16-bit resistor string DAC with full-calibration at final test. Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger |
| 2005 | A DDJ calibration methodology for high-speed test and measurement equipments. Touraj Farahmand, Sassan Tabatabaei, Freddy Ben-Zeev, André Ivanov |
| 2005 | A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski |
| 2005 | A concurrent BIST scheme for on-line/off-line testing based on a pre-computed test set. Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis, Constantin Halatsis |
| 2005 | A leakage control system for thermal stability during burn-in test. Mesut Meterelliyoz, Hamid Mahmoodi, Kaushik Roy |
| 2005 | A low power and low cost scan test architecture for multi-clock domain SoCs using virtual divide and conquer. Arasu T. Senthil, C. P. Ravikumar, Soumitra Kumar Nandy |
| 2005 | A methodology for testing one-hot transmission gate multiplexers. Teresa L. McLaurin, Frank Frederick, Rich Slobodnik |
| 2005 | A new approach for massive parallel scan design. Woo Cheol Chung, Dong Sam Ha |
| 2005 | A new probing technique for high-speed/high-density printed circuit boards. Kenneth P. Parker |
| 2005 | A novel process and hardware architecture to reduce burn-in cost. Chris Schroeder, Jin Pan, Todd Albertson |
| 2005 | A novel stuck-at based method for transistor stuck-open fault diagnosis. Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
| 2005 | A novel test methodology based on error-rate to support error-tolerance. Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer |
| 2005 | A practical perspective on reducing ASIC NTFs. Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow |
| 2005 | A random access scans architecture to reduce hardware overhead. Anand S. Mudlapur, Vishwani D. Agrawal, Adit D. Singh |
| 2005 | A scalable test strategy for network-on-chip routers. Alexandre M. Amory, Eduardo Wenzel Brião, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes |
| 2005 | A self-timed structural test methodology for timing anomalies due to defects and process variations. Adit D. Singh |
| 2005 | A static noise impact analysis methodology for evaluating transient error effects in digital VLSI circuits. Chong Zhao, Xiaoliang Bai, Sujit Dey |
| 2005 | A strategy for board level in-system programmable built-in assisted test and built-in self test. Joshua Ferry, Jozef Scesnak, Shoeib Shaikh |
| 2005 | A structured approach for the systematic test of embedded automotive communication systems. Eric Armengaud, Florian Rothensteiner, Andreas Steininger, Roman Pallierer, Martin Horauer, Martin Zauner |
| 2005 | A test case for 3Gbps serial attached SCSI (SAS). Yi Cai, Liming Fang, Robert Ratemo, J. Liu, K. Gross, Michael Kozma |
| 2005 | A test point selection method for data converters using Rademacher functions and wavelet transforms. Chandra Carter, Simon S. Ang |
| 2005 | A transparent solution for providing remote wired or wireless communication to board and system level boundary-scan architectures. Peter Collins, Ilka Reis, Mikko Simonen, Marc van Houcke |
| 2005 | A vector-based approach for power supply noise analysis in test compaction. Jing Wang, Ziding Yue, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. H. Walker |
| 2005 | A wideband low-noise ATE-based method for measuring jitter in GHz signals. Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma |
| 2005 | Achieving higher yield through diagnosis-the ASIC perspective. Chris Schuermyer |
| 2005 | Achieving higher yield through diagnosis. Nagesh Tamarapalli |
| 2005 | Achieving higher yield through diagnosis? Srikanth Venkataraman |
| 2005 | An advanced optical diagnostic technique of IBM z990 eServer microprocessor. Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus |
| 2005 | An optimal test pattern selection method to improve the defect coverage. Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer |
| 2005 | An update on IEEE 1149.6 - successes and issues. Bill Eklow |
| 2005 | Analysis of error-masking and X-masking probabilities for convolutional compactors. Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki |
| 2005 | Analysis of pseudo-interleaving AWG. Hideo Okawara |
| 2005 | Analyzing second-order effects between optimizations for system-level test-based model generation. Tiziana Margaria, Harald Raffelt, Bernhard Steffen |
| 2005 | Automated mapping of pre-computed module-level test sequences to processor instructions. S. Guramurthy, Shobha Vasudevan, Jacob A. Abraham |
| 2005 | Bead probes in practice. Kenneth P. Parker |
| 2005 | Board and system test with SoC DFT. Gordon D. Robinson |
| 2005 | Built-in constraint resolution. Grady Giles, Joel Irby, Daniela Toneva, Kun-Han Tsai |
| 2005 | Burn-in reduction using principal component analysis. Amit Nahar, W. Robert Daasch, Suresh Subramaniam |
| 2005 | Business constraints drive test decisions - not vice versa. Sanjiv Taneja |
| 2005 | Business constraints drive test decisions planning, partnerships and success. Michael Campbell |
| 2005 | Business constraints drive test decisions. Paul Domino |
| 2005 | Business constraints drive test decisions. Fidel Muradali |
| 2005 | CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. Masakatsu Suda, Kazuhiro Yamamoto, Toshiyuki Okayasu, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe |
| 2005 | Calibrating clock stretch during AC scan testing. Jeff Rearick, Richard Rodgers |
| 2005 | Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. Joel Lurkins, DeAnna Hill, Brady Benware |
| 2005 | Chasing subtle embedded RAM defects for nanometer technologies. Theo J. Powell, Amrendra Kumar, Joseph Rayhawk, Nilanjan Mukherjee |
| 2005 | Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains. Hung-Mao Lin, James Chien-Mo Li |
| 2005 | Comparative study of CA with phase shifters and GLFSRs. S. Chidambaram, Dimitrios Kagaris, Dhiraj K. Pradhan |
| 2005 | Compressed pattern diagnosis for scan chain failures. Yu Huang, Wu-Tung Cheng, Janusz Rajski |
| 2005 | Compression mode diagnosis enables high volume monitoring diagnosis flow. Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai |
| 2005 | Computational intelligence based testing for semiconductor measurement systems. Eric Liau, Doris Schmitt-Landsiedel |
| 2005 | Correct by construction is guaranteed to fail. Stephen K. Sunter |
| 2005 | Cost-effective designs of field service for electronic systems. Yu-Ting Lin, David Williams, Tony Ambler |
| 2005 | Darwin, thy name is system. Craig Force |
| 2005 | Data-driven models for statistical testing: measurements, estimates and residuals. W. Robert Daasch, Robert Madge |
| 2005 | Defect-based RF testing using a new catastrophic fault model. Erkan Acar, Sule Ozev |
| 2005 | Defect-oriented testing and diagnosis of digital microfluidics-based biochips. Fei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty |
| 2005 | Definition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain. Tom Waayers, Richard Morren, Roberto Grandi |
| 2005 | Definitions of jitter measurement terms and relationships. Iliya Zamek, Steve Zamek |
| 2005 | Design and analysis of multiple weight linear compactors of responses containing unknown values. Thomas Clouqueur, Kamran Zarrineh, Kewal K. Saluja, Hideo Fujiwara |
| 2005 | Development of a software framework for open architecture ATE. William Fritzsche |
| 2005 | Diagnosis and analysis of an analog circuit failure using time resolved emission microscopy. Ahmed Syed, Richard F. Herlein, Ben Cain, Frank Sauk |
| 2005 | Diagnosis framework for locating failed segments of path delay faults. Ying-Yen Chen, Min-Pin Kuo, Jing-Jia Liou |
| 2005 | Diagnosis with convolutional compactors in presence of unknown states. Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2005 | Drive only at speed functional testing; one of the techniques Intel is using to control test costs. Mike Tripp, Silvio Picano, Baruch Schnarch |
| 2005 | Effect of lead free solders on in-circuit test process. Rosa D. Reinosa |
| 2005 | Efficient SAT-based combinational ATPG using multi-level don't-cares. Nikhil Saluja, Sunil P. Khatri |
| 2005 | Efficient compression of deterministic patterns into multiple PRPG seeds. Peter Wohl, John A. Waicukauski, Sanjay Patel, Francisco DaSilva, Thomas W. Williams, Rohit Kapur |
| 2005 | Enabling yield analysis with X-compact. Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman |
| 2005 | Encounter test OPMISR Brion L. Keller |
| 2005 | Enhanced launch-off-capture transition fault testing. Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar |
| 2005 | Evaluating ATE-equipment for volume diagnosis. Ralf Arnold, Andreas Leininger |
| 2005 | External memory BIST for system-in-package. Kaname Yamasaki, Iwao Suzuki, Azumi Kobayashi, Keiichi Horie, Yasuharu Kobayashi, Hideyuki Aoki, Hideki Hayashi, Kenichi Tada, Koki Tsutsumida, Keiichi Higeta |
| 2005 | Forming N-detection test sets from one-detection test sets without test generation. Irith Pomeranz, Sudhakar M. Reddy |
| 2005 | Full-speed field-programmable memory BIST architecture. Xiaogang Du, Nilanjan Mukherjee, Wu-Tung Cheng, Sudhakar M. Reddy |
| 2005 | Functional vs. multi-VDD testing of RF circuits. Estella Silva, José Pineda de Gyvez, Guido Gronthoud |
| 2005 | Gate exhaustive testing. Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey |
| 2005 | Guaranteed by design or guaranteed to fail or guaranteed by test? or ... neither? Mani Soma |
| 2005 | Have we overcome the challenges associated with SoC and multi-core testing? Rajesh Raina |
| 2005 | Have we overcome the challenges associated with SoC and multi-core testing? Rajesh Raina |
| 2005 | Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects. Benjamin N. Lee, Hui Li, Li-C. Wang, Magdy S. Abadir |
| 2005 | Hierarchical DFT with enhancements for AC scan, test scheduling and on-chip compression - a case study. Jeff Remmers, Darin Lee, Richard Fisette |
| 2005 | High speed differential pin electronics over 6.4 Gbps. Atsushi Oshima, Toshihiro Nomura |
| 2005 | High-performance ADC linearity test using low-precision signals in non-stationary environments. Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen |
| 2005 | How are we going to test SOC's on a board? Michael J. Smith |
| 2005 | How are we going to test SoC's on a PCB? Peter Collins |
| 2005 | How are we going to test SoCs on a board?: the users viewpoint. Gunnar Carlsson |
| 2005 | How are we going to test socs on a board? the users viewpoint. Gunnar Carlsson |
| 2005 | I Bin Xue, D. M. H. Walker |
| 2005 | IEEE 1500 utilization in SOC design and test. Yervant Zorian, Avetik Yessayan |
| 2005 | IJTAG (internal JTAG): a step toward a DFT standard. Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts |
| 2005 | Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware |
| 2005 | Impact of back side circuit edit on active device performance in bulk silicon ICs. Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted R. Lundquist, Siegfried Pauthner |
| 2005 | Invisible delay quality - SDQM model lights up what could not be seen. Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara |
| 2005 | Is the concern for soft-error overblown? Rajesh Galivanche |
| 2005 | Is the concern for soft-error overblown? Rajesh Raina |
| 2005 | Is the concern for soft-error overblown? Rajesh Raina |
| 2005 | JTAG-based vector and chain management for system test. Bradford G. Van Treuren, Bryan E. Peterson, José M. Miranda |
| 2005 | Jitter spectrum analysis using continuous time interval analyzer (CTIA). Sassan Tabatabaei, Freddy Ben-Zeev, Touraj Farahmand |
| 2005 | Jitter transformations in measurement instruments and discrepancies between measurement results. Iliya Zamek, Steve Zamek |
| 2005 | Layering of the STIL extensions. Gregory A. Maston, Tony Taylor |
| 2005 | Logic proximity bridges. Eric N. Tran, Vamsee Krishna, Sujit T. Zachariah, Sreejit Chakravarty |
| 2005 | Logic soft errors: a major barrier to robust platform design. Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim |
| 2005 | Low cost multisite testing of quadruple band GSM transceivers. Larry Zhang, Dale Heaton, Hank Largey |
| 2005 | Low-capture-power test generation for scan-based at-speed testing. Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2005 | Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers. Brian Arkin |
| 2005 | March AB, March AB1: new March tests for unlinked dynamic memory faults. Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2005 | Methods for improving test compression. Nur A. Touba |
| 2005 | Methods for improving transition delay fault coverage using broadside tests. Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2005 | Microprocessor silicon debug based on failure propagation tracing. Olivier Caty, Peter Dahlgren, Ismet Bayraktaroglu |
| 2005 | Multiple tests for each gate delay fault: higher coverage and lower test application cost. Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer |
| 2005 | Needs fabless yield ramp foundry partnership to be most successful. Bruce Cory |
| 2005 | Node sensitivity analysis for soft errors in CMOS logic. Balkaran S. Gill, Christos A. Papachristou, Francis G. Wolff, Norbert Seifert |
| 2005 | Noncontact wafer probe using wireless probe cards. Chris Sellathamby, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Steven Slupsky, Igor M. Filanovsky, Kris Iniewski |
| 2005 | Off-shore outsource DFT vs. build off-shore branch offices. Yu Huang |
| 2005 | On concurrent test of wrapped cores and unwrapped logic blocks in SOCs. Qiang Xu, Nicola Nicolici |
| 2005 | Optimized reasoning-based diagnosis for non-random, board-level, production defects. Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow |
| 2005 | Outsourcing DFT: it can be done but it isn't easy. LeRoy Winemberg |
| 2005 | Outsourcing DFT: the right mix. Carl Holzwarth |
| 2005 | Panel discussion for "have we overcome the challenges associated with SoC and multi-core testing?". Nathan Chelstrom |
| 2005 | Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail? Hosam Haggag, Abhijit Chatterjee |
| 2005 | Panel: business constraints drive test decisions. Jeff Schneider |
| 2005 | Parallel, multi-DUT testing in an open architecture test system. Toshiaki Adachi, Ankan K. Pramanick, Mark Elston |
| 2005 | Partnering with customer to achieve high yield. James Wang |
| 2005 | Position statement: "have we overcome the challenges associated with SoC and multi-core testing?". Tim Wood |
| 2005 | Power-scan chain: design for analog testability. Amir Zjajo, Henk Jan Bergveld, Rodger Schuttert, José Pineda de Gyvez |
| 2005 | Power-supply noise in SoCs: ATPG, estimation and control. Mehrdad Nourani, Arun Radhakrishnan |
| 2005 | Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005 |
| 2005 | Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2005 | Production-oriented interface testing for PCI-Express by enhanced loop-back technique. Mitchell Lin, Kwang-Ting Cheng, Jimmy Hsu, M. C. Sun, Jason Chen, Shelton Lu |
| 2005 | Programmable memory BIST. Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
| 2005 | Progressive random access scan: a simultaneous solution to test power, test data volume and test time. Dong Hyun Baik, Kewal K. Saluja |
| 2005 | Reconfigurable systems self-healing using mobile hardware agents. Alfredo Benso, Alessandro Cilardo, Nicola Mazzocca, Liviu Miclea, Paolo Prinetto, Szilárd Enyedi |
| 2005 | Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail? Mustapha Slamani |
| 2005 | Reducing test cost through the use of digital testers for analog tests. John Sweeney, Alan Tsefrekas |
| 2005 | Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring. Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy |
| 2005 | Remote boundary-scan system test control for the ATCA standard. David Bäckström, Gunnar Carlsson, Erik Larsson |
| 2005 | STIL persistence [data reduction]. Greg Maston, Julie Villar |
| 2005 | Safely backdriving low voltage devices at in-circuit test. Chris Jacobsen, Tony Saye, Tom Trader |
| 2005 | Simulation of transients caused by single-event upsets in combinational logic. Kartik Mohanram |
| 2005 | Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology. Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Wei-Ting Liu, Ji-Jan Chen |
| 2005 | Soft errors: is the concern for soft-errors overblown? Narayanan Vijaykrishnan |
| 2005 | Structural tests for jitter tolerance in SerDes receivers. Stephen K. Sunter, Aubin Roy |
| 2005 | Synthesis of nonintrusive concurrent error detection using an even error detecting function. Avijit Dutta, Nur A. Touba |
| 2005 | Technique to improve the performance of time-interleaved A-D converters. Koji Asami |
| 2005 | Test and debug features of the RTO7 chip. Kees van Kaam, Bart Vermeulen, Henk Jan Bergveld |
| 2005 | Test compression - real issues and matching solutions. Janusz Rajski |
| 2005 | Test compression and logic BIST at your fingertips. Shianling Wu, Laung-Terng Wang, Jin Woo Cho, Zhigang Jiang, Boryau Sheu |
| 2005 | Test connections - tying application to process. John M. Carulli Jr., Thomas J. Anderson |
| 2005 | Test data compression for IP embedded cores using selective encoding of scan slices. Zhanglei Wang, Krishnendu Chakrabarty |
| 2005 | Test generation for ultra-high-speed asynchronous pipelines. Feng Shi, Yiorgos Makris, Steven M. Nowick, Montek Singh |
| 2005 | Test implications of lead-free implementation in a high-volume manufacturing environment. Shu Peng, Sam Wong |
| 2005 | Test methodology for Freescale's high performance e600 core based on PowerPC© instruction set architecture. Nandu Tendolkar, Dawit Belete, Ashutosh Razdan, Hereman Reyes, Bill Schwarz, Marie Sullivan |
| 2005 | Test the test experts: do we know what we are doing? Rohit Kapur |
| 2005 | Test time reduction of successive approximation register A/D converter by selective code measurement. Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag |
| 2005 | Testability features of the first-generation CELL processor. Mack W. Riley, Louis B. Bushard, Nathan Paul Chelstrom, Naoki Kiryu, Steven Ross Ferguson |
| 2005 | Testing and debugging delay faults in dynamic circuits. Ramyanshu Datta, Sani R. Nassif, Robert K. Montoye, Jacob A. Abraham |
| 2005 | Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems. Iain Robertson, Graham Hetherington, Tom Leslie, Ishwar Parulkar, Ronald Lesnikoski |
| 2005 | Testing priority address encoder faults of content addressable memories. Jin-Fu Li |
| 2005 | Testing throughput computing interconnect topologies with Tbits/sec bandwidth in manufacturing and in field. Ishwar Parulkar, Dawei Huang, Leandro Chua Jr., Drew Doblar |
| 2005 | The ITC test compression shootout. Scott Davidson |
| 2005 | The PXI carrier: a novel approach to ATE instrument development. Eric Kushnick |
| 2005 | The case for outsourcing DFT. Jeffrey L. Roehr |
| 2005 | The concern for soft errors is not overblown. Pia N. Sanda |
| 2005 | The effects of defects on high-speed boards. Kenneth P. Parker |
| 2005 | The final D-frontier: should DFT be outsourced? Luis Basto |
| 2005 | The value of statistical testing for quality, yield and test cost improvement. Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch |
| 2005 | Third-Order Phase Lock Loop Measurement and Characterization. J. Ma, M. Li, M. Marlett |
| 2005 | Today's SOC test challenges. Yervant Zorian |
| 2005 | Towards achieving relentless reliability gains in a server marketplace of teraflops, laptops, kilowatts, and "cost, cost, cost"...: making peace between a black art and the bottom line. Jody Van Horn |
| 2005 | Transient fault characterization in dynamic noisy environments. Ilia Polian, John P. Hayes, Sandip Kundu, Bernd Becker |
| 2005 | UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang |
| 2005 | Understanding NTF components from the field. Scott Davidson |
| 2005 | Use of MISRs for compression and diagnostics. Brion L. Keller, Thomas Bartenstein |
| 2005 | Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. Zhanglei Wang, Krishnendu Chakrabarty |
| 2005 | Variance reduction and outliers: statistical analysis of semiconductor test data. W. Robert Daasch, Robert Madge |
| 2005 | Verifying flying prober performance - fitness is survival. Bob Russell |
| 2005 | Word line pulsing technique for stability fault detection in SRAM cells. Andrei Pavlov, Mohamed Azimane, José Pineda de Gyvez, Manoj Sachdev |
| 2005 | X-filter: filtering unknowns from compacted test responses. Manish Sharma, Wu-Tung Cheng |
| 2005 | XMAX: a practical and efficient compression architecture. Kee Sup Kim |
| 2005 | XWRC: externally-loaded weighted random pattern testing for input test data compression. Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar |