| 2004 | "Real Life" System Testing of Networking Equipment. Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein |
| 2004 | 100 DPPM in Nanometer Technology - Is it achievable? Greg Aldrich |
| 2004 | 2003 Paper Awards. |
| 2004 | 2005 Call for Papers. |
| 2004 | 34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System. Daisuke Watanabe, Masakatsu Suda, Toshiyuki Okayasu |
| 2004 | A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems. C. J. Clark, Mike Ricchetti |
| 2004 | A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. Zhongjun Yu, Degang Chen, Randall L. Geiger |
| 2004 | A Critical Path Selection Method for Delay Testing. Saravanan Padmanaban, Spyros Tragoudas |
| 2004 | A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
| 2004 | A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis. Benjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal |
| 2004 | A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4. Juha Häkkinen, Pekka Syri, Juha-Veikko Voutilainen, Markku Moilanen |
| 2004 | A Hierarchical DFT Architecture for Chip, Board and System Test/Debug. Charles Njinda |
| 2004 | A High-Resolution Flash Time-to-Digital Converter and Calibration Scheme. Peter M. Levine, Gordon W. Roberts |
| 2004 | A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sébastien Laberge, Gordon W. Roberts |
| 2004 | A Holistic Parallel and Hierarchical Approach towards Design-For-Test. C. P. Ravikumar, Graham Hetherington |
| 2004 | A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals. Jim Sproch |
| 2004 | A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices. Bernd Laquai |
| 2004 | A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. Robert C. Aitken |
| 2004 | A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. Kenneth P. Parker |
| 2004 | A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia |
| 2004 | A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems. Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Christian Krawinkel, Katsuaki Ohsawa, Masao Sugai |
| 2004 | AC IO Loopback Design for High Speed µProcessor IO Test. Benoit Provost, Chee How Lim, Mo Bashir, Ali Muhtaroglu, Tiffany Huang, Kathy Tian, Mubeen Atha, Cangsang Zhao, Harry Muljono |
| 2004 | ALAPTF: A new Transition Faultmodel and the ATPG Algorithm. Puneet Gupta, Michael S. Hsiao |
| 2004 | AN SRAM Weak Cell Fault Model and a DFT Technique with a Programmable Detection Threshold. Andrei Pavlov, Manoj Sachdev, José Pineda de Gyvez |
| 2004 | ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw |
| 2004 | ATE Value Add through Open Data Collection. Robert Madge |
| 2004 | Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. Phil Nigh |
| 2004 | Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. Brady Benware |
| 2004 | Active Tester Interface Unit Design For Data Collection. A. T. Sivaram, Pascal Pierra, Shida Sheibani, Nancy Wang-Lee, Jorge E. Solorzano, Lily Tran |
| 2004 | Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski |
| 2004 | An Automated, Complete, Structural Test Solution for SERDES. Stephen K. Sunter, Aubin Roy, Jean-Francois Cote |
| 2004 | An Economic Analysis and ROI Model for Nanometer Test. Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane |
| 2004 | An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher |
| 2004 | An SOC Test Integration Platform and Its Industrial Realization. Kuo-Liang Cheng, Jing-Reng Huang, Chih-Wea Wang, Chih-Yen Lo, Li-Ming Denq, Chih-Tsun Huang, Shin-Wei Hung, Jye-Yuan Lee |
| 2004 | Analysis of delay caused by bridging faults in RLC interconnects. Quming Zhou, Kartik Mohanram |
| 2004 | Application-Dependent Diagnosis of FPGAs. Mehdi Baradaran Tahoori |
| 2004 | Architectures of Increased Availability Wireless Sensor Network Nodes. Man Wah Chiang, Zeljko Zilic, Jean-Samuel Chenard, Katarzyna Radecka |
| 2004 | At-Speed Interconnect Test and Diagnosis of External Memories on a System. Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung |
| 2004 | Automatic Delay Calibration Method for Multi-channel CMOS Formatter. Ahmed Rashid Syed |
| 2004 | Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer. Foster F. Dai, Charles E. Stroud, Dayu Yang, Shuying Qi |
| 2004 | Autonomous Yet Deterministic Test of SOC Cores. Ozgur Sinanoglu, Alex Orailoglu |
| 2004 | BER Estimation for Serial Links Based on Jitter Spectrum and Clock Recovery Characteristics. Dongwoo Hong, Chee-Kian Ong, Kwang-Ting (Tim) Cheng |
| 2004 | Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary |
| 2004 | Board Test Coverage Needs to be Standardized. Kenneth P. Parker |
| 2004 | Built-In Self-Test for System-on-Chip: A Case Study. Charles E. Stroud, John Sunwoo, Srinivas M. Garimella, Jonathan Harris |
| 2004 | CAEN-BIST: Testing the NanoFabric. Jason G. Brown, R. D. (Shawn) Blanton |
| 2004 | CMOS IC diagnostics using the luminescence of OFF-state leakage currents. Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho |
| 2004 | Channel Masking Synthesis for Efficient On-Chip Test Compression. Vivek Chickermane, Brian Foutz, Brion L. Keller |
| 2004 | Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed Biomedical Assays. Fei Su, Krishnendu Chakrabarty |
| 2004 | Controlled Sine Wave Fitting for ADC Test. Heinz Mattes, Claus Dworski, Sebastian Sattler |
| 2004 | Cost of Test - Taking Control. Nilanjan Mukherjee |
| 2004 | DFT for Test Optimisations in a Complex Mixed-Signal SOC - Case Study on TI's TNETD7300 ADSL Modem Device. K. Nikila, Rubin A. Parekhji |
| 2004 | Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand |
| 2004 | Data Mining Integrated Circuit Fails with Fail Commonalities. Leendert M. Huisman, Maroun Kassab, Leah Pastel |
| 2004 | Decision Selection and Learning for an All-Solutions ATPG Engine. Kameshwar Chandrasekar, Michael S. Hsiao |
| 2004 | Defect Coverage Analysis of Partitioned Testing. Sreejit Chakravarty, Eric W. Savage, Eric N. Tran |
| 2004 | Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement. Chintan Patel, Abhishek Singh, Jim Plusquellic |
| 2004 | Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. Erkan Acar, Sule Ozev |
| 2004 | Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. Ad J. van de Goor, Said Hamdioui, Rob Wadsworth |
| 2004 | Diagnosis Meets Physical Failure Analysis: How Long can we Succeed? Anne E. Gattiker |
| 2004 | Diagnosis meets Physical Failure Analysis: What is needed to succeed? Srikanth Venkataraman |
| 2004 | Digital Synchronization for Reconfigurable ATE. Burnell G. West, Michael F. Jones |
| 2004 | Divide and Conquer based Fast Shmoo algorithms. Peter Patten |
| 2004 | Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. W. Robert Daasch, Manu Rehani |
| 2004 | Efficient Pattern Mapping for Deterministic Logic BIST. Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers |
| 2004 | Electronic circuit comprising a secret sub-module. Hérvé Fleury |
| 2004 | Elimination of Traditional Functional Testing of Interface Timings at Intel. Mike Tripp, T. M. Mak, Anne Meixner |
| 2004 | Embedded Test for a new Memory-Card Architecture. David Resnick |
| 2004 | Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study. Haihua Yan, Adit D. Singh |
| 2004 | Evaluating the Effects of Transient Faults on Vehicle Dynamic Performance in Automotive Systems. Fulvio Corno, Matteo Sonza Reorda, Simonluca Tosato, F. Esposito |
| 2004 | Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee |
| 2004 | Experimental Results for High-Speed Jitter Measurement Technique. Karen Taylor, Bryan Nelson, Alan Chong, Hieu Nguyen, Henry C. Lin, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz |
| 2004 | Extending STIL 1450 Standard for Test Program Flow. David Dowding, Ernie Wahl, Don Organ |
| 2004 | Extending the Digital Core-based Test Methodology to Support Mixed-Signal. Geert Seuren, Tom Waayers |
| 2004 | Fault Diagnosis in Designs with Convolutional Compactors. Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski |
| 2004 | Fault Tolerant Arithmetic with Applications in Nanotechnology based Systems. Wenjing Rao, Alex Orailoglu, Ramesh Karri |
| 2004 | Feed Forward Test Methodology Utilizing Device Identification. A. Cabbibo, J. Conder, M. Jacobs |
| 2004 | Formal Description of Test Specification and ATE Architecture for Mixed-Signal Test. Baolin Deng, Wolfram Glauert |
| 2004 | Formal Verification of a System-on-Chip Using Computation Slicing. Alper Sen, Vijay K. Garg, Jacob A. Abraham, Jayanta Bhadra |
| 2004 | Functional Test Coverage Effectiveness on the Decline. Jay J. Nejedlo |
| 2004 | Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. Alfred L. Crouch |
| 2004 | Glamorous Analog Testability - We Already Test them and Ship Them - So What is the Problem? Mohamed Hafed |
| 2004 | Global Failure Localization: We Have To, But on What and How? Edward I. Cole Jr. |
| 2004 | Hierarchical DFT Methodology - A Case Study. Jeff Remmers, Moe Villalba, Richard Fisette |
| 2004 | How long can we succeed using the OBIRCH and its derivatives? Kiyoshi Nikawa |
| 2004 | How to Bridge the Gap Between Simulationand Test. Martin Zambaldi, Wolfgang Ecker |
| 2004 | I/O Self-Leakage Test. Ali Muhtaroglu, Benoit Provost, Tawfik Rahal-Arabi, Greg Taylor |
| 2004 | IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores. Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty |
| 2004 | IEEE Std 1149.6 Implementation for a XAUI-to-Serial 10-Gbps Transceiver. Saghir A. Shaikh |
| 2004 | IPV6 Conformance Testing: Theory and Practice. Yujun Zhang, Zhongcheng Li |
| 2004 | ITC 2004 Panel: Cost of Test - Taking Control. Mike Tripp |
| 2004 | ITC Technical Paper Evaluation and Selection Process. |
| 2004 | Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. Manan Syal, Michael S. Hsiao, Sreejit Chakravarty |
| 2004 | Impact of Body Bias on Delay Fault Testing of Nanoscale CMOS Circuits. Bipul Chandra Paul, Cassondra Neau, Kaushik Roy |
| 2004 | Impact of Negative Bias Temperature Instability on Product Parametric Drift. Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess |
| 2004 | Implementation of an Economic Jitter Compliance Test for a Multi-Gigabit Device on ATE. Gert Hansel, Korbinian Stieglbauer |
| 2004 | Improving Encoding Efficiency for Linear Decompressors Using Scan Inversion. Kedarnath J. Balakrishnan, Nur A. Touba |
| 2004 | In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler |
| 2004 | Integrating Boundary Scan into Multi-GHz I/O Circuitry. Jeff Rearick, Sylvia Patterson, Krista Dorner |
| 2004 | Integrating Core Selection in the SOC Test Solution Design-Flow. Erik Larsson |
| 2004 | Interconnect Delay Testing of Designs on Programmable Logic Devices. Mehdi Baradaran Tahoori, Subhasish Mitra |
| 2004 | Interconnect Test Pattern Generation Algorithm For Meeting Device and Global SSO Limits With Safe Initial Vectors. Kendrick Baker, Mehrdad Nourani |
| 2004 | International Test Conference - Copyright. |
| 2004 | International Test Conference - Cover. |
| 2004 | International Test Conference - Title Page. |
| 2004 | Investment vs. Yield Relationship for Memories and IP in SOC. Joseph A. Reynick |
| 2004 | Investment vs. Yield Relationship for Memories in SOC. Yervant Zorian |
| 2004 | Is "Design to Production" The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs? Mike Li |
| 2004 | Jitter Generation and Measurement for Test of Multigbps Serial IO. Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev |
| 2004 | Jitter Models and Measurement Methods for High-Speed Serial Interconnects. Andy Kuo, Touraj Farahmand, Nelson Ou, André Ivanov, Sassan Tabatabaei |
| 2004 | K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran |
| 2004 | Localizing Open Interconnect Defects using Targeted Routing in FPGA's. Dave Mark, Jenny Fan |
| 2004 | Logic BIST with Scan Chain Segmentation. Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng |
| 2004 | Loopback or not? Takahiro J. Yamaguchi |
| 2004 | Low Cost Concurrent Error Detection for the Advanced Encryption Standard. Kaijie Wu, Ramesh Karri, Grigori Kuznetsov, Michael Gössel |
| 2004 | Low Overhead Delay Testing of ASICS. Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley |
| 2004 | MRAM Defect Analysis and Fault Modeli. Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu |
| 2004 | Memory Yield Improvement - SoC Design Perspective. Jitendra Khare |
| 2004 | Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington |
| 2004 | Minimum Testing Requirements to Screen Temperature Dependent Defects. Chris Schuermyer, Jens Ruffler, W. Robert Daasch |
| 2004 | Modular Extension of ATE to 5 Gbps. David C. Keezer, Dany Minier, F. Binette |
| 2004 | Ned Kornfield Memorial. |
| 2004 | New Test Paradigms for Yield and Manufacturability. Robert Madge |
| 2004 | Non-Deterministic DUT Behavior During Functional Testing of High Speed Serial Busses: Challenges and Solutions. Jonathan Hops, Brian Swing, Brian Phelps, Bruce Sudweeks, John Pane, James Kinslow |
| 2004 | On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. Jing Zeng, Magdy S. Abadir, A. Kolhatkar, G. Vandling, Li-C. Wang, Jacob A. Abraham |
| 2004 | On Hazard-free Patterns for Fine-delay Fault Testing. Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger |
| 2004 | On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits. Junwu Zhang, Michael L. Bushnell, Vishwani D. Agrawal |
| 2004 | On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing. Abhishek Singh, Chintan Patel, Jim Plusquellic |
| 2004 | On-Chip Mixed-Signal Test Structures Re-used for Board Test. Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar |
| 2004 | On-line Testing Field Programmable Analog Array Circuits. Haibo Wang, Suchitra Kulkarni, Spyros Tragoudas |
| 2004 | Open Architecture ATE: Dream or Reality? Gordon D. Robinson |
| 2004 | Open Architecture ATE: Prospects and Problems. Burnell G. West |
| 2004 | Open Architecture Test System: System Architecture and Design. Rochit Rajsuman, Masuda Noriyuki |
| 2004 | Options for High-Volume Test of Multi-GB/s Ports. John C. Johnson |
| 2004 | Panel 9 - Diagnostics vs. Failure Analysis. Thomas Bartenstein |
| 2004 | Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed? Yukio Okuda |
| 2004 | Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. Hak-Soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham |
| 2004 | Plan Ahead for Yield. Jun Qian |
| 2004 | Post-Packaging Auto Repair Techniques for Fast Row Cycle Embedded DRAM. Osamu Wada, Toshimasa Namekawa, Hiroshi Ito, Atsushi Nakayama, Shuso Fujii |
| 2004 | Power Supply Ramping for Quasi-static Testing of PLLs. José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller |
| 2004 | Practical Instrumentation Integration Considerations. Thomas J. Anderson |
| 2004 | Precise Pulse Width Measurement in Write Pre-compensation Test. Hideo Okawara |
| 2004 | Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies. Amit Verma, Charles Robinson, Steve Butkovich |
| 2004 | Programmable At-Speed Array and Functional BIST for Embedded DRAM LSI. Masaji Kume, Katsutoshi Uehara, Minoru Itakura, Hideo Sawamoto, Toru Kobayashi, Masatoshi Hasegawa, Hideki Hayashi |
| 2004 | Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee |
| 2004 | RF Testing on a Mixed Signal Tester. Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat |
| 2004 | Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. Phil Nigh, Anne E. Gattiker |
| 2004 | Realizing High Test Quality Goals with Smart Test Resource Usage. Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski |
| 2004 | Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". Phil Nigh |
| 2004 | Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time. Christopher S. Taillefer, Gordon W. Roberts |
| 2004 | Reducing Power Consumption in Memory ECC Checkers. Shalini Ghosh, Nur A. Touba, Sugato Basu |
| 2004 | Removing JTAG Bottlenecks in System Interconnect Test. Hong Shin Jun, Sung Soo Chung, Sang H. Baeg |
| 2004 | Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing. Cecilia Metra, T. M. Mak, Martin Omaña |
| 2004 | Routability and Fault Tolerance of FPGA Interconnect Architectures. Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi |
| 2004 | SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits. Feng Shi, Yiorgos Makris |
| 2004 | Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard. Bo Yang, Kaijie Wu, Ramesh Karri |
| 2004 | Security vs. Test Quality: Are they mutually exclusive? Rohit Kapur |
| 2004 | Security vs. Test Quality: Can We Really Only Have One at a Time? Erik Jan Marinissen |
| 2004 | Security vs. Test Quality: Fully Embedded Test Approaches Are the Key to Having Both. Stephen Pateras |
| 2004 | Simulation Based System Level Fault Insertion Using Co-verification Tools. Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau |
| 2004 | Simulation Requirements for Vectors in ATE Formats. R. Raghuraman |
| 2004 | Spectral Analysis for Statistical Response Compaction During Built-In Self-Testing. Omar I. Khan, Michael L. Bushnell |
| 2004 | Speed Clustering of Integrated Circuits. Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra |
| 2004 | State Variable Extraction to Reduce Problem Complexity for ATPG and Design Validation. Qingwei Wu, Michael S. Hsiao |
| 2004 | Steering Committee and Subcommittees. |
| 2004 | Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. Kenneth M. Butler |
| 2004 | System Monitor for Diagnostic, Calibration and System Configuration. Maurizio Gavardoni, Michael Jones, Russell Poffenberger, Miguel Conde |
| 2004 | Systematic Defects in Deep Sub-Micron Technologies. Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede |
| 2004 | TTTC: Test Technology Technical Council. |
| 2004 | Technical Paper Reviewers. |
| 2004 | Technical Program Committee. |
| 2004 | Test Cost Reduction Through A Reconfigurable Scan Architecture. Baris Arslan, Alex Orailoglu |
| 2004 | Test In the Era of "What You see Is NOT What You Get". Bernd Koenemann |
| 2004 | Test Programming Environment in a Modular, Open Architecture Test System. Ankan K. Pramanick, Ramachandran Krishnaswamy, Mark Elston, Toshiaki Adachi, Harsanjeet Singh, Bruce R. Parnas |
| 2004 | Test Scheduling for Network-on-Chip with BIST and Precedence Constraints. Chunsheng Liu, Hamid Sharif, Érika F. Cota, Dhiraj K. Pradhan |
| 2004 | Test Strategies For a 40Gbps Framer SoC. Hans T. Heineken, Jitendra Khare |
| 2004 | Test Strategies for Nanometer Technologies. Sanjay Sengupta |
| 2004 | Test Strategy Cost Model Innovations. Carlos Michel, Rosa D. Reinosa |
| 2004 | Tester Architecture For The Source Synchronous Bus. A. T. Sivaram, Masashi Shimanouchi, Howard Maassen, Robert Jackson |
| 2004 | Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger |
| 2004 | Testing Micropipelined Asynchronous Circuits. Matthew L. King, Kewal K. Saluja |
| 2004 | Testing a secure device: High coverage with very low observability. Laurent Sourgen |
| 2004 | Testing and Remote Field Update of Distributed Base Stations in a Wireless Network. Chen-Huan Chiang, Paul J. Wheatley, Kenneth Y. Ho, Ken L. Cheung |
| 2004 | Testing in a high volume DSM Environment. Thomas M. Storey |
| 2004 | Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski |
| 2004 | The Critical Need For Open ATE Architecture. Sergio M. Perez |
| 2004 | The Leading Edge of Production Wafer Probe Test Technology. William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz |
| 2004 | Time/Area Tradeoffs in Testing Hierarchical SOCs With Hard Mega-Cores. Qiang Xu, Nicola Nicolici |
| 2004 | Timing Accuracy Enhancement by a New Calibration Scheme for Multi-Gbps ATE. Masashi Shimanouchi |
| 2004 | Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models. Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer |
| 2004 | To Test or To Inspect, What is the Coverage? Rob Jukna |
| 2004 | Towards Microagent based DBIST/DBISR. Liviu Miclea, Szilárd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto |
| 2004 | Transfer Functions For The Reference Clock Jitter In A Serial Link: Theory And Applications. Mike Li, Andy Martwick, Gerry Talbot, Jan B. Wilstrup |
| 2004 | Trends in Testing Integrated Circuits. Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge |
| 2004 | Trends in manufacturing test methods and their implications. Sandip Kundu, T. M. Mak, Rajesh Galivanche |
| 2004 | Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing. Ramyanshu Datta, Ravi Gupta, Antony Sebastine, Jacob A. Abraham, Manuel A. d'Abreu |
| 2004 | Use of Embedded Sensors for Built-In-Test of RF Circuits. Soumendu Bhattacharya, Abhijit Chatterjee |
| 2004 | Verification on Port Connections. Geeng-Wei Lee, Juinn-Dar Huang, Jing-Yang Jou, Chun-Yao Wang |
| 2004 | VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai |
| 2004 | Welcoming Message. |
| 2004 | What Do You Mean My Board Test Stinks? Bill Eklow |
| 2004 | What do you mean my Board Test stinks? Michael J. Smith |
| 2004 | Will "Heisenberg Uncertainty Principle" Hold For Designing and Testing Multiple GB/s ICs? Mike Li |
| 2004 | Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi |
| 2004 | X-Masking During Logic BIST and Its Impact on Defect Coverage. Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker |
| 2004 | X-Tolerant Signature Analysis. Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher |
| 2004 | Z-DFD: Design-for-Diagnosability Based on the Concept of Z-Detection. Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy |
| 2003 | Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA |