| 2003 | A BIST Solution for The Test of I/O Speed. Cheng Jia, Linda S. Milor |
| 2003 | A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow |
| 2003 | A Case Study of IR-Drop in Structured At-Speed Testing. Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger |
| 2003 | A Comprehensive Approach to Assessing and Analyzing 1149.1 Test Logic. Kevin Melocco, Hina Arora, Paul Setlak, Gary Kunselman, Shazia Mardhani |
| 2003 | A Generic Test Path and DUT Model for DataCom ATE. Jie Sun, Mike Li |
| 2003 | A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation. Nobuhiro Sato, Yoshihiro Hashimoto |
| 2003 | A Hybrid Coding Strategy For Optimized Test Data Compression. Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand |
| 2003 | A New Approach for Low Power Scan Testing. Takaki Yoshida, Masafumi Watari |
| 2003 | A New Maximal Diagnosis Algorithm for Bus-structured Systems. YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang |
| 2003 | A New Methodology For ADC Test Flow Optimization. Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell |
| 2003 | A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. David C. Keezer, Dany Minier, Marie-Christine Caron |
| 2003 | A Reconfigurable Power-Conscious Core Wrapper and its Application to SOC Test Scheduling. Erik Larsson, Zebo Peng |
| 2003 | A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. Seongmoon Wang, Srimat T. Chakradhar |
| 2003 | ATE-Customer Perspectives & Requirements Panel. Donald L. Wheater |
| 2003 | ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink |
| 2003 | Adapting JTAG for AC Interconnect Testing. Lee Whetsel |
| 2003 | Agent Based DBIST/DBISR And Its Web/Wireless Management. Liviu Miclea, Szilárd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto |
| 2003 | An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a Combinational Circuit. Wangqi Qiu, D. M. H. Walker |
| 2003 | An Efficient and Effective Methodology on the Multiple Fault Diagnosis. Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski |
| 2003 | An extension to JTAG for at-speed debug on a system. Leon van de Logt, Frank van der Heyden, Tom Waayers |
| 2003 | An improved Test Control Architecture and Test Control Expansion for Core-Based System Chips. Tom Waayers |
| 2003 | Analog Circuit Test using Transfer Function Coe .cient Estimates. Zhen Guo, Jacob Savir |
| 2003 | Analyzing the Effectiveness of Multiple-Detect Test Sets. R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah |
| 2003 | Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores. Nektarios Kranitis, George Xenoulis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian |
| 2003 | Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. John S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman |
| 2003 | Application of Built in Self-Test for Interconnect Testing of FPGAs. Dereck A. Fernandes, Ian G. Harris |
| 2003 | Architecting Millisecond Test Solutions for Wireless Phone RFIC's. John Ferrario, Randy Wolf, Steve Moss |
| 2003 | Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability. Tomokazu Yoneda, Tetsuo Uchiyama, Hideo Fujiwara |
| 2003 | Automatic Diagnostic Program Generation for Mixed Signal Load Board. Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam |
| 2003 | Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2003 | BIST for Deep Submicron ASIC Memories with High Performance Application. Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Omer Samman, Paul Policke, Sherry Lai |
| 2003 | BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study. Charles E. Stroud, Keshia N. Leach, Thomas A. Slaughter |
| 2003 | Backplane Test Bus Applications For IEEE STD 1149.1. Clayton Gibbs |
| 2003 | Board Life-Cycle Testing For Effective NPI Management of Wireless Products. Timo Piironen |
| 2003 | Board Test Coverage: The Value of Prediction and How to Compare Numbers. Wouter Rijckaert, Frans G. M. de Jong |
| 2003 | Building An RF Source For Low Cost Testers Using An ADPLL Controlled By Texas Instruments Digital Signal Processor (DSP) TMS320C5402. Iboun Taimiya Sylla |
| 2003 | Burn-in Temperature Projections for Deep Sub-micron Technologies. Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins |
| 2003 | CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura |
| 2003 | CMOS Built-In Test Architecture for High-Speed Jitter Measurement. Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz |
| 2003 | Case Study - Using STIL as Test Pattern Language. Daniel Fan, Steve Roehling, Rusty Carruth |
| 2003 | Challenges in Low Cost Test Approach for ARM9TM Core Based Mixed-Signal SoC DragonBallTM-MX1. George Bao |
| 2003 | Circular BIST testing the digital logic within a high speed Serdes. Graham Hetherington, Richard Simpson |
| 2003 | Collection of High-Level Microprocessor Bugs from Formal Verification of Pipelined and Superscalar Designs. Miroslav N. Velev |
| 2003 | Concurrent Error Detection in Linear Analog Circuits Using State Estimation. Haralampos-G. D. Stratigopoulos, Yiorgos Makris |
| 2003 | Constructive Pattern Generation Heuristic for Meeting SSO Limits. Kendrick Baker |
| 2003 | Convolutional Compaction of Test Responses. Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy |
| 2003 | Cost Containment for High-Volume Test of Multi-GB/s Ports. John C. Johnson |
| 2003 | Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits. Kartik Mohanram, Nur A. Touba |
| 2003 | Coverage-Directed Management and Optimization of Random Functional Verification. Amir Hekmatpour, James Coulter |
| 2003 | Critical Timing Analysis in Microprocessors Using Near-IR Laser Assisted Device Alteration (LADA). Jeremy A. Rowlette, Travis M. Eiles |
| 2003 | DFFT : Design For Functional Testability. Haluk Konuk, Leon Xiao |
| 2003 | DFM - A Fabless Perspective. Jitendra Khare |
| 2003 | DFM - An Industry Paradigm Shift. Cliff Ma |
| 2003 | DFM: The Real 90nm Hurdle. Robert C. Aitken |
| 2003 | Data Critically Estimation In Software Applications. Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri |
| 2003 | Data flow within an open architecture tester. Maurizio Gavardoni |
| 2003 | Debug and Diagnosis in the Age of System-on-a-Chip. Robert F. Molyneaux |
| 2003 | Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? Kenneth P. Parker |
| 2003 | Defect Tolerance at the End of the Roadmap. Mahim Mishra, Seth Copen Goldstein |
| 2003 | Deformations of IC Structure in Test and Yield Learning. Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey |
| 2003 | Design Verification Problems: Test To The Rescue? Prab Varma |
| 2003 | Design and Implementation of IEEE 1149.6. Ivan Duzevik |
| 2003 | Design for Manufacturability - or the meaning of 'subtle'. Stefan Eichenberger |
| 2003 | Designed -in-diagnostics: A new optical method. Keneth R. Wilsher |
| 2003 | Detection of Resistive Shorts in Deep Sub-micron Technologies. Bram Kruseman, Stefan van den Oetelaar |
| 2003 | Deterministic BIST Based on a Reconfigurable Interconnection Network. Lei Li, Krishnendu Chakrabarty |
| 2003 | Diagnosis in Modern Design - Just the Tip of the Iceberg. Fidel Muradali |
| 2003 | Diagnosis in Modern Design to Volume - The Tip of the Iceberg. William V. Huott |
| 2003 | Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak |
| 2003 | Double-Tree Scan: A Novel Low-Power Scan-Path Architecture. Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang |
| 2003 | EEPROM Memory: Threshold Voltage Built In Self Diagnosis. Jean-Michel Portal, Hassen Aziza, Didier Née |
| 2003 | Effectiveness Improvement of ECR Tests. Wanli Jiang, Eric Peterson, Bob Robotka |
| 2003 | Effects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements. Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Makoto Kurosawa, Hirobumi Musha |
| 2003 | Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch |
| 2003 | Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal. Qingwei Wu, Michael S. Hsiao |
| 2003 | Efficient Sequential ATPG for Functional RTL Circuits. Liang Zhang, Indradeep Ghosh, Michael S. Hsiao |
| 2003 | Elimination of Traditional Functional Testing of Interface Timings at Intel. Mike Tripp, T. M. Mak, Anne Meixner |
| 2003 | Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel |
| 2003 | Experiments in Detecting Delay Faults using Multiple Higher Frequency Clocks and Results from Neighboring Die. Haihua Yan, Adit D. Singh |
| 2003 | Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante |
| 2003 | Extraction Error Diagnosis and Correction in High-Performance Designs. Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikaran, Andreas G. Veneris |
| 2003 | FPGA Interconnect Delay Fault Testing. Erik Chmelar |
| 2003 | Failure Mechanisms in MEMS. Jeremy A. Walraven |
| 2003 | Fault Collapsing via Functional Dominance. Vishwani D. Agrawal, A. V. S. S. Prasad, Madhusudan V. Atre |
| 2003 | Fault Injection for Verifying Testability at the VHDL Level. S. R. Seward, Parag K. Lala |
| 2003 | Fault Localization using Time Resolved Photon Emission and STIL Waveforms. Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah |
| 2003 | Fault Pattern Oriented Defect Diagnosis for Memories. Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang |
| 2003 | First IC Validation of IEEE Std. 1149.6. Suzette Vandivier, Mark Wahl, Jeff Rearick |
| 2003 | Future ATE for System on a Chip... Some Perspectives. Tom Newsom |
| 2003 | Future ATE: Perspectives & Requirements. Lee Y. Song |
| 2003 | Future ATE: Perspectives & Requirements. Fidel Muradali |
| 2003 | Future Challenges for MEMS Failure Analysis. Jeremy A. Walraven |
| 2003 | H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish |
| 2003 | High Quality ATPG for Delay Defects. Puneet Gupta, Michael S. Hsiao |
| 2003 | How (In)Adequate is One-time Testing. Peter Ehlig |
| 2003 | HyAC: A Hybrid Structural SAT Based ATPG for Crosstalk. Xiaoliang Bai, Sujit Dey, Angela Krstic |
| 2003 | Hybrid Multisite Testing at Manufacturing. Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi |
| 2003 | Hysteresis of Intrinsic IDDQ Currents. Yukio Okuda, Nobuyuki Furukawa |
| 2003 | IBISTTM (Interconnect Built-in Self-Test) Architecture and Methodology for PCI Express: Intel?s Next-Generation Test and Validation Methodology for Performance IO. Jay J. Nejedlo |
| 2003 | IEEE 1149.6 - A Practical Perspective. Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz |
| 2003 | IEEE P1581: To Live or Let die? Frans G. M. de Jong, Leon van de Logt |
| 2003 | Impact of Multiple-Detect Test Patterns on Product Quality. Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
| 2003 | Impedance Profile of a Commercial Power Grid and Test System. Dhruva Acharyya, Jim Plusquellic |
| 2003 | Improving Wireless Product Testing via University and Industry Collaboration. William R. Eisenstadt |
| 2003 | Improving Wireless Product Testing: An Opportunity for University and Industry Collaboratio. Jim Paviol |
| 2003 | Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski |
| 2003 | Infrastructure IP for Back-End Yield Improvement. L. Forli, Jean-Michel Portal, Didier Née, Bertrand Borot |
| 2003 | Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar, Richard Lee, John Bell, Lisa Curhan |
| 2003 | Introduction to Applications and Industries for Microelectromechanical Systems (MEMS). Jeremy A. Walraven |
| 2003 | Jitter Test in Production for High Speed Serial Links. Yi Cai |
| 2003 | Key Impediments to DFT-Focused Test and How to Overcome Them. Kenneth E. Posse, Geir Eide |
| 2003 | Latch Divergency In Microprocessor Failure Analysis. Peter Dahlgren, Paul Dickinson, Ishwar Parulkar |
| 2003 | Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger |
| 2003 | Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers. Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga |
| 2003 | MEMS Design And Verification. Tamal Mukherjee |
| 2003 | MEMS Fabrication. Gary K. Fedder |
| 2003 | MEMS Manufacturing Testing: An Accelerometer Case Study. Theresa Maudie, Alex Hardt, Rick Nielsen, Dennis Stanerson, Ron Bieschke, Mike Miller |
| 2003 | Managing the Multi-Gbit/s Test Challenges. Ulrich Schoettmer, Bernd Laquai |
| 2003 | Method of reducing contactor effect when testing high-precision ADCs. Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy |
| 2003 | Mitigating the Effects of The DUT Interface board and Test System Parasitics in Gigabit-Plus Measurements. Thomas P. Warwick |
| 2003 | Modeling Scan Chain Modifications For Scan-in Test Power Minimization. Ozgur Sinanoglu, Alex Orailoglu |
| 2003 | Multi-GB/s IC Test Challenges and Solutions. Burnell G. West |
| 2003 | Next-Generation Devices and Networks Bring Opportunities and Challenges. Antti Sivula |
| 2003 | Novel Transient Fault Hardened Static Latch. Martin Omaña, Daniele Rossi, Cecilia Metra |
| 2003 | On Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures. Ramesh C. Tekumalla |
| 2003 | On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs. Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz |
| 2003 | On Reducing Wrapper Boundary Register Cells in Modular SOC Testing. Qiang Xu, Nicola Nicolici |
| 2003 | On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding. Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
| 2003 | On-line Detection of Faults in Carry-Select Adders. B. Kiran Kumar, Parag K. Lala |
| 2003 | Open Architecture ATE and 250 Consecutive UIs. Takahiro J. Yamaguchi |
| 2003 | Open Microphone - My DFT is better than yours ... Geir Eide, Kenneth E. Posse |
| 2003 | Optical and Electrical Testing of Latchup in I/O Interface Circuits. Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda |
| 2003 | Optimal Interconnect ATPG Under a Ground-Bounce Constraint. Henk D. L. Hollmann, Erik Jan Marinissen, Bart Vermeulen |
| 2003 | Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. Zhen Shi, Peter Sandborn |
| 2003 | Outlier Detection for DPPM Reduction. Paul Buxton, Paul Tabor |
| 2003 | Overview of the IEEE P1500 Standard. Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur |
| 2003 | PXI - A New Architecture for Many Testing Requirements. Bob Stasonis |
| 2003 | PXI: A Solution For Board Functional Test? Jim Webster |
| 2003 | Panel Synopsis - How (In)Adequate is One Time Testing? Rubin A. Parekhji |
| 2003 | Parity-Based Concurrent Error Detection in Symmetric Block Ciphers. Ramesh Karri, Grigori Kuznetsov, Michael Gössel |
| 2003 | Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk. Rahul Kundu, R. D. (Shawn) Blanton |
| 2003 | Periodic Jitter Injection with Direct Time Synthesis by SPPTM ATE for SerDes Jitter Tolerance Test in Production. Masashi Shimanouchi |
| 2003 | Power-aware NoC Reuse on the Testing of Core-based Systems. Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski |
| 2003 | Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA |
| 2003 | Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee |
| 2003 | Production Test Challenges And Possible Solutions For Multiple GB/s ICs. Mike Li |
| 2003 | Progressive Bridge Identification. Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton |
| 2003 | RF Test 101: Defining the Problem, Finding Solutions. Mustapha Slamani |
| 2003 | RIC/DICMOS - Multi-channel CMOS Formatter. Ahmed Rashid Syed |
| 2003 | Race: A Word-Level ATPG-Based Constraints Solver System For Smart Random Simulation. Mahesh A. Iyer |
| 2003 | Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan Chains in Circuits with Multiple Scan Chains. Irith Pomeranz |
| 2003 | Register Transfer Level Approach to Hybrid Time and Hardware Redundancy Based Fault Secure Datapath Synthesis. Kaijie Wu, Ramesh Karri |
| 2003 | Relating Yield Models to Burn-In Fall-Out in Time. Thomas S. Barnett, Adit D. Singh |
| 2003 | Reliability Threats in VDSM - Shortcomings in Conventional Test and Fault-Tolerance Alternatives. Michael Nicolaidis |
| 2003 | Requirements, Challenges, And Solutions For Testing Multiple GB/s ICs In Production. Mike Li |
| 2003 | Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning |
| 2003 | Seamless Research Between Academia And Industry To Facilitate Test Of Integrated High-Speed Wireless Systems: Is This An Illusion? Abhijit Chatterjee |
| 2003 | Seeing Chip Testability Through a Systems Person's Eyes. David W. Yen |
| 2003 | Selecting PXI Architecture for Board (System) Functional Test. Eric L. Smitt |
| 2003 | Self-Testing and Self-Healing via Mobile Agents. Alfredo Benso |
| 2003 | Should Nanometer Circuits be Periodically Tested in the Field? Adit D. Singh |
| 2003 | Silicon Diagnosis. Wu-Tung Cheng |
| 2003 | Silicon IP And Successful DFM. Robert C. Aitken |
| 2003 | Simulating Resistive Bridging and Stuck-At Faults. Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker |
| 2003 | Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy. Burnell G. West |
| 2003 | Standards Based Wireless Device Testing. John D. Bowne |
| 2003 | Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault. Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-Ju Hsieh, Yu-Ting Hung |
| 2003 | Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing. Kun Young Chung, Sandeep K. Gupta |
| 2003 | TRIBuTETM Board and Platform Test Methodology: Intel's Next-Generation Test and Validation Methodology for Platforms. Jay J. Nejedlo |
| 2003 | Test Challenges of Nanometer Technology. Janusz Rajski |
| 2003 | Test Outsourcing - A Subcontract Manufacturer's Perspective. John Roberts |
| 2003 | Test Vector Generation Based on Correlation Model for Ratio-Iddq. Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota |
| 2003 | Test-Based Model Generation For Legacy Systems. Hardi Hungar, Tiziana Margaria, Bernhard Steffen |
| 2003 | Testability Features of the Alpha 21364 Microprocessor. Scott Erlanger, Dilip K. Bhavsar, Richard A. Davies |
| 2003 | Testing 3G-controlled systems: time to rejoice or time to feel pain? Tapio Koivukangas |
| 2003 | Testing 3G-controlled systems: time to rejoice or time to feel pain? Moray Rumney |
| 2003 | Testing Challenges of Future Wireless World. Tapio Koivukangas |
| 2003 | Testing DSM ASIC With Static, \DeltaIDDQ, And Dynamic Test Suite: Implementation And Results. Yoshihito Nishizaki, Osamu Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura |
| 2003 | Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus. Stephen K. Sunter |
| 2003 | Testing of Droplet-Based Microelectrofluidic Systems. Fei Su, Sule Ozev, Krishnendu Chakrabarty |
| 2003 | The Confluence of Manufacturing Test and Design Validation. Kwang-Ting Cheng |
| 2003 | The Confluence of Manufacturing Test and Design Validation. Ian G. Harris |
| 2003 | The Confluence of Manufacturing Test and Design Validation. Franco Fummi |
| 2003 | The Increasing Importance of On-line Testing to Ensure High-Reliability Products. Phil Nigh |
| 2003 | The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod |
| 2003 | The PXI Modular Instrumentation Architecture. Eric Starkloff, Tim Fountain, Garth Black |
| 2003 | The Testability Features of The ARM1026EJ Microprocessor Core. Teresa L. McLaurin, Frank Frederick, Rich Slobodnik |
| 2003 | Tools and Techniques for Failure Analysis and Qualification of MEMS. Jeremy A. Walraven |
| 2003 | Towards Structural Testing of Superconductor Electronics. Arun A. Joseph, Hans G. Kerkhoff |
| 2003 | Transistor-Level Fault Analysis and Test Algorithm Development for Ternary Dynamic Content Addressable Memorie. Derek Wright, Manoj Sachdev |
| 2003 | Ultra Low Cost Linear Testing. Michael A. Jones |
| 2003 | Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir |
| 2003 | VDD Ramp Testing for RF Circuits. José Pineda de Gyvez, Guido Gronthoud, Rashid Amine |
| 2003 | X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture. Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin |
| 2003 | XML And Java For Open ATE Programming Environment. A. T. Sivaram, Daniel Fan, Jon Pryce |
| 2003 | Yield Threats and Inadequacy of One-time Test. Yervant Zorian |