| 2002 | A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
| 2002 | A Multi-Language Goal-Tree Based Functional Test Planning System. Rajneesh Mahajan, Ramesh Govindarajulu, James R. Armstrong, F. Gail Gray |
| 2002 | A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets. A. V. S. S. Prasad, Vishwani D. Agrawal, Madhusudan V. Atre |
| 2002 | A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter. Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie |
| 2002 | A New Test Generation Approach for Embedded Analogue Cores in SoC. M. Stancic, Liquan Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff |
| 2002 | A Novel Fault Injection Method for System Verification Based on FPGA Boundary Scan Architectur. Tapan J. Chakraborty, Chen-Huan Chiang |
| 2002 | A Persistent Diagnostic Technique for Unstable Defects. Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura |
| 2002 | A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC Ishwar Parulkar, Thomas A. Ziaja, Rajesh Pendurkar, Anand D'Souza, Amitava Majumdar |
| 2002 | A Set of Benchmarks fo Modular Testing of SOCs. Erik Jan Marinissen, Vikram Iyengar, Krishnendu Chakrabarty |
| 2002 | A Structured Graphical Tool for Analyzing Boundary Scan Violations. Michael Cogswell, Shazia Mardhani, Kevin Melocco, Hina Arora |
| 2002 | A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. Shigeki Tomishima, Hiroaki Tanizaki, Mitsutaka Niiro, Masanao Maruta, Hideto Hidaka, T. Tada, Kenji Gamo |
| 2002 | A Wavelet-Based Timing Parameter Extraction Method. Mani Soma, Welela Haileselassie, Jessica Yan, Rajesh Raina |
| 2002 | A/MS BISTs: The FACTS, Just the Facts. Arnold Frisch |
| 2002 | Across the Great Divide: Examination of Simulation Data with Actual Silicon Waveforms Improves Device Characterization and Production Test Development. Tom Austin, Charisma Canlas, Brady Morgan, Jorge L. Rodriguez |
| 2002 | Adapting an SoC to ATE Concurrent Test Capabilities. Rainer Dorsch, Ramón Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer |
| 2002 | An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes. Zhigang Jiang, Sandeep K. Gupta |
| 2002 | An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née |
| 2002 | An Effective Diagnosis Method to Support Yield Improvement. Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg |
| 2002 | An Efficient Linear Time Algorithm for Scan Chain Optimization and Repartitioning. David Berthelot, Samit Chaudhuri, Hamid Savoj |
| 2002 | An Embedded Core for Sub-Picosecond Timing Measurements. Sassan Tabatabaei, André Ivanov |
| 2002 | An Implementation of IEEE 1149.1 to Avoid Timing Violations and Other Practical In-Compliance Improvements. Dave Stang, Ramaswami Dandapani |
| 2002 | An Integrated Approach to Yield Loss Characterization. Mark Craig, Alvin Jee, Prashant Maniar |
| 2002 | An Open Architecture for Semiconductor Test: Enablers and Challenges. Mark Jagiela |
| 2002 | Analog Macromodeling of Capacitive Coupling Faults in Digital Circuit Interconnects. Aditya D. Sathe, Michael L. Bushnell, Vishwani D. Agrawal |
| 2002 | Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2002 | Application of High-Quality Built-In Test to Industrial Designs. Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo |
| 2002 | Architecting Millisecond Test Solutions for Wireless Phone RFIC's. John Ferrario, Randy Wolf, Steve Moss |
| 2002 | Automatic Generation of Design Constraints in Verifying High Performance Embedded Dynamic Circuits. Jayanta Bhadra, Narayanan Krishnamurthy |
| 2002 | Automatic Scan Insertion and Test Generation for Asynchronous Circuits. Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff |
| 2002 | BIST-Based Diagnosis of FPGA Interconnect. Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici |
| 2002 | Board Test Is NOT Mature. Kenneth P. Parker |
| 2002 | Board Test: Wanted Dead or Alive. Gordon D. Robinson |
| 2002 | Built-In Self Test of CMOS-MEMS Accelerometers. Nilmoni Deb, R. D. (Shawn) Blanton |
| 2002 | CMOS Circuit Technology for Precise GHz Timing Generator. Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto |
| 2002 | Can IC Test Learn from How a Tester is Tested. Rochit Rajsuman |
| 2002 | Challenges and Solutions for Multi-Gigahertz Testing. David C. Keezer |
| 2002 | Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura |
| 2002 | Clock Faults? Impact on Manufacturing Testing and Their Possible Detection Through On-Line Testing. Cecilia Metra, Stefano Di Francescantonio, T. M. Mak |
| 2002 | Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems. Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir |
| 2002 | Comparison of IDDQ Testing and Very-Low Voltage Testing. Bram Kruseman, Stefan van den Oetelaar, Josep Rius |
| 2002 | Compensation of Transmission Line Loss for Gbit/s Test on ATEs. Wolfram Humann |
| 2002 | Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost. Stephen K. Sunter, Benoit Nadeau-Dostie |
| 2002 | Considerations for STIL Data Application. Gregory A. Maston |
| 2002 | Core-Based Scan Architecture for Silicon Debug. Bart Vermeulen, Tom Waayers, Sandeep Kumar Goel |
| 2002 | DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs. Osamu Hirabayashi, Azuma Suzuki, Tomoaki Yabe, Atsushi Kawasumi, Yasuhisa Takeyama, Keiichi Kushida, Akihito Tohata, Nobuaki Otsuka |
| 2002 | DUT Capture Using Simultaneous Logic Acquisition. A. T. Sivaram, William Fritzsche, Toshitaka Koshi, Nam Lai |
| 2002 | Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores. Mohsen Nahvi, André Ivanov, Resve A. Saleh |
| 2002 | Design Rewiring Using ATPG. Andreas G. Veneris, Magdy S. Abadir, Mandana Amiri |
| 2002 | Diagonal Test and Diagnostic Schemes for Flash Memorie. Sau-Kwo Chiu, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu |
| 2002 | EEE 1149.1-Compliant Access Architecture for Multiple Core Debug on Digital System Chips. Bart Vermeulen, Tom Waayers, Sjaak Bakker |
| 2002 | Effective and Efficient Test Architecture Design for SOCs. Sandeep Kumar Goel, Erik Jan Marinissen |
| 2002 | Efficient Design of System Test: A Layered Architecture. Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei |
| 2002 | Efficient Embedded Memory Testing with APG. A. T. Sivaram, Daniel Fan, A. Yiin |
| 2002 | Embedded Deterministic Test for Low-Cost Manufacturing Test. Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian |
| 2002 | Embedded Memory Test and Repair: Infrastructure IP for SOC Yield. Yervant Zorian |
| 2002 | Experimental Evaluation of Scan Tests for Bridges. Sreejit Chakravarty, Ankur Jain, Nandakumar Radhakrishnan, Eric W. Savage, Sujit T. Zachariah |
| 2002 | FPGA Test and Coverage. Shahin Toutounchi, Andrew Lai |
| 2002 | FRITS - A Microprocessor Functional BIST Method. Praveen Parvathala, Kaila Maneparambil, William Lindsay |
| 2002 | Facilitating Rapid First Silicon Debug. Hari Balachandran, Kenneth M. Butler, Neil Simpson |
| 2002 | Fault Grading FPGA Interconnect Test Configurations. Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey |
| 2002 | Fault Tuples in Diagnosis of Deep-Submicron Circuits. Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels |
| 2002 | Finding a Small Set of Longest Testable Paths that Cover Every Gate. Manish Sharma, Janak H. Patel |
| 2002 | Frequency/Phase Movement Analy i by Orthogonal Demodulation. Hideo Okawara |
| 2002 | GHz Testing and Its Fuzzy Targets. Chuck Hawkins, Jaume Segura |
| 2002 | Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. Seongmoon Wang |
| 2002 | Good Scan = Good Quality Level? Well, It Depends ? Anjali Kinra Vij |
| 2002 | Hierarchical Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips. Sandeep Kumar Goel, Bart Vermeulen |
| 2002 | High Accuracy Stimulus Generation for A/D Converter BIST. Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello |
| 2002 | High Current DPS Architecture for Sort Test Challenge. Jean-Pascal Mallet |
| 2002 | Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. Bozena Kaminska |
| 2002 | Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. Dale E. Hoffman |
| 2002 | Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. Bill Bottoms |
| 2002 | Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. Gregory S. Spirakis |
| 2002 | IC Mixed-Signal BIST: Separating Facts from Fiction. Stephen K. Sunter |
| 2002 | IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. Bill Eklow, Carl Barnhart, Kenneth P. Parker |
| 2002 | Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. Carsten Wegener, Michael Peter Kennedy |
| 2002 | Improved Digital I/O Ports Enhance Testability of Interconnections. Adam Kristof |
| 2002 | Improved IDDQ Testing with Empirical Linear Prediction. David I. Bergman, Hans Engler |
| 2002 | Incremental Diagnosis of Multiple Open-Interconnects. Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Takahashi |
| 2002 | Inevitable Use of TAP Domains in SOCs. Lee Whetsel |
| 2002 | Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici |
| 2002 | Integrating DFT in the Physical Synthesis Flow. Loïs Guiller, Frederic Neuveux, S. Duggirala, R. Chandramouli, Rohit Kapur |
| 2002 | Integration of SRAM Redundancy into Production Test. Jayasanker Jayabalan, Juraj Povazanec |
| 2002 | Is Board Test Worth Talking About? Bill Eklow |
| 2002 | Is ITC Bored with Board Test? Kenneth M. Butler |
| 2002 | Is It Rocket Science? Anthony P. Ambler |
| 2002 | Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It. Grady Giles |
| 2002 | Is an Open Architecture Tester Really Achievable? Paul D. Roddy |
| 2002 | Isolating and Removing Sources of Variation in Test Data. David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge |
| 2002 | Itelligent Agents and BIST/BISR - Working Together in Distributed Systems. Liviu Miclea, Szilárd Enyedi, Alfredo Benso |
| 2002 | Jitter Testing for Multi-Gigabit Backplane SerDes - Techniques to Decompose and Combine Various Types of Jitter. Yi Cai, S. A. Werner, G. J. Zhang, Max J. Olsen, Robert D. Brink |
| 2002 | Low-Contact-Force Probing on Copper Electrodes. Kenichi Kataoka, Toshihiro Itoh, Katsuya Okumura, Tadatomo Suga |
| 2002 | Managing in the ATE Business - Postcards from the Past, Lessons for the Future. Alex d'Arbeloff |
| 2002 | Mission Impossible? Open Architecture ATE. Dennis R. Conti |
| 2002 | Mission Possible? Open Architecture ATE. Paul F. Scrivens |
| 2002 | Mixed Signal BIST: Fact or Fiction. Lee Y. Song |
| 2002 | Mixed-Signal BIST: Fact or Fiction. Karim Arabi |
| 2002 | Mixed-Signal BIST: Fact or Fiction. Gordon W. Roberts |
| 2002 | Multi-GHz interface devices should be tested using external test resources. Takahiro J. Yamaguchi |
| 2002 | Multi-Gigahertz Digital Test Challenges and Techniques. Manoj Sachdev |
| 2002 | Multi-Gigahertz Digital Test Challenges and Techniques. Ulrich Schoettmer |
| 2002 | Multi-Purpose Digital Test Core Utilizing Programmable Logic. John S. Davis, David C. Keezer |
| 2002 | Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis. David B. Lavo, Ismed Hartanto, Tracy Larrabee |
| 2002 | Multiscan-Based Test Compression and Hardware Decompression Using LZ77. Francis G. Wolff, Christos A. Papachristou |
| 2002 | Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. W. Robert Daasch, Kevin Cota, James McNames, Robert Madge |
| 2002 | New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing. Masashi Shimanouchi |
| 2002 | On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis. Ramesh C. Tekumalla, Scott Davidson |
| 2002 | On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. Li-C. Wang, Magdy S. Abadir, Juhong Zhu |
| 2002 | On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita |
| 2002 | On the Accuracy of Jitter Separation from Bit Error Rate Function. Mike Peng Li, Jan B. Wilstrup |
| 2002 | On the Use of k-tuples for SoC Test Schedule Representation. Sandeep Koranne, Vikram Iyengar |
| 2002 | On-Chip Repair and an ATE Independent Fusing Methodology. Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater |
| 2002 | On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms). Mike Tripp |
| 2002 | On-Line Testing of Multi-Source Noise-Induced Errors on the Interconnects and Buses of System-on-Chips. Yi Zhao, Li Chen, Sujit Dey |
| 2002 | Open ATE Architecture: Key Challenges. Burnell G. West |
| 2002 | Optimal BIST Using an Embedded Microprocessor. Sungbae Hwang, Jacob A. Abraham |
| 2002 | Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm. Yu Huang, Sudhakar M. Reddy, Wu-Tung Cheng, Paul Reuter, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan |
| 2002 | Outsourcing Test without Standards? Peter Muhmenthaler |
| 2002 | Packet-Based Input Test Data Compression Techniques. Erik H. Volkerink, Ajay Khoche, Subhasish Mitra |
| 2002 | Panel: "Board Test and ITC: What Does the Future Hold?". Monica Lobetti Bodoni |
| 2002 | Parametric Failures in CMOS ICs - A Defect-Based Analysis. Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins |
| 2002 | Physical Principles of Interface Design. Todd Sargent |
| 2002 | Power Driven Chaining of Flip-Flops in Scan Architectures. Yannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch |
| 2002 | Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 |
| 2002 | Pseudo Random Patterns Using Markov Sources for Scan BIST. Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz |
| 2002 | R4X/D4X - Formatters for Flexible Test System Architecture. Ahmed Rashid Syed |
| 2002 | RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras |
| 2002 | Re-Using DFT Logic for Functional and Silicon Debugging Test. Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung |
| 2002 | Realistic Spring Probe Testing Methods and Results. David Gessel, Alexander H. Slcoum, Alexander D. Sprunt, Scott Ziegenhagen |
| 2002 | Realizing the Benefits of Structural Test for Intel Microprocessors. Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp |
| 2002 | Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression. C. V. Krishna, Nur A. Touba |
| 2002 | Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh |
| 2002 | Robustness IPs for Reliability and Security of SoCs. Eric Dupont, Michael Nicolaidis |
| 2002 | Scan Power Reduction Through Test Data Transition Frequency Analysis. Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu |
| 2002 | Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique. Vishal Jain, John A. Waicukauski |
| 2002 | Scan and BIST Can Almost Achieve Test Quality Levels. Carol Pyron |
| 2002 | Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. Phil Nigh |
| 2002 | Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech |
| 2002 | Screening MinVDD Outliers Using Feed-Forward Voltage Testing. Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner |
| 2002 | Selective Optimization of Test for Embedded Flash Memory. Roger Barth |
| 2002 | Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor. Mohammad H. Tehranipour, Mehrdad Nourani |
| 2002 | Silicon Symptoms to Solutions: Applying Design for Debug Techniques. Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger |
| 2002 | Static Analysis of SEU Effects on Software Applications. Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2002 | Support for Debugging in the Alpha 21364 Microprocessor. Timothe Litt |
| 2002 | System Manufacturing Test Cost Model. David Williams, Anthony P. Ambler |
| 2002 | TAPS All Over My Chips! So Now What Do I Do? Bart Vermeulen |
| 2002 | TAPS All Over My Chips. Teresa L. McLaurin |
| 2002 | TAPs All Over My Chips. Steven F. Oakland |
| 2002 | Techniques to Reduce Data Volume and Application Time for Transition Test. Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran |
| 2002 | Test Coverage Models for System Test? David Williams |
| 2002 | Test Coverage: What Does It Mean When a Board Test Passes?. Kathy Hird, Kenneth P. Parker, Bill Follis |
| 2002 | Test Methodology for Motorola's High Performance e500 Core Based on PowerPC Instruction Set Architecture. Robert Bailey, A. Metayer, B. Svrcek, Nandu Tendolkar, E. Wolf, Eric Fiene, Mike Alexander, Rick Woltenberg, Rajesh Raina |
| 2002 | Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume. M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor |
| 2002 | Test Resource Optimization for Multi-Site Testing of SOCs Under ATE Memory Depth Constraints. Vikram Iyengar, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty |
| 2002 | Test Setup Simulation - A High-Performance VHDL-Based Virtual Test Solution Meeting Industrial Requirements. Gunter Krampl, Marco Rona, Hermann Tauber |
| 2002 | Test Time Impact of Redundancy Repair in Embedded Flash Memory. Paul Okino |
| 2002 | Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores. Mohamed M. Hafed, Gordon W. Roberts |
| 2002 | Test and Repair of Embedded Flash Memories. Jean Michel Daga |
| 2002 | Test and Repair of Non-Volatile Commodity and Embedded Memories (NAND Flash Memory). Riichiro Shirota |
| 2002 | Test and Repair of Nonvolatile Commodity and Embedded Memories. Shigeo Tsuchida |
| 2002 | Testing CrossTalk Induced Delay Faults in Static CMOS Circuits Through Dynamic Timing Analysis. Bipul Chandra Paul, Kaushik Roy |
| 2002 | Testing Finite State Machines Based on a Structural Coverage Metric . Sezer Gören, F. Joel Ferguson |
| 2002 | Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? Mustapha Slamani |
| 2002 | Testing The Tester. Rochit Rajsuman |
| 2002 | Testing The Tester. Rochit Rajsuman |
| 2002 | Testing Wireless Local Area Network Transceiver ICs at 5 GHz. Kevin M. MacKay |
| 2002 | Testing the Tester: Specification and Validation Approaches. John C. Johnson |
| 2002 | Testing the Tester: What Broke? Where? When? Why? Alfred L. Crouch |
| 2002 | The Consequences of an Open ATE Architecture. Sergio M. Perez |
| 2002 | The Heisenberg Uncertainty of Test. Peter C. Maxwell |
| 2002 | The Impact of Outsourcing on Test. Fidel Muradali |
| 2002 | The Manic Depression of Microprocessor Debug. Don Douglas Josephson |
| 2002 | The Process and Challenges of a High-Speed DUT Board Project. David E. McFeely |
| 2002 | The Role of Test in a Highly Outsourced Business Model. Bill Price |
| 2002 | The Yield of Test Outsourcing. Davide Appello |
| 2002 | Trouble With Scan. David M. Wu |
| 2002 | Use of DFT Techniques In Speed Grading a 1GHz+ Microprocessor . Dawit Belete, Ashutosh Razdan, William Schwarz, Rajesh Raina, Christopher Hawkins, Jeff Morehead |
| 2002 | Use of Pipeline Converters for ATE Applications. Maurizio Gavardoni |
| 2002 | Verification of Device Interface Hardware Interconnections Prior to the Start of Testing. Guy Peterson |
| 2002 | Verifying Properties Using Sequential ATPG. Jacob A. Abraham, Vivekananda M. Vedula, Daniel G. Saab |
| 2002 | WCDMA Testing with a Baseband/IF Range AWG. Koji Asami, Yasuo Furukawa, Michael Purtell, Motoo Ueda, Karl Watanabe, Toshifumi Watanabe |
| 2002 | Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill |
| 2002 | Wafer/Package Test Mix for Optimal Defect Detection. Peter C. Maxwell |
| 2002 | What Can IC Test Teach System Test? Scott Davidson |
| 2002 | What a Device Interface Board Really Costs: An Evaluation of Technical Considerations for Testing Products Operating in the Gigabit Region. Thomas P. Warwick |
| 2002 | Wireless SOC Testing: Can RF Testing Costs Be Reduced? Alan Kafton |
| 2002 | X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. Subhasish Mitra, Kee Sup Kim |
| 2002 | XIDEN: Crosstalk Target Identification Framework. Shahin Nazarian, Hang Huang, Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 2002 | valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns |