| 1999 | "DFY and DFR are more important than DFT". David M. Wu |
| 1999 | A DFT technique for high performance circuit testing. Mansour Shashaani, Manoj Sachdev |
| 1999 | A comparison of bridging fault simulation methods. R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma |
| 1999 | A design diversity metric and reliability analysis for redundant systems. Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey |
| 1999 | A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming. Han Bin Kim, Dong Sam Ha |
| 1999 | A method to improve the performance of high-speed waveform digitizing. Koji Asami, Shinsuke Tajiri |
| 1999 | A new approach to RF impedance test. Dino Ren Tao |
| 1999 | A new method for jitter decomposition through its distribution tail fitting. Mike Peng Li, Jan B. Wilstrup, Ross Jessen, Dennis Petrich |
| 1999 | A probe scheduling algorithm for MCM substrates. Bruce C. Kim, Pinshan Jiang, Se Hyun Park |
| 1999 | A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. Kenneth M. Butler |
| 1999 | Accuracy requirements in at-speed functional test. Burnell G. West |
| 1999 | Accurate path delay fault coverage is feasible. Spyros Tragoudas |
| 1999 | Addressable test ports an approach to testing embedded cores. Lee Whetsel |
| 1999 | An accurate simulation model of the ATE test environment for very high speed devices. Thomas P. Warwick, Jung Cho, Yi Cai, Bill Ortner |
| 1999 | An algorithm for row-column self-repair of RAMs and its implementation in the Alpha 21264. Dilip K. Bhavsar |
| 1999 | An efficient on-line-test and back-up scheme for embedded processors. Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch |
| 1999 | An embedded technique for at-speed interconnect testing. Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras |
| 1999 | An histogram based procedure for current testing of active defects. Claude Thibeault |
| 1999 | An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques. Sandhya Seshadri, Michael S. Hsiao |
| 1999 | An on-line BISTed SRAM IP core. Monica Lobetti Bodoni, Alessio Pricco, Alfredo Benso, Silvia Chiusano, Paolo Prinetto |
| 1999 | Analog Fault Simulation: Key to Product Quality, or a Foot in the Door. Craig Force |
| 1999 | Analog Fault Simulation: Need it? No. It is already done. Eugene R. Atwood |
| 1999 | Application of Tools Developed at the University of Iowa to ITC Benchmarks. Sudhakar M. Reddy |
| 1999 | Applications of semiconductor test economics, and multisite testing to lower cost of test. Andrew C. Evans |
| 1999 | Applying lessons learned from TDDB testing. E. James Prendergast |
| 1999 | At-speed structural test. Burnell G. West |
| 1999 | Auto-calibrating analog timer for on-chip testing. Benoit Provost, Edgar Sánchez-Sinencio |
| 1999 | Automatic Functional Test Generation - A Reality. Raghuram S. Tapuri |
| 1999 | Automatic timing margin failure location analysis by CycleStretch method. Mitsuo Matsumoto, Yoshiharu Ikeda |
| 1999 | BIST for phase-locked loops in digital applications. Stephen K. Sunter, Aubin Roy |
| 1999 | Benchmarking DAT with the ITC'99 ATPG Benchmarks. Mario Konijnenburg, Hans van der Linden, Jeroen Geuzebroek |
| 1999 | Breaking the complexity spiral in board test. Stephen F. Scheiber |
| 1999 | Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani |
| 1999 | Changing our Path to High Level ATPG. Scott Davidson |
| 1999 | Characterization and optimization of the production probing process. Minh Quach, Rich Samuelson, David Shaw |
| 1999 | Checking sequence generation for asynchronous sequential elements. Sezer Gören, F. Joel Ferguson |
| 1999 | Closing The Gap Between Process Development and Mixed Signal Design and Testing. Hosam Haggag |
| 1999 | Clustering based techniques for I_DDQ testing. Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana |
| 1999 | Correlation of logical failures to a suspect process step. Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith |
| 1999 | Critical path identification and delay tests of dynamic circuits. Kyung Tek Lee, Jacob A. Abraham |
| 1999 | Current ratios: a self-scaling technique for production I_DDQ testing. Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
| 1999 | DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar |
| 1999 | DFT is all I can afford, who cares about Design for Yield or Design for Reliability! David M. Wu |
| 1999 | DFT, DFY, DFR: Who Cares? R. Scott Fetherston |
| 1999 | DFT, DFY, and DFR; Which One(s) Do You Worry About? James A. Monzel |
| 1999 | DFT, test lifecycles and the product lifecycle. Gordon D. Robinson |
| 1999 | Defect detection using power supply transient signal analysis. Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali |
| 1999 | Delay fault testing of IP-based designs via symbolic path modeling. HyungWon Kim, John P. Hayes |
| 1999 | Delay testing considering power supply noise effects. Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng |
| 1999 | Delay testing of SOI circuits: Challenges with the history effect. Eric W. MacDonald, Nur A. Touba |
| 1999 | Design for (physical) debug for silicon microsurgery and probing of flip-chip packaged integrated circuits. Richard H. Livengood, Donna Medeiros |
| 1999 | Design for In-System Programming. David A. Bonnett |
| 1999 | Design for Yield and Reliability is MORE Important Than DFT. D. M. H. Walker |
| 1999 | Design for test and time to market-friends or foes. Jon Turino |
| 1999 | Design for testability: it is time to deliver it for Time-to-Market. Bulent I. Dervisoglu |
| 1999 | Design of a test simulation environment for test program development. J. J. O. Riordan |
| 1999 | Design-for-test methodology for Motorola PowerPC microprocessors. Magdy S. Abadir, Rajesh Raina |
| 1999 | Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor. Peilin Song, Franco Motika, Daniel R. Knebel, Rick Rizzolo, Mary P. Kusko, Julie Lee, Moyra K. McManus |
| 1999 | Effective oscillation-based test for application to a DTMF filter bank. Gloria Huertas, Diego Vázquez, Adoración Rueda, José L. Huertas |
| 1999 | Eliminating the Ouija board: automatic thresholds and probabilistic I_DDQ diagnosis. David B. Lavo, Tracy Larrabee, Jonathon E. Colburn |
| 1999 | Embedded X86 testing methodology. Luis Basto, Asif Khan, Pete Hodakievic |
| 1999 | Estimating the integral non-linearity of A/D-converters via the frequency domain. Nico Csizmadia, Augustus J. E. M. Janssen |
| 1999 | Expediting ramp-to-volume production. Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala |
| 1999 | Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. David R. Lakin II, Adit D. Singh |
| 1999 | Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong |
| 1999 | Fault diagnosis in scan-based BIST using both time and space information. Jayabrata Ghosh-Dastidar, Debaleena Das, Nur A. Touba |
| 1999 | Fault modeling of suspended thermal MEMS. Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois |
| 1999 | Finite state machine synthesis with concurrent error detection. Chaohuang Zeng, Nirmal R. Saxena, Edward J. McCluskey |
| 1999 | Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]. Tagashi Kitagaki |
| 1999 | Functional verification of intellectual properties (IP): a simulation-based solution for an application-specific instruction-set processor. Manfred Stadler, Thomas Röwer, Hubert Kaeslin, Norbert Felber, Wolfgang Fichtner, Markus Thalmann |
| 1999 | HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs. Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian |
| 1999 | High Time For High Level ATPG. Mahesh A. Iyer |
| 1999 | High Time for Higher Level BIST. Christos A. Papachristou |
| 1999 | High level ATPG is important and is on its way! Rohit Kapur |
| 1999 | High level test bench generation using software engineering concepts. Jean François Santucci, Christophe Paoli |
| 1999 | High speed digital transceivers: A challenge for manufacturing. Clifford B. Cole, Thomas P. Warwick |
| 1999 | High time for high level ATPG. Wu-Tung Cheng |
| 1999 | High-level ATPG for Early Power Analysis. Wolfgang Roethig |
| 1999 | High-level ATPG: a real topic or an academic amusement? Matteo Sonza Reorda |
| 1999 | I Anthony C. Miller |
| 1999 | IMEMS accelerometer testing-test laboratory development and usage. Richard W. Beegle, Robert W. Brocato, Ronald W. Grant |
| 1999 | ITC'99 Benchmark Circuits - Preliminary Results. Scott Davidson |
| 1999 | Increasing Test Coverage in a VLSI Design Course. Michael L. Bushnell |
| 1999 | Increasing test coverage in a VLSI design course. Michel Robert |
| 1999 | Industrial evaluation of stress combinations for march tests applied to SRAMs. Ad J. van de Goor, Ivo Schanstra |
| 1999 | Interconnect delay fault testing with IEEE 1149.1. Yuejian Wu, Paul Soong |
| 1999 | Is Analog Fault Simulation a Key to Product Quality? Practical Considerations. Bozena Kaminska |
| 1999 | Is DFT right for you? Jim Johnson |
| 1999 | Is there a STIL for mixed signal testing? Marc Loranger |
| 1999 | It Makes Sense to Combine DFT and DFR/DFY. Robert C. Aitken |
| 1999 | LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. Seongmoon Wang, Sandeep K. Gupta |
| 1999 | Limited access testing of analog circuits: handling tolerances. Cherif Ahrikencheikh, Michael Spears |
| 1999 | Linearity testing issues of analog to digital converters. Turker Kuyel |
| 1999 | Logic BIST for large industrial designs: real issues and case studies. Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski |
| 1999 | Low overhead test point insertion for scan-based BIST. Michinobu Nakao, Seiji Kobayashi, Kazumi Hatayama, Kazuhiko Iijima, Seiji Terada |
| 1999 | Minimized power consumption for scan-based BIST. Stefan Gerstendörfer, Hans-Joachim Wunderlich |
| 1999 | Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer |
| 1999 | On achieving complete coverage of delay faults in full scan circuits using locally available lines. Irith Pomeranz, Sudhakar M. Reddy |
| 1999 | On-line fault detection in DSP circuits using extrapolated checksums with minimal test points. Sudip Chakrabarti, Abhijit Chatterjee |
| 1999 | Optimal conditions for Boolean and current detection of floating gate faults. Michel Renovell, André Ivanov, Yves Bertrand, Florence Azaïs, Sumbal Rafiq |
| 1999 | Output in still, input in still. Peter Wohl |
| 1999 | PC manufacturing test in a high volume environment. David Williams |
| 1999 | Panel Statement: Increasing test coverage in a VLSI design course. Mani Soma |
| 1999 | Panel: Increasing test coverage in a VLSI desgin course. Vishwani D. Agrawal |
| 1999 | Particulate failures for surface-micromachined MEMS. Tao Jiang, Ronald D. Blanton |
| 1999 | Port interference faults in two-port memories. Said Hamdioui, Ad J. van de Goor |
| 1999 | Position Statement: Increasing Test Coverage in a VLSI Design Course. Jacob A. Abraham |
| 1999 | Position Statement: Testing in a VLSI Design Course. Wayne H. Wolf |
| 1999 | Practical optical waveform probing of flip-chip CMOS devices. Keneth R. Wilsher, William K. Lo |
| 1999 | Practical scan test generation and application for embedded FIFOs. Jeff Rearick |
| 1999 | Probe contact resistance variations during elevated temperature wafer test. Jerry J. Broz, Reynaldo M. Rincon |
| 1999 | Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999 |
| 1999 | RF (gigahertz) ATE production testing on wafer: options and tradeoffs. Dean A. Gahagan |
| 1999 | Relating linearity test results to design flaws of pipelined analog to digital converters. Turker Kuyel, Haydar Bilhan |
| 1999 | Resistive bridge fault modeling, simulation and test generation. Vijay R. Sar-Dessai, D. M. H. Walker |
| 1999 | Robust test methods applied to functional design verification. Susana Stoica |
| 1999 | Robust testability of primitive faults using test points. Ramesh C. Tekumalla, Premachandran R. Menon |
| 1999 | SCITT: Back to Basics in Mass Production Testing. Frans G. M. de Jong |
| 1999 | SCITT: Bringing DRAMs Into the Test Fold. Frank W. Angelotti |
| 1999 | SIA Roadmaps: Sunset Boulevard for l_DDQ. Keith Baker |
| 1999 | STAR-ATPG: a high speed test pattern generator for large scan designs. Kuo-Hui Tsai, Tompson, Janusz Rajski, Malgorzata Marek-Sadowska |
| 1999 | STIL: the device-oriented database for the test development lifecycle. Nathan Biggs |
| 1999 | Scan Insertion at the Behavioral Level. Chouki Aktouf |
| 1999 | Self-checking scheme for very fast clocks' skew correction. Cecilia Metra, Flavio Giovanelli, Mani Soma, Bruno Riccò |
| 1999 | Silicon debug: scan chains alone are not enough. Gert-Jan van Rootselaar, Bart Vermeulen |
| 1999 | Speed-up of high accuracy analog test stimulus optimization. Abdelhakim Khouas, Anne Derieux |
| 1999 | Static Component Interconnection Test Technology (SCITT). Steffen Hellmold |
| 1999 | Static component interconnect test technology (SCITT) a new technology for assembly testing. Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg |
| 1999 | Static component interconnection test technology in practice. Frans G. M. de Jong, Rob Raaijmakers |
| 1999 | Statistical threshold formulation for dynamic I_dd test. Wanli Jiang, Bapiraju Vinnakota |
| 1999 | Subband filtering scheme for analog and mixed-signal circuit testing. Jeongjin Roh, Jacob A. Abraham |
| 1999 | Switch-level delay test. Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | SymSim: symbolic fault simulation of data-flow data-path designs at the Register-Transfer level. Sitaran Yadavalli, Sudhakar M. Reddy |
| 1999 | Synthesis of pattern generators based on cellular automata with phase shifters. Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski |
| 1999 | System design verification tests - an overview. Susana Stoica |
| 1999 | Test features of a core-based co-processor array for video applications. Jos van Beers, Harry Van Herten |
| 1999 | Test generation for crosstalk-induced delay in integrated circuits. Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | Test process optimization: closing the gap in the defect spectrum. Norma Barrett, Simon Martin, Chryssa Dislis |
| 1999 | Test support processors for enhanced testability of high performance circuits. David C. Keezer, Q. Zhou |
| 1999 | Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring |
| 1999 | Testability of the Philips 80C51 micro-controller. M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1999 | Testing a system-on-a-chip with embedded microprocessor. Rochit Rajsuman |
| 1999 | Testing an MCM for high-energy physics experiments: a case study. Alfredo Benso, Silvia Chiusano, Paolo Prinetto, Simone Giovannetti, Riccardo Mariani, Silvano Motto |
| 1999 | Testing high speed high accuracy analog to digital converters embedded in systems on a chip. Solomon Max |
| 1999 | Testing reusable IP-a case study. Peter Harrod |
| 1999 | The HASS development process. David Rahe |
| 1999 | The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA). William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia N. Sanda, Steven C. Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky |
| 1999 | The effects of test compaction on fault diagnosis. Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
| 1999 | The evolution of a system test process [for Motorola GSM products]. Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren |
| 1999 | The integration of boundary-scan test methods to a mixed-signal environment. Adam W. Ley |
| 1999 | The test and debug features of the AMD-K7 microprocessor. Timothy J. Wood |
| 1999 | The test requirements model (TeRM) communicating test information throughout the product life cycle. Lee A. Shombert, Danny C. Davis, Eric M. Bukata |
| 1999 | The testability features of the 3rd generation ColdFire family of microprocessors. Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran |
| 1999 | The value of tester accuracy. Wajih Dalal, Song Miao |
| 1999 | Thin Gate Oxide Reliability. Jeffrey L. Roehr |
| 1999 | Towards a standard for embedded core test: an example. Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel |
| 1999 | Towards a standardized procedure for automatic test equipment timing accuracy evaluation. Yi Cai, William R. Ortner, C. T. Garrenton |
| 1999 | Towards reducing "functional only" fails for the UltraSPARC microprocessors. Anjali Kinra |
| 1999 | Tradeoff analysis for producing high quality tests for custom circuits in PowerPC microprocessors. Li-C. Wang, Magdy S. Abadir |
| 1999 | Transient current testing of 0.25 μm CMOS devices. Bram Kruseman, Peter Janssen, Victor Zieren |
| 1999 | Trends in SLI design and their effect on test. Robert C. Aitken, Fidel Muradali |
| 1999 | Using LSSD to test modules at the board level. Thomas A. Ziaja |
| 1999 | Using STIL to describe embedded core test requirements. Brion L. Keller |
| 1999 | Using Verilog simulation libraries for ATPG. Peter Wohl, John A. Waicukauski |
| 1999 | Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma |
| 1999 | VLSI design 101 - The test module. John Harrington |