| 1998 | A BIST scheme for the detection of path-delay faults. Nilanjan Mukherjee, Tapan J. Chakraborty, Sudipta Bhawmik |
| 1998 | A comprehensive approach to the partial scan problem using implicit state enumeration. Priyank Kalla, Maciej J. Ciesielski |
| 1998 | A diagnostic test generation procedure for synchronous sequential circuits based on test elimination. Irith Pomeranz, Sudhakar M. Reddy |
| 1998 | A distributed BIST technique for diagnosis of MCM interconnections. Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian |
| 1998 | A fault injection environment for microprocessor-based boards. Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 1998 | A goal tree based high-level test planning system for DSP real number models. Morris Lin, James R. Armstrong, F. Gail Gray |
| 1998 | A high speed and area efficient on-chip analog waveform extractor. Ara Hajjar, Gordon W. Roberts |
| 1998 | A high throughput test methodology for MCM substrates. Bruce C. Kim, David C. Keezer, Abhijit Chatterjee |
| 1998 | A highly testable and diagnosable fabrication process test chip. Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill |
| 1998 | A layout-based approach for ordering scan chain flip-flops. Samy Makar |
| 1998 | A lifecycle approach to design validation is it necessary? Is it feasible? Susana Stoica |
| 1998 | A method of serial data jitter analysis using one-shot time interval measurements. Jan B. Wilstrup |
| 1998 | A new approach to scan chain reordering using physical design information. Mokhtar Hirech, James Beausang, Xinli Gu |
| 1998 | A new framework for generating optimal March tests for memory arrays. Kamran Zarrineh, Shambhu J. Upadhyaya, Sreejit Chakravarty |
| 1998 | A new path-oriented effect-cause methodology to diagnose delay failures. Yuan-Chieh Hsu, Sandeep K. Gupta |
| 1998 | A non-enumerative path delay fault simulator for sequential circuits. Carlos G. Parodi, Vishwani D. Agrawal, Michael L. Bushnell, Shianling Wu |
| 1998 | A novel combinational testability analysis by considering signal correlation. Shih-Chieh Chang, Shi-Sen Chang, Wen-Ben Jone, Chien-Chung Tsai |
| 1998 | A novel test methodology for core-based system LSIs and a testing time minimization problem. Makoto Sugihara, Hiroshi Date, Hiroto Yasuura |
| 1998 | A performance analysis system for MEMS using automated imaging methods. Glenn F. LaVigne, Sam L. Miller |
| 1998 | A scalable architecture for VLSI test. Ed Chang, David Cheung, Robert E. Huston, Jim Seaton, Gary Smith |
| 1998 | A structured and scalable mechanism for test access to embedded reusable cores. Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters |
| 1998 | A structured test re-use methodology for core-based system chips. Prab Varma, Sandeep Bhatia |
| 1998 | A test site thermal control system for at-speed manufacturing testing. Mark Malinoski, James Maveety, Steve Knostman, Tom Jones |
| 1998 | A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits. Wen-Ben Jone, Jiann-Chyi Rau, Shih-Chieh Chang, Yu-Liang Wu |
| 1998 | ASIC jeopardy-diagnosing without a FAB. Scott Davidson |
| 1998 | ATPG in practical and non-traditional applications. Brion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs |
| 1998 | AVM Bob Hickling |
| 1998 | Accounting for the unexpected: fault diagnosis out of the ivory tower. Brian Chess |
| 1998 | Accumulator based deterministic BIST. Rainer Dorsch, Hans-Joachim Wunderlich |
| 1998 | Alternative interface methods for testing high speed bidirectional signals. David C. Keezer, Q. Zhou |
| 1998 | An algorithmic approach to optimizing fault coverage for BIST logic synthesis. Srinivas Devadas, Kurt Keutzer |
| 1998 | An almost full-scan BIST solution-higher fault coverage and shorter test application time. Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng |
| 1998 | An introduction to area array probing. Frederick L. Taber |
| 1998 | Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
| 1998 | Automated synthesis of large phase shifters for built-in self-test. Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer |
| 1998 | BETSY: synthesizing circuits for a specified BIST environment. Zhe Zhao, Bahram Pouya, Nur A. Touba |
| 1998 | BIST vs. ATE for testing system-on-a-chip. Neil Kelly |
| 1998 | BIST vs. ATE: need a different vehicle? Stephen K. Sunter |
| 1998 | BIST: required for embedded DRAM. Satoru Tanoi |
| 1998 | Boundary scan BIST methodology for reconfigurable systems. Chauchin Su, Shung-Won Jeng, Yue-Tsang Chen |
| 1998 | Built in self repair for embedded high density SRAM. Ilyoung Kim, Yervant Zorian, Goh Komoriya, Hai Pham, Frank P. Higgins, Jim L. Lewandowski |
| 1998 | Built-in self-test of FPGA interconnect. Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici |
| 1998 | Buying time for the stuck-at fault model. Jeff Rearick |
| 1998 | CMOS IC reliability indicators and burn-in economics. Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
| 1998 | Cache RAM inductive fault analysis with fab defect modeling. T. M. Mak, Debika Bhattacharya, Cheryl Prunty, Bob Roeder, Nermine Ramadan, F. Joel Ferguson, Jianlin Yu |
| 1998 | Can model-based and case-based expert systems operate together? Moshe Ben-Bassat, Israel Beniaminy, David Joseph |
| 1998 | Compact two-pattern test set generation for combinational and full scan circuits. Ilker Hamzaoglu, Janak H. Patel |
| 1998 | Consequences of port restrictions on testing two-port memories. Said Hamdioui, Ad J. van de Goor |
| 1998 | Contactless gigahertz testing. Wolfgang Mertin, Anton Leyk, Ulf Behnke, Volker Wittpahl |
| 1998 | Core test connectivity, communication, and control. Lee Whetsel |
| 1998 | Correlations between path delays and the accuracy of performance prediction. Leendert M. Huisman |
| 1998 | Cost of test reduction. Hervé Deshayes |
| 1998 | Current signatures: application [to CMOS]. Anne E. Gattiker, Wojciech Maly |
| 1998 | DFT guidance through RTL test justification and propagation analysis. Yiorgos Makris, Alex Orailoglu |
| 1998 | Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. Manoj Sachdev, Peter Janssen, Victor Zieren |
| 1998 | Defect level prediction for I_DDQ testing. Yukio Okuda, Isao Kubota, Masahiro Watanabe |
| 1998 | Defect-oriented test quality assessment using fault sampling and simulation. Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira |
| 1998 | Defect-oriented testing of mixed-signal ICs: some industrial experience. Y. Xing |
| 1998 | Defining ATPG rules checking in STIL. Peter Wohl, John A. Waicukauski |
| 1998 | Delay test of chip I/Os using LSSD boundary scan. Pamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur |
| 1998 | Design and implementation of the "G2" PowerPC 603e-embedded microprocessor core. Craig Hunter, Justin Gaither |
| 1998 | Design for diagnostics views and experiences. Vallluri R. Rao |
| 1998 | Design for soft-error robustness to rescue deep submicron scaling. Michael Nicolaidis |
| 1998 | Designing for scan test of high performance embedded memories. E. Kofi Vida-Torku, George Joos |
| 1998 | Detecting resistive shorts for CMOS domino circuits. Jonathan T.-Y. Chang, Edward J. McCluskey |
| 1998 | Detection of CMOS address decoder open faults with March and pseudo random memory tests. Jan Otterstedt, Dirk Niggemeyer, T. W. Williams |
| 1998 | Detection of bridging faults in logic resources of configurable FPGAs using I_DDQ. Lan Zhao, D. M. H. Walker, Fabrizio Lombardi |
| 1998 | Deterministic BIST with multiple scan chains. Gundolf Kiefer, Hans-Joachim Wunderlich |
| 1998 | DfT and on-line test of high-performance data converters: a practical case. Eduardo J. Peralías, Adoración Rueda, Juan A. Prieto, José L. Huertas |
| 1998 | Diagnosis and characterization of timing-related defects by time-dependent light emission. Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika |
| 1998 | Diagnosis method based on ΔIddq probabilistic signatures: experimental results. Claude Thibeault, Luc Boisvert |
| 1998 | Diagnostic techniques for the UltraSPARC microprocessors. Anjali Kinra, Aswin Mehta, Neal Smith, Jackie Mitchell, Fred Valente |
| 1998 | Digital bus faults measuring techniques. Reuben Schrift |
| 1998 | Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska |
| 1998 | Embedded self-testing checkers for low-cost arithmetic codes. Steffen Tarnick, Albrecht P. Stroele |
| 1998 | Enough is enough already. William R. Simpson |
| 1998 | Estimation of defect-free IDDQ in submicron circuits using switch level simulation. Peter C. Maxwell, Jeff Rearick |
| 1998 | Extracting gate-level networks from simulation tables. Peter Wohl, John A. Waicukauski |
| 1998 | Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. Phil Nigh, David P. Vallett, Atul Patel, Jason Wright |
| 1998 | Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois |
| 1998 | Failure modes for stiction in surface-micromachined MEMS. Abhijeet Kolpekwar, Ronald D. Blanton, David Woodilla |
| 1998 | FakeFault: a silicon debug software tool for microprocessor embedded memory arrays. Young-Jun Kwon, Ben Mathew, Hong Hao |
| 1998 | Fine pitch (45 micron) P4 probing. Toshinori Ishii, Hideaki Yoshida |
| 1998 | Flying probe test systems: capabilities for effective testing. Jack Ferguson |
| 1998 | Functional ATE can meet the challenges. Burnell G. West |
| 1998 | GateMaker: a transistor to gate level model extractor for simulation, automatic test pattern generation and verification. Sandip Kundu |
| 1998 | Generating interconnect models from prototype hardware. Frank W. Angelotti |
| 1998 | High quality, easy to use, on time ATE software Can it be done? Dan Proskauer |
| 1998 | High speed testing-have the laws of physics finally caught up with us? Jerry Katz |
| 1998 | High volume microprocessor test escapes, an analysis of defects our tests are missing. Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong |
| 1998 | High-coverage ATPG for datapath circuits with unimplemented blocks. HyungWon Kim, John P. Hayes |
| 1998 | How much testing is enough. Susana Stoica |
| 1998 | How real is the new SIA roadmap for mixed-signal test equipment? William R. Ortner |
| 1998 | How we test Siemens Embedded DRAM Cores. Roderick McConnell, Udo Möller, Detlev Richter |
| 1998 | IC diagnosis: preventing wars and war stories. Jayashree Saxena |
| 1998 | Implicit test generation for behavioral VHDL models. Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto |
| 1998 | Improved sensitivity for parallel test of substrate interconnections. David C. Keezer, K. E. Newman, John S. Davis |
| 1998 | Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques. Benoit Dufort, Gordon W. Roberts |
| 1998 | Integrated probe card/interface solutions for specific test applications. Jim Anderson |
| 1998 | Just how real is the SIA roadmap. Wayne M. Needham |
| 1998 | Learning to knit SOCs profitably. Todd E. Rockoff |
| 1998 | Leveraging new standards in ATE software. John Oonk |
| 1998 | Limited access testing: IEEE 1149.4-instrumentation and methods. John E. McDermid |
| 1998 | MEMS fault model generation using CARAMEL. Abhijeet Kolpekwar, Chris S. Kellen, Ronald D. Blanton |
| 1998 | Maximization of power dissipation under random excitation for burn-in testing. Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen |
| 1998 | Maximizing handler thermal throughput with a rib-roughened test tray. Andreas C. Pfahnl, John H. Lienhard V, Alexander H. Slocum |
| 1998 | Measuring jitter of high speed data channels using undersampling techniques. Wajih Dalal, Daniel A. Rosenthal |
| 1998 | Microelectromechanical systems (MEMS) tutorial. Kaigham J. Gabriel |
| 1998 | Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip. Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott |
| 1998 | Modeling the unknown! Towards model-independent fault and error diagnosis. Vamsi Boppana, Masahiro Fujita |
| 1998 | Modular logic built-in self-test for IP cores. Janusz Rajski, Jerzy Tyszer |
| 1998 | Multi-output one-digitizer measurement. S. Sasho, M. Shibata |
| 1998 | National Science Foundation Workshop on Future Research Directions in Testing of Electronic Circuits and Systems: executive summary of workshop report. Kwang-Ting Cheng |
| 1998 | Native mode functional test generation for processors with applications to self test and design validation. Jian Shen, Jacob A. Abraham |
| 1998 | Novel optical probing technique for flip chip packaged microprocessors. Mario Paniccia, Travis M. Eiles, V. R. M. Rao, Wai Mun Yee |
| 1998 | On applying non-classical defect models to automated diagnosis. Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess |
| 1998 | On-chip versus off-chip test: an artificial dichotomy. Robert C. Aitken |
| 1998 | On-line detection of logic errors due to crosstalk, delay, and transient faults. Cecilia Metra, Michele Favalli, Bruno Riccò |
| 1998 | On-line testing of scalable signal processing architectures using a software test method. Chouki Aktouf, Ghassan Al Hayek, Chantal Robach |
| 1998 | Probabilistic mixed-model fault diagnosis. David B. Lavo, Brian Chess, Tracy Larrabee, Ismed Hartanto |
| 1998 | Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998 |
| 1998 | Process-tolerant test with energy consumption ratio. Bapiraju Vinnakota, Wanli Jiang, Dechang Sun |
| 1998 | Quad DCVS dynamic logic fault modeling and testing. R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |
| 1998 | R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique. Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantinos Halatsis |
| 1998 | Reduction of errors due to source and meter in the nonlinearity test. Luke S. L. Hsieh |
| 1998 | SIA Roadmap: test must not limit future technologies. Phil Nigh |
| 1998 | SOC test: the devil is in the details of integration/implementation. Kamalesh N. Ruparel |
| 1998 | SRAM-based FPGA's: testing the LUT/RAM modules. Michel Renovell, Jean-Michel Portal, Joan Figueras, Yervant Zorian |
| 1998 | Scaling Deeper to Submicron: On-Line Testing to the Rescue. Michael Nicolaidis |
| 1998 | Scan chain design for test time reduction in core-based ICs. Joep Aerts, Erik Jan Marinissen |
| 1998 | Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. Ivo Schanstra, Dharmajaya Lukita, Ad J. van de Goor, Kees Veelenturf, Paul J. van Wijnen |
| 1998 | Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. Bulent I. Dervisoglu, Mike Ricchetti, William Eklow |
| 1998 | Spice up your life: simulate mixed-signal ICs! Keith Baker |
| 1998 | Standard test interface language (STIL), extending the standard. Tony Taylor |
| 1998 | Static test sequence compaction based on segment reordering and accelerated vector restoration. Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy |
| 1998 | Stimulus generation for built-in self-test of charge-pump phase-locked loops. Benoît R. Veillette, Gordon W. Roberts |
| 1998 | Stuck-at fault: a fault model for the next millennium. Janak H. Patel |
| 1998 | Switch-level bridging fault simulation in the presence of feedbacks. Peter Dahlgren |
| 1998 | System chip test: are we there yet? Prab Varma |
| 1998 | TAO: regular expression based high-level testability analysis and optimization. Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jha |
| 1998 | Temperature control of a handler test interface. Andreas C. Pfahnl, John H. Lienhard V, Alexander H. Slocum |
| 1998 | Test generation in VLSI circuits for crosstalk noise. Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1998 | Test methodology for a microprocessor with partial scan. Leland L. Day, Paul A. Ganfield, Dennis M. Rickert, Fred J. Ziegler |
| 1998 | Test session oriented built-in self-testable data path synthesis. Han Bin Kim, Takeshi Takahashi, Dong Sam Ha |
| 1998 | Test vector decompression via cyclical scan chains and its application to testing core-based designs. Abhijit Jas, Nur A. Touba |
| 1998 | Test: when is enough enough? Bret A. Stewart |
| 1998 | Testability access of the high speed test features in the Alpha 21264 microprocessor. Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson |
| 1998 | Testing a multichip package for a consumer communications application. Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer |
| 1998 | Testing embedded-core based system chips. Yervant Zorian, Erik Jan Marinissen, Sujit Dey |
| 1998 | Testing mixed signal SOCs. Mark Burns |
| 1998 | Testing the design: the evolution of test simulation. Craig Force, Tom Austin |
| 1998 | The CAT-exact data transfer to DDS-generated clock domains in a single-chip modular solution. Robert Gage, Ben Brown |
| 1998 | The rise and fall of the ATE industry. Todd E. Rockoff |
| 1998 | The stuck-at fault: it ain't over 'til it's over. Kenneth M. Butler |
| 1998 | Toward understanding "Iddq-only" fails. Anne E. Gattiker, Wojciech Maly |
| 1998 | Towards an automatic diagnosis for high-level design validation. Maisaa Khalil, Yves Le Traon, Chantal Robach |
| 1998 | Triggering and clocking architecture for mixed signal test. Naveed Zaman, Antony Spilman |
| 1998 | Versatile BIST: an integrated approach to on-line/off-line BIST. Ramesh Karri, Nilanjan Mukherjee |
| 1998 | When "almost" is good enough: a fresh look at DSP clock rates. Eric Rosenfeld, Solomon Max |
| 1998 | When two worlds merge [test issues for system-level ICs]. Ken Lanier |
| 1998 | probe card-a solution for at-speed, high density, wafer probing. Rajiv Pandey, Dan Higgins |