| 1997 | 1149.5: Now It's a Standard, So What? Harry Hulvershorn |
| 1997 | A 256Meg SDRAM BIST for Disturb Test Application. Theo J. Powell, Dan Cline, Francis Hii |
| 1997 | A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason |
| 1997 | A DSP-Based Feedback Loop for Mixed-Signal VLSI Testing. Lakshmikantha S. Prabhu, Daniel A. Rosenthal |
| 1997 | A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. K. E. Newman, David C. Keezer |
| 1997 | A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems. Indradeep Ghosh, Niraj K. Jha, Sujit Dey |
| 1997 | A New Probe Card Technology Using Compliant Microsprings Nicholas Sporck |
| 1997 | A New Validation Methodology Combining Test and Formal Verification for PowerPC Li-C. Wang, Magdy S. Abadir |
| 1997 | A Novel Functional Test Generation Method for Processors Using Commercial ATPG. Raghuram S. Tupuri, Jacob A. Abraham |
| 1997 | A Parameterized VHDL Library for On-Line Testing. Charles E. Stroud, M. Ding, S. Seshadri, Ramesh Karri, I. Kim, Subhajit Roy, S. Wu |
| 1997 | A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |
| 1997 | A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. Stephen K. Sunter, Naveena Nagi |
| 1997 | A Simulation-Based JTAG ATPG Optimized for MCMs. Andrew Flint |
| 1997 | A Symbolic Simulation-Based ANSI/IEEE Std 1149.1 Compliance Checker and BSDL Generator. Harbinder Singh, James Beausang, Girish Patankar |
| 1997 | A Unified Interface for Scan Test Generation Based on STIL. Peter Wohl, John A. Waicukauski |
| 1997 | ACT: A DFT Tool for Self-Timed Circuits. Ajay Khoche, Erik Brunvand |
| 1997 | ASIC Manufacturing Test Cost Prediction at Early Design Stage. Von-Kyoung Kim, Tom Chen, Mick Tegethoff |
| 1997 | Addressing Early Design-For-Test Synthesis in a Production Environment. Vivek Chickermane, Kamran Zarrineh |
| 1997 | Advances in Probe Technology: Best Sessions of the'97 Southwest Test Workshop. Dave Unzicker, Michael Bonham, Rey Rincon |
| 1997 | Algorithms for Switch Level Delay Fault Simulation. Soumitra Bose, Vishwani D. Agrawal, Thomas G. Szymanski |
| 1997 | An Effective BIST Scheme for Arithmetic Logic Units. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian, Mihalis Psarakis |
| 1997 | An Efficient Method for Compressing Test Data. Takahiro J. Yamaguchi, Masahiro Ishida, Marco Tilgner, Dong Sam Ha |
| 1997 | An Efficient Scheme to Diagnose Scan Chains. Sridhar Narayanan, Ashutosh Das |
| 1997 | An IDDQ Sensor Circuit for Low-Voltage ICs. Yukiya Miura |
| 1997 | An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. Lee Whetsel |
| 1997 | An On-Line Self-Testing Switched-Current Integrator. Osama K. Abu-Shahla, Ian M. Bell |
| 1997 | Analog AC Harmonic Method for Detecting Solder Opens. Chuck Robinson |
| 1997 | Analog Fault Diagnosis for Unpowered Circuit Boards. Jiun-Lang Huang, Kwang-Ting Cheng |
| 1997 | Analog and Mixed-Signal Benchmark Circuits-First Release. Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti |
| 1997 | Analytic Models for Crosstalk Delay and Pulse Analysis Under Non-Ideal Inputs. Weiyu Chen, Melvin A. Breuer, Sandeep K. Gupta |
| 1997 | Analyzing a PowerPC Richard Raimi, James Lear |
| 1997 | Application and Analysis of IDDQ Diagnostic Software. Phil Nigh, Donato O. Forlenza, Franco Motika |
| 1997 | Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)-A New Standard for System Diagnostics. John W. Sheppard, Leslie A. Orlidge |
| 1997 | BART: A Bridging Fault Test Generation for Sequential Circuits. James P. Cusey, Janak H. Patel |
| 1997 | BIST-Based Diagnostics of FPGA Logic Blocks. Charles E. Stroud, Eric Lee, Miron Abramovici |
| 1997 | Board Level Automated Fault Injection for Fault Coverage and Diagnostic Efficiency. Bret A. Stewart |
| 1997 | Bridging Fault Diagnosis in the Absence of Physical Information. David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler |
| 1997 | Capacitive Leadframe Testing. Ted T. Turner |
| 1997 | Cell Signal Measurement for High-Density DRAMs. Jörg E. Vollrath |
| 1997 | Current Signatures: Application. Anne E. Gattiker, Wojciech Maly |
| 1997 | DS-LFSR: A New BIST TPG for Low Heat Dissipation. Seongmoon Wang, Sandeep K. Gupta |
| 1997 | Delay Testing with Clock Control: An Alternative to Enhanced Scan. Ramesh C. Tekumalla, Premachandran R. Menon |
| 1997 | Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and I Karim Arabi, Bozena Kaminska |
| 1997 | Design for Primitive Delay Fault Testability. Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar |
| 1997 | Design of Cache Test Hardware on the HP PA8500. Jeff Brauch, Jay Fleischman |
| 1997 | Design, Fabrications and Use of Mixed-Signal IC Testability Structures. Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa |
| 1997 | Development of a MEMS Testing Methodology. Abhijeet Kolpekwar, Ronald D. Blanton |
| 1997 | Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing. Srikanth Venkataraman, W. Kent Fuchs |
| 1997 | Dynamic Testing of ADCs Using Wavelet Transforms. Takahiro J. Yamaguchi, Mani Soma |
| 1997 | Effective Path Selection for Delay Fault Testing of Sequential Circuits. Tapan J. Chakraborty, Vishwani D. Agrawal |
| 1997 | Efficient Identification of Non-Robustly Untestable Path Delay Faults. Zhongcheng Li, Robert K. Brayton, Yinghua Min |
| 1997 | Embedded At-Speed Test Probe. Mitch Aigner |
| 1997 | Embedded Core Test Plug-n-Play: Is It Achievable? Rudy Garcia |
| 1997 | Error Tracer: A Fault-Simualtion-Based Approach to Design Error Diagnosis. Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, David Ihsin Cheng |
| 1997 | Ethics, Professionalism and Accountability in Testing. William R. Simpson |
| 1997 | Experiences with Implementation of I Ralf Arnold, Markus Feuser, Horst-Udo Wedekind, Thorsten Bode |
| 1997 | Experimental Results for Current-Based Analog Scan. Thomas M. Bocek, Tuyen D. Vu, Mani Soma, Jason D. Moffatt |
| 1997 | Fault Diagnosis in Scan-Based BIST. Janusz Rajski, Jerzy Tyszer |
| 1997 | Fault Macromodeling for Analog/Mixed-Signal Circuits. Chen-Yang Pan, Kwang-Ting Cheng |
| 1997 | Fault Model Extension for Diagnosing Custom Cell Fails. Gilbert Vandling, Thomas Bartenstein |
| 1997 | Finding Opens with Optics. Douglas W. Raymond |
| 1997 | Future Management of the Semiconductor Manufacturing Process. James T. Healy |
| 1997 | H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs. Toshiharu Asaka, Masaaki Yoshida, Subhrajit Bhattacharya, Sujit Dey |
| 1997 | HABIST: Histogram-Based Analog Built-In Self-Test. Arnold Frisch, Thomas Almy |
| 1997 | Hardware Compression Speeds on Bitmap Fail Display. Robert Gage, Ben Brown, John Donaldson, Alexander Joffe |
| 1997 | Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao |
| 1997 | High-Performance Production Test Contractors for Fine-Pitch Integrated Circuits. James J. Brandes |
| 1997 | How Seriously Do You Take Your Possible-Detect Faults? Rajesh Raina, Charles Njinda, Robert F. Molyneaux |
| 1997 | I Antoni Ferré, Joan Figueras |
| 1997 | IC Diagnosis: Industry Issues. Jerry M. Soden, Christopher L. Henderson |
| 1997 | IEEE P1149.4-Almost a Standard. Adam Cron |
| 1997 | Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data. James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
| 1997 | Implementation of Mixed Current/Voltage Testing Using the IEEE P1149.4 Infrastructure. José Machado da Silva, Ana C. Leão, José Silva Matos, José Carlos Alves |
| 1997 | Incorporating Physical Design-for-Test into Routing. Richard McGowen, F. Joel Ferguson |
| 1997 | Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins |
| 1997 | Logic Diagnosis-Diversion or Necessity? W. Kent Fuchs |
| 1997 | Logical Diagnosis Solutions Must Drive Yield Improvement. Paul G. Ryan |
| 1997 | Low Current and Low Voltages-The High-End OP AMP Testing Challenge. Bob Cometta, Jan Witte |
| 1997 | Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. David C. Keezer, R. J. Wenzel |
| 1997 | Manufacturing Pattern Development for the Alpha 21164 Microprocessor. Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong |
| 1997 | Memory Test-Debugging Test Vectors Without ATE. Steve Westfall |
| 1997 | Modifying User-Defined Logic for Test Access to Embedded Cores. Bahram Pouya, Nur A. Touba |
| 1997 | Next-Generation PowerPC Carol Pyron, Javier Prado, James Golab |
| 1997 | OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. Yuhai Ma, Wanchun Shi |
| 1997 | On Using Machine Learning for Logic BIST. Christophe Fagot, Patrick Girard, Christian Landrault |
| 1997 | On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops. Benoît R. Veillette, Gordon W. Roberts |
| 1997 | On-Line Testable Logic Desgin for FPGA Implementation. Alfred L. Burress, Parag K. Lala |
| 1997 | On-Line Testing Scheme for Clock's Faults. Cecilia Metra, Michele Favalli, Bruno Riccò |
| 1997 | On-Line Testing for VLSI. Michael Nicolaidis |
| 1997 | Optical Communication Channel Test Using BIST Approaches. Mathieu Gagnon, Bozena Kaminska |
| 1997 | Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. Karim Arabi, Bozena Kaminska |
| 1997 | Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits. Haluk Konuk, F. Joel Ferguson |
| 1997 | P1149.4-Problem or Solution for Mixed-Signal IC Design? Stephen K. Sunter |
| 1997 | Parameterizable Testing Scheme for FIR Filters. Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer |
| 1997 | Parasitic Effect Removal for Analog Measurement in P1149.4 Environment. Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou |
| 1997 | Pentium Adrian Carbine, Derek Feltham |
| 1997 | Pin Margin Analysis. Robert E. Huston |
| 1997 | Plug and Play or Plug and Pray: We Have a Right to Know It Will Work (Or Why It Won't). Colin M. Maunder |
| 1997 | Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997 |
| 1997 | Putting the Squeeze on Test Sequences. Elizabeth M. Rudnick, Janak H. Patel |
| 1997 | RF Introduction and Analog Junction Techniques for Finding Opens. B. Karen McElfresh |
| 1997 | Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. Minh Quach, Kim Harper |
| 1997 | Scan Latch Design for Delay Test. Jacob Savir |
| 1997 | Scan Synthesis for One-Hot Signals. Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey |
| 1997 | Scan-Encoded Test Pattern Generation for BIST. Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski |
| 1997 | Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. Adit D. Singh, Phil Nigh, C. Mani Krishna |
| 1997 | Sequential Test Generation with Advanced Illegal State Search. M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1997 | Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams. Benoit Dufort, Gordon W. Roberts |
| 1997 | Signature Analysis for IC Diagnosis and Failure Analysis. Christopher L. Henderson, Jerry M. Soden |
| 1997 | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | Solder Paste Inspection: Process Control for Defect Reduction. Donald Burr |
| 1997 | Structuring STIL for Incremental Test Development. Gregory A. Maston |
| 1997 | Supervisors for Testing Non-Deterministically Specified Systems. Tony Savor, Rudolph E. Seviora |
| 1997 | System-Level Boundary-Scan in a Highly Integrated Switch. William J. Hughes III |
| 1997 | Test Access of TAP'ed & Non-TAP'ed Cores. Lee Whetsel |
| 1997 | Test Requirements for Embedded Core-Based Systems and IEEE P1500. Yervant Zorian |
| 1997 | Test Strategy Sensitivity to Defect Parameters. Michel Renovell, Yves Bertrand |
| 1997 | Test Width Compression for Built-In Self Testing. Krishnendu Chakrabarty, Jian Liu, Minyao Zhu, Brian T. Murray |
| 1997 | Testability Analysis and ATPG on Behavioral RT-Level VHDL. Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda |
| 1997 | Testability Enhancement for Behavioral Descriptions Containing Conditional Statements. Kelly A. Ockunzzi, Christos A. Papachristou |
| 1997 | Testability Features of AMD-K6 R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma |
| 1997 | Testing the 400-MHz IBM Generation-4 CMOS Chip. Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko |
| 1997 | Testing the Enterprise IBM System/390 Otto A. Torreiter, Ulrich Baur, Georg Goecke, Kevin Melocco |
| 1997 | The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices. Yeoh Eng Hong, Martin Tay Tiong We |
| 1997 | The Case of Partial Scan. Jeff Rearick |
| 1997 | The Fail-Stop Controller AE11. Eberhard Böhl, Thomas Lindenkreuz, R. Stephan |
| 1997 | The Implementation of Pseudo-Random Memory Tests on Commercial Memory Testers. Ad J. van de Goor, Mike Lin |
| 1997 | The Search for the Universal Probe Card Solution. R. Dennis Bates |
| 1997 | Thoughts on Core Integration and Test. Thomas L. Anderson |
| 1997 | To DFT or Not to DFT? Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly |
| 1997 | Transient Power Supply Voltage (V Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins |
| 1997 | Tree-Structured Linear Cellular Automata and Their Applications as PRPGs. J. Li, X. Sun, K. Soon |
| 1997 | Unpowered Opens Test with X-Ray Laminography. Stig Oresjo |
| 1997 | Using BIST Control for Pattern Generation. Gundolf Kiefer, Hans-Joachim Wunderlich |
| 1997 | Vision Inspection: Meeting the Promise? Richard Pye |
| 1997 | Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. Anne Meixner, Jash Banik |
| 1997 | Why Automate Optical Inspection? Douglas W. Raymond, Dominic F. Haigh |
| 1997 | Why Would an ASIC Foundry Accept Anything Less than Full Scan? Steven F. Oakland |
| 1997 | i J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca |