| 1995 | A Bulti-in Self-Test Strategy for Wireless Communication Systems. Benoît R. Veillette, Gordon W. Roberts |
| 1995 | A Comparative Analysis of Input Stimuli for Testing Mixed-Signal LSIs Based on Curent Testing. Yukiya Miura |
| 1995 | A Comparison of Test Requirements, Methods, and Results for Seven MCM Products. Andrew Flint |
| 1995 | A Designer's View of Chip Test. Thomas L. Anderson |
| 1995 | A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins |
| 1995 | A Discussion of Methods for Measuring Low-Amplitude Jitter. Michael K. Williams |
| 1995 | A Fault Model and a Test Method for Analog Fuzzy Logic Circuits. Stefan Weiner |
| 1995 | A Gate-Array-Based 666MHz VLSI Test System. Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino |
| 1995 | A General Purpose ATE Based I Gerald H. Johnson, Jan B. Wilstrup |
| 1995 | A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP). Richard M. Sedmak, John Evans |
| 1995 | A Low-Cost High-Performance CMOS Timing Vernier for ATE. Jim Chapman, Jeff Currin, Steve Payne |
| 1995 | A Methodology to Design Efficient BIST Test Pattern Generators. Chih-Ang Chen, Sandeep K. Gupta |
| 1995 | A New Hardware Fault Insertion Scheme for System Diagnostics Verification. Benoit Nadeau-Dostie, Harry Hulvershorn, Saman Adham |
| 1995 | A New Method for Partial Scan Design Based on Propagation and Justification Requirements of Faults. Insung Park, Dong Sam Ha, Gyoochan Sim |
| 1995 | A Novel Low-Cost Approach to MCM Interconnect Test. Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel |
| 1995 | A Routing Testing of a VLSI Massively Parallel Machine Based on IEEE 1149.1. Chouki Aktouf, Chantal Robach, A. Marinescu |
| 1995 | A Secure Data Transmission Scheme for 1149.1 Backplane Test Bus. Wuudiann Ke, Duy Le, Najmi T. Jarwala |
| 1995 | A Single Board Test System: Changing the Test Paradigm. Garry C. Gillette |
| 1995 | A Test Data Collection System for Uniform Data Analysis. Susan D. Shaye |
| 1995 | A Tester for Design Gary J. Lesmeister |
| 1995 | Advantages of High-Level Test Synthesis over Design for Test. Rabindra K. Roy |
| 1995 | Algorithmic Extraction of BSDL from 1149.1-compliant Sample ICs. Douglas W. Raymond, D. Eugene Wedge, Philip J. Stringer, Harold W. Ng, Suzanne T. Jennings, Craig T. Pynn, Winsor Soule Jr. |
| 1995 | An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. Fabian Vargas, Michael Nicolaidis, Yervant Zorian |
| 1995 | An Effective BIST Scheme for Booth Multipliers. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian |
| 1995 | An Efficient and Economic Partitioning Approach for Testability. Xinli Gu, Krzysztof Kuchcinski, Zebo Peng |
| 1995 | An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey |
| 1995 | An Experimental Chip to Evaluate Test Techniques: Experiment Results. Siyad C. Ma, Piero Franco, Edward J. McCluskey |
| 1995 | Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing. Xavier Haurie, Gordon W. Roberts |
| 1995 | Automated 1.5 GHz Sonet Characterization. Rob Tepper, Jim Tarpo |
| 1995 | Avoiding Unknown States When Scanning Mutually Exclusive Latches. Stephen Pateras, Martin S. Schmookler |
| 1995 | Capacitive Leadframe Testing. Ted T. Turner |
| 1995 | Challenging the "High Performance - High Cost" Paradigm in Test. Ulrich Schoettmer, Toshiyuki Minami |
| 1995 | Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests. Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal |
| 1995 | Compiled Code, Dynamic Worst Case Timing Simulation Tracking Multiple Causality. Kamal K. Varma |
| 1995 | Contract Manufacturing: How Much Can They Do? Tom Langford |
| 1995 | Coping with Re-usability Using Sequential ATPG: A Practical Case Study. Jos van Sas, Erik Huyskens, Hans Naert, Fred Schell, Ad J. van de Goor |
| 1995 | Cost-Effective System-Level Test Strategies. Des Farren, Anthony P. Ambler |
| 1995 | Cutting the Cost of Test; the Value-added Way. William R. Simpson |
| 1995 | DFT & ATPG: Together Again. Ben Mathew, Daniel G. Saab |
| 1995 | Deep Submicron: Is Test Up to the Challenge? Kenneth M. Butler |
| 1995 | Design and Testing of the On-Ramps to the Information Superhighway. Philippe Chauveau |
| 1995 | Deterministic Self-Test of a High-Speed Embedded Memory and Logic Processor Subsystem. Luigi Ternullo Jr., R. Dean Adams, John Connor, Garret S. Koch |
| 1995 | Development of an ATE Test Station for Mixed CATV/TELCO Products. Michael T. Freeman |
| 1995 | Distributed Probabilistic Diagnosis of MCMs on Large Area. Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes |
| 1995 | Dynamic Program Complexity and Software Testing. John C. Munson, Gregory A. Hall |
| 1995 | Dynamic Test Emulation for EDA-Based Mixed-Signal Test Development Automation. Jean Qincui Xia, Tom Austin, Nash Khouzam |
| 1995 | Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules. David C. Keezer |
| 1995 | End-to-End Performance Measurement for Interactive Multimedia Television. Martin A. Schulman |
| 1995 | End-to-End Test Strategy for Wireless Systems. Madhuri Jarwala, Duy Le, Michael S. Heutmaker |
| 1995 | Evaluating Waveform-Generation Capabilities of VLSI Test Systems. Michael G. Davis |
| 1995 | Exact Aliasing Computation for RAM BIST. O. Kebichi, Michael Nicolaidis, Vyacheslav N. Yarmolik |
| 1995 | Failure Analysis for Full-Scan Circuits. Kaushik De, Arun Gunda |
| 1995 | Finding Defects with Fault Models. Robert C. Aitken |
| 1995 | Finding I/O Faults on In-Circuit ICs Using Parasitic Transistor Tests. Jack Ferguson |
| 1995 | From Hardware to Software Testability. Yves Le Traon, Chantal Robach |
| 1995 | Functional Tests for Scan Chain Latches. Samy Makar, Edward J. McCluskey |
| 1995 | Hierarchical Functional-Fault Simulation for High-Level Synthesis. Mark Kassab, Janusz Rajski, Jerzy Tyszer |
| 1995 | High-Level Test Generation Using Symbolic Scheduling. Mark C. Hansen, John P. Hayes |
| 1995 | High-Performance Circuit Testing with Slow-Speed Testers. Vishwani D. Agrawal, Tapan J. Chakraborty |
| 1995 | I Manoj Sachdev |
| 1995 | I Adit D. Singh, Haroon Rasheed, Walter W. Weber |
| 1995 | IC Performance Prediction System. V. Ramakrishnan, D. M. H. Walker |
| 1995 | Implementing 1149.1 in the PowerPC Carol Pyron, William C. Bruce |
| 1995 | Improved Boundary Scan Design. Lee Whetsel |
| 1995 | Improvement of the Defect Level of Micro-computer LSI Testing. Junichi Hirase |
| 1995 | Improving Board and System Test: A Proposal to Integrate Boundary Scan and I Douglas Reed, Jason Doege, Antonio Rubio |
| 1995 | Improving DSP-Based Measurements with Spectral Interpolation. Mark Burns |
| 1995 | In-System Testing of Cache Memories. Janusz Sosnowski |
| 1995 | Increasing Test Throughput Through the Implementation of Parallel Test on a 16-Bit Multimedia Audio CODEC. Harold Bogard, Celeste Repasky |
| 1995 | Inductive Contamination Analysis (ICA) with SRAM Application. Jitendra Khare, Wojciech Maly |
| 1995 | Industrial Relevance of Analog IFA: A Fact or a Fiction. Manoj Sachdev, Bert Atzema |
| 1995 | IntegraTEST: The New Wave in Mixed-Signal Test. Birger Schneider, Soeren Soegaard |
| 1995 | Integrated Test Solutions and Test Economics for MCMs. Kevin T. Kornegay, Kaushik Roy |
| 1995 | Integration of IEEE Std. 1149.1 and Mixed-Signal Test Architectures. David J. Cheek, Ramaswami Dandapani |
| 1995 | Intel 386 Hitesh Ahuja, Dean Arriens, Ben Schneller, Vandana Verma, Wendy Whitman |
| 1995 | Intel and the Myths of Test. Kenneth M. Thompson |
| 1995 | Is High-Level Test Synthesis Just Design for Test? Christian Landrault, Marie-Lise Flottes, Bruno Rouzeyre |
| 1995 | It's DFT, Boundary Scan and Life Cycle Benefits. Gary O'Donnell |
| 1995 | Leave the Wires to Last - Funcitonal Evaluation of the IEEE Std 1149.5 Module Test and Maintenance Bus. Rodham E. Tulloss |
| 1995 | Linking Diagnostic Software to Hardware Self Test in Telecom Systems. Harry Hulvershorn, Paul Soong, Saman Adham |
| 1995 | Low-Complexity Fault Simulation under the Multiplie Observation Time Testing Approach. Irith Pomeranz, Sudhakar M. Reddy |
| 1995 | MCM Quality and Cost Analysis Using Economics Models. Chryssa Dislis, A. F. Al-Ani, Ian P. Jalowiecki |
| 1995 | Matching Models to Real Life for Defect Reduction. James A. Tuttle, Thomas W. Collins, Mary Stone Tuttle |
| 1995 | Non-Robust versus Robust. Alicja Pierzynska, Slawomir Pilarski |
| 1995 | On Combining Design for Testability Techniques. Prashant S. Parikh, Miron Abramovici |
| 1995 | On Efficiently and Reliably Achieving Low Defective Part Levels. Li-C. Wang, M. Ray Mercer, Thomas W. Williams |
| 1995 | On the Effect of I Kenneth M. Wallquist |
| 1995 | On the Use of Neural Networks to Guide Software Testing Activities. Charles Anderson, Anneliese von Mayrhauser, Richard T. Mraz |
| 1995 | Optimal Space Compaction of Test Responses. Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes |
| 1995 | Optimizing Product Profitability - The Test Way. Prab Varma |
| 1995 | Optimizing Test Strategies for SONET/SDH/ATM Network Element Manufacturing. Mark Hoogerbrugge |
| 1995 | Overview of PowerPC Jen-Tien Yen, Marie Sullivan, Carlos Montemayor, Pete Wilson, Richard Evers |
| 1995 | Parallel Delay Fault Coverage and Test Quality Evaluation. Ira Pramanick, Ankan K. Pramanick |
| 1995 | Performance Driven BIST Technique for Random Logic. Charles Njinda, Neeraj Kaul |
| 1995 | Plug & Play I Keith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen |
| 1995 | Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995 |
| 1995 | Production I Gregory A. Maston |
| 1995 | Re-examining the Needs of the Mixed-Signal Test. Gordon W. Roberts |
| 1995 | Report on a Pilot Project Successfully Implementing a Design-to-Test Methodology. Scot Bullock |
| 1995 | Required - A Portable Test Standard. Lawrence D. Carpenter |
| 1995 | STIL from the Users Perspective. Gregory A. Maston |
| 1995 | SiPROBE - A New Technology for Wafer Probing. Karl F. Zimmermann |
| 1995 | Software Test Data Generation Using the Chaining Approach. Roger Ferguson, Bogdan Korel |
| 1995 | Solving Known Good Die (and Substrate) Test Issues. Alan W. Righter |
| 1995 | Structured Design-for-Debug - The SuperSPARC Hong Hao, Rick Avra |
| 1995 | Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say? Keith Baker |
| 1995 | Study on the Costs of On-site VLSI Testing. Junichi Hirase |
| 1995 | Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, Mousumi Mitra Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey |
| 1995 | Synthesis and Retiming for the Pseudo-Exhaustive BIST of Synchronous Sequential Circuits. Samir Lejmi, Bozena Kaminska, Bechir Ayari |
| 1995 | Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST. Nur A. Touba, Edward J. McCluskey |
| 1995 | Synthesized Transparent BIST for Detecting Scrambled Pattern-Sensitive Faults in RAMs. Bruce F. Cockburn, Y.-F. Nicole Sat |
| 1995 | THD and SNR Tests Using the Simplified Volterra Series with Adaptive Algorithms. Luke S. L. Hsieh, Andrew Grochowski |
| 1995 | Telecom Test: New Challenges, Old Roots. James Jamieson |
| 1995 | Test Generation and Design for Test for a Large Multiprocessing DSP. Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell |
| 1995 | Test Point Insertion for an Area Efficient BIST. Claus Schotten, Heinrich Meyr |
| 1995 | Test Quality: Required Stuck-at Fault Coverage with the Use of I Ron Wantuck |
| 1995 | Test SPC: A Process to Improve Test System Integrity. Willie Benitez, Deo Marrero, Douglas J. Mirizzi, Dale Ohmart |
| 1995 | Test Synthesis in the Behavioral Domain. Christos A. Papachristou, Joan Carletta |
| 1995 | Test Synthesis: From Wishful Thinking to Reality. Kamalesh N. Ruparel |
| 1995 | Test Vector Generation for Parametric Path Delay Faults. Mukund Sivaraman, Andrzej J. Strojwas |
| 1995 | Testability, Debuggability, and Manufacturability Features of the UltraSPARC Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam |
| 1995 | Testing a Switching Memory in a Telcommunication System. Stefano Barbagallo, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda |
| 1995 | The Case for Contract Manufacturing. Randall Hassig |
| 1995 | The Final Barriers to Widespread Use of I John M. Acken |
| 1995 | The ITC Lecture Series: An Experiment. Kenneth P. Parker, David Greene |
| 1995 | The Many Faces of Test Synthesis. Peter C. Maxwell |
| 1995 | The P1149.4 Mixed Signal Test Bus: Costs and Benefits. Stephen K. Sunter |
| 1995 | The Use of Linear Models for the Efficient and Accurate Testing of A/D Converters. Peter D. Capofreddi, Bruce A. Wooley |
| 1995 | Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST. Kwang-Ting Cheng, Chih-Jen Lin |
| 1995 | Towards 100% Testable FIR Digital Filters. Laurence Goodby, Alex Orailoglu |
| 1995 | Transient Power Supply Current Testing of Digital CMOS Circuits. Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle |
| 1995 | Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test & Radio Frequency Induction Test. Joe Wrinn |
| 1995 | Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. Th. Calin, F. L. Vargas, Michael Nicolaidis |
| 1995 | User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters. Alex M. Ijaz, Eugene R. Hnatek |
| 1995 | Using the Right Tools and Techniques leads to Successful Testing of MCMs. Andrew Flint |
| 1995 | Visualizing Quality. Solomon Max |
| 1995 | What's So Different about Deep-Submicron Test? Craig Hunter |
| 1995 | Yiel Learning via Functional Test Data. Young-Jun Kwon, D. M. H. Walker |