| 1994 | 1149.1 Scan Control Transport Levels. Robert Gage |
| 1994 | 3B21D BIST/Boundary-Scan System Diagnostic Test Story. Edward C. Behnke |
| 1994 | 500-MHz Testing on a 100-MHz Tester. Didier Wimmers, Kris Sakaitani, Burnell G. West |
| 1994 | A Case Study in the Use of Scan in microSparc Jerry Katz |
| 1994 | A Generic Test and Maintenance Node for Embedded System Test. John D. Lofgren |
| 1994 | A Hierarchical Environment for Interactive Test Engineering. Thomas Burch, Joachim Hartmann, Günter Hotz, M. Krallmann, U. Nikolaus, Sudhakar M. Reddy, Uwe Sparmann |
| 1994 | A Hybrid Fault Simulator for Synchronous Sequential Circuits. Rolf Krieger, Bernd Becker, Martin Keim |
| 1994 | A Practical System for Mutation Testing: Help for the Common Programmer. A. Jefferson Offutt |
| 1994 | A Procedural Interface to Test. Gregory A. Maston |
| 1994 | A Serially Addressable, Flexible Current Monitor for Test Fixture Based I Alan Hales |
| 1994 | A Simulation-Based Protocol-Driven Scan-Test-Design Rule Checker. Edward B. Pitty, Denis Martin, Hi-Kyeung Tony Ma |
| 1994 | A Software Architecture for Mixed-Signal Functional Testing. John A. Masciola, Gerald K. Morgan, Geoffrey L. Templeton |
| 1994 | A Study of I Sreejit Chakravarty, Paul J. Thadikaran |
| 1994 | A Test Methodology to Support an ASEM MCM Foundry. Thomas M. Storey, C. Lapihuska, E. Atwood, L. Su |
| 1994 | A Test Process Optimization and Cost Modeling Tool. Timothy J. Moore |
| 1994 | A Test Retrospection and a Quest for Direction. Robert E. Anderson |
| 1994 | A Test-Clock Reduction Method for Scan-Designed Circuits. Jau-Shien Chang, Chen-Shang Lin |
| 1994 | A Test-System Architecture to Reduce Transmission Line Effects During High-Speed Testing. Marc Mydill |
| 1994 | ASIC Test Cost/Strategy Trade-offs. Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix |
| 1994 | ATPG for Heat Dissipation Minimization During Test Application. Seongmoon Wang, Sandeep K. Gupta |
| 1994 | Achieving +/-30ps Accuracy in the ATE Environment. Dennis Petrich |
| 1994 | Aliasing-free Signature Analysis for RAM BIST. Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi |
| 1994 | An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications. A. K. Lu, Gordon W. Roberts |
| 1994 | An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. Lee Whetsel |
| 1994 | An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms. Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 1994 | An Effective BIST Scheme for Ring-Address Type FIFOs. Yervant Zorian, Ad J. van de Goor, Ivo Schanstra |
| 1994 | An I Chauchin Su, Kychin Hwang, Shyh-Jye Jou |
| 1994 | An Improved Method of ADC Jitter Measurement. Yves Langard, Jean-Luc Balat, Jacques Durand |
| 1994 | An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters. Mustapha Slamani, Bozena Kaminska, Guy Quesnel |
| 1994 | An Intelligent Software-Integrated Environment of IC Testing. Yuning Sun, Xiaoming Wang, Wanchun Shi |
| 1994 | An Off-chip I Hans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts |
| 1994 | An On-Line Data Collection and Analysis System for VLSI Devices at Wafer Probe and Final Test. Gregory W. Papadeas, David Gauthier |
| 1994 | Analogue Fault Simulation Based on Layout-Dependent Fault Models. R. J. A. Harvey, Andrew Mark David Richardson, Eric Bruls, Keith Baker |
| 1994 | Application of Joint Time-Frequency Analysis in Mixed-Signal Testing. Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, Jan Koopmans |
| 1994 | Application of Optoelectronic Techniques to High Speed Testing. Ewa Sokolowska, Bozena Kaminska |
| 1994 | Automated Logic Synthesis of Random-Pattern-Testable Circuits. Nur A. Touba, Edward J. McCluskey |
| 1994 | Automatic Failure-Analysis System for High-Density DRAM. Sangchul Oh, Jae-Ho Kim, Ho-Jeong Choi, Si-Don Choi, Ki Tae Park, Jong-Woo Park, Wha-Joon Lee |
| 1994 | B-algorithm: A Behavioral-Test Generation Algorithm. Chang Hyun Cho, James R. Armstrong |
| 1994 | Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. Mario Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira |
| 1994 | Backplane Test Bus Selection Criteria. Cary Champlin |
| 1994 | Balancing Structured and Ad-hoc Design for Test: Testing of the PowerPC 603 Craig Hunter, E. Kofi Vida-Torku, Johnny J. LeBlanc |
| 1994 | Behavioral-Test Generation using Mixed-Integer Non-linear Programming. R. S. Ramchandani, Donald E. Thomas |
| 1994 | Benchmarking. Kamalesh N. Ruparel |
| 1994 | Built-in System Test and Fault Location. Gordon R. McLeod |
| 1994 | Calculating Error of Measurement on High-Speed Microprocessor Test. Tamorah Comard, Madhukar Joshi, Donald A. Morin, Kimberley Sprague |
| 1994 | Concurrent Engineering with DFT in the Digital System: A Parallel Process. Ralph Sanchez |
| 1994 | Configuring Flip-Flops to BIST Registers. Albrecht P. Stroele, Hans-Joachim Wunderlich |
| 1994 | Control Strategies for Chip-Based DFT/BIST Hardware. Debaditya Mukherjee, Massoud Pedram, Melvin A. Breuer |
| 1994 | Defect Classes - An Overdue Paradigm for CMOS IC. Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson |
| 1994 | Defects, Fault Coverage, Yield and Cost in Board Manufacturing. Mick Tegethoff, Tom Chen |
| 1994 | Design of an Efficient Weighted-Random-Pattern Generation System. Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams |
| 1994 | Designing "Dual-Personality" IEEE 1149.1-Compliant Multi-Chip Modules. Najmi T. Jarwala |
| 1994 | Detection and Correction of Systematic Type 1 Test Errors Through Concurrent Engineering. William R. Kosar |
| 1994 | Development of a CLASS 1 QTAG Monitor. Keith Baker, A. H. Bratt, Andrew Richardson, A. Welbers |
| 1994 | Development of a Solution for Achieving Known-Good-Die. Lina Prokopchak |
| 1994 | Digitizer Error Extraction in the Nonlinearity Test. Luke S. L. Hsieh, Sandeep P. Kumar |
| 1994 | Do You Practice Safe Tests? What We Found Out About Your Habits. Cecil A. Dean, Yervant Zorian |
| 1994 | ECC-On-SIMM Test Challenges. Timothy J. Dell |
| 1994 | Efficient O(sqrt(n)) BIST Algorithms for DDNPS Faults in Dual-Port Memories. Alaaeldin A. Amin, Mohamed Y. Osman, Radwan E. Abdel-Aal, Husni Al-Muhtaseb |
| 1994 | Efficient Test-Response Compression for Multiple-Output Cicuits. Krishnendu Chakrabarty, John P. Hayes |
| 1994 | Ensuring System Traceability to International Standards. Solomon Max |
| 1994 | Environmental Stress Testing with Boundary-Scan. Duy Le, Ivan Karolik, Ronald Smith, A. J. Mcgovern, Chyral Curette, Joseph Ulbin, Michael Zarubaiko, Charles Henry, Lewis Stevens |
| 1994 | Faster, Better, Cheaper: What Does This Mean For The Test Industry? Walt Wilson |
| 1994 | Fastpath: A Path-Delay Test Generator for Standard Scan Designs. Bill Underwood, Wai-On Law, Sungho Kang, Haluk Konuk |
| 1994 | Fault Injection Boundary-Scan Design for Verification of Fault-Tolerant Systems. Savio N. Chau |
| 1994 | Feasibility Study of Smart Substrate Multichip Modules. Anne E. Gattiker, Wojciech Maly |
| 1994 | Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. Mohammed F. AlShaibi, Charles R. Kime |
| 1994 | Full-Symbolic ATPG for Large Circuits. Gianpiero Cabodi, Paolo Camurati, Stefano Quer |
| 1994 | GLFSR - A New Test Pattern Generator for Built-In Self-Test. Dhiraj K. Pradhan, Mitrajit Chatterjee |
| 1994 | Generating March Tests Automatically. Ad J. van de Goor, B. Smit |
| 1994 | Goal-Directed Vector Generation Using Sample ICs. Douglas W. Raymond, Philip J. Stringer, Harold W. Ng, Michael Mitsumata, Robert Burk |
| 1994 | HALT: Bridging the Gap Between Theory and Practice. Cheryl Ascarrunz |
| 1994 | High-Yield Multichip Modules Based on Minimal IC Pretest. William E. Burdick Jr., Wolfgang Daum |
| 1994 | Hybrid Design for Testability Combining Scan and Clock Line Control and Method for Test Generation. Sanghyeon Baeg, William A. Rogers |
| 1994 | Implementation of a Dual-Segment Architecture for a High-Pin-Count VLSI Test System. Michael G. Davis |
| 1994 | Improving Software Testability with Assertion Insertion. Hwei Yin, James M. Bieman |
| 1994 | In-System Timing Extraction and Control Through Scan-Based, Test-Access Ports. André DeHon |
| 1994 | Integration of Design, Manufacturing and Testing. Wojciech Maly |
| 1994 | Is I Scott Davidson |
| 1994 | Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. Alfred L. Crouch, Rick Ramus, Colin M. Maunder |
| 1994 | MCM Test Trade-Offs. Jed Eastman |
| 1994 | Making the Circular Self-Test Path Technique Effective for Real Circuits. Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda |
| 1994 | Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs. Mick Tegethoff, Tom Chen |
| 1994 | Membrane Prove Technology for MCM Known-Good-Die. Toshiaki Ueno, You Kondoh |
| 1994 | Modeling for Structured System Interconnect Test. Frank W. Angelotti |
| 1994 | Modeling the Effect of Ground Bounce on Noise Margin. Mary Sue Haydt, Robert Owens, Samiha Mourad |
| 1994 | Modular Mixed Signal Testing: High Speed or High Resolution. Eric Kushnick |
| 1994 | Multi-Frequency, Multi-Phase Scan Chain. Kee Sup Kim, Len Schultz |
| 1994 | Multichip Module Testing Methodologies: What's In; What's Not. Kenneth E. Posse |
| 1994 | NAND Trees Accurately Diagnose Board-Level Pin Faults. Gordon D. Robinson |
| 1994 | Navigating Test Access in Systems. Lee Whetsel |
| 1994 | Non-Volatile Programmable Devices and In-Circuit Test. Douglas W. Raymond, Dominic F. Haigh, Ray Bodick, Barbara Ryan, Dale McCombs |
| 1994 | Observations on the 1149.x Family of Standards. Kenneth P. Parker |
| 1994 | On Achieving Complete Testability of Synchronous Sequential Circuits with Synchronizing Sequences. Irith Pomeranz, Sudhakar M. Reddy |
| 1994 | On Path-Delay Testing in a Standard Scan Environment. Prab Varma |
| 1994 | On Synthesizing Circuits With Implicit Testability Constraints. Henry Cox |
| 1994 | On the Initialization of Sequential Circuits. Jalal A. Wehbeh, Daniel G. Saab |
| 1994 | Optimizing Boundary Scan in a Proprietary Environment. William Eklow |
| 1994 | Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O. J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor |
| 1994 | Potential Solutions for Benchmarking Issues. Don Sterba |
| 1994 | Practical Test Methods for Verification of the EDRAM. Kent Stalnaker |
| 1994 | Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994 |
| 1994 | QTAG: A Standard for Test Fixture Based I Keith Baker |
| 1994 | Reduced Scan Shift: A New Testing Method for Sequential Circuit. Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita |
| 1994 | Residual Charge on the Faulty Floating Gate MOS Transistor. Simon Johnson |
| 1994 | Roadmap for Extending IEEE 1149.1 for Hierarchical Control of Locally-Stored, Standardized-Command-Set Test Programs. John Andrews |
| 1994 | Sequentially Untestable Faults Identified Without Search ("Simple Implications Beat Exhaustive Search!"). Mahesh A. Iyer, Miron Abramovici |
| 1994 | Simulation Results of an Efficient Defect-Analysis Procedure. Olaf Stern, Hans-Joachim Wunderlich |
| 1994 | Sleuth: A Domain-Based Testing Tool. Anneliese von Mayrhauser, Jeff Walls, Richard T. Mraz |
| 1994 | Structure and Metrology for a Single-wire Analog. Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati |
| 1994 | System Test Cost Modelling Based on Event Rate Analysis. Des Farren, Anthony P. Ambler |
| 1994 | System-Level Testability of Hardware/Software Systems. Harald P. E. Vranken, M. P. J. Stevens, M. T. M. Segers, J. H. M. M. van Rhee |
| 1994 | Techniques for Characterizing DRAMs With a 500-MHz Interface. James A. Gasbarro, Mark Horowitz |
| 1994 | Test Station Workcell Controller and Resource Relationship Design. Scott A. Erjavic |
| 1994 | Test Strategies for a Family of Complex MCMs. Andrew Flint |
| 1994 | Test: The New Value-Added Field. Aart J. de Geus |
| 1994 | Testability Strategy of the ALPHA AXP 21164 Microprocessor. Dilip K. Bhavsar, John H. Edmondson |
| 1994 | Testabilty Features of the MC 68060 Microprocessor. Alfred L. Crouch, Matthew Pressly, Joe Circello |
| 1994 | Testing 256k Word x 16 Bit Cache DRAM (CDRAM). Yasuhiro Konishi, Toshiyuki Ogawa, Masaki Kumanoya |
| 1994 | Testing CMOS Logic Gates for Realistic Shorts. Brian Chess, Anthony Freitas, F. Joel Ferguson, Tracy Larrabee |
| 1994 | Testing High Speed Drams. James A. Gasbarro |
| 1994 | Testing Issues on High Speed Synchronous DRAMs. Wha-Joon Lee |
| 1994 | Testing Two Generations of HDTV Decoders - The Impact of Boundary-Scan. Lars Eerenstein |
| 1994 | The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman |
| 1994 | The IEEE P1149.5 MTM-Bus, A Backplane Test and Initialization Interface. Patrick F. McHugh |
| 1994 | The PowerPC 603 Craig Hunter, Jeff Slaton, Jim Eno, Romesh M. Jessani, Carl Dietz |
| 1994 | Transforming Behavioral Specifications to Facilitate Synthesis of Testable Designs. Sujit Dey, Miodrag Potkonjak |
| 1994 | Transparent Memory Testing for Pattern-Sensitive Faults. Mark G. Karpovsky, Vyacheslav N. Yarmolik |
| 1994 | Ultra Hi-Speed Pin-Electronics and Test Station Using GaAs IC. Takashi Sekino, Toshiyuki Okayasu |
| 1994 | Using SCAN John Andrews |
| 1994 | Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. Eric Bruls |
| 1994 | When Does It Make cents to Give Up Physical Test Access? David A. Greene |
| 1994 | microSPARC Kalon Holdbrook, Sunil Joshi, Samir Mitra, Joe Petolino, Renu Raman, Michelle Wong |