| 1993 | "In System" Transparent Autodiagnostics of Rams. Janusz Sosnowski |
| 1993 | A BIST Scheme for an SNR Test of a Sigma-Delta ADC. Michael F. Toner, Gordon W. Roberts |
| 1993 | A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC. Eiichi Teraoka, Toru Kengaku, Ikuo Yasui, Kazuyuki Ishikawa, Takahiro Matsuo, Hideyuki Wakada, Narumi Sakashita, Yukihiko Shimazu, Takeshi Tokuda |
| 1993 | A Comparison of Stuck-At Fault Coverage and I Paul C. Wiscombe |
| 1993 | A Conditional Resource-Sharing Method for Behavior Synthesis of Highly- Testable Data Paths. Tien-Chien Lee, Niraj K. Jha, Wayne H. Wolf |
| 1993 | A Flexible Approach to Data Collection for Component Test Systems. Jim Mosley III |
| 1993 | A General Purpose I Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins |
| 1993 | A Learning-Based Method to Match a Test Pattern Generator to a Circuit-Under-Test. Irith Pomeranz, Sudhakar M. Reddy |
| 1993 | A Method for Delay Fault Self-Testing of Macrocells. Harold N. Scholz, Duane R. Aadsen, Yervant Zorian |
| 1993 | A Method for Reducing the Search Space in Test Pattern Generation. Mitsuo Teramoto |
| 1993 | A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits. Jayashree Saxena, Dhiraj K. Pradhan |
| 1993 | A New Approach for PLL Characterization on Mixed Signal ATE. Shinichi Kimura, Makoto Kimura, Takayuki Nakatani, Masao Sugai |
| 1993 | A Novel Instrument for Accurate Time Measurement in Automatic Calibration of Test Systems. Richard K. Feldman |
| 1993 | A Serial-Scan Test-Vector-Compression Methodology. Chauchin Su, Kychin Hwang |
| 1993 | A Synthesis Approach to Design for Testability. Suman Kanjilal, Srimat T. Chakradhar, Vishwani D. Agrawal |
| 1993 | A Test Methodology for VLSI Chips on Silicon. Thomas M. Storey |
| 1993 | A Universal Framework for Managed Built-in Test. Colin M. Maunder |
| 1993 | Algorithms for Cost Optimised Test Strategy Selection. Chryssa Dislis, J. H. Dick, Anthony P. Ambler |
| 1993 | An ALU-Based Programmable MISR/Pseudorandom Generator for a MC68HC11 Family Self-Test. James Broseghini, Donald H. Lenhert |
| 1993 | An Implicit Delay-Fault Simulation Method with Approximate Detection Threshold Calculation. D. Dumas, Patrick Girard, Christian Landrault, Serge Pravossoudovitch |
| 1993 | Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling. Naim Ben-Hamida, Bozena Kaminska |
| 1993 | Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò |
| 1993 | Application of Statistical Techniques to Critical System Parameters. Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz |
| 1993 | Automated Testing of Open Software Standards. James F. Leathrum, K. A. Liburdy |
| 1993 | Automated Wafer Lot Approval: A Statistically Based Implementation. Kurt A. Milne |
| 1993 | Automatic Test Plan Generation for Analog and Mixed Signal Integrated Circuits using Partial Activation and High Level Simulation. Ravindranath Naiknaware, G. N. Nandakumar, Srinivasa Rao Kasa |
| 1993 | Automotive Industry: The Next DFT Challenge. Michael S. Ledford |
| 1993 | BIST and Delay Fault Detection. Slawomir Pilarski, Alicja Pierzynska |
| 1993 | BIST for 1149.1-Compatible Boards: A Low-Cost and Maximum-Flexibility Solution. José Manuel Martins Ferreira, Manuel G. Gericota, José L. Ramalho, Gustavo R. Alves |
| 1993 | BIST for Embedded Static RAMs with Coverage Calculation. Jos van Sas, Geert van Wauwe, Erik Huyskens, Dirk Rabaey |
| 1993 | BP-1992 A Comparison of Defect Models for Fault Location with I Robert C. Aitken |
| 1993 | Benefits of Boundary-Scan to In-Circuit Test. David A. Greene |
| 1993 | Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. Peter C. Maxwell, Robert C. Aitken |
| 1993 | Built-In Current Sensor for I Ching-Wen Hsue, Chih-Jen Lin |
| 1993 | CAD-Driven High-Precision E-Beam Positioning. Kent Kwang, Hsin Wang, Arthur Hu, Mitsuyuki Asaki, Hironobu Niijima |
| 1993 | CHEETA: Composition of Hierarchical Sequential Tests Using ATKET. Praveen Vishakantaiah, Jacob A. Abraham, Daniel G. Saab |
| 1993 | CMOS Bridges and Resistive Transistor Faults: I Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser |
| 1993 | Calculatoin of Multiple Sets of Weights for Weighted-Random Testing. Michael Bershteyn |
| 1993 | Catch the Ground Bounce Before It Hits your System. E. Kurzweil, M. Lallement, R. Blanc, R. Pasquinelli |
| 1993 | Certification Trails and Software Design for Testability. Gregory F. Sullivan, Dwight S. Wilson, Gerald M. Masson |
| 1993 | Characterization of Edge Placement Accuracy in High-Speed Digital Pin Electronics. Will Creek |
| 1993 | Control and Observation of Analog Nodes in Mixed-Signal Boards. José Silva Matos, Ana C. Leão, João Canas Ferreira |
| 1993 | Creating A Mixed-Signal Simulation Capability for Concurrent IC Design and Test Program Development. Tom Austin |
| 1993 | Cultural Evolution in Software Testing. Alex Elentukh |
| 1993 | DELTEST: Deterministic Test Generation for Gate-Delay Faults. Udo Mahlstedt |
| 1993 | DFT: Profit or Loss -- A Position Paper. Jon Turino |
| 1993 | DOs and DON'Ts in Computing Fault Coverage. Miron Abramovici |
| 1993 | Delay Testing Using a Matrix of Accessible Storage. Prab Varma, Tushar Gheewala |
| 1993 | Delay Testing for Non-Robust Untestable Circuits. Kwang-Ting Cheng, Hsi-Chuan Chen |
| 1993 | Design and Test: What Will It Take to Tie the Knot? Joseph B. Costello |
| 1993 | Design for Testability of a Modular, Mixed Signal Family of VLSI Devices. Ed Flaherty, Andrew Allen, John Morris |
| 1993 | Design of Scan-Based Path-Delay-Testable Sequential Circuits. Ankan K. Pramanick, Sandip Kundu |
| 1993 | Design-For-Test Techniques Utilized in an Avionics Computer MCM. Russell J. Wagner, Joel A. Jorgenson |
| 1993 | Design-For-Testability Economics. Carl W. Thatcher |
| 1993 | Development of Fault Model and Test Algorithms for Embedded DRAMs. Manoj Sachdev, Math Verstraelen |
| 1993 | Differential Virtual Instrumentation with Continuously. Bryan J. Dinteman, Paul Botsford |
| 1993 | Distributed Implementation of an ATPG System Using Dynamic Fault Allocation. Maria José Aguado, Eduardo de la Torre, Miguel Miranda, Carlos A. López-Barrio |
| 1993 | Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler |
| 1993 | Efficient Testing of Software Modifications. Anneliese von Mayrhauser, Kurt M. Olender |
| 1993 | Experience in Diagnosing a Remote, Tele-Controlled Unit Using the AITEST Expert System. Israel Beniaminy, Moshe Ben-Bassat, M. Bodenheimer, M. Eshel |
| 1993 | Extraction of Coupled SPICE Models for Packages and Interconnects. Scott Diamond, Bo Janko |
| 1993 | FFT Based Troubleshooting of 120dB Dynamic Range ADC Systems. David Ownby, Harold Bogard |
| 1993 | Fast and Accurate CMOS Bridging Fault Simulation. Jeff Rearick, Janak H. Patel |
| 1993 | Fault Coverage of DC Parametric Tests for Embedded Analog Amplifiers. Mani Soma |
| 1993 | Fault Diagnosis of Flash ADC using DNL Test. Anchada Charoenrook, Mani Soma |
| 1993 | Fault Location Algorithms for Repairable Embedded. Robert P. Treuer, Vinod K. Agarwal |
| 1993 | Generated in Real-time Instant Process Statistics ("GRIPS"): Immediate, Tester-computed Test Statistics, Eliminating the Post-processing of Datalogs. John O'Donnell |
| 1993 | Generation of Compact Delay Tests by Multiple-Path Activation. Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal |
| 1993 | Generation of Optimized Single Distributions of Weights for Random Built-in Self-Test. Miguel Miranda, Carlos A. López-Barrio |
| 1993 | Hierarchically Accessing 1149.1 Applications in a System Environment. Lee Whetsel |
| 1993 | High-Speed Sampling Capability for a VLSI Mixed-Signal Tester. Paul Sakamoto, Tom Chiu |
| 1993 | IEEE 1149 Standards - Changing Testing, Silicon to Systems. Rodham E. Tulloss |
| 1993 | IEEE 1149.1 Growing Pains. Wayne T. Daniel |
| 1993 | IEEE 1149.1: How to Justify Implementation. Mick Tegethoff |
| 1993 | IEEE P1149.5 to 1149.1 Data and Protocol Conversion. Christopher Poirier |
| 1993 | IRIDIUM Cary Champlin |
| 1993 | Implementation of Parallelsite Test on an 8Bit Configurable Microcontroller. Douglas J. Mirizzi, Willie Jerrels, Dale Ohmart |
| 1993 | Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. Danial J. Neebel, Charles R. Kime |
| 1993 | Integrating Electrical Test into Final Assembly. Hugh Littlebury, Roger Brueckner |
| 1993 | Keep Alive - A New Requirement for High Performance uProcessor Test. Rudy Garcia |
| 1993 | Knowledge-Based Testing. Himanshu Kumar, Scott A. Erjavic |
| 1993 | Known Godd Die for MCMs: Enabling Technologies. David C. Keezer |
| 1993 | Let's Grade ALL the Faults. Peter C. Maxwell |
| 1993 | MCM Foundry Test Methodology and Implementation. Lynn Roszel |
| 1993 | Minimizing Test Time by Exploiting Parallelism in Macro Test. Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker |
| 1993 | Mix Test: A Mixed-Signal Extension to a Digital Test System. R. Mehtani, Bert Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra |
| 1993 | Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits. Yves Bertrand, Frédéric Bancel, Michel Renovell |
| 1993 | Multiple Fault Diagnosis in Printed Circuit Boards. S. J. Barnfield, Will R. Moore |
| 1993 | Mutation-Based Testing of Concurrent Programs. Richard H. Carver |
| 1993 | Novel Test Pattern Generators for Pseudo-Exhaustive Testing. Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A. Breuer |
| 1993 | On Accurate Modeling and Efficient Simulation of CMOS Opens. Chennian Di, Jochen A. G. Jess |
| 1993 | On Selecting Flip-Flops for Partial Reset. Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab |
| 1993 | On the Design for Testability of Communication Software. Samuel T. Chanson, Antonio Alfredo Ferreira Loureiro, Son T. Vuong |
| 1993 | On the Evaluation of Software Inspections and Tests. Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege |
| 1993 | PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik |
| 1993 | Parameter Monitoring: Advantages and Pitfalls. M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess |
| 1993 | Partial Scan Using Reverse Direction Empirical Testability. Kee Sup Kim, Charles R. Kime |
| 1993 | Partial Scan at the Register-Transfer Level. Johannes Steensma, Francky Catthoor, Hugo De Man |
| 1993 | Position Statement: ITC93 Boundary-Scan Panel. Colin M. Maunder |
| 1993 | Practical Application of Statistical Process Control in Semiconductor Manufacturing. Brian Beck |
| 1993 | Practical Considerations for Mixed-Signal Test Bus. Nai-Chi Lee |
| 1993 | Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993 |
| 1993 | Quality Testing Requires Quality Thinking. Jerry M. Soden, Charles F. Hawkins |
| 1993 | Quality and Single-Stuck Faults. Edward J. McCluskey |
| 1993 | Realizing a High Measure of Confidence for Defect Level Analysis of Random Testing. Paresh Gondalia, Allan Gutjahr, Wen-Ben Jone |
| 1993 | Scan DFT: Why More Can Cost Less. Prab Varma |
| 1993 | Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. Udo Mahlstedt, Jürgen Alt |
| 1993 | Software Regression Testing Success Story. Michael A. Long |
| 1993 | Structure and Metrology for an Analog Testability Bus. Kenneth P. Parker, John E. McDermid, Stig Oresjo |
| 1993 | Structured CBIST in ASICs. Robert Gage |
| 1993 | Switch-Level ATPG Using Constraint-Guided Line Justification. Eun Sei Park, M. Ray Mercer |
| 1993 | Synthesizing for Scan Dependence in Built-In Self-Testable Desings. LaNae J. Avra, Edward J. McCluskey |
| 1993 | System Level Interconnect Test in a Tristate Environment. Frank W. Angelotti, Wayne A. Britson, Kerry T. Kaliszewski, Steve M. Douskey |
| 1993 | Technology Independent Boundary Scan Synthesis (Technology and Physical Issues). Markus Robinson, Frédéric Mailhot, Jim Konsevich |
| 1993 | Terminating Transmission lines in the Test Environment. Richard F. Herlein |
| 1993 | Test Features of the HP PA7100LC Processor. Don Douglas Josephson, Daniel J. Dixon, Barry J. Arnold |
| 1993 | Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits. Eugeni Isern, Joan Figueras |
| 1993 | Test Pattern Generation with Restrictors. M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1993 | Test Synthesis from a User Perspective. Gunnar Carlsson |
| 1993 | Testability Features of the SuperSPARC Rajiv Patel, Krishna Yarlagadda |
| 1993 | Testable Programmable Digital Clock Pulse Control Elements. Kenneth D. Wagner, Bernd Könemann |
| 1993 | Testing Fully Testable Systems: A Case Study. John W. Sheppard |
| 1993 | The Cost of Quality: Reducing ASIC Defects with I Rick Gayle |
| 1993 | The Economics of Guardband Placement. Richard H. Williams, Charles F. Hawkins |
| 1993 | The Evolving Role of Testing in Open Systems Standards. James F. Leathrum, K. A. Liburdy |
| 1993 | The Impact of Commercial Off-The-Shelf (COTS) Equipment on System Test and Diagnosis. William R. Simpson, John W. Sheppard |
| 1993 | The Standard Mirror Boards (SMBs) Concept - An Innovative Improvement of Traditional ATE for up to 10 Mil Bare Board Testing. Christophe Vaucher, Louis Balme |
| 1993 | Timing Analyzer for Embedded Testing. Arnold Frisch, Thomas Almy |
| 1993 | Tools and Techniques for Converting Simulation Models into Test Patterns. Tony Taylor |
| 1993 | Towards a Test Standard for Board and System Level Mixed-Signal Interconnects. Carl W. Thatcher, Rodham E. Tulloss |
| 1993 | Using Boundary Scan Test to Test Random Access Memory Clusters. Math Muris, Alex S. Biewenga |
| 1993 | Utilizing Boundary Scan to Implement BIST. Tom Langford |
| 1993 | VINCI: Secure Test of a VLSI High-Speed Encryption System. Heinz Bonnenberg, Andreas Curiger, Norbert Felber, Hubert Kaeslin, Reto Zimmermann, Wolfgang Fichtner |
| 1993 | Very-Low-Voltage Testing for Weak CMOS Logic ICs. Hong Hao, Edward J. McCluskey |
| 1993 | Visualizing Test Information: A Novel Approach for Improving Testability. Jan Moorman, Steven D. Millman |
| 1993 | Workstation Based Parallel Test Generation. Robert H. Klenke, Lori M. Kaufman, James H. Aylor, Ronald Waxman, Padmini Narayan |
| 1993 | i J. S. Beasley, H. Ramamurthy, Jaime Ramírez-Angulo, Mark DeYong |