| 1992 | A 3GHz, 144 Point Probe Fixture for Automatic IC Wafer Testing. Daniel T. Hamling |
| 1992 | A Boundary Scan Test Controller for Hierarchical BIST. José M. M. Ferreira, Filipe S. Pinto, José Silva Matos |
| 1992 | A Comparison of Defect Models for Fault Location with I Robert C. Aitken |
| 1992 | A Fast Testing Method for Sequential Circuits at the State Trasition Level. Wei-Lun Wang, Jhing-Fa Wang, Kuen-Jong Lee |
| 1992 | A Framework for Boundary-Scan Based System Test Diagnosis. Najmi T. Jarwala, Paul Stiling, Enn Tammaru, Chi W. Yau |
| 1992 | A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination. Sungju Park, Sheldon B. Akers |
| 1992 | A Method of Jitter Measurement. Eric Rosenfeld |
| 1992 | A Mixed Signal Analog Test Bus Framework. Richard Hulse |
| 1992 | A Proposed Method of Accessing 1149.1 in a Backplane Environment. Lee Whetsel |
| 1992 | A Self-Testing and Self-Repairing Structure for Ultra-Large Capacity Memories. Tom Chen, Glen Sunada |
| 1992 | A Simulation Environment for Early Lifecycle Software Reliability Research and Prediction. Anneliese von Mayrhauser, James Keables |
| 1992 | A Small Test Generator for Large Designs. Sandip Kundu, Leendert M. Huisman, Indira Nair, Vijay S. Iyengar, Lakshmi N. Reddy |
| 1992 | A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler |
| 1992 | A Structure for Board-Level Mixed-Signal Testability. Brian R. Wilkins |
| 1992 | A Study of the Error Behavior of a 32-bit RISC Subjected to Simulated Transient Fault Injection. Marcus Rimén, Joakim Ohlsson |
| 1992 | A Suite of Novel Digital ATE Timing Calibration Methods. Herbert Thaler, Lee Holt |
| 1992 | A Test Generation Methodology for High-Performance Computer Chips and Modules. Bernd Könemann, Phil Noto |
| 1992 | A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter. Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsunori Suma, Kazuyasu Fujishima |
| 1992 | A VXI Driver-Sensor Instrument with Large Tester Architecture. Matthew L. Fichtenbaum, Robert J. Muller |
| 1992 | AC Dynamic Testing of 20Bit Sigma-Delta Over-Sampling D/A Converter on a Mixed Signal Test System. Masao Sugai, Takayuki Nakatani |
| 1992 | AC Test Quality: Beyond Transition Fault Coverage. Yaron Aizenbud, Paul Chang, Moshe Leibowitz, Dave Smith, Bernd Könemann, Vijay S. Iyengar, Barry K. Rosen |
| 1992 | ACCORD: Automatic Catching and CORrection of Logic Design Errors in Combinatorial Circuits. Pi-Yu Chung, Ibrahim N. Hajj |
| 1992 | Advances in Membrane Probe Technology. January Kister, Robert L. Franch |
| 1992 | All Tests for a Fault Are Not Equally Valuable for Defect Detection. Rohit Kapur, Jaehong Park, M. Ray Mercer |
| 1992 | Amdahl Corporation Board Delay Test System. Bejoy G. Oomman, Prasad Kongara, Chittaranjan Mallipeddi |
| 1992 | An ATPG Driver Selection Algorithm for Interconnect Test with Boundary Scan. Wei-Cheng Her, Lin-Ming Jin, Yacoub M. El-Ziq |
| 1992 | An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics. Robert Trahan, Rex Kiang |
| 1992 | An Architecture for a Reconfigurable IEEE 1149.n Master Controller Board. Kevin T. Kornegay, Robert W. Brodersen |
| 1992 | An Automated Optical On-Wager Probing System for Ultra-High-Speed ICs. Mitsuru Shinagawa, Tadao Nagatsuma |
| 1992 | An Evaluation of I K. Sawada, S. Kayano |
| 1992 | An Instruction Sequence Assembling Methodology for Testing Microprocessors. Jaushin Lee, Janak H. Patel |
| 1992 | An Integrated Built-In Self-Testing and Self-Repair of VLSI/WSI Hexagonal Arrays. Pinaki Mazumder |
| 1992 | An Open Modular Test Concept for the DSP KISS-16Vs. Joachim Preißner, G.-H. Huaman-Bollo, Gisela Mahlich, Johannes Schuck, Hans Sahm, P. Weingart, Dirk Weinsziehr, J. Yeandel, R. Evans |
| 1992 | Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò |
| 1992 | Applications of the IEEE P1149.5 Module Test and Maintenance Bus. David L. Landis, Chuck Hudson, Patrick F. McHugh |
| 1992 | Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults. Matthew Melton, Franc Brglez |
| 1992 | Automatic Test Program Generation for Mixed Signal ICs via Design to Test Link. William Kao, Jean Xia, Tom Boydston |
| 1992 | BIST Techniques for ASIC Design. Gordon R. Mc Leod |
| 1992 | Board Test DFT Model for Computer Products. Mick Tegethoff, T. E. Figal, S. W. Hird |
| 1992 | Boundary Scan Testing for Multichip Modules. Stephen C. Hilla |
| 1992 | Bridging Defects Resistance Measurements in a CMOS Process. Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls |
| 1992 | CCD Image Sensor Test Using Cellular Automation-Type Pattern Recognition System. Haruo Kato |
| 1992 | CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò |
| 1992 | COM (Cost Oriented Memory) Testing. T. Yamada, Akihiro Fujiwara, Michiko Inoue |
| 1992 | Calibration Techniques for a Gigahertz Test System. David C. Keezer, R. J. Wenzel |
| 1992 | Can Concurrent Checkers Help BIST? Sandeep K. Gupta, Dhiraj K. Pradhan |
| 1992 | Circuit Design for Built-in Current Testing. Yukiya Miura, Kozo Kinoshita |
| 1992 | Correlation of Capacitive Load Delay. Ran Edeleman, Ishai Kreiser |
| 1992 | DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements. R. Scharf, Claus Kuntzsch, Klaus Helmreich, Werner Wolz, Klaus D. Müller-Glaser |
| 1992 | Delay Test: The Next Frontier for LSSD Test Systems. Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, T. Williams |
| 1992 | Design Verification of a High Density Computer Using IEEE 1149.1. Wayne T. Daniel |
| 1992 | Design for Test Approaches to Mixed-Signal Testing. Madhuri Jarwala |
| 1992 | Design for Testability Using Architectural Descriptions. Vivek Chickermane, Jaushin Lee, Janak H. Patel |
| 1992 | Designing for Software Testability Using Automated Oracles. James M. Bieman, Hwei Yin |
| 1992 | Detection of "Undetectable" Faults Using I Ravi K. Gulati, Weiwei Mao, Deepak K. Goel |
| 1992 | Diagnostic Fault Simulation of Sequential Circuits. Elizabeth M. Rudnick, W. Kent Fuchs, Janak H. Patel |
| 1992 | Does Object-Oriented Programming Fit in the Real World of ATE? Richard S. Levy |
| 1992 | EDIF Test - The Upcoming Standard for Test Data Transfers. Michael G. Wahl, Carol Pyron |
| 1992 | Economic Impact of Type I Test Errors at System and Board Levels. Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins |
| 1992 | Enhanced Probe Card Facilities At-Speed Wafer Probing in Very High Density Applications. Eswar Subramanian, Randy Nelson |
| 1992 | Functional Testing of Current Microprocessors (applied to the Intel i860 Ad J. van de Goor, Th. J. W. Verhallen |
| 1992 | Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski |
| 1992 | HIST: A Methodology for the Automatic Insertion of a Hierarchical Self Test. Oliver F. Haberl, Thomas Kropf |
| 1992 | High Performance Monolithic Verniers for VLSI Automatic Test Equipment. R. Warren Necoechea |
| 1992 | High Performance Pin Electronics with GaAs, A Contradiction in Terms? Ulrich Schoettmer, Holger Engelhard |
| 1992 | High Quality Testing of Embedded RAMs Using Circular Self-Test Path. Andrzej Krasniewski, Slawomir Pilarski |
| 1992 | High-Performance CMOS-Based VLSI Testers: Timing Control and Compensation. Jim Chapman |
| 1992 | I Roger Perry |
| 1992 | IDA: A Tool for Computer-Aided Failure Analysis. Alan C. Noble |
| 1992 | IEEE 1149.1 Applied to Mixed TTL-ECL and Differential Logic. John Andrews |
| 1992 | Impact of Boundary Scan Design on Delay Test. E. Kofi Vida-Torku |
| 1992 | Implementing 1149.1 on CMOS Microprocessors. William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns |
| 1992 | Improving Total IC Design Quality Using Application Mode Testing. R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker |
| 1992 | In-Process Inspection Technique for Active-Matrix LCD Panels. Takashi Kido |
| 1992 | Intelligent Fault Localization in Software. Ilene Burnstein, Nitya Jani, Steve Mannina, Joe Tamsevicius, Michael Goldshteyn, Louis Lendi |
| 1992 | Interconnect and Delay Testing with a 4800-Pin Board Tester. Shuichi Kameyama, Hideyuki Ohara, Chihiro Endo, Naoki Takayama |
| 1992 | Is Burn-In Burned-Out - Part 2. Noel E. Donlin |
| 1992 | Is IEEE 1149.1 Boundary Scan Cost Effective: A Simple Case Study. Barry Caldwell, Tom Langford |
| 1992 | LSSD Compatible and Concurrently Testable Ram. Hideshi Maeno, Koji Nii, S. Sakayanagi, S. Kato |
| 1992 | MCM Test Using Available Technology. David C. Keezer |
| 1992 | Macro Testability: The Results of Production Device Applications. Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker |
| 1992 | Memory Interconnection Test at Board Level. Frans G. M. de Jong, Adriaan J. de Lind van Wijngaarden |
| 1992 | Merging Concurrent Checking and Off-line BIST. Xiaoling Sun, Micaela Serra |
| 1992 | Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus |
| 1992 | Non-Conventional Faults in BiCMOS Digital Circuits. Siyad C. Ma, Edward J. McCluskey |
| 1992 | On the Design of Self-Checking Boundary Scannable Boards. Marcelo Lubaszewski, Bernard Courtois |
| 1992 | One-Pass Redundancy Identification and Removal. Miron Abramovici, Mahesh A. Iyer |
| 1992 | Optimal Sequencing of Scan Registers. Sridhar Narayanan, Charles Njinda, Melvin A. Breuer |
| 1992 | Optimized BIST Strategies for Programmable Data Paths Based on Cellular Automata. Jos van Sas, Francky Catthoor, Hugo De Man |
| 1992 | Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò |
| 1992 | Parity-Scan Design to Reduce the Cost of Test Application. Hideo Fujiwara, Akihiro Yamamoto |
| 1992 | Physical DFT for High Coverage of Realistic Faults. M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira |
| 1992 | Position of Component Testing in Total Quality Management (TQM). Babur Mustafa Pulat, Lauren M. Streb |
| 1992 | Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992 |
| 1992 | Progress in DFT: A Personal View. Ben Bennetts |
| 1992 | Recursive Learning: An Attractive Alternative to the Decision Tree for Test Genration in Digital Circuits. Wolfgang Kunz, Dhiraj K. Pradhan |
| 1992 | Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults. Weiwei Mao, Michael D. Ciletti |
| 1992 | ScanBIST: A Multi-frequency Scan-based BIST Method. Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan |
| 1992 | Self-Test Scheduling with Bounded Test Execution. Albrecht P. Stroele |
| 1992 | Sequential Circuit Diagnosis Based on Formal Verification Techniques. Gianpiero Cabodi, Paolo Camurati, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda |
| 1992 | Sequential Redundancy Identification Using Verification Techniques. John Moondanos, Jacob A. Abraham |
| 1992 | Sequential Test Generation Based on Real-Value Logic. Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi |
| 1992 | Simulation of an Integrated Design and Test Environment for Mixed-Signal Integrated Circuits. Stephen C. Bateman, William H. Kao |
| 1992 | Skewed-Load Transition Test: Part 1, Calculus. Jacob Savir |
| 1992 | Skewed-Load Transition Test: Part 2, Coverage. Srinivas Patil, Jacob Savir |
| 1992 | Software Testing: Opportunity and Nightmare. Anneliese von Mayrhauser |
| 1992 | Software Testing: Theory and Practice. Simeon C. Ntafos |
| 1992 | Successful Implementation of SPC in Semiconductor Final Test. Sarkis Ourfalian |
| 1992 | System Perspective on Diagnostic Testing. William R. Simpson, John W. Sheppard |
| 1992 | System Test: What is it? Why Bother Defining It? Maury A. Smeyne |
| 1992 | System Testing: The Future for All of Us. Charles F. Hawkins |
| 1992 | TGEN: Flexible Timing Generator Architecture. Timothy Alton |
| 1992 | Test Generation and Concurrent Error Detection in Current-Mode A/D Converters. Shoba Krishnan, Sondes Sahli, Chin-Long Wey |
| 1992 | Test/Agent: CAD-integrated Automatic Generation of Test Programs. R. Arnold, Michael Chowanetz, Werner Wolz, Klaus D. Müller-Glaser |
| 1992 | Testable Designs of Sequential Circuits Under Highly Observable Condition. Xiaoqing Wen, Kozo Kinoshita |
| 1992 | Testing Errors: Data and Calculations in an IC Manufacturing Process. Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins |
| 1992 | Testing Video Processors. Paul Kelley |
| 1992 | Testing a DSP-Based Mixed-Signal Telecommunications Chip. Paul Astrachan, Todd Brooks, Jody Everett, Wai-On Law, Kenneth McIntyre, Chuong Nguyen, Charles Weng |
| 1992 | The Advanced Test System Architecture Provides Fast and Accurate Test for a High Resolution ADC. Akinori Maeda |
| 1992 | The Effectiveness of I Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang |
| 1992 | The Great ATE Robbery. Andrew Rappaport |
| 1992 | The Production Implementation of a Linear Error Modeling Technique. Timothy Daniel Lyons |
| 1992 | The Reality of Object Oriented Solutions for ATE. James R. Ward |
| 1992 | Time-to-Market: An Issue in Mixed-signal vs. Analogue. Keith Baker |
| 1992 | Timing-Per-Pin Flexibility at Shared-Resource Cost. Gary Fehr |
| 1992 | Transistor Fault Coverage for Self-Testing CMOS Checkers. Peter Lidén, Peter Dahlgren, Jan Torin |
| 1992 | Transition Fault Simulation for Sequential Circuits. Kwang-Ting Cheng |
| 1992 | Transparent BIST for RAMs. Michael Nicolaidis |
| 1992 | Using EDIF for Transfer of Test Data: Practical Experience. Bas Verhelst, Richard Morren, Keith Baker |
| 1992 | Using Tester Repeatability to Improve Yields. Robert James Montoya |
| 1992 | VECTOR (Virtual Edge Connector Test): A Strategy to Increase TPS Fault Coverage Without Adding Test Vectors. Gaspare Pantano, Dave Rolince |
| 1992 | Warning: 100% Fault Coverage May Be Misleading!! Miron Abramovici, Prashant S. Parikh |