| 1988 | : A Parallel Algorithm for Fault Simulation on the Connection Machine. Vinod Narayanan, Vijay Pitchumani |
| 1988 | : Test Scheduling for High Performance VLSI System Implementations. John Y. Sayah, Charles R. Kime |
| 1988 | A BIST Design of Structured Arrays with Fault-Tolerant Layout. Mehdi Katoozi, Mani Soma |
| 1988 | A High Level Approach to Integrating Design and Test. John Ivie |
| 1988 | A High-Resolution Waveform Analysis Tool. Patrick M. Powers |
| 1988 | A Knowledge Representation Scheme for DFT. Desmond F. D'Souza |
| 1988 | A Method to Generate Tests for Combinational Logic Circuits Using an Ultra-High-Speed Logic Simulator. Fumiyasu Hirose, Koichiro Takayama, Nobuaki Kawato |
| 1988 | A New Framework for Designing and Analyzing BIST Techniques: Computation of Exact Aliasing Probability. Sandeep K. Gupta, Dhiraj K. Pradhan |
| 1988 | A Realistic Self-Test Machine for Static Random Access Memories. Frans P. M. Beenker, Rob Dekker, Loek Thijssen |
| 1988 | A Strategy for Generating Functional Tests from Device Simulations. Cristopher Merritt |
| 1988 | A Test and Maintenance Controller for a Module Containing Testable Chips. Melvin A. Breuer, Jung-Cheun Lien |
| 1988 | An Advanced Data Compaction Approach for Test During Burn-In. Birger Schneider, Peter Oestergaard |
| 1988 | An Algorithmic Branch and Bound Method for PLA Test Pattern Generation. Markus Robinson, Janusz Rajski |
| 1988 | An Expert Test Program Generation System for Per-Pin Testers. A. Walter, Y. Kleinman, L. Edelshteyn, Jeff Gartner |
| 1988 | An Incomplete Scan Design Approach to Test Generation for Sequential Machines. Hi-Keung Tony Ma, A. Richard Newton, Srinivas Devadas, Alberto L. Sangiovanni-Vincentelli |
| 1988 | An On-Chip Double-Bit Error-Correcting Code for Three-Dimensional Dynamic Random-Access Memory. Pinaki Mazumder |
| 1988 | Analysis of Experimental Results on Functional Testing and Diagnosis of Complex Circuits. Catherine Bellon, Raoul Velazco, Haissam Ziade |
| 1988 | Application of a Commercial Data Base Management System to Memory Device Test Program Generation and Debugging. Steve Grennan |
| 1988 | Automatic Location of IC Design Errors Using Beam System. M. Melgara, M. Battu, P. Garino, J. Dowe, Y. J. Vernay, M. Marzouki, Francis M. Boland |
| 1988 | Board-Level Diagnosis by Signature Analysis. Mark G. Karpovsky, Prawat Nagvajara |
| 1988 | Boundary Scan with Cellular-Based Built-In Self-Test. Clay Gloster, Franc Brglez |
| 1988 | Boundary Scan: The ATE Vendors' View. Phil Collins |
| 1988 | Built-In Test Compiler in an ASIC Environment. Eric Archambeau, Ken Van Egmond |
| 1988 | Built-In Test Strategy for Next Generation Military Avionic Hardware. Donald H. Merliho, John Hadjilogiou |
| 1988 | CAD Tools for Supporting System Design for Testability. Jill J. Hallenbeck, Nick Kanopoulos, Nagesh Vasanthavada, James W. Watterson |
| 1988 | CIM , Electronics Manufacturing and ATE. Neil Hutchinson |
| 1988 | Characteristic Impedance and Coupling Coefficients for Multilayer PC Boards. J. R. Birchak, H. K. Haill |
| 1988 | Circular BIST with Partial Scan. M. M. Pradhan, E. J. O'Brien, S. L. Lam, James Beausang |
| 1988 | Concurrent Control of Multiple BIT Structures. Sandeep K. Gupta, Melvin A. Breuer, Jung-Cheun Lien |
| 1988 | Concurrent Off-Phase Built-in Self-Test of Dormant Logic. Leon J. Sigal, Charles R. Kime |
| 1988 | Contactors for Testing at High Frequencies. Bernd Reichelmann |
| 1988 | Continuous Signature Monitoring: Efficient Concurrent-Detection of Processor Control Errors. Kent D. Wilken, John Paul Shen |
| 1988 | DC_IATP : An Iterative Analog Circuit Test Generation Program for Generating DC Single Pattern Tests. M. J. Marlett, Jacob A. Abraham |
| 1988 | D^3FS: A Demand Driven Deductive Fault Simulator. Steven P. Smith, Bill Underwood, M. Ray Mercer |
| 1988 | Defining a Standard for Fault Simulator Evaluation. Sami A. Al-Arian, Kevin A. Kwiat |
| 1988 | Delay Test Generation 1: Concepts and Coverage Metrics. Vijay S. Iyengar, Barry K. Rosen, Ilan Y. Spillinger |
| 1988 | Delay Test Generation 2: Algebra and Algorithms. Vijay S. Iyengar, Barry K. Rosen, Ilan Y. Spillinger |
| 1988 | Design for Test and the Cost of Quality. Chris Salzmann, Martin Funcell, Richard Taylor |
| 1988 | Design for Testability for Wafer-Scale Integration Interconnect Systems Design and Test Methodology. Matthias Gruetzner |
| 1988 | Design for Testability of Mixed Signal Integrated Circuits. Kenneth D. Wagner, Thomas W. Williams |
| 1988 | Design for Testability of a 32-Bit Microprocessor, the TX1. Yasuyuki Nozuyama, Akira Nishimura, Jun Iwamura |
| 1988 | Designing State Machines for Testability. Michael Treseler |
| 1988 | Designs for Diagnosability and Reliability in VLSI Systems. Stephen Y. H. Su, Hede Ma |
| 1988 | Detecting Bridging Faults with Stuck-at Test Sets. Steven D. Millman, Edward J. McCluskey |
| 1988 | Detection of Control Flow Errors Using Signature and Checking Instructions. Janusz Sosnowski |
| 1988 | Detection of Hard Faults in a Combinational Circuit Using Budget Constraints. David Stannard, Bozena Kaminska |
| 1988 | Determination of Safe Back-Driving Currents in Bond Wires and Dice. G. J. Hill, B. C. Roberts, C. P. Strudwick |
| 1988 | Digital Testing, Theory and Practice. Samiha Mourad |
| 1988 | Do the Designs Work ? Kenneth Rose |
| 1988 | Dual Port Static RAM Testing. Manuel J. Raposa |
| 1988 | Dynamic Techniques for Yield Enhancement of Field Programmable Logic Arrays. Michael Demjanenko, Shambhu J. Upadhyaya |
| 1988 | Electron Beam Tester Integrated into a VLSI Tester. Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum |
| 1988 | Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. W. David Ballew, Lauren M. Streb |
| 1988 | Emulative Testing at the Bus Speed Limit. Douglas B. Arnett, K. S. Bhaskar |
| 1988 | Enhancing Random-Pattern Coverage of Programmable Logic Arrays via Masking Technique. Hideo Fujiwara, Osamu Fujisawa, Kazunori Hikone |
| 1988 | Error Detection with Latency in Sequential Circuits. Lawrence P. Holmquist, Larry L. Kinney |
| 1988 | Evaluating the Limitations of High-Speed Board Testers. John Arena |
| 1988 | Evaluation of System BIST Using Computational Performance Measures. David L. Landis, Daniel C. Muha |
| 1988 | Experiences with Concurrent Fault Simulation of Diagnostic Programs. Stephen R. Demba, Ernst G. Ulrich, Karen Panetta, David Giramma |
| 1988 | Expert System for the Functional Test Program Generation of Digital Electronic Circuit Boards. Stephen M. Lea, Nigel Brown, Tim Katz, Phil Collins |
| 1988 | Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault Analysis. John Paul Shen, F. Joel Ferguson |
| 1988 | Fault Bundling: Reducing Machine Evaluation Activity in Hierarchical Concurrent Fault Simulation. William H. Nicholls, Mani Soma |
| 1988 | Fault Detection Effectiveness of Weighted Random Patterns. John A. Waicukauski, Eric Lindbloom |
| 1988 | Fault Detection of Combinational Circuits Based on Supply Current. Masaki Hashizume, Takeomi Tamesada, Kazuhiro Yamada, Masaaki Kawakami |
| 1988 | Fault Isolation in Grey Systems. Stephen Y. H. Su, Hede Ma |
| 1988 | Fault Modeling and Test Algorithm Development. Frans P. M. Beenker, Rob Dekker, Loek Thijssen |
| 1988 | Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. Jean Paul Caisso, Bernard Courtois |
| 1988 | Flexible Deep Memory Architecture Aids Program Development. John L. Russo |
| 1988 | Functional Test Program Generation Through interactive Graphics. Cihan Tinaztepe, Bülent Özgüç |
| 1988 | G-RIDDLE : A Formal Analysis of Logic Designs Condiucive to the Acceleration of Backtracing. Gabriel M. Silberman, Ilan Y. Spillinger |
| 1988 | GaAs Driver and Sensor for a High-Speed Test System. Sheng-Jen Tsai, Charles D. Hechtman |
| 1988 | Hierarchical Test Generation Using Precomputed Tests for Modules. Brian T. Murray, John P. Hayes |
| 1988 | High-Speed Pattern Generator and GaAs Pin : Electronics for a Gigahertz Production Test System. Dean J. Kratzer, Steve Barton, Francois J. Henley, David A. Plomgrem |
| 1988 | IC Quality and Test Transparency. Edward J. McCluskey, Fred Buelow |
| 1988 | Identification of Failing Tests with Cycling Registers. Jacob Savir, William H. McAnney |
| 1988 | Impact of Testability Standards on University Research and Instruction. Charles R. Kime |
| 1988 | In-Circuit Test Fixture. Charles D. Hechtman |
| 1988 | Integrated Pin Electronics for a VLSI Test System. Christopher W. Branson, Don Murray, Steve Sullivan |
| 1988 | Integrated Test Logic for Video ICs. John Beck, James Pappas, Robert Rose, Larry Seiler |
| 1988 | Key Technologies for 500 MHz VLSI Test System "ULTIMATE". Teruo Tamama, Naoaki Narumi, Tai-ichi Otsuji, Masao Suzuki, Tsuneta Sudo |
| 1988 | Managing Quality : Today's Opportunities, Tomorrow's Challenges. A. Blanton Godfrey |
| 1988 | Managing the ASIC Design to Test Process. Gary D. Culbertson |
| 1988 | Membrane Probe Card Technology (the Future for High Performance Wafer Test). Brian Leslie, Farid Matta |
| 1988 | Microprocessor Testing by Instruction Sequences Derived from Random Patterns. Hans Peter Klug |
| 1988 | Multiple Distributions for Biased Random Test Patterns. Hans-Joachim Wunderlich |
| 1988 | New Automated Prober Support for High Pincount Test Heads. T. Roland Fredriksen, David Grano |
| 1988 | New Testing Equipment for SMT PC Boards. Luis Balme, Anne Mignotte, Jean-Yves Monari, Patrick Pondaven, Christophe Vaucher |
| 1988 | On Behavior Fault Modeling for Combinational Digital Designs. Tapan J. Chakraborty, Sumit Ghosh |
| 1988 | On Benchmarking Digital Testing Systems. Samiha Mourad, Edward J. McCluskey |
| 1988 | On Multiple Fault Coverage and Aliasing Probability Measures. Henry Cox, André Ivanov, Vinod K. Agarwal, Janusz Rajski |
| 1988 | On the Detection of Delay Faults. Ankan K. Pramanick, Sudhakar M. Reddy |
| 1988 | On the Testing of Multiplexers. Samy Makar, Edward J. McCluskey |
| 1988 | Optical Testing of Printed Circuit Boards. G. Tremblay, P. Meyrueix, J. C. Peuzin |
| 1988 | Optimal Logic Synthesis and Testability : Two Sides of the Same Coin. Alberto L. Sangiovanni-Vincentelli |
| 1988 | Optimal Scheduling of Signature Analysis for VLSI Testing. C. Mani Krishna, Yann-Hang Lee |
| 1988 | Optimal Use of Timing Resources: A Crucial Step in Test Program Generation. Ji-en Morris Chang, William T. Krakow |
| 1988 | PGTOOL: An Automatic Interactive Program Generation Tool for Testing New-Generation Memory Devices. Yuichi Kawabata, Masami Maruyama, Al Tejeda |
| 1988 | Packaging Technologies for the 500 MHz VLSI Test System "ULTIMATE". Yoshimitsu Sakagawa, Yusio Akazawa, Naoaki Narumi, Akira Yoshii, Tsuneta Sudo |
| 1988 | Partial Hardware Partitioning: A New Pseudo-Exhaustive Test Implementation. Jon G. Udeli Jr., Edward J. McCluskey |
| 1988 | Practical Production Testing of ISDN Circuit Boards. Robert E. McAuliffe |
| 1988 | Practice and Theory. Edward J. McCluskey |
| 1988 | Predicting and Obtaining High Final Test Yields. Raymond J. Balzer, Greg A. Larsen |
| 1988 | Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988 |
| 1988 | RTRAM: Reconfigurable and Testable Multi-Bit RAM Design. Dhiraj K. Pradhan, Nirmala R. Kamath |
| 1988 | Reconfigurable Hardware for Pseudo-Exhaustive Test. Jon G. Udeli Jr. |
| 1988 | Reliability Testing by Precise Electrical Measurement. A. P. Dorey, B. K. Jones, Andrew Mark David Richardson, P. C. Russell, Y. Z. Xu |
| 1988 | Robust Tests for Parity Trees. Sandip Kundu, Sudhakar M. Reddy |
| 1988 | Scan Diagnostic Strategy for the Series 10000 Prism Workstation. Mike Ricchetti, John Hoglund |
| 1988 | Scan Path and Beyond : The Road to Improved ASIC Testability. Lutz P. Henckels |
| 1988 | Semiconductor Perspective on Test Standards. Pete Fleming |
| 1988 | Simultaneous Switching Noise Evaluation of Advanced CMOS Logic (ACL). Kenneth R. Stuchlik |
| 1988 | Software Environment for 500 MHz VLSI Test System "ULTIMATE". Tohru Adachi, M. Tanno, Tsuneta Sudo |
| 1988 | Some New Techniques in Waveshape Capture and Analysis. Arthur E. Downey, Kazuhiko Matsuda |
| 1988 | Standardization of ATE Timing Accuracy Specifications. Marc Mydill |
| 1988 | Statistical Delay Fault Coverage and Defect Level for Delay Faults. Eun Sei Park, Thomas W. Williams, M. Ray Mercer |
| 1988 | Stuck-Open and Transition Fault Testing in CMOS Complex Gates. Henry Cox, Janusz Rajski |
| 1988 | Switch-Level Concurrent Fault Simulation Based on a General Purpose List Traversal Mechanism. Deborah Machlin, David Gross, Sudhir Kadkade, Ernst G. Ulrich |
| 1988 | Synthesis and Optimization Procedures for Fully and Easily Testable Sequential Machines. Srinivas Devadas, Hi-Keung Tony Ma, A. Richard Newton, Alberto L. Sangiovanni-Vincentelli |
| 1988 | System Level Fault Dictionary Generation. Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba |
| 1988 | TASTE: A Tool for Analog System Testability Evaluation. Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff |
| 1988 | Techniques for User Testing of the 68882. Mark Marshall |
| 1988 | Test Head Design Using Electro-Optic Receivers and GaAs Pin Electronics for a Gigahertz Production Test System. Francois J. Henley, Hee-June Choi |
| 1988 | Testability Features in the TMS370 Family of Microcomputers. Theo J. Powell, Fred Hwang, Bill Johnson |
| 1988 | Testability Features of a 32 Kbps ADPCM Transcoder. Luis A. Bonet |
| 1988 | Testability Using Random Access Test Register. Cuong Bui |
| 1988 | Testing and Diagnosis of Interconnects Using Boundary Scan Architecture. Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski |
| 1988 | The KARL/KARATE System: Automatic Test Pattern Generation Based on RT Level Descriptions. Gerold Affs, Reiner W. Hartenstein, Andrea Wodtko |
| 1988 | The Non-Linear Feedback Shift-Register as a Built-In Self-Test (BIST) Resource. Peter N. Marinos |
| 1988 | Threading of Multiple Scan Paths in a VLSI Circuit. S. Bhawmick, M. S. Khaira, P. P. Mishra, A. Das, A. Dasgupta, P. Palchaudhury |
| 1988 | Timing Generation for DSP Testing. Eric Rosenfeld |
| 1988 | Trouble-Shooting: A Key to Process Improvement. Chi W. Yau, Song-Lin Chang, Bruce F. Jordan, Joe J. Schwermann, Joan A. Wellman |
| 1988 | Using Scan Technology for Debug and Diagnostics in a Workstation Environment. Bulent I. Dervisoglu |
| 1988 | Value of Testability Standards in Testing Commercial Products. David J. Richards |
| 1988 | Very High Density Probing. C. Barsotti, S. Tremaine, M. Bonham |
| 1988 | WTPGA : A Novel Weighted Test Pattern Generation Approach for VLSI Built-In Self-Test. Fardad Siavoshi |
| 1988 | What is the Path to Fast Fault Simulation? Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad Seth, John A. Waicukauski |