| 1986 | A Concurrent Testing Strategy for PLAs. Dali L. Tao, Carlos R. P. Hartmann, Parag K. Lala |
| 1986 | A Divide and Conquer Testing Strategy for Detection of Multiple Faults by SFDTS. J. S. R. Subrahmanyam, Parimal Pal Chaudhuri |
| 1986 | A Functional Test Program Generator. Endre F. Sarkany, J. Feeney, J. Muhr |
| 1986 | A Group Probing Strategy for Testing Large Number of Chips. Vladimir Cherkassky, Larry L. Kinney |
| 1986 | A Hybrid Design of Maximum-Length Sequence Generators. Laung-Terng Wang, Edward J. McCluskey |
| 1986 | A Knowledge Based Diagnostic System for Automatic Test Equipment. Bruce L. Havlicsek |
| 1986 | A Method of Flexible Catch RAM Display for Memory Testing. Mark Rich |
| 1986 | A Method of Improving In-Circuit Test Effectiveness. Robert J. Russell |
| 1986 | A Model for Analyzing Test Capacity, Cost, and Productivity. Ron Leckie |
| 1986 | A Multi-Level Test Pattern Generation and Validation Environment. Ioannis Stamelos, M. Melgara, M. Paolini, S. Morpurgo, C. Segre |
| 1986 | A New Pin Electronics Architecture for High Performance Functional Module Testing. Stephen A. Cohen |
| 1986 | A New Testability Measure for Digital Circuits. Jian-Cao Wang, Daozheng Wei |
| 1986 | A Novel Approach for Testing Memories Using a Built-In Self Testing Technique. Kim T. Le, Kewal K. Saluja |
| 1986 | A Parity Bit Signature for Exhaustive Testing. Sheldon B. Akers |
| 1986 | A Prober/Handler Interface for High Pin-Count ASIC Devices. Ben Wells |
| 1986 | A Solution to Test Data Acquisition and Management. Dennis Mancl, Mark J. Sullivan |
| 1986 | A Strategy for Enhancing Fault Coverage on VLSI Circuit Boards Using Performance In-Circuit Test Techniques. Mike Fabish |
| 1986 | A Test Generator IC for Testing Large CMOS-RAMs. Wilfried Daehn, Josef Gross |
| 1986 | A Test System tor High Density and High Speed Digital Board. K. Moriwaki, S. Ishiyama, K. Takizawa, F. Kobayashi, S. Sekine, Y. Hinataze |
| 1986 | ABNER : A Burn-In Monitor and Error Reporting System for PBX Systems Test. William W. Bust, Charles R. Darst, Gregory G. Krysl |
| 1986 | ARNOLD: Applying an AI Workstation to Production Test Code Generation. Rik Fischer Smoody |
| 1986 | ASIC Verification: Second Generation Systems and Solutions. Barry Baril |
| 1986 | ATE Test Head Requirements for Low-Cost VLSI Testing. James D. Bray |
| 1986 | Accuracy and Repeatability with DSP Test Methods. Eric Rosenfeld |
| 1986 | Accurate, Cost Effective Performance Screening of VLSI Circuit Designs. Jody Van Horn |
| 1986 | An Artificial Intelligence Based Implementation of the P-Algorithm for Test Generation. Nagendra C. E. Srinivas, Anthony S. Wojcik, Ytzhak H. Levendel |
| 1986 | An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs. Norio Kuji, Teruo Tamama |
| 1986 | An Automated Menu Screen Generation Software Tool for VLSI ATE Programming and Operation. Noah Morgan |
| 1986 | An Efficient Self-Test Structure for Sequential Machines. Syed Zahoor Hassan |
| 1986 | An Experiment on Intermittent-Failure Mechanisms. Mario Lúcio Côrtes, Edward J. McCluskey |
| 1986 | An Improved Search Algorithm. Michael Keating |
| 1986 | An Intelligent Knowledge-Based System Tool for High-Level BIST Design. N. A. Jones, Keith Baker |
| 1986 | An MC68020 Users Test Program. Boyd Henshaw |
| 1986 | Approaches to Circuit Level Design for Testability. Robert H. Fujii, Jacob A. Abraham |
| 1986 | Artificial Intelligence in Semiconductor Manufacturing for Process Development, Functional Diagnostics, and Yield Crash Prevention. Mary C. Murphy-Hoye |
| 1986 | Automated Effective-Bit Characterization of Waveform Digitizers. Yih-Chyun Jenq |
| 1986 | Automatic Modelling of MOS Transistor Networks for Test Pattern Generation. Chantal Vivier, Georges Fournie |
| 1986 | Benchmarking an Expert System for Electronic Diagnosis. A. Jesse Wilkinson |
| 1986 | Built-In Checking of the Correct Self-Test Signature. William H. McAnney, Jacob Savir |
| 1986 | Calculation of Greatest Lower Bounds Obtainable by the Cutting Algorithm. Rhonda Kay Gaede, M. Ray Mercer, Bill Underwood |
| 1986 | Case History of Networking a Wafer-Sort Area. David P. Cohoon, Jey Sheridan |
| 1986 | Challenges in AC Testability : Testing Gigahertz Logic. Michael J. Roberts |
| 1986 | Circuits for Pseudo-Exhaustive Test Pattern Generation. Laung-Terng Wang, Edward J. McCluskey |
| 1986 | Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke |
| 1986 | Concurrent Test Generation Using AI Techniques. Chi W. Yau |
| 1986 | DSP Measurement of Frequency. Eric Rosenfeld |
| 1986 | DVTS: Design Verification Techniques for Functional Simulation. Kohei Fukuoka, Ken Ohga, Atsushi Sugiyama, Satoshi Takemura |
| 1986 | Designing Characterization Tests for Bipolar Array Performance Verification. T. J. Knips, D. J. Malone |
| 1986 | Designing Testable Control Paths with Multiple and Feedback Scan-Paths. Rafic Z. Makki, C. Tiansheng |
| 1986 | Detecting Multiple Faults in CMOS Circuits. Niraj K. Jha |
| 1986 | Deterministic Versus Random Testing. Vishwani D. Agrawal, M. Ray Mercer |
| 1986 | ESIM/AFS : A Concurrent Architectural Level Fault Simulator. Scott Davidson, James L. Lewandowski |
| 1986 | Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear |
| 1986 | Efficient Fault Simulation of CMOS Circuits with Accurate Models. Zeev Barzilai, J. Lawrence Carter, Vijay S. Iyengar, Indira Nair, Barry K. Rosen, Joe D. Rutledge, Gabriel M. Silberman |
| 1986 | Electron Beam Tester with 10 ps Time Resolution. Hideo Todokoro, Shouzou Yoneda, Sigemitu Seitou, Sigeyuki Hosoki |
| 1986 | Explanation Capabilities in DEFT : A Design-For-Testability Expert System. M. Arif Samad, José A. B. Fortes |
| 1986 | FIFO Test Program Development. A. Kanadjian, D. Rodgers, M. Shepherd |
| 1986 | Financial Impact of Tester Reliability Improvements. Judith E. Dayhoff, Robert W. Atherton |
| 1986 | Functional Testing of Microprocessor-like Architectures. Günhan Kildiran, Peter N. Marinos |
| 1986 | Functional Testing of the NS32332 \muProcessor. Shmuel Shalem |
| 1986 | Fundamental Limits to Timing Accuracy. Michael Keating |
| 1986 | IC Burn-In : The Changing Scene. Eugene R. Hnatek |
| 1986 | ISDN Device Testing Demands a New Level of Performance for Automatic Test Equipment. Randall Kramer |
| 1986 | ISDN, Analog or Digital Test ? David P. Orecchio |
| 1986 | Improved Techniques for Estimating Signal Probabilities. Balakrishnan Krishnamurthy, Ioannis G. Tollis |
| 1986 | Improved Workstation/Tester Interface Is the Key to the Quality of Test-Program Generation. Jim Teisher |
| 1986 | Improving In-Circuit Diagnosis of Analog Networks with Expert Systems Techniques. Larry Apfelbaum |
| 1986 | Inexpensive Microprocessor Testing of Custom Integrated Circuits on Wafers, Packages, and Boards. Timothy J. Mulrooney |
| 1986 | Informed Test Generation Guidance Using Partially Specified Fanout Constraints. Ki Soo Hwang, M. Ray Mercer |
| 1986 | Innovative Video RAM Testing. Al Tejeda, George Conner |
| 1986 | Instability : A CAD Dilemma. Maqsoodul Mannan |
| 1986 | Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach. Vin Ratford, Paul Keating |
| 1986 | Issues That Arise in Translating VLSI Test Programs Between Testers. Charles D. Havener |
| 1986 | Logic Elements for Universally Testable Circuits. M. Ray Mercer |
| 1986 | Look Who's Refueling the Technology Race. John R. Wallace |
| 1986 | Making a Test System Diagnostic Usable. Oliver Grillmeyer |
| 1986 | Memory Chip Test Economics. Al A. Tuszynski |
| 1986 | Modeling and Simulation of Delay Faults in CMOS Logic Circuits. S. Koeppe |
| 1986 | Multiple Stuck-At Fault Coverage of Single Stuck-At Fault Test Sets. Joseph L. A. Hughes, Edward J. McCluskey |
| 1986 | New Front-End and Line Justification Algorithm for Automatic Test Generation. Ruey-Sing Wei, Alberto L. Sangiovanni-Vincentelli |
| 1986 | On Built-In Testing of VLSI Chips. Parag K. Lala |
| 1986 | On Concurrently Testable Microprogrammed Control Units. Cheng Hsien Tung, John P. Robinson |
| 1986 | On the Computation of Detection Probability for Multiple Faults. Sreejit Chakravarty, Harry B. Hunt III |
| 1986 | On the Design of Random Pattern Testable PLAs. Dong Sam Ha, Sudhakar M. Reddy |
| 1986 | On the Possible Limits of External Testing. Richard M. Sedmak |
| 1986 | PROSPECT : A Production System for Partitioning and Evaluating Chip Testability. David O. Lahti, Grace C. Chen-Ellis |
| 1986 | PROTEUS : A Logic Verification System for Combinational Circuits. Alberto L. Sangiovanni-Vincentelli, Ruey-Sing Wei |
| 1986 | Performance Assurance of Memories Embedded in VLSI Chips. E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke |
| 1986 | Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986 |
| 1986 | Proposed Test Method to Prove Software Having a Vector Space Behavior. P. Veronneau, Pierre N. Robillard |
| 1986 | Quickly Developing Effective Codec Tests on an In-Circuit Board Test System. Joe Kirschling |
| 1986 | Random Pattern Testability by Fast Fault Simulation. A. J. Briers, K. A. E. Totton |
| 1986 | Random Pattern Testability of Delay Faults. Jacob Savir, William H. McAnney |
| 1986 | Reducing Test Costs Through Strategic Changes in Maintenance and Service. Jerry Perone |
| 1986 | Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode. Yasumasa Nishimura, Mitsuhiro Hamada, Hideto Hidaka, Hideyuki Ozaki, Kazuyasu Fujishima, Y. Hayasaka |
| 1986 | Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. Jerry M. Soden, Charles F. Hawkins |
| 1986 | Requirements and Trends for High Speed Testing. George Chiu, Jean-Mark Halbout |
| 1986 | Scan Path with Look Ahead Shifting (SPLASH). Magdy S. Abadir, Melvin A. Breuer |
| 1986 | Self Diagnostics on System Level by Design. Yehuda Baron |
| 1986 | Software Integration in a Workstation-Based F-Beam Tester. Stefano Concina, Gerald Liu, Len Lattanzi, Semyon Reyfman, Neil Richardson |
| 1986 | Statistical AC Test Coverage. David M. Wu, Charles E. Radke, J. Paul Roth |
| 1986 | Statistical Process Control Using the Parametric Tester. A. Dale Flowers, Kamlesh Mathur, John Isakson |
| 1986 | Structured Functional Level Test Generation Using Binary Decision Diagrams. Hongtao P. Chang, William A. Rogers, Jacob A. Abraham |
| 1986 | Systematic Yield Improvement in Board Testing Practice. Earl Dalton, Walter Ahern, Stephen Denker, Ken Sweitzer, Bill Cooper, Tom Kelly, Stan Smith |
| 1986 | TRIM : Testability Range by Ignoring the Memory. Leendert M. Huisman, Larry Carter, Tom W. Williams |
| 1986 | Tabular Mechanisation for Flexible Testing of Microprocessors. P. Seetharamaiah, V. R. Murthy |
| 1986 | Techniques for Testing Hexagonally Connected Systolic Arrays. Hasan Elhuni, Larry L. Kinney |
| 1986 | Test Data Quality Assurance. Masato Kawai, T. Shimono, Shigehiro Funatsu |
| 1986 | Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm. Noriyoshi Itazaki, Kozo Kinoshita |
| 1986 | Test Program Debugging Environment for Linear IC Testers. Takashi Hidai, Toshi Matsumoto, Fumiro Tsuruda |
| 1986 | Test System Architecture for Testing Advanced Mixed-Signal Devices. Richard Nohelty |
| 1986 | Test to Eliminate Test. Kemon P. Taschioglou |
| 1986 | Testability Design for Micro/370, a System/370 Single Chip Microprocessor. F. Warren Shih, Hu H. Chao, Shauchi Ong, Andrew L. Diamond, Jeffrey Yuh-Fong Tang, Cynthia A. Trempel |
| 1986 | Testability Features of the MC68851 PMMU. Grady Giles, Kenneth Scheuer |
| 1986 | Testability Measures : What Do They Do for ATPG ? André Ivanov, Vinod K. Agarwal |
| 1986 | Testability, the Achilles Heel of Design. Willem D. Maris |
| 1986 | Testing 10-Bit A/D Converter with a Digital VLSI Tester. Steven M. McIntyre |
| 1986 | Testing Barrel Shifters in Microprocessors. William C. Bruce, C. C. Hunter, L. A. Basto |
| 1986 | Testing FMAX in a Production Environment. Daniel R. Simpkins |
| 1986 | Testing GaAs Devices with a Digital In-Circuit Test System. Joe Kirschling |
| 1986 | Testing a Board Loaded with Leaded and Surface Mounted Components. Harry Bleeker, D. van de Lagemaat |
| 1986 | Testing for a Solid-State Color Image Sensor. T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka |
| 1986 | Testing in the Data Communications Industries. Arthur R. Braun |
| 1986 | Testing of Fault-Tolerant Clock Systems. Nagesh Vasanthavada, Peter N. Marinos, Gerald S. Mersten |
| 1986 | Testing the Sperry 36/72 Bit CMOS Micromainframe Chip Set. Jesse G. Crane |
| 1986 | Tests of Hermetically Sealed LSI/VLSI Devices by Laser Photoexcitation Logic Analysis. Francois J. Henley |
| 1986 | The DASS Needs You ! : An Update on the Activities of the DASS. Ronald J. Short |
| 1986 | The Difference Fault Model : Using Functional Fault Simulation to Obtain Implementation Fault Coverage. Gabriel M. Silberman, Ilan Y. Spillinger |
| 1986 | The Effects of Backdrive Stressing Fast IC Technologies. Birger Schneider, Gert Jørgensen, Mogens B. Christensen |
| 1986 | The Role of Pattern Recognition in VLSI Testing. Steve D. Bedrosian |
| 1986 | Thermal Analysis of Backdriven Output Transistors. Richard L. Swent, Michael J. Ward |
| 1986 | Timing Accuracy and Yield Estimation. J. Stephen Pabst |
| 1986 | Timing Measurements on CMOS VLSI Devices Designed to Drive TTL Loads. Mark R. Barber, Walter I. Satre |
| 1986 | Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin |
| 1986 | Transient Thermal Characteristics of VLSI Devices : Evaluation and Application. M. Aghazadeh, M. Kirschner |
| 1986 | Transition Fault Simulation by Parallel Pattern Single Fault Propagation. John A. Waicukauski, Eric Lindbloom, Vijay S. Iyengar, Barry K. Rosen |
| 1986 | Transmission Problems Encountered When Testing Memory Devices in Parallel on Memory ATE. Al Mostacciuolo |
| 1986 | Two CMOS Metastability Sensors. Greg G. Freeman, Dick L. Liu, Bruce A. Wooley, Edward J. McCluskey |
| 1986 | Using a Relational Database to Develop a Statistical Quality Control System for ATE. Mark D. Winkel |
| 1986 | VIVED : A Visual Vector Editor. Rihard S. Chomiczewski |
| 1986 | Vernier Method for Calibration ot High-Speed Sampling System. Wendell Damm, Pete Janowitz, Michael Hagen, YeeMay Shih, Glenn Widener |
| 1986 | Video DAC/ADC Dynamic Testing. Toshio Tamamura |
| 1986 | Visual Programming for Analog/Hybrid ATE. Fred Cox, Lloyd K. Konneker, Douglas Moreland |