| 1985 | "Concatenable Polydividers": Bit-Sliced LFSR Chips for Board Self-Test. Dilip K. Bhavsar |
| 1985 | : A Testable PLA Design with Minimal Hardware and Test Set. James Jacob, Nripendra N. Biswas |
| 1985 | : Modeling and Test Point Selection for Data Converter Testing. Gerard N. Stenbakken, T. Michael Souders |
| 1985 | A Comprehensive Approach to Test Program Debugging for High Performance VLSI Test Systems. S. Daniel Lee, Lisa Deerr Li |
| 1985 | A Computer System Diagnostic Strategy Based on ROM-Resident Diagnostics. Sherri Klosterman |
| 1985 | A Computerized Solution to the Fixture-Wiring Problem. H. S. Lahman, C. L. Johnson |
| 1985 | A Fast Fault Grader: Analysis and Applications. Franc Brglez |
| 1985 | A Fast, Probabilistic Algorithm for Functional Testing of Random Access Memory Systems. David M. Jacobson |
| 1985 | A Method for Test Generation Directly from Testability Analysis. Angelo C. Hung, Francis C. Wang |
| 1985 | A Method of Reducing ATE System Error Components and Guaranteeing Subnanosecond Measurement Accuracies. Jim Healy, Gary Ure |
| 1985 | A Methodology for Testing Content Addressable Memories. Grady Giles, Craig Hunter |
| 1985 | A Microprocessor Test Approach Allowing Fault Localization. Raoul Velazco, Haissam Ziade, E. Kolokithas |
| 1985 | A New Approach to the Use of Testability Analysis in Test Generation. Balakrishnan Krishnamurthy, Richard Li-Cheng Sheng |
| 1985 | A New Parallel Test Approach for Large Memories. Thirumalai Sridhar |
| 1985 | A Programmable Bus Emulation Technique for Processor Based and Peripheral Printed Circuit Boards. Jaffery C. Phillips |
| 1985 | A Sequential Circuit Test Generation System. Sivanarayana Mallela, Shianling Wu |
| 1985 | A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy |
| 1985 | A Testable Design of Programmable Logic Arrays with Universal Control and Minimal Overhead. Hideo Fujiwara, Kewal K. Saluja, Kozo Kinoshita |
| 1985 | AFS : An Approximate Fault Simulator. Masahiko Kawamura, Kanji Hirabayashi |
| 1985 | Accurate Fault Modeling and Efficient Simulation of Differential CVS Circuits. Zeev Barzilai, Vijay S. Iyengar, Barry K. Rosen, Gabriel M. Silberman |
| 1985 | Achieving Accurate Timing Measurements on TTL/CMOS Devices in a Manufacturing/Incoming Inspection Environment. Dennis Petrich |
| 1985 | Algorithms for High-Performance Fixture Wiring. Martin I. Eiger, Michele J. Chabot |
| 1985 | An AC/DC Test Generation System for Gate Array LSIs. T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu |
| 1985 | An Algorithm to Generate Tests for MOS Circuits at the Switch Level. Harry H. Chen, Robert G. Mathews, John A. Newkirk |
| 1985 | An Expert System for In-Circuit Fault Diagnosis. Larry Apfelbaum |
| 1985 | An On-Lined Laser Probing System for Diagnosing Scaled VLSI. T. Shiragasawa, M. Sugano, Yoshihisa Mano, M. Noyori |
| 1985 | An Operationally Efficient Scheme for Exhaustive Test-Pattern Generation Using Linear Codes. Nagesh Vasanthavada, Peter N. Marinos |
| 1985 | Asynchronous FIFO's Require Special Attention. D. Rodgers, M. Shepherd |
| 1985 | Auto-Probing on the L200 Functional Tester. Tim Moore, Stephen Garner |
| 1985 | Automated Design for Testability of Semicustom Integrated Circuits. Patrick P. Fasang, Michael A. Schuette, John Paul Shen, William A. Gwaltney |
| 1985 | Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. Norio Kuji, Teruo Tamama |
| 1985 | Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules. Andrzej Krasniewski, Alexander Albicki |
| 1985 | Automatic Test Generation for Generic Scan Designs. Matthew Adiletta, Elizabeth M. Cooper, Keith Gutfreund |
| 1985 | Automatic Visual Test of Surface Mount Assemblies. Dom Marro |
| 1985 | Automating Test-Bed Fault Detection and Diagnosis. Stephen F. Filippone |
| 1985 | Backdrive Stress-Testing of CMOS Gate Array Circuits. Frank H. Hielscher, John C. Pagano |
| 1985 | Built-In Self Test Input Generator for Programmable Logic Arrays. John Salick, Bill Underwood, M. Ray Mercer |
| 1985 | CHIEFS : A Concurrent, Hierarchical and Extensible Fault Simulator. William A. Rogers, Jacob A. Abraham |
| 1985 | Calibration of Systematic Errors in Precision Time-Interval Counters. David C. Chu |
| 1985 | Case Study: ATE Networking Using Peripheral Emulation. William P. Allaire |
| 1985 | Complexity, Test, and the Productivity Challenge of the 90s. John Manzo |
| 1985 | Concurrent Simulation at the Switch, Gate, and Register Levels. Ernst G. Ulrich |
| 1985 | Concurrent System-Level Error Detection Using a Watchdog Processor. Aamer Mahmood, Edward J. McCluskey, Aydin Ersoz |
| 1985 | Considerations of the Testing of RAMs with Dual Ports. T. Fujieda, N. Arai |
| 1985 | Contactless VLSI Laser Probing. Uming Ko, Dinesh G. Patel, Francois J. Henley |
| 1985 | Converting Device Test Vectors to an In-Circuit Board Test Environment. Peter Hansen |
| 1985 | Curriculum for a Rapidly Changing Technology. Al A. Tuszynski |
| 1985 | Custom VLSI Test System. Ryozou Yoshino, Ryuichi Takagi |
| 1985 | DIP : A Diagnostics Processor. Shmuel Shalem |
| 1985 | DSP Synthesized Signal Source for Analog Testing Stimulus and New Test Method. H. Kitayoshi, S. Sumida, K. Shirakawa, S. Takeshita |
| 1985 | Defect Analysis and Fault Modeling in MOS Technology. R. Chandramouli, Hector R. Sucar |
| 1985 | Design of a Class of Self-Exercising Combinational Circuits. Albert Lam, Savio N. Chau, Huy Luong |
| 1985 | Detectable CMOS Faults in Switch-Level Simulation. Stephen L. Lusky, Thirumalai Sridhar |
| 1985 | Distributed Factory Data Management-Breaking the Network Bottleneck. Steven R. Nelson |
| 1985 | Driver/Sensor Design for High-Performance ATE. James Congdon |
| 1985 | Easing the Transition from Design to Test. Thomas M. McWilliams |
| 1985 | Efficient Test Generation Algorithms. Andrew V. Goldberg, Karl J. Lieberherr |
| 1985 | Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. Jerry M. Soden, Charles F. Hawkins |
| 1985 | Employing Multiple Test Techniques for Complex Telecommunications Devices. Brent Schusheim |
| 1985 | Enhancing Device Test Programming Productivity: The CATalyst Automated Test Program Generator. James G. Wilber |
| 1985 | Evaluation ot Monitor Complexity for Concurrently Testing Microprogrammed Control Units. Carl Staelin, Alexander Albicki |
| 1985 | Experiences and Expectations in VLSI Testing. Edward B. Eichelberger |
| 1985 | Fault Coverage Tools: Case Studies. Franc Brglez |
| 1985 | Faults in Microprogrammed and Hardwired Control. Yashwant K. Malaiya |
| 1985 | Financial Implications of a Detailed Analysis of Test Floor Operations. Judith E. Dayhoff, Robert W. Atherton |
| 1985 | Flexible Inspection Systems (FIS) for Printed Circuit Board Production: ATE Finds a Quality Partner. Scott T. Jones |
| 1985 | Functional Test Generation for LSI Circuits Described by Binary Decision Diagrams. Magdy S. Abadir, Hassan K. Reghbati |
| 1985 | Future Trends in Test of Electronic Circuits With Implications tor Entry Level Test Professionals. Albert B. Grubbs Jr., Glenn Neland |
| 1985 | Guided Inconsistent Path Sensitization: Method And Experimental Results. Erwin Trischler |
| 1985 | Integrated Test Program Development Package. Brijendra Sharma, Colin McIntyre, Gerard Labonville, Jose Avila |
| 1985 | Isolating Failures within VLSI Chips That Incorporate Signature Analysis and Set/Scan Techniques. Frances D. Koo, Gene W. Lee |
| 1985 | Knowledge Acquisition for ATE Diagnosis. Patricia M. Ryan, A. Jesse Wilkinson |
| 1985 | Language Independent Test Generation. Keiji Muranaga, Kyoshiro Sakurada, Yukio Oikawa |
| 1985 | Linking Design Tools to In-Circuit Test Systems. Michael Dapron |
| 1985 | Low Cost Test System Speeds Design Verification for Custom VLSI. Ken Lindsay |
| 1985 | Low-Cost Fault Simulation: Why, When and How. Miron Abramovici |
| 1985 | MHz Frequency Counting with VLSI Testers 420. Antony K. Stevens |
| 1985 | Maintaining Simulation Accuracy through Physical Device Models. David Giles, Kenneth R. Bowden, Mike Haney, Gregory A. Maston |
| 1985 | Memory Embedded VLSI Gate Array Testing. M. Shimizu, N. Okino, J. Nishiura, H. Maruyama |
| 1985 | Microprocessor Speed Optimization Using Pattern-Recognition Analysis of Parametric Test Data. Robert W. Atherton, John L. Mudge |
| 1985 | Model for Delay Faults Based upon Paths. Gordon L. Smith |
| 1985 | Multiple Output Pass Networks: Design and Testing. Ali Feizi, Damu Radhakrishnan |
| 1985 | Multiple-Fault Detection in Iterative Logic Arrays. Wu-Tung Cheng, Janak H. Patel |
| 1985 | New Concepts of Applying Thermographic Testing to Printed Circuit Boards and Finished Products. Herb Boulton |
| 1985 | On the Design of Testable Domino PLAs. Dong Sam Ha, Sudhakar M. Reddy |
| 1985 | Overdriving NMOS and CMOS VLSI Circuits. Josef H. Hendriks |
| 1985 | Parallel Programming Significantly Improves Production NVM Wafer Sort. John Stone, Howard Ignatius, Randall Nuss |
| 1985 | Power Conditioning Provides Documented Productivity Gains in Semiconductor Fabrication and ATE. Peter Nystrom, Steven Cosgrove |
| 1985 | Predicting Fault Coverage from Probabilistic Testability. Sharad C. Seth |
| 1985 | Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985 |
| 1985 | Programmable Logic: Testability by Design. Robert J. Orsello |
| 1985 | Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. Gary L. Craig, Charles R. Kime |
| 1985 | RF Calibration in ATE Systems. William Corley, David S. Curry |
| 1985 | Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory. Jacob Savir, William H. McAnney, Salvatore R. Vecchio |
| 1985 | Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory. Jacob Savir, William H. McAnney, Salvatore R. Vecchio |
| 1985 | Recycling Functional Test Vectors: Techniques and Tools for Pattern Conversion. Tom Middleton |
| 1985 | Reducing Test Program Development Time for Memory Devices. John D. Tobey |
| 1985 | Rule Based Testability Checker and Test Generator. Kyushik Son |
| 1985 | STAFAN Takes a Middle Course. Vishwani D. Agrawal |
| 1985 | Self-Test for Microprocessors. Robert H. Fujii, Jacob A. Abraham |
| 1985 | Self-Test of Random Access Memories. Paul H. Bardell, William H. McAnney |
| 1985 | Semiconductor Test Equipment Viewed as an Auto-Alignment System. David S. Curry |
| 1985 | Simplifying Analog Device Test Program Generation. Claude J. Pany |
| 1985 | Statistical Failure Detection Methods for Linear Analog Systems. D. Kazakos |
| 1985 | Statistical Fault Sampling and Full Fault Simulation. Prabhakar Goel, Chi-Lai Huang |
| 1985 | Systematic and Structured Methods for Digital Board Testing. Frans P. M. Beenker |
| 1985 | TRS and DTS : IC Test Result Standards. Reed I. White |
| 1985 | Test Features ot the MC68881 Floating-Point Coprocessor. Luis A. Basto, John R. Kuban |
| 1985 | Test Generation In Lamp2: Concepts and Algorithms. Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller |
| 1985 | Test Generation In Lamp2: System Overview. Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller |
| 1985 | Test Length for Pseudo Random Testing. Cary K. Chin, Edward J. McCluskey |
| 1985 | Test Pattern Considerations for Fault Tolerant High Density DRAM. Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, Takao Nakano |
| 1985 | Test Teaching. Edward J. McCluskey |
| 1985 | Test Technology In a University Setting. Kenneth Rose |
| 1985 | Test of Digital Transversal Filters. F. Matthiesen, Michael J. Ohletz |
| 1985 | Testability Analysis of Programmable Array Logic. Predrag G. Kovijanic, Ramesh G. Kulkarni |
| 1985 | Testability Features of the MC68HC11. D. K. Verbeek, William C. Bruce |
| 1985 | Tester Independent Support Software System (TISSS). L. J. Falkenstrom, David C. Keezer, A. Patterson, Robert M. Rolfe, J. Wolcott |
| 1985 | Testing A/D Converters on Microcomputers. Clyde Browning |
| 1985 | Testing CMOS VLSI: Tools, Concepts, and Experimental Results. Mark E. Turner, Duane G. Leet, Ronald J. Prilik, David J. McLean |
| 1985 | Testing Properties and Applications of Inverter-Free PLA's. Vinod K. Agarwal, Janusz Rajski |
| 1985 | The Autopal Test Process. Maurizio Contini |
| 1985 | The Challenge of Configurable Logic Array Testing. Bell Liu |
| 1985 | The Cost and Speed Barriers in LSI/VLSI Testing : Can They Be Overcome By Testability Design ? Frank F. Tsui |
| 1985 | The Design and Construction of a Rule Base and an Inference Engine for Test System Diagnosis. Oliver Grillmeyer, A. Jesse Wilkinson |
| 1985 | The Effects of Backdriving Integrated Circuits : An Accurate Electro-Thermal Model. Jill M. McPhee |
| 1985 | The Error Latency of Delay Faults in Combinational and Sequential Circuits. Kenneth D. Wagner |
| 1985 | The Growth of Application Specific Integrated Circuits: Opportunities and Challenges. Paul M. Russo |
| 1985 | The Modern Fault Dictionary. Jeremy Richman, Kenneth R. Bowden |
| 1985 | The Uses and Costs of the Addition of Remote Operation Capability to New Products. Donald H. Lenhert |
| 1985 | Timing Accuracy Measurement System. Garry C. Gillette |
| 1985 | Training Tomorrow's Test Engineers: Experiences in Teaching an Undergraduate Course in VLSI Testing. Robert J. Feugate Jr., Steven M. McIntyre |
| 1985 | Universal Signal Routing Card. D. R. Morris |
| 1985 | VLSI Functional Test Pattern Generation: A Design and Implementation. Tonysheng Lin, Stephen Y. H. Su |
| 1985 | Various Architectures of Systems for Measuring Early-Life Failure Rates of Semiconductor Components. Howard D. Helms |
| 1985 | Waveform: A Software Tool for Efficient Test Program Development. Arthur E. Downey |
| 1985 | What Do You Say When Writing a Text About Test ? Alexander Miczo |