| 1984 | "Instant On" Semiconductor Memories: Reality or Myth. Frederick G. Hall, Robert G. Hillman, John M. Bednarczyk |
| 1984 | "Low Cost Testers" : Are They Really Low Cost ? Gordon H. Bowers Jr., Bruce G. Pratt |
| 1984 | 21-Bit Precision and High-Speed DC Measurement System. Tadaaki Satoh, Akira Takagi, Masami Kita, Katsuhiko Shirakawa, Shimpei Takeshita |
| 1984 | A Built-In Test Methodology for VLSI Data Paths. Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams |
| 1984 | A Design for Machines with Built-In Tolerance to Soft Errors. Yvon Savaria, Vinod K. Agarwal, Nicholas C. Rumin, Jeremiah F. Hayes |
| 1984 | A Fault-Driven, Comprehensive Redundancy Algorithm for Repair of Dynamic RAMs. John R. Day |
| 1984 | A Flexible Database System and Its Application in VLSI Process Development. Kou Wada, Satoshi Tazawa, Katsutoshi Kubota |
| 1984 | A Method for Test System Diagnostics Based on the Principles of Artificial Intelligence. A. Jesse Wilkinson |
| 1984 | A Multimode Programming Strategy for VLSI Boards. Peter Hansen |
| 1984 | A New Timing Calibration Method for High Speed Memory Test. Yasumasa Nishimura, Mitsuhiro Hamada, Y. Hayasaka |
| 1984 | A Rational Basis for Setting Burn-In Yield Criteria. Anthony P. van den Heuvel, Noshir F. Khory |
| 1984 | A Real-time Executive for a Distributed Processing System. G. Heretz, L. T. Matlock |
| 1984 | A Technique for Making Asynchronous Sequential Circuits Readily Testable. Alfred K. Susskind |
| 1984 | A Totally Universal Reset, Initialization (and) Nodal Observation Circuit. Jon Turino |
| 1984 | A Vote in Favor of Fault Simulation. J. Lawrence Carter |
| 1984 | ATWIG, An Automatic Test Pattern Generator with Inherent Guidance. Erwin Trischler |
| 1984 | Access Time Evaluation of Fast Static MOS Memories. E. Kurzweil, L. Jambut |
| 1984 | Adapting CAE Design Information for In-Circuit Test Generation. Brian C. Crosby |
| 1984 | Advanced Test System Software Architecture Blends High Speed with User Friendliness. Terence King |
| 1984 | An Analysis of the Economics of Self Test. Prab Varma, Anthony P. Ambler, Keith Baker |
| 1984 | An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets. Joseph L. A. Hughes, Edward J. McCluskey |
| 1984 | An Automated Laser Prober to Determine VLSI Internal Node Logic States. Francois J. Henley |
| 1984 | An Automated Test of a Disk Product Power System Independent of the Primary Function of the Machine. Gerard FitzPatrick, David F. Peach, Richard P. Cushman |
| 1984 | An Expert System for VLSI Tester Diagnostics. Robert Mullis |
| 1984 | An Information Processing Software System for ATE. James T. Healy |
| 1984 | Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing. Franc Brglez, Philip Pownall, Robert Hum |
| 1984 | Artificial Intelligence and Testing. Gordon D. Robinson |
| 1984 | Automated Electron Beam Testing of VLSI Circuits. P. Köllensperger, A. Krupp, Mathias Sturm, R. Weyl, F. Widulla, Eckhard Wolfgang |
| 1984 | Automatic Test Pattern Generation for Asynchronous Networks. Brian J. Heard, Ramu N. Sheshadri, Ronald B. David, Arvid G. Sammuli |
| 1984 | Automatic Visual Testing: A New, Comprehensive Element of Cost-Effective PCB Testing Strategies. Stephen P. Denker, Judy Cobb |
| 1984 | Automating Functional Programming for Micro-Based Boards. Steve Broyles |
| 1984 | Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of Test Programs. S. Daniel Lee, Tom Middleton |
| 1984 | Built-In Test for CMOS Circuits. Corot W. Starke |
| 1984 | Built-in Testing of Memory Using On-chip Compact Testing Scheme. Kozo Kinoshita, Kewal K. Saluja |
| 1984 | C : An Important Tool for Test Software Development. Steven L. Watkins, Kenny Liu, Mitchell Schrift, Robert Patrie |
| 1984 | CADOC : A System for Computer Aided Functional Test. Catherine Bellon, Gabriele Saucier |
| 1984 | CMOS VLSI Challenges to Test. Kenneth D. Mandl |
| 1984 | CODEC Testing Using Synchronized Analog and Digital Signals. Douglas K. Shirachi |
| 1984 | CVT-FERT : Automatic Generator of Analytical Faults at Register Transfer Level from Electrical and Topological Descriptions. M. Melgara, M. Paolini, Roberto Roncella, S. Morpurgo |
| 1984 | Can We Eliminate Fault Escape in Self-Testing by Polynomial Division (Signature Analysis) ? Dilip K. Bhavsar, Balakrishnan Krishnamurthy |
| 1984 | Channel Card Architecture for Multimode Board Test Systems. Mark S. Hoffman, Joseph F. Wrinn |
| 1984 | Compaction Technique Universal Pin Electronics. Philip C. Jackson, Gregory de Mare, Albert Esser |
| 1984 | Component Level Fault-Isolation Techniques in a Systems Test Environment. Eric Sacher |
| 1984 | Comprehensive Fault Model and Testing of CMOS Circuits. Dharma P. Agrawal, Sami A. Al-Arian |
| 1984 | Conquering Testability Problems by Combining In-Circuit and Functional Techniques. Stephen Caplow |
| 1984 | Correlating Testability with Fault Detection. Bill Underwood, M. Ray Mercer |
| 1984 | DeltaI vs. DeltaY : A Quantitative Analysis of the Trade-offs Between Higher Capital Investment and Higher Yield in PCB Testing. Mark A. Myers |
| 1984 | Design Verification, Product Characterization and Production Testing of Hybrids and Printed Circuit Cards Using High-Sensitivity Thermography Systems. Herb Boulton |
| 1984 | Design of Test Pattern Generators for Built-In Test. Ramaswami Dandapani, Janak H. Patel, Jacob A. Abraham |
| 1984 | Device Models : A New Methodology for a Perennial Problem. David Giles, Gregory A. Maston |
| 1984 | Disc Drive Testing Instrument. M. V. Limaye, K. Rajanikanth, H. S. Jamadagni |
| 1984 | Electron Beam Prober for LSI Testing with 100ps Time Resolution. Y. Goto, K. Ozaki, T. Ishizuka, A. Ito, Y. Furukawa, T. Inagaki |
| 1984 | Exploratory Data Analysis Makes Testing More Valuable for Semiconductor Manufacturing. Dean Bandes |
| 1984 | Fault Simulation at the Architectural Level. Scott Davidson |
| 1984 | Functional Characterization of Microprocessors. Axel Hunger, Axel Gärtner |
| 1984 | Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Technique. Tonysheng Lin, Stephen Y. H. Su |
| 1984 | Functional Test Pattern Generation for Integrated Circuits. Ramin Khorram |
| 1984 | Hardware and Software Tools for Microprocessor Functional Test. Catherine Bellon, Raoul Velazco |
| 1984 | High Resolution, High Linearity Interpolating A/D Converter. Alexander Holland |
| 1984 | High Speed Redundancy Processor. Gene P. Bosse |
| 1984 | Higher Certainty of Error Coverage by Output Data Modification. Yervant Zorian, Vinod K. Agarwal |
| 1984 | IBM's Cost Performance Array Tester Architecture for the 80's. Donald L. Wheater |
| 1984 | Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design. Yacoub M. El-Ziq, Hamid H. Butt |
| 1984 | Improve Yield and Quality Through Testability Analysis of VLSI Circuits. David M. Wu, Charles E. Radke, C. C. Beh |
| 1984 | In-Circuit Analog Component Testing at High Frequencies. Terence Lee |
| 1984 | In-Circuit Testability Factors: Shoot With a Rifle. Douglas W. Raymond |
| 1984 | Information and Material Flow Within a Production Test Cell. Graeme R. Kinsey |
| 1984 | Knowledge Representation in an In-Circuit Test Program Generator. Edward S. Hirgelt |
| 1984 | Logic Design Verification Using Automated Test Generation. Tohru Sasaki, Shunichi Kato, Nobuyoshi Nomizu, Hidetoshi Tanaka |
| 1984 | Logic Device Characterization Using Computer-Aided Test and Analysis. Robert W. Atherton, Leonard Ekkelkamp, Chuck Schmitz |
| 1984 | Logical Modeling of Physical Failures and Their Inherent Syndrome Testability in MOS LSI/VLSI Networks. Bhargab B. Bhattacharya, Bidyut Gupta |
| 1984 | Lower Overhead Design for Testability of Programmable Logic Arrays. Saied Bozorgui-Nesbat, Edward J. McCluskey |
| 1984 | MOS Gate Oxide Quality Control and Reliability Assessment by Voltage Ramping. Sushil K. Malik, E. F. Chace |
| 1984 | Measuring Thermal Rises Due to Digital Device Overdriving. G. Siva Bushanam, Vance R. Harwood, Philip N. King, Roger D. Story |
| 1984 | Methodology for and Results from the Use of a Hardware Logic Simulation Engine for Fault Simulation. Leslie Turner Smith, Roy R. Rezac |
| 1984 | Monitored Burn-In (A Case Study for In-Situ Testing and Reliability Studies). Michael J. Campbell |
| 1984 | Multi-Port Test Data Supply System. R. E. Kizis, G. C. Wickham |
| 1984 | On CMOS Totally Self-Checking Circuits. Sridhar R. Manthani, Sudhakar M. Reddy |
| 1984 | On Coosing a Hardware Descriptive Language for Digital Systems Testing/Verification. Bulent I. Dervisoglu |
| 1984 | PAL and Logic Array In-Circuit Testing Considerations. Robert G. Jacobson |
| 1984 | PBX System Test: Fast Functional Testing Without System Assembly. R. F. Voitus |
| 1984 | Parallel Pseudorandom Sequences for Built-In Test. Paul H. Bardell, William H. McAnney |
| 1984 | Parallel Testing of Random Logic LSIs. Nobuo Arai, Yoshio Yamanaka |
| 1984 | Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). Beau R. Wilson Jr., Eugene R. Hnatek |
| 1984 | Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984 |
| 1984 | Processing of Test Data between Design and Testing. A. J. Kombol |
| 1984 | Pseudo-Exhaustive Testing of Sequential Machines Using Signature Analysis. Syed Zahoor Hassan, Edward J. McCluskey |
| 1984 | Random Testing for Stuck-At Storage Cells in an Embedded Memory. William H. McAnney, Paul H. Bardell, V. P. Gupta |
| 1984 | Scan Path in CMOS Semicustom LSI Chips ? M. Gerner, Hans Nertinger |
| 1984 | Self-Testing of Embedded RAMs. Zuhi Sun, Laung-Terng Wang |
| 1984 | Software Convergence of Test Program Parameters. Anthony J. Burke |
| 1984 | Software Verification Techniques. Vin Ratford, Mike Gill |
| 1984 | Sufficient Testing In A Self-Testing Environment. Tom W. Williams |
| 1984 | Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells. Wojciech Maly, F. Joel Ferguson, John Paul Shen |
| 1984 | TPG2 : An Automatic Test Program Generator for Custom ICs. D. P. Ahrens, P. J. Bednarczyk, D. L. Denburg, R. M. Robertson |
| 1984 | Test Generation for FET Switching Circuits. J. Paul Roth, Vojin G. Oklobdzija, John F. Beetem |
| 1984 | Test Generation for MOS Circuits. Harry H. Chen, Robert G. Mathews, John A. Newkirk |
| 1984 | Test Logic Economic Considerations in a Commercial VLSI Chip Environment. J. S. Pittman, William C. Bruce |
| 1984 | Test Strategy for a 32-Bit Microprocessor Module with Memory Management. Ramaswamy Balasubramaniam, Peretz Feder |
| 1984 | Testability Analysis of MOS VLSI Circuits. David M. Singer |
| 1984 | Testability Analysis will not Replace Fault Simulation. Prabhakar Goel |
| 1984 | Testability Analysis: What Role Should it Play in IC Design ? F. C. Wang |
| 1984 | Testability Features of the MC68020. John Kuban, John Salick |
| 1984 | Testing a 317K bit High Speed Video Memory with a VSLI Test System. F. Pool, J. Hop, J. P. L. Lagerberg, C. Da Costa |
| 1984 | The Coverage Problem for Random Testing. Yashwant K. Malaiya, Shoubao Yang |
| 1984 | The Future is Now: Extending CAE into Test of Custom VLSI. Robert S. Broughton, Michael G. Brashler |
| 1984 | The Importance of Fault Simulation. Robert Willoner |
| 1984 | The Need for Real-Time Intelligence When Testing VLSI. Jeff Angwin, Paul Drake, Glenn Reader |
| 1984 | The Role of the Engineering Work Station in Test Program Development. Todd Westerhoff, Andre DiMino |
| 1984 | Thoughts on VLSI Burn-in. Eugene R. Hnatek |
| 1984 | Time Specification Conformance of VLSI Test Systems O5. William B. Abbott IV |
| 1984 | Transfer Function Estimation Part I : Theoretical and Practical Considerations. E. A. Sloane |
| 1984 | Transfer Function Estimation Part II : Some Experimental Results. James F. Campbell Jr. |
| 1984 | Using Simulation in the Design Process - A Case Study. Arthur Babitz, Kurt Lender |
| 1984 | Using a Synchronous High-Speed Sensor System to Diagnose Microprocessor Boards. Stephen R. Teta |
| 1984 | Will Testability Analysis Replace Fault Simulation ? Vishwani D. Agrawal |