| 1983 | A Convenient Algebra of Quality for Interpreting ATE Test Data. Kemon P. Taschioglou |
| 1983 | A Digital Polarity Correlator Featuring Built-In Self Test and Self Repair Mechanisms. William S. Blackley, Mervyn A. Jack, James R. Jordan |
| 1983 | A General Method for Increasing Converter Accuracy and Resolution. E. A. Sloane, P. W. Dodd |
| 1983 | A High Level Test Pattern Generation Algorithm. Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki |
| 1983 | A Microprocessor Based Method for Testing Transition Noise in Analog to Digital Converters. Phil Carrier |
| 1983 | A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis. Yacoub M. El-Ziq, Hamid H. Butt |
| 1983 | A New Approach to DC Parameter Measurement in the Day of VLSI. Takeshi Shigematsu, Takashi Sakamoto, Yoshio Yamanaka |
| 1983 | A New Hardware Architecture for Digital In-Circuit Testing. Matt Snook, Bob Illick |
| 1983 | A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. Miron Abramovici, Premachandran R. Menon |
| 1983 | A Simplified Algorithm for Testing Microprocessors. Kewal K. Saluja, Li Shen, Stephen Y. H. Su |
| 1983 | A Suitable Test System for Gate Array. Y. Kuramitsu, Y. Gamo |
| 1983 | A Tightly Coupled Multiprocessor for VLSI Testing. David R. Emberson |
| 1983 | A Waveform Digitizer for Dynamic Testing of High Speed Data Conversion Components. Joel Halbert, Mike Koen |
| 1983 | Adaptive Self-Test for a Microprocessor. C. Timoc, F. Stott, K. Wickman, L. Hess |
| 1983 | An Adaptable Emulation Support Environment for Microprocessor Systems. George F. Sprott |
| 1983 | An Analysis of ATE Testing Costs. Robert E. Huston |
| 1983 | An Analysis of the Cost and Quality Impact of LSI/VLSI Technology on PCB Test Strategies. Mark A. Myers |
| 1983 | An Application of Statistical Methods for System Failure Prediction. Alexander Kheruze, Ken Caruso |
| 1983 | An ETHERNET Based Solution to ATE Networking. Mark P. Skrzynski, Neal Shea |
| 1983 | An Information-Rich ATE Architecture. Larry C. Sollman |
| 1983 | An LSSD Pseudo Random Pattern Test System. Franco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom |
| 1983 | Analysis of Gate Array Failures Using Functional ATE. G. F. Meravi, J. J. Bell, Joseph C. Bernier |
| 1983 | Attainable Accuracy of Autocalibrating VLSI Test Systems. Burnell G. West |
| 1983 | Automatic Calibration for a VLSI Test System. Lisa Deerr |
| 1983 | Bayesian Models of Tests : Some Practical Results. M. Small, D. Murray |
| 1983 | Chroma Voltmeter Measurement Techniques for Analog LSI Devices. Robert Craven, Joseph Schissler, Peter Konde |
| 1983 | Comparison of AC Self-Testing Procedures. Zeev Barzilai, Barry K. Rosen |
| 1983 | Computer Aided Testability Evaluation and Test Generation. Chantal Robach, Ch. Malecha, Gilles Michel |
| 1983 | Concurrent Fault Detection Using a Watchdog Processor and Assertions. Aamer Mahmood, Edward J. McCluskey, David J. Lu |
| 1983 | Consideration While Introducing a Test Data Management System to the Factory Floor. R. Wade Williams |
| 1983 | Design for Testability Using Logic Programming. Paul W. Horstmann |
| 1983 | Design of High-Level Test Language for Digital LSI. Takuji Okamoto, Hiroyuki Shibata, Kozo Kinoshita |
| 1983 | Designing the VLSI Device-to-Board Test Ukraine Translator. Lubomyr M. Zobniw |
| 1983 | Digital Signal Processing Test Techniques for Telecommunications Integrated Circuits. Juerg Hofer, Bob Sigsby |
| 1983 | Diversified Testing. Al A. Tuszynski |
| 1983 | Employing Massive Parallelism in Digital ATPG Algorithms. Glenn A. Kramer |
| 1983 | Estimating the Required Size of an Automated Test and Repair System from Subassembly Volume and Failure Information. John C. Howland, Pat T. Harding |
| 1983 | FAST Technology In-Circuit Testing Considerations. Brian C. Crosby |
| 1983 | Fixturing for Surface-Mounted Devices. Richard N. Barnes |
| 1983 | Functional Test Vector Generation for Digital LSI/VLSI Devices. Tom Middleton |
| 1983 | Future of Temperature and Humidity Testing: Highly Accelerated Temperature and Humidity Stress Test (HAST). Sushil K. Malik, Jeffrey E. Gunn, Robert E. Camenga |
| 1983 | Generating Tests for Physical Failures in MOS Logic Circuits. Prithviraj Banerjee, Jacob A. Abraham |
| 1983 | HITEST : Intelligent Test Generation. Gordon D. Robinson |
| 1983 | HITEST Test Generation System Interfaces. Colin M. Maunder |
| 1983 | High-Fidelity Device Tester Interface. Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata |
| 1983 | High-Speed In-Circuit Testing. Steven L. Bates |
| 1983 | IC Quality Control by the User. Roger Dunn |
| 1983 | Implementation of a Memory-Emulation Diagnostic Technique. Brian J. Sargent |
| 1983 | Implementing a Self-Managed Test Vector Memory with One Million Elements. Steven Ladd |
| 1983 | Incorporating Test Technology into an Undergraduate Curriculum. Jacob A. Abraham |
| 1983 | Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System. Michael Catalano, Richard K. Feldman, Roberto Krutiansky, Richard Swan |
| 1983 | Inside a Modern Test Language Compiler. David C. Snyder, Elaina S. Stokes, Richard C. Mahoney |
| 1983 | Integration into the CAD Environment. W. Boggs |
| 1983 | Logical Models of Physical Failures. C. Timoc, M. Buehler, T. Griswold, C. Pina, F. Stott, L. Hess |
| 1983 | New Directions for VLSI Test Systems. Phil Brothers |
| 1983 | New Techniques for High Speed Analog Testing. Matthew V. Mahoney |
| 1983 | New Techniques for Manufacturing Test and Diagnosis of LSSD Boards. Peter Hansen |
| 1983 | Non-Stuck-At Fault Detection in nMOS Circuits by Region Analysis. Michael G. Lamoureux, Vinod K. Agarwal |
| 1983 | On Random Pattern Test Length. Jacob Savir, Paul H. Bardell |
| 1983 | On Testable Design for CMOS Logic Circuits. Jon G. Kuhl, Sudhakar M. Reddy |
| 1983 | On-Line Self-Monitoring Using Signatured Instruction Streams. Michael A. Schuette, John Paul Shen |
| 1983 | Operations Management and Analysis in the Management of Electronic Testing. Robert W. Atherton, Alfred H. Miller Jr., Judith E. Dayhoff |
| 1983 | Optimizing the Timing Architecture of a Digital LSI Test System. Richard F. Herlein |
| 1983 | Parallel Testing of Non-Volatile Memories. Garry Marks |
| 1983 | Pattern Recognition of Bit Fail Maps. Marc R. Faucher |
| 1983 | Power Supply Noise Testing of VLSI Chips. R. Y. Li, S. C. Diehl, S. Harrison |
| 1983 | Predicting Test Accuracy for Analog In-Circuit Testing. Max Khazam |
| 1983 | Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983 |
| 1983 | Production Test and Repair of 256K Dynamic RAMS with Redundancy. Donald M. Stewart |
| 1983 | Production Testing of PCM (Digital) Audio Circuits. Mark Landry |
| 1983 | Real-Time Automatic Calibration of Analog Test Systems. Douglas A. Blakeslee |
| 1983 | Real-Time Product Characterization by Fault Modeling and Pattern Recognitions. Feng-Hsien Warren Shih |
| 1983 | Recurrent Test Patterns. Edward J. McCluskey, David J. Lu |
| 1983 | Reducing the Cost of Quality through Test Data Management. Paul N. Manikas, Stephen G. Eichenlaub |
| 1983 | Safe Operating Zones for Digital In-Circuit Testing. G. Siva Bushanam, H. Story |
| 1983 | Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost. Alan F. Murray, Peter B. Denyer, David Renshaw |
| 1983 | Signature Testing of Sequential Machines. Syed Zahoor Hassan |
| 1983 | Simulation Pattern Capturing System for Design Verification Using a Dynamic High Speed Functional Tester (DHSFT). David Florcik, David Low |
| 1983 | Software Solutions Enhance ATE Networking Capabilities. Gerry Schmid |
| 1983 | Structured Logic Analysis for Manufacturing Testing. Robert S. Broughton |
| 1983 | Subnanosecond Timing Measurements on MOS Devices Using Modern VLSI Test Systems. Mark R. Barber |
| 1983 | Syndrome Testable Design of Combinational Networks for Detecting Stuck-At and Bridging Faults. Bhargab B. Bhattacharya, Bidyut Gupta |
| 1983 | Syndrome-Testable Design of Programmable Logic Arrays. Teruhiko Yamada |
| 1983 | System Architecture for Optimum DC Parameter Measurements. John R. Schinabeck |
| 1983 | System Test Visibility Or Why Can't You Test Your Electronics. Frederick G. Danner |
| 1983 | System Test: Applications of Control Interface Testing. F. Scott Davidson |
| 1983 | Teaching Testing. Edward J. McCluskey |
| 1983 | Test Pattern Compaction in VLSI Testers. Robert Albrow |
| 1983 | Test Program Optimization Techniques for a High Speed Performance VLSI Tester. Arthur L. Downey |
| 1983 | Test Set Reduction Using the Subscripted D-Algorithm. John F. McDonald, C. Benmehrez |
| 1983 | Test Technology in the University. Kenneth Rose |
| 1983 | Testability Emphasis in the General Electric A/VLSI Program. Robert C. Kroeger |
| 1983 | Tester Correlation Problem in Memory Testers Used in Production Lines. Masaaki Arao, Takao Tadokoro, Hiromi Maruyama, Shinpei Kamata |
| 1983 | Tester Independent Problem Representation and Tester Dependent Program Generation. Robert L. Hickling |
| 1983 | Testing Computer Hardware through Data Compression in Space and Time. Kewal K. Saluja, Mark G. Karpovsky |
| 1983 | Testing Issues at the University of Texas. M. Ray Mercer |
| 1983 | Testing Microprocessor Boards and Systems: A New Approach. John A. Masciola, Gary Roberts |
| 1983 | Testing Trends in Automotive Electronics. Robert F. Miller, Kenneth W. Doversberger |
| 1983 | Testing a High Performance Modem Filter. Stephen W. Bryson |
| 1983 | Testing for Timing Faults in Synchronous Sequential Integrated Circuits. Yashwant K. Malaiya, Ramesh Narayanaswamy |
| 1983 | Testing of Bit-Serial Signal Processors. Nick Kanopoulos, G. Thomas Mitchell |
| 1983 | The Develpment of a Tester-Per-Pin VLSI Test System Architecture. Steve Bisset |
| 1983 | The Economics of Parallel Testing. Marc A. Rich, Daniel E. Gentry |
| 1983 | The Effect of the Factory of the Future on Society. J. A. G. Shearsmith |
| 1983 | The GENESYS-Algorithm for ATPG without Fault Simulation. Mats Johansson |
| 1983 | The HITEST Test Generation System Overview. David J. Wharton |
| 1983 | The Impact of a VLSI Test System on the Test Throughput Equation. Charles McMinn |
| 1983 | The MC6804P2 Built-In Self-Test. John R. Kuban, Bill Bruce |
| 1983 | The Role of Testing in Achieving Zero Defects. Donald S. Cleverley |
| 1983 | The Sequential ATPG: A Theoretical Limit. Alexander Miczo |
| 1983 | Total Fault Testing Using the Bipartite Transformation. Andrea S. LaPaugh, Richard J. Lipton |
| 1983 | Turning Test Data into Information. Pat T. Harding, John C. Howland |
| 1983 | Use of In-Fab Parametric Testing for Process Control of Semiconductor Manufacturing. Robert W. Atherton, David M. Campbell |
| 1983 | User's Requirements for Automated Handling in Computer Manufacturing and Board Test. Jack H. Arabian |