| 1982 | , An Efficient Test Vector Generation and Reduction Method for an LSI Digital Filter Circuit Using an Adaptive Search Technique. Roderick H. Macmillan, M. R. Bentley |
| 1982 | 9826A Computer Burn-In Program. Ken Fedraw |
| 1982 | A Closer Look at Testing Costs. G. A. Perone, R. S. Maljatt, J. P. Kain, W. I. Goodheim |
| 1982 | A Coherent and Efficient Approach to LSI Modeling and Testing for Integrated Circuit Users. Jaques Couesnon, Michel Parot |
| 1982 | A Common Pascal Test Language: Reality or Pipedream. Richard C. Mahoney |
| 1982 | A Design for Complete Testability of Programmable Logic Arrays. K. S. Ramanatha, Nripendra N. Biswas |
| 1982 | A Fault Detection and Isolation Technique for Microcomputers. Patrick P. Fasang |
| 1982 | A New Approach to On-Board Microprocessor-Based Self-Test. T. Jackson, P. Vais, K. Schwerbrock |
| 1982 | A New Fault Model and Testing Technique for CMOS Devices. Yashwant K. Malaiya, Stephen Y. H. Su |
| 1982 | A New Software Tool for Detecting Problems Caused by Inductively-Generated Switching Noise. John P. Barlow |
| 1982 | A Precision Measurement Technique for High Frequency Repetitive Signals. David C. Cheng |
| 1982 | A Pursuit of Superior Cost-Per-Performance in General-Purpose Linear IC Test System. Yasutoshi Otani, Eiji Ishiwa, Nobuo Arai, Yoshio Yamanaka |
| 1982 | A Technique for Testing Large Distributed Systems. John A. Masciola, Mark S. Lucas |
| 1982 | A Tester-Independent Automated Test Preparation Process for Loaded Boards. Hookuong Wong, David Florcik |
| 1982 | A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams |
| 1982 | ATPG and Simulation Systems : The State of the Art. Harold Levin |
| 1982 | An Accelerated Testing Technique for Plastic Package Devices Using a Sequential Combination of Pressure Cooker and 85/85 (PCTH). G. Eugene Gottlieb |
| 1982 | An Algorithmic Approach to the Testing of a Wafer Scale Integrated (WSI) Circuit. Neal H. MacDonald, Gordon B. Neish |
| 1982 | An Architecture for Testable VLSI Processors. Satish M. Thatte, D. S. Ho, H.-T. Yuan, Thirumalai Sridhar, Theo J. Powell |
| 1982 | An Automatic Test Equipment Database System Used in the Generation and Analysis of Fault Statistics at the Printed Circuit Board Level. W. L. Goldie, P. F. Macready |
| 1982 | An Evaluation of the 2816 EEPROM. Eugene R. Hnatek, Beau R. Wilson Jr. |
| 1982 | An Interactive Descrambler Program for RAMs with Redundancy. Nik Kirschner |
| 1982 | An STL Gate Array Reliability Test Bar. Joel P. LeBlanc Jr. |
| 1982 | Analysis and Simulation of Parallel Signature Analyzers. Thirumalai Sridhar, D. S. Ho, Theo J. Powell, Satish M. Thatte |
| 1982 | Analysis of the Switching Behavior of Combinatorial Logic Networks. Eugen I. Muehldorf, Thomas W. Williams |
| 1982 | Applying Test Theory to VLSI Testing. Ming-Guan Lin, Kenneth Rose |
| 1982 | Automated Analysis of Static RAM Failures. Mike Schell, Mike Sigler |
| 1982 | Automated Contactless Digital Test System for VLSI. K. Thangamuthu, M. Macari, S. Cohen |
| 1982 | Automated Generation of Device Test Software. Iqbal Syed, Nicole Rose |
| 1982 | Automated Test Instrumentation for Low-Current Testing. Kennteth F. Coop |
| 1982 | Automatic Behavioral Test Generation. Kyuhik Son, James Y. O. Fong |
| 1982 | Benefits of ATE and Host Computer Networking. Wayne Bryant, Charles Furry, Jim Hahn |
| 1982 | Board Diagnosis: A Current Assessment and Direction for Future Improvement. Peter Solecky, Frank C. Hsu |
| 1982 | Board Test Session I. Eric H. Millham |
| 1982 | Board Testing II. R. Oberly |
| 1982 | Board Testing. Reymon Oberly |
| 1982 | Built-In Verification Test. Edward J. McCluskey |
| 1982 | COMET: A Testability Analysis and Design Modification Package. William C. Berg, Robert D. Hess |
| 1982 | Calculating VOH for LSI 10K ECL. Thomas A. Senna |
| 1982 | Closing the Loop: An Expanding Role for ATE in Semiconductor Manufacturing. Matthew V. Mahoney |
| 1982 | Concurrent Checking of Program Flow in VLSI Processors. Thirumalai Sridhar, Satish M. Thatte |
| 1982 | Concurrent Testing of Flow of Control in Simple Microprogrammed Control Units. Vijay S. Iyengar, Larry L. Kinney |
| 1982 | Design Goals and Implementation Techniques for Time-Based Digital Simulation and Hazard Detection. Kenneth R. Bowden |
| 1982 | Design of Easily Testable Microprocessors : A Case Study. Sunil Nanda, Sudhakar M. Reddy |
| 1982 | Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks |
| 1982 | Designing a High-Speed Vector Bust to Meet the Requirements of Analog LSI Testing. James Seaton, Jeffrey Axelbank |
| 1982 | Digital Signal Processing for Production Testing of Analog LSI Devices. Tim Higgins |
| 1982 | Do Stuck Fault Models Reflect Manufacturing Defects? C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku |
| 1982 | ECL Board Testing: An In-Circuit Point of View. Brian C. Crosby |
| 1982 | Electronic Chip-In-Place Test. Prabhakar Goel, M. T. McMahon |
| 1982 | Fault Modeling and Test Effectiveness Evaluation for VLSI Circuits. Peter S. Bottorff |
| 1982 | Fault Modelling for Functional Primitives. Alexander Miczo |
| 1982 | Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions. Matthew L. Fichtenbaum |
| 1982 | Filtering Methods for Fast Ultra-Low Distortion Measurements. William J. Bowhers |
| 1982 | Higher Yields, Lower Costs. Melissa E. Broussard |
| 1982 | ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs. I. M. Watson, John A. Newkirk, Robert G. Mathews, D. B. Boyle |
| 1982 | Implications of the Technique for Dynamic High Speed Functional Testing. Dennis Hebert, Jack H. Arabian |
| 1982 | Improving the Effectiveness of Board Test Programmers. Donald Stewart |
| 1982 | Increasing Test Engineering Effectivness. Douglas Greenwood |
| 1982 | Integrated Functional/Structural Timing for Digital Simulation. David Giles, Charles Berking, Kenneth Wacks |
| 1982 | LSI Self-Test Using Level Sensitive Scan Design and Signature Analysis. Donald Komonytsky |
| 1982 | MCM Data Analysis Tracking System. R. Burgess, E. Pignetti, J. Pitti |
| 1982 | Maintaing Quality, Poductivity and Profit in a Changing Bell System. Luis T. Burke Jr. |
| 1982 | Managing Your Test Cost for the 80's. William K. Jones |
| 1982 | Manufacturing Productivity: Automated vs. Manual Test-Data-Management Systems. Bruce G. MacAloney, Paul Littlejohn |
| 1982 | Memory Test : An International Art. D. J. Graham |
| 1982 | Methods of Assignment of Nodes to Pins for Multiplexed Testers. James J. Faran Jr. |
| 1982 | Microelectronic Device Electrical Test Implementation Problems on Automated Test Equipment. Willis J. Horth, Frederick G. Hall, Robert G. Hillman |
| 1982 | On Functional Controllability and Observability Analysis. James Y. O. Fong |
| 1982 | Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982 |
| 1982 | Professional Aspects of Test Engineering. John Turino |
| 1982 | Professional Aspects of Test Engineering. James L. Kroening |
| 1982 | Quality Control for Production Testing. F. G. Cockerill |
| 1982 | Quality and Reliability. Bill Hedrick |
| 1982 | Run-Time Program for Self-Checking Single Board Computer. J. Abadir, Yves Deswarte |
| 1982 | Self-Test Chip to System Level Approaches. Richard M. Sedmak |
| 1982 | Self-Testing of Multichip Logic Modules. Paul H. Bardell, William H. McAnney |
| 1982 | Signature Analysis: Yet Another Perspective. K. S. Bhaskar |
| 1982 | Signature Testing with Guaranteed Bounds for Fault Coverage. William C. Carter |
| 1982 | Simple and Efficient Algorithms for Functional RAM Testing. Marian Marinescu |
| 1982 | Simplified Microprocessor Test Generation. Charles Hinchcliff |
| 1982 | Soft Failure Detection and Correction in Microprocessor Characterization. Bell Liu |
| 1982 | Structured Programming and the I.C. Test Engineer. Antony K. Stevens |
| 1982 | System Test. Richard A. Albright |
| 1982 | Systems Testing Why ? Kenneth R. Willey |
| 1982 | Techniques for Concurrent Testing of VLSI Processor Operation. Masood Namjoo |
| 1982 | Test Considerations for Components with Redundant Elements. David C. Cheng, Alexander A. Grillo |
| 1982 | Test Data Automation: An ATE Distributed Processing Application in a Multi-Vendor Environment. David W. Malas, Stephen C. Hagan |
| 1982 | Test Equipment and Methods I. Joel M. Schoen |
| 1982 | Test Equipment and Methods II. Richard B. Craven |
| 1982 | Test Pattern Portability for Microprocessors. William S. Richardson |
| 1982 | Test Software. Roger Simpson |
| 1982 | Test System Remote Program Management. Gregory Illes |
| 1982 | Testability Measures : What Do They Tell Us ? Vishwani D. Agrawal, M. Ray Mercer |
| 1982 | Testing System for Redundant Memory. Y. Hayasaka, K. Shimotori, K. Okada |
| 1982 | Testing VLSI Microprocessor with New Functional Capability. Junji Nishiura, Toshio Maruyama, Hiromi Maruyama, Shinpei Kamata |
| 1982 | Testing an Audio Spectrum Analyzer for Speech Recognition Systems. Stephen W. Bryson |
| 1982 | Testing and Structured Design. Erik DeBenedictis, Charles L. Seitz |
| 1982 | Testing during Burn-In: Economical Alternative for Testing Memories. Charles E. Shalvoy |
| 1982 | Testing of Sense Amplifier in Dynamic Memory. T. Tada, T. Kobayashi, K. Okada, Y. Kuramitsu |
| 1982 | Testing the Dynamic Performance of High-Speed A/D Converters. K. Uchida |
| 1982 | The Effects of Backdriving Digital Integrated Circuits during In-Circuit Testing. Louis J. Sobotka |
| 1982 | To Measure Quality in the Manufacturing of Printed Circuit Boards. Kemon P. Taschioglou |
| 1982 | Universal Tests Detecting Input/Output Faults in Almost All Devices. Mark G. Karpovsky |
| 1982 | Using Analog Signature Analysis in Speech Synthesis Device Testing. Bradford Robbins, David K. Oka |
| 1982 | VICTOR : A Fast VLSI Testability Analysis Program. Ion M. Ratiu, Alberto L. Sangiovanni-Vincentelli, Donald O. Pederson |