| 1981 | A "Three Mode" Command Language for ATE. Arthur E. Downey |
| 1981 | A CCD Imager Test System. Charles Koehler |
| 1981 | A Calculus of Testability Measure at the Functional Level. Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada |
| 1981 | A Correlation Study of Modern Techniques Applied to the Testing of Telecommunication Circuits. Richard Adams |
| 1981 | A Data Management System for Testing Memory Devices. C. P. Ancheta, J. C. Helland |
| 1981 | A High-Performance Integrated Analog/Digital Test and Characterization Test System. R. A. Hum, D. L. Williams, J. W. Lamonde |
| 1981 | A Method for Testing Subnanosecond ECL. Beau R. Wilson Jr. |
| 1981 | A New Technique for Testing Settling Time in a Production Environment. J. Anson Whealler |
| 1981 | A Self-Test Method for Digital Circuits. M. T. M. Segers |
| 1981 | A System for Converter Testing Using Walsh Transform Techniques. E. A. Sloane |
| 1981 | A Test Analysis Program for Memory Testing. Nalin Shah, Hira Ranga |
| 1981 | A Unified Test Plan for LSI or VLSI Components. Kent Lunneborg |
| 1981 | A Working Approach to Volume CODEC Testing. John C. Lundy |
| 1981 | ANGEL : Algorithmic Pattern Generation System. Brad Snoulten, John Peacock |
| 1981 | An 18-Bit Precision DC Measurement System. Robert B. Craven, E. Rachel Morris |
| 1981 | An Approach to Memory Testing, Diagnostics and Analysis. Joan M. Morrissey, Ching-Hua Chow, Ronald C. Devries, C. Megivern |
| 1981 | An Enhanced Analog/Digital GPIB Based PCB Test System. Dave Peachey, Robert O'Harold |
| 1981 | An NBS Calibration Service for A/D and D/A Converters. T. Michael Souders, D. R. Flach |
| 1981 | Analysis and Definition of Overall Timing Accuracy in VLSI Test System. Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo |
| 1981 | Analytical Testing of Data Processing Sections of Integrated CPUs. Bernard Courtois |
| 1981 | Applying Quality Curves for Economic Comparison of Alternative Test Strategies. Kemon P. Taschioglou |
| 1981 | Automated Measurement of 12 to 16-Bit Converters. Matthew V. Mahoney |
| 1981 | Automatic Testing of Speech Synthesis Integrated Circuits. David K. Oka, Bradford Robbins, William Bowhers |
| 1981 | BELLMACT-32 : A Testable 32 bit Microprocessor. Williams Ludwell Harrison, Robert P. Davidson, Ronald L. Wadsack |
| 1981 | CMOS Is Most Testable. Mark W. Levi |
| 1981 | Completely Self-Checking Checkers in PLAs. Kyushik Son, Dhiraj K. Pradhan |
| 1981 | Computer-Guided Probing Techniques. Stephen Jochan, Norman Landis, Duke Monson |
| 1981 | DIAL : An Automated ATE Service Support System. Gerald C. Goshaw |
| 1981 | DORA : A System of CAD Post-Processors Providing Test Programs and Automatic Diagnostics Data for Digital Device and Board Manufacture. R. W. Allen, C. D. Chen, M. M. Ervin-Willis, K. R. Rahlfs, R. F. Thulloss, S. L. Wu |
| 1981 | Data Management for Large Memory Device Characterization. Robert S. Broughton |
| 1981 | Designing Testable Synchronous Logic. Chung Ho Chen |
| 1981 | Digital Signal Processing Considerations in Filter-Codec Testing. Franc Brglez |
| 1981 | Documentation for Testability : The Supplier's Responsibility to the User. Eugene R. Hnatek |
| 1981 | Driving Forces Behind Field-Based System Testing. J. Thomas Zender |
| 1981 | Dynamic Memory Array Card Burn-In and High Speed Functional Card Testing. John J. Allard |
| 1981 | Efficient Logic Verification and Test Validation for MOS LSI Circuits. Kaoru Okazaki, Toshihiko Yahara |
| 1981 | Electron-Beam Testing of VLSI Dyrnamic RAMs. G. K. Lukianoff, J. S. Wolcott, Joan M. Morrissey |
| 1981 | Factory Final Test Systems. J. L. Saathoff |
| 1981 | Fault Diagnosis in an LSSD Environment. Y. Arzoumanian, John A. Waicukauski |
| 1981 | Fault Spectrum: An Analysis of System Level Test with Proposed Solutions. Bruce G. MacAloney |
| 1981 | Field System Test Strategies for the 1980's. Charles P. Frusterio |
| 1981 | Final Test of an LSI Populated System: A Pragmatic Approach. William K. Jones |
| 1981 | Functional Level Test Generation for Complex Digital Systems. Jacob A. Abraham |
| 1981 | Functional Testing Folklore and Fact. Peter S. Bottorff |
| 1981 | Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI. Yacoub M. El-Ziq, Richard J. Cloutier |
| 1981 | Hardware Test Pattern Generation for Built-In Testing. Wilfried Daehn, Joachim Mucha |
| 1981 | Hidden Cost Considerations in Long Term Use of ATE Programs. Joseph A. Ruggieri |
| 1981 | High-Speed Functional Testing of Microprocessor-Based Circuit Boards. Eric Sacher |
| 1981 | High-Volume Production Testing and Its Impact on the Development of Microprocessor Prototyping Tools. Robert M. Rolfe |
| 1981 | IBM's VLSI Logic Test System. R. N. Powell |
| 1981 | Implications of Board Testing at Speed. Geoffrey J. Bunza |
| 1981 | Importance of Asynchronous Refreshing in Memory Testing. E. Kurzweil, L. Jambut |
| 1981 | In-Circuit Test Techniques Applied to Complex Digital Assemblies. Aldo Mastrocola |
| 1981 | Internal Diagnostics for Tektronix Graphics Terminals. Wayne Cook |
| 1981 | Microprocessor Modeling for Logic Simulation. James Y. O. Fong |
| 1981 | Paragons for Memory Test. Steven Winegarden, Donald Pannell |
| 1981 | Parametric Relationships for Self-Contained Test for Digital Avionics Functions. Samuel Kitces, John E. Bauer |
| 1981 | Planning for Test of Custom IC Devices. Micahel R. Saleno |
| 1981 | Preparation of Product Test Plans. G. W. Jacob |
| 1981 | Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981 |
| 1981 | Self-Testing by Polynomial Division. Dilip K. Bhavsar, Richard W. Heckelman |
| 1981 | Single Testability Figure of Merit. Predrag G. Kovijanic |
| 1981 | State Diagram Approach for Functional Testing of Control Section. Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya |
| 1981 | System to Optimize Test Quality and Efficiency for Memories and LSI. Robert G. Dunn, A. Kwan, David P. Rodgers, D. Sandstrom, C. Sie |
| 1981 | Test Generation for Highly Sequential Scan-Testable Circuits Through Logic Transformation. M. Ray Mercer, Vishwani D. Agrawal, Carlos M. Roman |
| 1981 | Testing Functional Faults in Digital Systems Described by Register Transfer Language. Stephen Y. H. Su, Yu-I Hsieh |
| 1981 | Testing Repairable RAMs and Mostly Good Memories. Robert C. Evans |
| 1981 | The Challenge of Testing VLSI in the 1980's. William P. Thurston |
| 1981 | The Economics of the Memory Tester Decision. G. A. Perone, P. A. LaBerge |
| 1981 | The IBM Maintenance Device. John W. Marvill |
| 1981 | The PIN Module: A High Accuracy Concept in Very High Frequency Pin Electronics. Paul Chang, Ed Richards, David Richter |
| 1981 | The Self-Assist Test Approach to Embedded Arrays. Douglas W. Westcott |
| 1981 | The Series/1 as a Test System Controller for System Verification and Calibration. Donald L. Wheater, Richard Soderman |
| 1981 | Today a Collection of Modules: Tomorrow a System. D. C. Jessep Jr. |
| 1981 | VLSI : How Much Fault Coverage Is Enough ? Ronald L. Wadsack |
| 1981 | VLSI Self-Testing Based on Syndrome Techniques. Zeev Barzilai, Jacob Savir, George Markowsky, Merlin G. Smith |