| 2002 | 13th International Symposium on Software Reliability Engineering (ISSRE 2002), 12-15 November 2002, Annapolis, MD, USA |
| 2002 | A Case Study Using the Round-Trip Strategy for State-Based Class Testing. Giuliano Antoniol, Lionel C. Briand, Massimiliano Di Penta, Yvan Labiche |
| 2002 | A Flexible Generator Architecture for Improving Software Dependability. Christof Fetzer, Zhen Xiao |
| 2002 | A Framework for Live Software Upgrade. Lizhou Yu, Gholamali C. Shoja, Hausi A. Müller, Anand Srinivasan |
| 2002 | A Reliability Estimator for Model Based Software Testing. Kirk Sayre, Jesse H. Poore |
| 2002 | A Vector Markov Model for Structural Coverage Growth and the Number of Failure Occurrences. Michael Grottke |
| 2002 | An Empirical Study of Tracing Techniques from a Failure Analysis Perspective. Satya Kanduri, Sebastian G. Elbaum |
| 2002 | Automatic Failure Detection, Logging, and Recovery for High-Availability Java Servers. Reinhard Klemm, Navjot Singh |
| 2002 | Automatic Synthesis of Dynamic Fault Trees from UML System Models. Ganesh J. Pai, Joanne Bechta Dugan |
| 2002 | Blocking-based Simultaneous Reachability Analysis of Asynchronous Message-passing Programs. Yu Lei, Kuo-Chung Tai |
| 2002 | Data Coverage Testing of Programs for Container Classes. Ponrudee Netisopakul, Lee J. White, John Morris, Daniel Hoffman |
| 2002 | Dependability Analysis of a Client/Server Software System with Rejuvenation. Hiroyuki Okamura, Satoshi Miyahara, Tadashi Dohi |
| 2002 | Effect of Disturbances on the Convergence of Failure Intensity. João W. Cangussu, Aditya P. Mathur, Raymond A. DeCarlo |
| 2002 | Emulation of Software Faults by Educated Mutations at Machine-Code Level. João Durães, Henrique Madeira |
| 2002 | Fault Contribution Trees for Product Families. Dingding Lu, Robyn R. Lutz |
| 2002 | Fault Detection Capabilities of Coupling-based OO Testing. Roger T. Alexander, Jeff Offutt, James M. Bieman |
| 2002 | Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment. Benoit Baudry, Franck Fleurey, Jean-Marc Jézéquel, Yves Le Traon |
| 2002 | Heterogeneous Software Reliability Modeling. Wen-Li Wang, Mei-Hwa Chen |
| 2002 | Improving Usefulness of Software Quality Classification Models Based on Boolean Discriminant Functions. Taghi M. Khoshgoftaar |
| 2002 | Informal Proof Analysis Towards Testing Enhancement. Guillaume Lussier, Hélène Waeselynck |
| 2002 | Inter-Class Mutation Operators for Java. Yu-Seung Ma, Yong Rae Kwon, Jeff Offutt |
| 2002 | Metrics for Measuring the Effectiveness of Software-Testing Tools. James Bret Michael, Bernard J. Bossuyt, Byron B. Snyder |
| 2002 | Modeling and Analysis of Software Rejuvenation in Cable Modem Termination Systems. Yun Liu, Kishor S. Trivedi, Yue Ma, James J. Han, Haim Levendel |
| 2002 | Mutation of Java Objects. Roger T. Alexander, James M. Bieman, Sudipto Ghosh, Bixia Ji |
| 2002 | On Estimating Testing Effort Needed to Assure Field Quality in Software Development. Osamu Mizuno, Eijiro Shigematsu, Yasunari Takagi, Tohru Kikuno |
| 2002 | Optimal Allocation of Testing Resources for Modular Software Systems. Chin-Yu Huang, Jung-Hua Lo, Sy-Yen Kuo, Michael R. Lyu |
| 2002 | Reliability Assessment of Framework-Based Distributed Embedded Software Systems. Farokh B. Bastani, Sung Kim, I-Ling Yen, Ing-Ray Chen |
| 2002 | Reliability Prediction and Sensitivity Analysis Based on Software Architecture. Swapna S. Gokhale, Kishor S. Trivedi |
| 2002 | Saturation Effects in Testing of Formal Models. Tim Menzies, David Owen, Bojan Cukic |
| 2002 | Test Reuse in the Spreadsheet Paradigm. Marc Fisher II, Dalai Jin, Gregg Rothermel, Margaret M. Burnett |
| 2002 | Testing Processes from Formal Specifications with Inputs, Outputs and Data Types. Grégory Lestiennes, Marie-Claude Gaudel |
| 2002 | The Impact of Recovery Mechanisms on the Likelihood of Saving Corrupted State. Subhachandra Chandra, Peter M. Chen |
| 2002 | Toward A Quantifiable Definition of Software Faults. John C. Munson, Allen P. Nikora |
| 2002 | Worst Case Reliability Prediction Based on a Prior Estimate of Residual Defects. Peter G. Bishop, Robin E. Bloomfield |