IOLTS C

36 papers

YearTitle / Authors
2023$\text{MP}\ell\circ \mathrm{C}$: Privacy-Preserving IP Verification Using Logic Locking and Secure Multiparty Computation.
Dimitris Mouris, Charles Gouert, Nektarios Georgios Tsoutsos
202329th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023, Crete, Greece, July 3-5, 2023
Alessandro Savino, Michail Maniatakos, Stefano Di Carlo, Dimitris Gizopoulos
2023A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor Logic.
Zhe Zhang, Zhihang Wu, Christian Weis, Norbert Wehn, Mehdi Baradaran Tahoori
2023A Novel Approach to Error Resilience in Online Reinforcement Learning.
Chandramouli N. Amarnath, Abhijit Chatterjee
2023A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable Functions.
Aghiles Douadi, Giorgio Di Natale, Paolo Maistri, Elena-Ioana Vatajelu, Vincent Beroulle
2023About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics.
Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2023An Integrated Testbed for Trojans in Printed Circuit Boards with Fuzzing Capabilities.
Prashanth Krishnamurthy, Hammond Pearce, Virinchi Roy Surabhi, Joshua Trujillo, Ramesh Karri, Farshad Khorrami
2023Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power Lines.
Fabian Vargas, Douglas Borba, Juliano Benfica, Rizwan Tariq Syed
2023Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication.
Riku Iwamoto, Masanori Hashimoto
2023BALoo: First and Efficient Countermeasure Dedicated to Persistent Fault Attacks.
Pierre-Antoine Tissot, Lilian Bossuet, Vincent Grosso
2023Detecting Hardware Faults in Approximate Adders via Minimum Redundancy.
Ioannis Tsounis, Dimitris Agiakatsikas, Mihalis Psarakis
2023ERrOR: Improving Performance and Fault Tolerance Using Early Execution.
Raj Kumar Choudhary, Janeel Patel, Virendra Singh
2023Evaluation and Mitigation of Faults Affecting Swin Transformers.
Gabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez
2023Experimental Evaluation of Delayed-Based Detectors Against Power-off Attack.
Maryam Esmaeilian, Aghiles Douadi, Zahra Kazemi, Vincent Beroulle, Amir-Pasha Mirbaha, Mahdi Fazeli, Elena-Ioana Vatajelu, Paolo Maistri, Giorgio Di Natale
2023Exploiting the Error Resilience of the Preconditioned Conjugate Gradient Method for Energy and Delay Optimization.
Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich
2023Feedback-Tuned Fuzzing for Accelerating Quality Verification of Approximate Computing Design.
Yusei Honda, Yutaka Masuda, Tohru Ishihara
2023Keytone: Silent Data Corruptions at Scale.
Harish Dixit
2023ML-Based Online Design Error Localization for RISC-V Implementations.
Hardi Selg, Maksim Jenihhin, Peeter Ellervee, Jaan Raik
2023Microarchitecture-Aware Timing Error Prediction via Deep Neural Networks.
Styliani Tompazi, Georgios Karakonstantis
2023Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging.
Yunus Emre Aslan, Florian Cacho, T. Kumar, D. K. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel
2023Neural Network Quantisation for Faster Homomorphic Encryption.
Wouter Legiest, Furkan Turan, Michiel Van Beirendonck, Jan-Pieter D'Anvers, Ingrid Verbauwhede
2023On Evaluating the Security of Dynamic Scan Obfuscation Scheme.
Gaurav Kumar, Anjum Riaz, Yamuna Prasad, Satyadev Ahlawat
2023On the Development of Prognostics and System Health Management (PHM) Techniques for ReRAM Applications.
Jose Cayo, Matias Melivilu, Antonio Rubio, Ioannis Vourkas
2023On the Facilitation of Voltage Over-Scaling and Minimization of Timing Errors in Floating-Point Multipliers.
Georgios Chatzitsompanis, Georgios Karakonstantis
2023On-Chip SRAM Disclosure Attack Prevention Technique for SoC.
Prokash Ghosh, Yogesh Gholap, Virendra Singh
2023On-Line Method to Limit Unreliability and Bit-Aliasing in RO-PUF.
Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu
2023Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation.
Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard
2023Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System.
Corrado De Sio, Daniele Rizzieri, Andrea Portaluri, Salvatore Gabriele La Greca, Sarah Azimi
2023Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection.
Nasr-Eddine Ouldei Tebina, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri
2023SLM ISA and Hardware Extensions for RISC-V Processors.
Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori
2023SafeLS: An Open Source Implementation of a Lockstep NOEL-V RISC-V Core.
Marcel Sarraseca, Sergi Alcaide, Francisco Fuentes, Juan Carlos Rodriguez, Feng Chang, Ilham Lasfar, Ramon Canal, Francisco J. Cazorla, Jaume Abella
2023ShapeShifter: Protecting FPGAs from Side-Channel Attacks with Isofunctional Heterogeneous Modules.
Mahya Morid Ahmadi, Lilas Alrahis, Ozgur Sinanoglu, Muhammad Shafique
2023Silent Data Corruptions: The Stealthy Saboteurs of Digital Integrity.
George Papadimitriou, Dimitris Gizopoulos, Harish Dattatraya Dixit, Sriram Sankar
2023Space Shuttle: A Test Vehicle for the Reliability of the SkyWater 130nm PDK for Future Space Processors.
Ivan Rodriguez-Ferrandez, Leonidas Kosmidis, Maris Tali, David Steenari
2023TREFU: An Online Error Detecting and Correcting Fault Tolerant GPGPU Architecture.
Raghunandana K. K, B. K. S. V. L. Varaprasad, Matteo Sonza Reorda, Virendra Singh
2023Towards Dependable RISC-V Cores for Edge Computing Devices.
Pegdwende Romaric Nikiema, Alessandro Palumbo, Allan Aasma, Luca Cassano, Angeliki Kritikakou, Ari Kulmala, Jari Lukkarila, Marco Ottavi, Rafail Psiakis, Marcello Traiola