IOLTS C

38 papers

YearTitle / Authors
202228th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, September 12-14, 2022
Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos
2022A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks.
Kevin Hector, Pierre-Alain Moëllic, Mathieu Dumont, Jean-Max Dutertre
2022A New Decoding Method for Double Error Correcting Cross Parity Codes.
Georg Duchrau, Michael Gössel
2022A Novel Fault-Tolerant Logic Style with Self-Checking Capability.
Mahdi Taheri, Saeideh Sheikhpour, Ali Mahani, Maksim Jenihhin
2022A Software Approach Towards Defeating Power Management Side Channel Leakage.
Md. Nazmul Islam, Sandip Kundu
2022Adaptive Block Error Correction for Memristive Crossbars.
Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori
2022All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.
Michael Sekyere, Marampally Saikiran, Degang Chen
2022An Anomalous Behavior Detection Method for IoT Devices Based on Power Waveform Shapes.
Kota Hisafuru, Kazunari Takasaki, Nozomu Togawa
2022An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation.
William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre
2022Compressed Learning in MCA Architectures to Tolerate Malicious Noise.
Bijay Raj Paudel, Spyros Tragoudas
2022Detecting Functional Safety Violations in Online AI Accelerators.
Shamik Kundu, Kanad Basu
2022Effective Hardware-Trojan Feature Extraction Against Adversarial Attacks at Gate-Level Netlists.
Kazuki Yamashita, Tomohiro Kato, Kento Hasegawa, Seira Hidano, Kazuhide Fukushima, Nozomu Togawa
2022Effective fault simulation of GPU's permanent faults for reliability estimation of CNNs.
Juan-David Guerrero-Balaguera, Robert Limas Sierra, Matteo Sonza Reorda
2022Experimental evaluation of neutron-induced errors on a multicore RISC-V platform.
Fernando Fernandes dos Santos, Angeliki Kritikakou, Olivier Sentieys
2022Functional and Timing Implications of Transient Faults in Critical Systems.
Angeliki Kritikakou, Panagiota Nikolaou, Ivan Rodriguez-Ferrandez, Joseph Paturel, Leonidas Kosmidis, Maria K. Michael, Olivier Sentieys, David Steenari
2022LIN-MM: Multiplexed Message Authentication Code for Local Interconnect Network message authentication in road vehicles.
Franco Oberti, Ernesto Sánchez, Alessandro Savino, Filippo Parisi, Mirco Brero, Stefano Di Carlo
2022MLC: A Machine Learning Based Checker For Soft Error Detection In Embedded Processors.
Nooshin Nosrati, Maksim Jenihhin, Zainalabedin Navabi
2022Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data.
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero
2022Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function.
Marco Grossi, Martin Omaña, Daniele Rossi, Biagio Marzulli, Cecilia Metra
2022On Attacking IJTAG Architecture based on Locking SIB with Security LFSR.
Gaurav Kumar, Anjum Riaz, Yamuna Prasad, Satyadev Ahlawat
2022Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability.
Gabriele Gavarini, Diego Stucchi, Annachiara Ruospo, Giacomo Boracchi, Ernesto Sánchez
2022Power Cycling Body Diode Current Flow on SiC MOSFET Device.
Giovanni Corrente, Nella Bentivegna, Sebastiano Russo
2022Quantum Noise in the Flow of Time: A Temporal Study of the Noise in Quantum Computers.
Betis Baheri, Qiang Guan, Vipin Chaudhary, Ang Li
2022REVOLVER: A Zero-Step Execution Emulation Framework for Mitigating Power Side-Channel Attacks on ARM64.
Christos Zonios, Vasileios Tenentes
2022Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process.
Ryuichi Nakajima, Kazuya Ioki, Jun Furuta, Kazutoshi Kobayashi
2022Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices.
Andrea Portaluri, Sarah Azimi, Corrado De Sio, Luca Sterpone, David Merodio Codinachs
2022Recent Trends and Perspectives on Defect-Oriented Testing.
Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu
2022Recovering Information on the CVA6 RISC-V CPU with a Baremetal Micro-Architectural Covert Channel.
Valentin Martinoli, Yannick Teglia, Abdellah Bouagoun, Régis Leveugle
2022SENAS: Security driven ENergy Aware Scheduler for Real Time Approximate Computing Tasks on Multi-Processor Systems.
Krishnendu Guha, Sangeet Saha, Klaus D. McDonald-Maier
2022Security and Reliability Evaluation of Countermeasures implemented using High-Level Synthesis.
Amalia-Artemis Koufopoulou, Kalliopi Xevgeni, Athanasios Papadimitriou, Mihalis Psarakis, David Hély
2022Soft Error Resilient Deep Learning Systems Using Neuron Gradient Statistics.
Chandramouli N. Amarnath, Mohamed Mejri, Kwondo Ma, Abhijit Chatterjee
2022Software Product Reliability Based on Basic Block Metrics Recomposition.
Tiziano Fiorucci, Giorgio Di Natale, Jean-Marc Daveau, Philippe Roche
2022Sources of Single Event Effects in the NVIDIA Xavier SoC Family under Proton Irradiation.
Ivan Rodriguez-Ferrandez, Maris Tali, Leonidas Kosmidis, Marta Rovituso, David Steenari
2022Structural Test Generation for AI Accelerators using Neural Twins.
Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
2022Towards AI-Enabled Hardware Security: Challenges and Opportunities.
Hossein Sayadi, Mehrdad Aliasgari, Furkan Aydin, Seetal Potluri, Aydin Aysu, Jack Edmonds, Sara Tehranipoor
2022Transient-Fault-Aware Design and Training to Enhance DNNs Reliability with Zero-Overhead.
Niccolò Cavagnero, Fernando Fernandes dos Santos, Marco Ciccone, Giuseppe Averta, Tatiana Tommasi, Paolo Rech
2022Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults.
Nadir Casciola, Edoardo Giusto, Emanuele Dri, Daniel Oliveira, Paolo Rech, Bartolomeo Montrucchio
2022Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability.
Anu Bala, Saurabh Khandelwal, Abusaleh M. Jabir, Marco Ottavi