| 2020 | 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020 |
| 2020 | A CMOS OxRAM-Based Neuron Circuit Hardened with Enclosed Layout Transistors for Aerospace Applications. Pablo Ilha Vaz, Patrick Girard, Arnaud Virazel, Hassen Aziza |
| 2020 | A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System. Michele Portolan, R. Silveira Feitoza, Ghislain Takam Tchendjou, Vincent Reynaud, Kalpana Senthamarai Kannan, Manuel J. Barragán, Emmanuel Simeu, Paolo Maistri, Lorena Anghel, Régis Leveugle, Salvador Mir |
| 2020 | A Framework and Protocol for Dynamic Management of Fault Tolerant Systems in Harsh Environments. Eduardo Weber Wächter, Server Kasap, Xiaojun Zhai, Shoaib Ehsan, Klaus D. McDonald-Maier |
| 2020 | A Low Capture Power Oriented X-Identification-Filling Co-Optimization Method. Toshinori Hosokawa, Kenichiro Misawa, Hiroshi Yamazaki, Masayoshi Yoshimura, Masayuki Arai |
| 2020 | A Secure Scan Controller for Protecting Logic Locking. Quang-Linh Nguyen, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre |
| 2020 | A Test Sensitization State Compaction Method on Controller Augmentation. Yuki Ikegaya, Toshinori Hosokawa, Yuta Ishiyama, Hiroshi Yamazaki |
| 2020 | A self-scrubbing scheme for embedded systems in radiation environments. Yufan Lu, Xiaojun Zhai, Sangeet Saha, Shoaib Ehsan, Klaus D. McDonald-Maier |
| 2020 | An Anomalous Behavior Detection Method for IoT Devices by Extracting Application-Specific Power Behaviors. Kazunari Takasaki, Kento Hasegawa, Ryoichi Kida, Nozomu Togawa |
| 2020 | An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard |
| 2020 | Automatic Fault Simulators for Diagnosis of Analog Systems. Tommaso Melis, Emmanuel Simeu, Etienne Auvray |
| 2020 | Broadside ATPG for Low Power Trojans Detection using Built-in Current Sensors. Basim Shanyour, Spyros Tragoudas |
| 2020 | Defect Characterization of Spintronic-based Neuromorphic Circuits. Christopher Münch, Mehdi B. Tahoori |
| 2020 | Dependable Deep Learning: Towards Cost-Efficient Resilience of Deep Neural Network Accelerators against Soft Errors and Permanent Faults. Muhammad Abdullah Hanif, Muhammad Shafique |
| 2020 | Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel |
| 2020 | Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux |
| 2020 | Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation. Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee |
| 2020 | Error Modeling for Image Processing Filters accelerated onto SRAM-based FPGAs. Cristiana Bolchini, Luca Cassano, Andrea Mazzeo, Antonio Miele |
| 2020 | Error Resilient Machine Learning for Safety-Critical Systems: Position Paper. Karthik Pattabiraman, Guanpeng Li, Zitao Chen |
| 2020 | Evaluation on Hardware-Trojan Detection at Gate-Level IP Cores Utilizing Machine Learning Methods. Tatsuki Kurihara, Kento Hasegawa, Nozomu Togawa |
| 2020 | Explainability and Dependability Analysis of Learning Automata based AI Hardware. Rishad A. Shafik, Adrian Wheeldon, Alex Yakovlev |
| 2020 | Fast BCH 1-Bit Error Correction Combined with Fast Multi-Bit Error Detection. Christian Schulz-Hanke |
| 2020 | Hardware Security Vulnerability Assessment to Identify the Potential Risks in A Critical Embedded Application. Zahra Kazemi, Mahdi Fazeli, David Hély, Vincent Beroulle |
| 2020 | High-level Modeling of Manufacturing Faults in Deep Neural Network Accelerators. Shamik Kundu, Ahmet Soyyigit, Khaza Anuarul Hoque, Kanad Basu |
| 2020 | Impact of Aging on Soft Error Susceptibility in CMOS Circuits. Ambika Prasad Shah, Patrick Girard |
| 2020 | In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops. Sarah Azimi, Corrado De Sio, Luca Sterpone |
| 2020 | Industrial Practices in Low-Power Robust Design. C. P. Ravikumar |
| 2020 | Leveraging CMOS Aging for Efficient Microelectronics Design. Antonio Leonel Hernández Martínez, S. Saqib Khursheed, Daniele Rossi |
| 2020 | Leveraging reuse and endurance by efficient mapping and placement for NVM-based FPGAs. João Paulo Cardoso de Lima, Rafael Fão de Moura, Luigi Carro |
| 2020 | Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. Leila Bagheriye, Ghazanfar Ali, Hans G. Kerkhoff |
| 2020 | Lightweight Protection of Cryptographic Hardware Accelerators against Differential Fault Analysis. Ana Lasheras, Ramon Canal, Eva Rodríguez, Luca Cassano |
| 2020 | Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone |
| 2020 | Muon-Ra: Quantum random number generation from cosmic rays. Homer Gamil, Pranav Mehta, Eduardo Chielle, Adriano Di Giovanni, Mohammed Nabeel, Francesco Arneodo, Michail Maniatakos |
| 2020 | On the testing of special memories in GPGPUs. Josie E. Rodriguez Condia, Matteo Sonza Reorda |
| 2020 | On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura |
| 2020 | PISA: Power-robust Multiprocessor Design for Space Applications. Aleksandar Simevski, Oliver Schrape, Carlos Benito, Milos Krstic, Marko S. Andjelkovic |
| 2020 | Reduced Fault Coverage as a Target for Design Scaffolding Security. Irith Pomeranz, Sandip Kundu |
| 2020 | Reduced-Precision DWC for Mixed-Precision GPUs. Fernando Fernandes dos Santos, Marcelo Brandalero, Pedro Martins Basso, Michael Hübner, Luigi Carro, Paolo Rech |
| 2020 | Representing Gate-Level SET Faults by Multiple SEU Faults at RTL. Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer |
| 2020 | SCARF: Detecting Side-Channel Attacks at Real-time using Low-level Hardware Features. Han Wang, Hossein Sayadi, Setareh Rafatirad, Avesta Sasan, Houman Homayoun |
| 2020 | Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit. Abhishek Jain, Andrea Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin |
| 2020 | Soft Error Tolerance of Power-Supply-Noise Hardened Latches. Yukiya Miura, Yuya Kinoshita |
| 2020 | Spiking Neuron Hardware-Level Fault Modeling. Sarah A. El-Sayed, Theofilos Spyrou, Antonios Pavlidis, Engin Afacan, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. D. Stratigopoulos |
| 2020 | Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests. Irith Pomeranz |
| 2020 | Temporary Laser Fault Injection into Flash Memory: Calibration, Enhanced Attacks, and Countermeasures. Kathrin Garb, Johannes Obermaier |
| 2020 | Yield Estimation of a Memristive Sensor Array. Vishal Gupta, Saurabh Khandelwal, Giulio Panunzi, Eugenio Martinelli, Said Hamdioui, Abusaleh M. Jabir, Marco Ottavi |