IOLTS C

61 papers

YearTitle / Authors
201723rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017
20176T CMOS SRAMs reliability monitoring through stability measurements.
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota
2017A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687.
Ahmed Ibrahim, Hans G. Kerkhoff
2017A generic embedded sequence generator for constrained-random validation with weighted distributions.
Xiaobing Shi, Nicola Nicolici
2017A new 3-bit burst-error correcting code.
Alexander Klockmann, Georg Georgakos, Michael Gössel
2017Advanced ECC solution for automotive SoCs.
Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian
2017An effective functional safety infrastructure for system-on-chips.
Christophe Eychenne, Yervant Zorian
2017An on-line test strategy and analysis for a 1T1R crossbar memory.
Manuel Escudero-Lopez, Francesc Moll, Antonio Rubio, Ioannis Vourkas
2017Analysis of radiation-induced cross domain errors in TMR architectures on SRAM-based FPGAs.
Luca Sterpone, Luca Boragno
2017Assessment of the amplitude-duration criterion for SET/SEU robustness evaluation.
Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer
2017Automating wafer-level test of uncooled infrared detectors using wafer-prober.
Mohamed Makhlouf, Diana Goller, Lutz Gendrisch, Stephan Kolnsberg, Franz Vogt, Alexander Utz, Dirk Weiler, Holger Vogt
2017BPPT - Bulk potential protection technique for hardened sequentials.
Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2017Cache timing attacks countermeasures and error detection in Euclidean addition chains based scalar multiplication algorithm for elliptic curves.
Fangan-Yssouf Dosso, Pascal Véron
2017Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT.
Ghaith Bany Hamad, Ghaith Kazma, Otmane Aït Mohamed, Yvon Savaria
2017Controller augmentation and test point insertion at RTL for concurrent operational unit testing.
Toshinori Hosokawa, Shun Takeda, Hiroshi Yamazaki, Masayoshi Yoshimura
2017Design flows for resilient energy-efficient systems.
Mohammad Saber Golanbari, Mehdi Baradaran Tahoori
2017Design of efficient error resilience in signal processing and control systems: From algorithms to circuits.
Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee
2017Design-time reliability evaluation for digital circuits.
Mohamed A. Abufalgha, Alex Bystrov
2017Deterministic network on chip for deploying real time applications on many-core processors.
Stefano Esposito, Massimo Violante
2017Diagnosis with transition faults on embedded segments.
Theodoros Toulas, Spyros Tragoudas
2017Dynamic aging compensation and Safety measures in Automotive environment.
Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix
2017EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety.
Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Issam Nofal
2017Energy-efficient and error-resilient iterative solvers for approximate computing.
Alexander Schöll, Claus Braun, Hans-Joachim Wunderlich
2017Fast power overhead prediction for hardware redundancy-based fault tolerance.
Stefan Scharoba, Heinrich Theodor Vierhaus
2017Field profiling & monitoring of payload transistors in FPGAs.
Da Cheng, Amitava Majumdar, Xiaobao Wang, Nui Chong
2017Handling of permanent faults in dynamically scheduled processors.
Felix Mühlbauer, Lukas Schröder, Mario Schölzel
2017Hardware Trojan detection and classification based on steady state learning.
Masaru Oya, Masao Yanagisawa, Nozomu Togawa
2017Hardware Trojans classification for gate-level netlists using multi-layer neural networks.
Kento Hasegawa, Masao Yanagisawa, Nozomu Togawa
2017In-situ Fmax/Vmin tracking for energy efficiency and reliability optimization.
Ivan Miro Panades, Edith Beigné, Olivier Billoint, Yvain Thonnart
2017Instruction-based self-test for delay faults maximizing operating temperature.
Nihar Hage, Rohini Gulve, Masahiro Fujita, Virendra Singh
2017Investigation of critical path selection for in-situ monitors insertion.
Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel
2017Jamming resistant encoding for non-uniformly distributed information.
Batya Karp, Yerucham Berkowitz, Osnat Keren
2017Minimal exercise vector generation for reliability improvement.
P. Madhukar Reddy, Stavros Hadjitheophanous, Vassos Soteriou, Paul V. Gratz, Maria K. Michael
2017NBTI/PBTI tolerant arbiter PUF circuits.
Koyo Suzuki, Katsuyoshi Miura, Koji Nakamae
2017On comparison of robust configurable FPGA encoders for dependable industrial communication systems.
Petr Pfeifer, Farnoosh Hosseinzadeh, Heinrich Theodor Vierhaus
2017On the in-field test of embedded memories.
Paolo Bernardi, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda
2017On-line monitoring of system health using on-chip SRAMs as a wearout sensor.
Woongrae Kim, Taizhi Liu, Linda Milor
2017On-line testing of sensor networks: A case study.
José Angel Miranda, Anna Vaskova, Marta Portela-García, Mario García-Valderas, Celia López-Ongil
2017PUFMon: Security monitoring of FPGAs using physically unclonable functions.
Shahin Tajik, Julian Fietkau, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit
2017Polymorphic PUF: Exploiting reconfigurability of CPU+FPGA SoC to resist modeling attack.
Jing Ye, Yue Gong, Yu Hu, Xiaowei Li
2017Probabilistic error detection and correction in switched capacitor circuits using checksum codes.
Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee
2017Relaxing DRAM refresh rate through access pattern scheduling: A case study on stencil-based algorithms.
Konstantinos Tovletoglou, Dimitrios S. Nikolopoulos, Georgios Karakonstantis
2017Reliability analysis of MTJ-based functional module for neuromorphic computing.
Elena-Ioana Vatajelu, Lorena Anghel
2017Reliability issues in RRAM ternary memories affected by variability and aging mechanisms.
Antonio Rubio, Manuel Escudero, Peyman Pouyan
2017Reliability of computing systems: From flip flops to variables.
Giorgio Di Natale, Maha Kooli, Alberto Bosio, Michele Portolan, Régis Leveugle
2017Reliable gas sensing with memristive array.
Adedotun Adeyemo, Abusaleh M. Jabir, Jimson Mathew, Eugenio Martinelli, Corrado Di Natale, Marco Ottavi
2017Revisiting random access scan for effective enhancement of post-silicon observability.
Binod Kumar, Ankit Jindal, Jaynarayan T. Tudu, Brajesh Pandey, Virendra Singh
2017Robustness in automotive electronics: An industrial overview of major concerns.
Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner
2017SICTA: A superimposed in-circuit fault tolerant architecture for SRAM-based FPGAs.
Alexandra Kourfali, Amit Kulkarni, Dirk Stroobandt
2017SIFI: AMD southern islands GPU microarchitectural level fault injector.
Alessandro Vallero, Dimitris Gizopoulos, Stefano Di Carlo
2017Simulation-based analysis of FF behavior in presence of power supply noise.
Yukiya Miura, Takuya Yamamoto
2017Soft error analysis of MTJ-based logic-in-memory full adder: Threats and solution.
Javad Talafy, Hamid R. Zarandi
2017Soft errors: Reliability challenges in energy-constrained ULP body sensor networks applications.
Harsh N. Patel, Benton H. Calhoun, Randy W. Mann
2017Temporal redundancy latch-based architecture for soft error mitigation.
Robert Schmidt, Alberto García Ortiz, Görschwin Fey
2017Test pattern generation to detect multiple faults in ROBDD based combinational circuits.
Toral Shah, Anzhela Yu. Matrosova, Virendra Singh
2017Thermal laser attack and high temperature heating on HfO2-based OxRAM cells.
Alexis Krakovinsky, Marc Bocquet, Romain Wacquez, Jean Coignus, Jean-Michel Portal
2017Trojan circuits preventing and masking in sequential circuits.
Anjela Yu. Matrosova, Eugeniy Mitrofanov, Sergei Ostanin, Irina Kirienko
2017VPUF: Voter based physical unclonable function with high reliability and modeling attack resistance.
Jing Ye, Yu Hu, Xiaowei Li
2017Variation tolerant BTI monitoring in SRAM cells.
Yiorgos Sfikas, Yiorgos Tsiatouhas
2017Voltage margins identification on commercial x86-64 multicore microprocessors.
George Papadimitriou, Manolis Kaliorakis, Athanasios Chatzidimitriou, Charalampos Magdalinos, Dimitris Gizopoulos
2017Weighted logic locking: A new approach for IC piracy protection.
Nikolaos Karousos, Konstantinos Pexaras, Irene G. Karybali, Emmanouil Kalligeros