IOLTS C

40 papers

YearTitle / Authors
201218th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012
2012A fault attack robust TRNG.
Eberhard Böhl, Markus Ihle
2012A real-case application of a synergetic design-flow-oriented SER analysis.
Miguel Vilchis, Ramnath Venkatraman, Enrico Costenaro, Dan Alexandrescu
2012Algorithmic techniques for robust applications.
Rakesh Kumar
2012An efficient probability framework for error propagation and correlation estimation.
Liang Chen, Mehdi Baradaran Tahoori
2012Analysis of FinFET technology on memories.
Esteve Amat, A. Asenov, Ramon Canal, Binjie Cheng, J.-Ll. Cruz, Zoran Jaksic, Miguel Miranda, Antonio Rubio, Paul Zuber
2012Analyzing and alleviating the impact of errors on an SRAM-based FPGA cluster.
Arwa Ben Dhia, Lirida A. B. Naviner, Philippe Matherat
2012Architectural vulnerability aware checkpoint placement in a multicore processor.
Atieh Lotfi, Arash Bayat, Saeed Safari
2012Cross-level protection of circuits against faults and malicious attacks.
Victor Tomashevich, Sudarshan Srinivasan, Fabian Foerg, Ilia Polian
2012Do more camera pixels result in a better picture?
Glenn H. Chapman, Israel Koren, Zahava Koren
2012Error detection and correction of single event upset (SEU) tolerant latch.
Norhuzaimin Julai, Alexandre Yakovlev, Alexandre V. Bystrov
2012Evaluation of test algorithms stress effect on SRAMs under neutron radiation.
Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné
2012Event-driven on-line co-simulation with fault diagnostic.
Mikhail Baklashov
2012Fault coverage of a timing and control flow checker for hard real-time systems.
Julian Wolf, Bernhard Fechner, Theo Ungerer
2012Fault missing rate analysis of the arithmetic residue codes based fault-tolerant FIR filter design.
Zhen Gao, Wenhui Yang, Xiang Chen, Ming Zhao, Jing Wang
2012Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons.
Eishi Ibe, Tadanobu Toba, Ken-ichi Shimbo, Hitoshi Taniguchi
2012Functional level embedded self testing for Walsh transform based adaptive hardware.
Ariel Burg, Osnat Keren
2012Gatewaying IEEE 1149.1 and IEEE 1149.7 test access ports.
Francisco R. Fernandes, Ricardo J. Machado, José M. Ferreira, Manuel G. Gericota
2012Logic masking for SET Mitigation Using Approximate Logic Circuits.
Antonio Sanchez-Clemente, Luis Entrena, Mario García-Valderas, Celia López-Ongil
2012Low Power embedded DRAM caches using BCH code partitioning.
Pedro Reviriego, Alfonso Sánchez-Macián, Juan Antonio Maestro
2012Neutron radiation test of graphic processing units.
Paolo Rech, Caroline Aguiar, Ronaldo Rodrigues Ferreira, Christopher Frost, Luigi Carro
2012Neutron-induced soft error rate estimation for SRAM using PHITS.
Shusuke Yoshimoto, Takuro Amashita, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto
2012On line monitoring of RF power amplifiers with embedded temperature sensors.
Josep Altet, Diego Mateo, Didac Gómez
2012On the functional test of L2 caches.
Michele Riga, Ernesto Sánchez, Matteo Sonza Reorda
2012Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis.
Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee
2012Punctured Karpovsky-Taubin binary robust error detecting codes for cryptographic devices.
Yaara Neumeier, Osnat Keren
2012RIIF - Reliability information interchange format.
Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro
2012Relation between HCI-induced performance degradation and applications in a RISC processor.
Clement Bertolini, Olivier Héron, Nicolas Ventroux, François Marc
2012Reliable and secure memories based on algebraic manipulation correction codes.
Zhen Wang, Mark G. Karpovsky
2012SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems.
Yang Lin, Mark Zwolinski
2012SEU sensitivity of robust communication protocols.
Celia López-Ongil, Marta Portela-García, Mario García-Valderas, Anna Vaskova, Luis Entrena, Joaquín Rivas-Abalo, Alberto Martín-Ortega, Javier Martinez-Oter, S. Rodriguez-Bustabad, Ignacio Arruego
2012SEU tolerant robust memory cell design.
Mohammed Shayan, Virendra Singh, Adit D. Singh, Masahiro Fujita
2012SEU-X: A SEu un-excitability prover for SRAM-FPGAs.
Cinzia Bernardeschi, Luca Cassano, Andrea Domenici
2012Soft-errors resilient logic optimization for low power.
Sujan Pandey, Klaas Brink
2012Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors.
Ameya Chaudhari, Jacob A. Abraham
2012Test access mechanism for chips with spare identical cores.
Ozgur Sinanoglu
2012The influence of clock-gating on NBTI-induced delay degradation.
Jackson Pachito, Celestino V. Martins, Jorge Semião, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira
2012Through-silicon-via built-in self-repair for aggressive 3D integration.
Michael Nicolaidis, Vladimir Pasca, Lorena Anghel
2012Towards optimized functional evaluation of SEE-induced failures in complex designs.
Dan Alexandrescu, Enrico Costenaro
2012Transparent structural online test for reconfigurable systems.
Mohamed Abdelfattah, Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Jörg Henkel, Hans-Joachim Wunderlich