IOLTS C

58 papers

YearTitle / Authors
201117th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece
2011A BIST scheme for testing and repair of multi-mode power switches.
Zhaobo Zhang, Xrysovalantis Kavousianos, Yiorgos Tsiatouhas, Krishnendu Chakrabarty
2011A comprehensive soft error analysis methodology for SoCs/ASICs memory instances.
Dan Alexandrescu
2011A multi-objective optimization for memory BIST sharing using a genetic algorithm.
Lilia Zaourar, Yann Kieffer, Arnaud Wenzel
2011A new IP core for fast error detection and fault tolerance in COTS-based solid state mass memories.
Enrico Costenaro, Massimo Violante, Dan Alexandrescu
2011A novel radiation tolerant SRAM design based on synergetic functional component separation for nanoscale CMOS.
Yuriy Shiyanovskii, Aravind Rajendran, Christos A. Papachristou
2011A reliable fault classifier for dependable systems on SRAM-based FPGAs.
Cristiana Bolchini, Chiara Sandionigi, Luca Fossati, David Merodio Codinachs
2011A robust algorithm for pessimistic analysis of logic masking effects in combinational circuits.
Taiga Takata, Yusuke Matsunaga
2011A side channel attack countermeasure using system-on-chip power profile scrambling.
Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiss, Josef Haid
2011A verification strategy for fault-detection and fault-tolerance circuits.
Gabriele Boschi, Riccardo Mariani, Stefano Lorenzini
2011AKARI-X: A pseudorandom number generator for secure lightweight systems.
Honorio Martín, Enrique San Millán, Luis Entrena, Julio César Hernández Castro, Pedro Peris-Lopez
2011Accelerating secure circuit design with hardware implementation of Diehard Battery of tests of randomness.
Anna Vaskova, Celia López-Ongil, Enrique San Millán, Alejandro Jiménez-Horas, Luis Entrena
2011Algebraic manipulation detection codes and their applications for design of secure cryptographic devices.
Zhen Wang, Mark G. Karpovsky
2011An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors.
Matthias Sauer, Victor Tomashevich, Jörg Müller, Matthew Lewis, Andreas Spilla, Ilia Polian, Bernd Becker, Wolfram Burgard
2011An analytical model for the calculation of the Expected Miss Ratio in faulty caches.
Daniel Sánchez, Yiannakis Sazeides, Juan L. Aragón, José M. García
2011An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities.
Josep Torras Flaquer, Jean-Marc Daveau, Lirida A. B. Naviner, Philippe Roche
2011An effective methodology for on-line testing of embedded microprocessors.
Paolo Bernardi, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda
2011An intellectual property core to detect task schedulling-related faults in RTOS-based embedded systems.
Dhiego Silva, Letícia Maria Veiras Bolzani, Fabian Vargas
2011An on-line memory state validation using shadow memory cloning.
Mikhail Baklashov
2011Control-flow error recovery using commodity multi-core architecture features.
Navid Khoshavi, Hamid R. Zarandi, Mohammad Maghsoudloo
2011Countermeasures against fault attacks: The good, the bad, and the ugly.
Paolo Maistri
2011Detection of Trojan HW by using hidden information on the system.
Osnat Keren, Ilya Levin, Vladimir Sinelnikov
2011Error correction encoding for multi-threshold capture mechanism.
Kedar Karmarkar, Spyros Tragoudas
2011Estimation of component criticality in early design steps.
Matthias Sauer, Alejandro Czutro, Ilia Polian, Bernd Becker
2011Evaluation techniques for on-line testing of robust systems based on critical tasks distribution.
Anna Vaskova, Celia López-Ongil, Mario García-Valderas, Marta Portela-García, Luis Entrena
2011Fail-safety in core-based system design.
Rafal Baranowski, Hans-Joachim Wunderlich
2011Fault attack resistant deterministic random bit generator usable for key randomization.
Eberhard Böhl, Paul Duplys
2011Fault-tolerance assessment and enhancement in SoCWire interface: A system-on-chip wire.
Ronak Salamat, Hamid R. Zarandi
2011Generalized parity-check matrices for SEC-DED codes with fixed parity.
Valentin Gherman, Samuel Evain, Nathaniel Seymour, Yannick Bonhomme
2011Generic BIST architecture for testing of content addressable memories.
Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011High-level synthesis for multi-cycle transient fault tolerant datapaths.
Tomoo Inoue, Hayato Henmi, Yuki Yoshikawa, Hideyuki Ichihara
2011ICT: Interface software for the characterization and test of mixed-signal power cores.
Jorge O. M. Esteves, Tiago H. Moita, Carlos B. Almeida, Marcelino B. Santos
2011Internal model control for a self-tuning Delay-Locked Loop in UWB communication systems.
Rshdee Alhakim, Emmanuel Simeu, Kosai Raoof
2011Investigation of multi cell upset in sequential logic and validity of redundancy technique.
Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka
2011Loopback output router for reliable Network on Chip.
Cédric Killian, Camel Tanougast, Fabrice Monteiro, Abbas Dandache
2011Matrix control-flow algorithm-based fault tolerance.
Ronaldo Rodrigues Ferreira, Álvaro Freitas Moreira, Luigi Carro
2011Memory BIST with address programmability.
Aymen Fradi, Michael Nicolaidis, Lorena Anghel
2011Modeling and mitigating NBTI in nanoscale circuits.
Seyab Khan, Said Hamdioui
2011Multi-level secure JTAG architecture.
Luke Pierce, Spyros Tragoudas
2011Multiple-bit-upset and single-bit-upset resilient 8T SRAM bitcell layout with divided wordline structure.
Shusuke Yoshimoto, Takuro Amashita, D. Kozuwa, Taiga Takata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Hiroshi Kawaguchi, Masahiko Yoshimoto
2011New reliability mechanisms in memory design for sub-22nm technologies.
Nivard Aymerich, A. Asenov, Andrew R. Brown, Ramon Canal, Binjie Cheng, Joan Figueras, Antonio González, Enric Herrero, S. Markov, Miguel Miranda, Peyman Pouyan, Tanausú Ramírez, Antonio Rubio, Elena I. Vatajelu, Xavier Vera, Xingsheng Wang, Paul Zuber
2011Noise margin, critical charge and power-delay tradeoffs for SRAM design.
Aravind Rajendran, Yuriy Shiyanovskii, Frank Wolff, Christos A. Papachristou
2011On graceful degradation of chip multiprocessors in presence of faults via flexible pooling of critical execution units.
Rance Rodrigues, Sandip Kundu
2011On graceful degradation of microprocessors in presence of faults via resource banking.
Rance Rodrigues, Sandip Kundu
2011RVC-based time-predictable faulty caches for safety-critical systems.
Jaume Abella, Eduardo Quiñones, Francisco J. Cazorla, Mateo Valero, Yanos Sazeides
2011Real time cross-layer adaptation for minimum energy wireless image transport using bit error rate control.
Jayaram Natarajan, Shreyas Sen, Abhijit Chatterjee
2011Reduced overhead soft error mitigation using error control coding techniques.
V. Prasanth, Virendra Singh, Rubin A. Parekhji
2011Rise of the hardware Trojans.
Berk Sunar
2011Selective fault tolerance for finite state machines.
Michael Augustin, Michael Gössel, Rolf Kraemer
2011Self-checking test circuits for latches and flip-flops.
Renato P. Ribas, Yuyang Sun, André Inácio Reis, André Ivanov
2011Soft error correction in embedded storage elements.
Michael E. Imhof, Hans-Joachim Wunderlich
2011Software-based control flow error detection and correction using branch triplication.
Nahid Farhady Ghalaty, Mahdi Fazeli, Hossein Izadi Rad, Seyed Ghassem Miremadi
2011The cost of cryptography: Is low budget possible?
Ingrid Verbauwhede
2011Towards functional-safe timing-dependable real-time architectures.
Marco Paolieri, Riccardo Mariani
2011Towards improved survivability in safety-critical systems.
Jaume Abella, Francisco J. Cazorla, Eduardo Quiñones, Arnaud Grasset, Sami Yehia, Philippe Bonnot, Dimitris Gizopoulos, Riccardo Mariani, Guillem Bernat
2011Unidirectional error detection, localization and correction for DRAMs: Application to on-line DRAM repair strategies.
Madalin Neagu, Liviu Miclea, Joan Figueras
2011Variability-aware task mapping strategies for many-cores processor chips.
Fabien Chaix, Gilles Bizot, Michael Nicolaidis, Nacer-Eddine Zergainoh
2011Variations of fault manifestation during Burn-In - A case study on industrial SRAM test results.
Michael Linder, Alfred Eder, Klaus Oberländer, Martin Huch