| 2008 | 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece |
| 2008 | A BISR Architecture for Embedded Memories. Kiamal Z. Pekmestzi, Nicholas Axelos, Isidoros Sideris, Nikos K. Moshopoulos |
| 2008 | A Built-In Self-Test Scheme for Soft Error Rate Characterization. Alodeep Sanyal, Syed M. Alam, Sandip Kundu |
| 2008 | A Fault-Tolerant Attitude Determination System Based on COTS Devices. Ricardo de Oliveira Duarte, Luiz de Siqueira Martins-Filho, Guilherme F. T. Knop, Ricardo S. Prado |
| 2008 | A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs. Wilson J. Pérez H., Jaime Velasco-Medina, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda |
| 2008 | A Low-Cost Accumulator-Based Test Pattern Generation Architecture. Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick |
| 2008 | A Modular Memory BIST for Optimized Memory Repair. Philipp Öhler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand |
| 2008 | A New Approach for Transient Fault Injection Using Symbolic Simulation. Ashish Darbari, Bashir M. Al-Hashimi, Peter Harrod, Daryl Bradley |
| 2008 | A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies. Zhengfeng Huang, Huaguo Liang |
| 2008 | A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing. Naghmeh Karimi, Soheil Aminzadeh, Saeed Safari, Zainalabedin Navabi |
| 2008 | A Systematical Method of Quantifying SEU FIT. Shi-Jie Wen, Dan Alexandrescu, Renaud Perez |
| 2008 | An Enhanced Logic BIST Architecture for Online Testing. Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
| 2008 | Basic Architecture for Logic Self Repair. Tobias Koal, Heinrich Theodor Vierhaus |
| 2008 | Budget-Dependent Control-Flow Error Detection. Ramtilak Vemu, Jacob A. Abraham |
| 2008 | Communication Aware Recovery Configurations for Networks-on-Chip. Claudia Rusu, Cristian Grecu, Lorena Anghel |
| 2008 | Design Techniques for Bit-Parallel Galois Field Multipliers with On-Line Single Error Correction and Double Error Detection. Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan |
| 2008 | Detailed Analyses of Single Laser Shot Effects in the Configuration of a Virtex-II FPGA. Gaetan Canivet, Jessy Clédière, Jean Baptiste Ferron, Frédéric Valette, Marc Renaudin, Régis Leveugle |
| 2008 | Deterministic Built-in TPG with Segmented FSMs. Samara Sudireddy, Jayawant Kakade, Dimitri Kagaris |
| 2008 | Developing Fault Injection Environment for Complex Experiments. Piotr Gawkowski, Janusz Sosnowski |
| 2008 | Development of a Testbench for Validation of DMT and DT2 Fault-Tolerant Architectures on SOI PowerPC7448. Michel Pignol, Thierry Parrain, Vincent Claverie, Christian Boléat, Guy Estaves |
| 2008 | Directed Random SBST Generation for On-Line Testing of Pipelined Processors. Andreas Merentitis, George Theodorou, Mihalis Giorgaras, Nektarios Kranitis |
| 2008 | Dynamic Scheduling of Test Routines for Efficient Online Self-Testing of Embedded Microprocessors. Nikolaos G. Bartzoudis, Vasileios Tantsios, Klaus D. McDonald-Maier |
| 2008 | Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco |
| 2008 | Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. Costas Argyrides, Fabian Vargas, Marlon Moraes, Dhiraj K. Pradhan |
| 2008 | Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira |
| 2008 | False Error Study of On-line Soft Error Detection Mechanisms. M. Kiran Kumar Reddy, Bharadwaj S. Amrutur, Rubin A. Parekhji |
| 2008 | Fault Tolerant Reversible Finite Field Arithmetic Circuits. Jimson Mathew, Jawar Singh, Anas Abu Taleb, Dhiraj K. Pradhan |
| 2008 | Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS. Philippe Roche, Mark Lysinger, Gilles Gasiot, Jean-Marc Daveau, Mehdi Zamanian, Pierre Dautriche |
| 2008 | Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters. Muhammad Mudassar Nisar, Abhijit Chatterjee |
| 2008 | Integrating Scan Design and Soft Error Correction in Low-Power Applications. Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin |
| 2008 | Modeling and Simulation of Circuit Aging in Scaled CMOS Design. Yu (Kevin) Kao |
| 2008 | New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. Michael Richter, Klaus Oberländer, Michael Gössel |
| 2008 | On Line Testing of Single Feedback Bridging Fault in Cluster Based FPGA by Using Asynchronous Element. Nachiketa Das, Pranab Roy, Hafizur Rahaman |
| 2008 | On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring. Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell |
| 2008 | On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante |
| 2008 | On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD. Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris |
| 2008 | On-Line Failure Detection and Confinement in Caches. Jaume Abella, Pedro Chaparro, Xavier Vera, Javier Carretero, Antonio González |
| 2008 | On-Line Testing of Lab-on-Chip Using Digital Microfluidic Compactors. Yang Zhao, Krishnendu Chakrabarty |
| 2008 | Physical Demonstration of Polymorphic Self-Checking Circuits. Richard Ruzicka, Lukás Sekanina, Roman Prokop |
| 2008 | Propagation of Transients Along Sensitizable Paths. Sreenivas Gangadhar, Michael N. Skoufis, Spyros Tragoudas |
| 2008 | Reliability in Application Specific Mesh-Based NoC Architectures. Fatemeh Refan, Homa Alemzadeh, Saeed Safari, Paolo Prinetto, Zainalabedin Navabi |
| 2008 | SDRAM Architecture & Single Event Effects Revealed with Laser. Antonin Bougerol, Florent Miller, Nadine Buard |
| 2008 | SRAM Cell Design Protected from SEU Upsets. Yuriy Shiyanovskii, Francis G. Wolff, Christos A. Papachristou |
| 2008 | Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips. Piotr Zajac, Jacques Henri Collet, Andrzej Napieralski |
| 2008 | Smart Hardening for Round-based Encryption Algorithms: Application to Advanced Encryption Standard. Celia López-Ongil, Alejandro Jiménez-Horas, Marta Portela-García, Mario García-Valderas, Enrique San Millán, Luis Entrena |
| 2008 | Soft Error Protection Techniques. Subhasish Mitra |
| 2008 | Soft Error Rates of Hardened Sequentials utilizing Local Redundancy. Norbert Seifert |
| 2008 | Soft-Error Vulnerability of Sub-100-nm Flip-Flops. Tino Heijmen |
| 2008 | Software Self-Testing of a Symmetric Cipher with Error Detection Capability. Paolo Maistri, Cyril Excoffon, Régis Leveugle |
| 2008 | Special Session 1: Radiation Hardening Techniques. Norbert Seifert |
| 2008 | Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force? Michael Nicolaidis |
| 2008 | Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec? Tino Heijmen |
| 2008 | Special Session 4: Reliability and Circuit Simulation. Rob Aitken |
| 2008 | SystemC-Based Minimum Intrusive Fault Injection Technique with Improved Fault Representation. Rishad A. Shafik, Paul M. Rosinger, Bashir M. Al-Hashimi |
| 2008 | Totally Fault Tolerant RNS Based FIR Filters. Salvatore Pontarelli, Gian Carlo Cardarilli, Marco Re, Adelio Salsano |
| 2008 | Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh |
| 2008 | Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong |
| 2008 | Verification and Analysis of Self-Checking Properties through ATPG. Marc Hunger, Sybille Hellebrand |
| 2008 | Yield Improvement, Fault-Tolerance to the Rescue?. Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |