| 2003 | 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece |
| 2003 | A Configurable Built in Current Sensor for Mixed Signal Circuit Testing. Rodrigo Picos, Joan Font, Eugeni Isern, Miquel Roca, Eugenio García |
| 2003 | A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers. Steffen Tarnick |
| 2003 | A Fault Injection Tool for SRAM-based FPGAs. Monica Alderighi, Sergio D'Angelo, Marcello Mancini, Giacomo R. Sechi |
| 2003 | A Methodology for Test Replacement Solutions of Obsolete Processors. Raoul Velazco, Lorena Anghel, S. Saleh |
| 2003 | A Model for Transient Fault Propagation in Combinatorial Logic. Martin Omaña, Giacinto Papasso, Daniele Rossi, Cecilia Metra |
| 2003 | A Modulo p Checked Self-Checking Carry Select Adder. Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld |
| 2003 | A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs. Y. Tsiatouhas, Sotirios Matakias, Angela Arapoyanni, Th. Haniotakis |
| 2003 | A Watchdog Processor to Detect Data and Control Flow Errors. Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2003 | Accurate and Efficient Analysis of Single Event Transients in VLSI Circuits. Matteo Sonza Reorda, Massimo Violante |
| 2003 | An Analog Checker With Input-Relative Tolerance for Duplicate Signals. Haralampos-G. D. Stratigopoulos, Yiorgos Makris |
| 2003 | An Efficient BIST scheme for High-Speed Adders. Dimitris G. Nikolos, Dimitris Nikolos, Haridimos T. Vergos, Costas Efstathiou |
| 2003 | An Evaluation of Built-in vs. Off-chip Strategies for On-line Transient Current Testing. Bartomeu Alorda, Jaume Segura |
| 2003 | An Improved Markov Source Design for Scan BIST. Chaowen Yu, Wei Li, Sudhakar M. Reddy, Irith Pomeranz |
| 2003 | An RT-level Concurrent Error Detection Technique for Data Dominated Systems. Olga Goloubeva, Matteo Sonza Reorda, Massimo Violante |
| 2003 | Analysis of Bit Transition Count for EDAC Encoded FSM. N. Venkateswaran, V. Balaji, Venkataraman Mahalingam, T. L. Rajaprabhu |
| 2003 | Analyzing SEU Effects in SRAM-based FPGAs. Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori |
| 2003 | Automatic toolset for fault tolerant design: results demonstration on a running industrial application. Alberto Manzone, Claudio Genta |
| 2003 | Challenges and Opportunities for FPGA Programmable System Platforms. Ivo Bolsens |
| 2003 | Control Signal Protection For High Performance Processors. Matthias Pflanz, Heinrich Theodor Vierhaus |
| 2003 | Crosstalk Effect Minimization for Encoded Busses. L. Di Silvio, Daniele Rossi, Cecilia Metra |
| 2003 | Defect Analysis for Delay-Fault BIST in FPGAs. Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell |
| 2003 | Designing FPGA based Self-Testing Checkers for m-out-of-n Codes. Anzhela Yu. Matrosova, Vladimir Ostrovsky, Ilya Levin, K. Nikitin |
| 2003 | Error-Injection-Based Failure Characterization of the IEEE 1394 Bus. D. J. Beauregard, Zbigniew Kalbarczyk, Ravishankar K. Iyer, Savio N. Chau, Leon Alkalai |
| 2003 | Evaluation of the Quality of Testing Path Delay Faults under Restricted Input Assumption. Andrzej Krasniewski |
| 2003 | FAUST: FAUlt-injection Script-based Tool. Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri |
| 2003 | Fault Injection in Digital Logic Circuits at the VHDL Level. S. R. Seward, Parag K. Lala |
| 2003 | Foundation of Combined Datapath and Controller Self-checking Design. Petros Oikonomakos, Mark Zwolinski |
| 2003 | InTeRail: Using Existing and Extra Interconnects to Test Core-Based SOCs. Dimitri Kagaris, Spyros Tragoudas |
| 2003 | Increasing Implementability of beta-driven Threshold Checkers. Victor Varshavsky, Ilya Levin, Vladimir Ostrovsky |
| 2003 | Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy? Fabian Vargas, Diogo B. Brum, Dárcio Prestes, Letícia Maria Veiras Bolzani, Eduardo Luis Rhod, Matteo Sonza Reorda |
| 2003 | Low-Cost On-Line Fault Detection Using Control Flow Assertions. Rajesh Venkatasubramanian, John P. Hayes, Brian T. Murray |
| 2003 | Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores. George Xenoulis, Dimitris Gizopoulos, Nektarios Kranitis, Antonis M. Paschalis |
| 2003 | Memory Built-In Self-Repair for Nanotechnologies. Michael Nicolaidis, Nadir Achouri, Lorena Anghel |
| 2003 | On Compaction-Based Concurrent Error Detection. Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris |
| 2003 | On a Redundant Diversified Steering Angle. Elmar Dilger, Matthias Gulbins, Thomas Ohnesorge, Bernd Straube |
| 2003 | On the Probability of Detecting Data Errors Generated by Permanent Faults Using Time Redundancy. Joakim Aidemark, Peter Folkesson, Johan Karlsson |
| 2003 | On-Line Error Detecting Constant Delay Adder. Whitney J. Townsend, Jacob A. Abraham, Parag K. Lala |
| 2003 | On-Line Testable Decimation Filter Design for AMS Systems. Mohammad A. Naal, Emmanuel Simeu, Salvador Mir |
| 2003 | Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus |
| 2003 | Power Consumption of Fault Tolerant Codes: the Active Elements. Daniele Rossi, Steven V. E. S. van Dijk, Richard P. Kleihorst, André K. Nieuwland, Cecilia Metra |
| 2003 | Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira |
| 2003 | Radiation test methodology for SRAM-based FPGAs by using THESIC. Monica Alderighi, Fabio Casini, Sergio D'Angelo, F. Faure, Marcello Mancini, Sandro Pastore, Giacomo R. Sechi, Raoul Velazco |
| 2003 | Separate Dual-Transistor Registers - A Circuit Solution for On-line Testing of Transient Error in UDSM-IC. Yi Zhao, Sujit Dey |
| 2003 | Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba |
| 2003 | Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices. Robert Baumann |
| 2003 | The positive effect on IC yield of embedded Fault Tolerance for SEUs. André K. Nieuwland, Richard P. Kleihorst |