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| 2025 | A UCIe Compatible Repair Scheme for the Clustered Faults in the Hexagonal Array of Interconnect Lanes. Zhaohong Lin, Xiaole Cui, Juncheng Pu, Huan Yang |
| 2025 | AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications. Mehdi Bejani, Davide Appello, Marco Mauri, Simone Todaro, Stefano Mariani |
| 2025 | An Integrated Framework for Aging Analysis Based on an Age-Aware Cell Library. Amirmahdi Joudi, Negin Safari, Fatemeh MohammadZadeh, Katayoon Basharkhah, Fatemeh Sheikhshoaei, Zainalabedin Navabi |
| 2025 | Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. Zhe Zhang, Surendra Hemaram, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2025 | Automated Test Equipment Drift Characterization Based on Gauge Repeatability and Reproducibility. Anand Venkatachalam, Ernst Aderholz, Matthias Sauer, Simon Schweizer, Matthias Werner, Ilia Polian |
| 2025 | Automatic Test Pattern Generation for Printed Neuromorphic Circuits. Tara Gheshlaghi, Priyanjana Pal, Alexander Studt, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori |
| 2025 | BISSEL: Built-In Self Security via Embedded Sensors for Reproducible Side-Channel Leakage Assessment. Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi |
| 2025 | Computing with Printed and Flexible Electronics. Mehdi B. Tahoori, Emre Ozer, Georgios Zervakis, Konstantinos Balaskas, Priyanjana Pal |
| 2025 | Confidence Driven Compact Testing of Compute-in-Memory Based Language Models. Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee |
| 2025 | DFT Techniques For Efficient 3D IC Interconnect Test For Chiplet and Multi-Die Package. Anshuman Chandra, Chi-Chun Yang, Quoc Phan, Martin Keim |
| 2025 | Dependable Neuromorphic Computing-in-Memory Architectures. Farhad Merchant, Ankit Bende, Markus Fritscher, Shahar Kvatinsky, Simranjeet Singh, Vikas Rana, Regina Dittmann, Keerthi Dorai Swamy Reddy, Christian Wenger, Fouwad Jamil Mir, Mottaqiallah Taouil, Manil Dev Gomony, Said Hamdioui, Henk Corporaal |
| 2025 | Design-for-Test and Calibration for Silicon Photonics using Ring Resonators and Wavelength Division Multiplexing. Pratishtha Agnihotri, Lawrence M. Schlitt, Priyank Kalla, Steve Blair |
| 2025 | Early Result Capture: Racing Conditions in Pipeline due to Clock Glitches. Roua Boulifa, Paolo Maistri, Giorgio Di Natale |
| 2025 | European Test Symposium Teams: an Anniversary Snapshot. Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | Extendable E Po-Yao Chuang, Erik Jan Marinissen |
| 2025 | FLARE: Fault Attack Leveraging Address Reconfiguration Exploits in Multi-Tenant FPGAs. Jayeeta Chaudhuri, Hassan Nassar, Dennis R. E. Gnad, Jörg Henkel, Mehdi B. Tahoori, Krishnendu Chakrabarty |
| 2025 | FSMlock: Defending against Oracle-based Sequential Logic-Locking Attacks under Output-Corruption Requirements. Ioannis Stavrinos, Christos Chalagiannis, Emmanouil Kalligeros |
| 2025 | FastGDBN: A GPU-Accelerated DNN for Identifying Good Dies in Bad Neighborhoods. Yu-Heng Tsao, Yu-Guang Chen |
| 2025 | Heterogeneous Integration of Advanced CMOS and Emerging Devices: Challenges and Solutions. Letícia Maria Bolzani Pöhls, André Lucas Chinazzo, Mahdi Benkhelifa, Anirban Kar, Hussam Amrouch, Milos Krstic |
| 2025 | Holistic Memory DFT Partitioning Using a Convolution-Based Algorithm. Olivier Romain, Wojciech Gierszal, Luc Romain, Artur Pogiel |
| 2025 | IEEE European Test Symposium, ETS 2025, Tallinn, Estonia, May 26-30, 2025 |
| 2025 | Identification of Failing Flip-Flops with Triangular Test Response Compaction. Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer |
| 2025 | In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | LLM-aided Test Generation for Custom Neural Network Hardware Accelerators. Federico Nicolás Peccia, Tobias Hald, Oliver Bringmann |
| 2025 | Large Language Models (LLMs) for Verification, Testing, and Design. Chandan Kumar Jha, Muhammad Hassan, Khushboo Qayyum, Sallar Ahmadi-Pour, Kangwei Xu, Ruidi Qiu, Jason Blocklove, Luca Collini, Andre Nakkab, Ulf Schlichtmann, Grace Li Zhang, Ramesh Karri, Bing Li, Siddharth Garg, Rolf Drechsler |
| 2025 | Local Trimming Method for Enhancing the Read Reliability of STT-MRAMs. Pei-Yun Lin, Jin-Fu Li |
| 2025 | MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori |
| 2025 | MTMS: Age-Aware Multi-Task Multi-Layer Stacking for SSD Failure Prediction. Guo Li, Zijun Jing, Jing Li, Jianli Ding |
| 2025 | Machine Learning-Assisted Side-Channel Analysis for Software Integrity Verification. Niklas Lindskog, Håkan Englund, Jakob Sternby, Elena Dubrova |
| 2025 | Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes. Shayesteh Masoumian, Roel Maes, Noemie Beringuier-Boher, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2025 | Multi Coefficient CPA on a Black Box Hardware Implementation of CRYSTALS-Kyber. Tarick Welling, Maël Gay, Ilia Polian |
| 2025 | Multi-Context Execution on a RISC-V Core for Mixed-Criticality Systems. Leonardo Fazzini, Giacomo Valente, Fabio Federici, Matthew P. Corbett, Tania Di Mascio |
| 2025 | Non-Uniform Error Correction for Hyperdimensional Computing Edge Accelerators. Mahboobe Sadeghipour Roodsari, Surendra Hemaram, Mehdi B. Tahoori |
| 2025 | On the Fault Sensitivity of Natural Language Embeddings Computation. Sumeet Sapkal, Ussama Zahid, Giulio Gambardella, Haralampos-G. Stratigopoulos, Brian Clerkin |
| 2025 | On the Trustworthiness of Spiking Neural Networks and Neuromorphic Systems. Theofilos Spyrou, Haralampos-G. Stratigopoulos, Ihsen Alouani, Said Hamdioui, Anteneh Gebregiorgis |
| 2025 | Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim |
| 2025 | Optimizing RO-PUFs: A Filtering Approach to Reliability and Entropy Trade-offs. Vasilii Kulagin, Giorgio Di Natale, Elena-Ioana Vatajelu |
| 2025 | Physical Unclonable Functions (PUFs): Foundations, Evaluation, and Testing for Secure Hardware Systems. Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu |
| 2025 | Pin Electronics for Instrumentation and Automated Test Equipment: Challenges and Solutions. Sandeep D'Souza, Matthew Getz, Patrick Sullivan, Joseph Peraza, Gerwin Veltink, Paul Van Ulsen |
| 2025 | Pulsed Electromagnetic Fault Injection Attack on Ring Oscillator-based PUFs in FPGAs. Sami El Amraoui, Aghiles Douadi, Régis Leveugle, Paolo Maistri |
| 2025 | Reliability Under Stress: The Impact of Localized Aging on RO-PUF Architectures in FPGAs. Aghiles Douadi, Elena-Ioana Vatajelu, Paolo Maistri, David Hély, Vincent Beroulle, Giorgio Di Natale |
| 2025 | Robust Pattern Generation for Small Delay Faults under the Impact of Variations. Hanieh Jafarzadeh, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2025 | Securing Reconfigurable Scan Networks Against Data Sniffing and Data Alteration Attacks. Joel Åhlund, Markus Törmänen, Mikael Kerttu, Pamela Svensson, Torbjörn Månefjord, Christian Johansson, Erik Larsson |
| 2025 | Security Risks in AI Accelerators: Detecting RTL Vulnerabilities to Model Theft with Formal Verification. Mohamed Shelkamy Ali, Lucas Deutschmann, Johannes Müller, Anna Lena Duque Antón, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz |
| 2025 | Self-Aware Silicon: Enhancing Lifecycle Management with Intelligent Testing and Data Insights. Fabian Vargas, Marko S. Andjelkovic, Milos Krstic, Anirban Kar, Swati Deshwal, Yogesh Singh Chauhan, Hussam Amrouch, Daniel Tille, Sebastian Huhn |
| 2025 | SiFFS: A Scalable in-Fault Functional Simulation Framework for Fault Criticality Analysis. Haripriya R. S, Naveen Kollepara, Jaynarayan T. Tudu |
| 2025 | Silent Data Corruption: DRAM Root Causes and Ways of Improving Test Quality Towards 0ppm. Chenyu Fang, Peter Poechmueller |
| 2025 | Structural Testing of a RRAM-based AI Accelerator Core. Emmanouil Anastasios Serlis, Hanzhi Xun, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | Synergistic Built-In ECC Repair (BIER) Technique for Enhancing Yield and Reliability of Flash Memory. Shyue-Kung Lu, Chun-Kai Chao, Kohei Miyase |
| 2025 | Synthesizing 56 Gbps NRZ Test Signals Using FPGAs and SiGe Logie. David Keezer, Cao Wang, Shengbo Liu |
| 2025 | Testing Functional Interfaces And Complex PADs Within Multi-Die Packages With IEEE P3405. Anshuman Chandra, Nir Sever, Martin Keim |
| 2025 | Towards Understanding of System-Level Test Unique Fails. Nourhan Elhamawy, Jens Anders, Ilia Polian, Matthias Sauer |