| 2024 | A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement. Vladimir A. Zivkovic, Inga Abel, Anthony Candage |
| 2024 | A Fully Pipelined High-Performance Elliptic Curve Cryptography Processor for NIST P-256. Han Yan, Shuai Chen, JunYing Huang, Jing Ye, Huawei Li, Xiaowei Li |
| 2024 | A Multi-Objective Evolutionary Approach for Test Network Design. Payam Habiby, Fatemeh Shirinzadeh, Sebastian Huhn, Rolf Drechsler |
| 2024 | A Novel Power Analysis Attack against CRYSTALS-Dilithium Implementation. Yong Liu, Yuejun Liu, Yongbin Zhou, Yiwen Gao, Zehua Qiao, Huaxin Wang |
| 2024 | A SystemC-AMS Development Framework for High Power IC Test-Hardware. Davide Turossi, Andrea Baschirotto |
| 2024 | AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate. Suhasini Komarraju, Mohamed Mejri, Akhil Tammana, Gowsika Dharmaraj, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2024 | AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators. Mahdi Taheri, Natalia Cherezova, Samira Nazari, Ahsan Rafiq, Ali Azarpeyvand, Tara Ghasempouri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin |
| 2024 | Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations. Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Robert Limas Sierra, Matteo Sonza Reorda |
| 2024 | Approximate Fault-Tolerant Neural Network Systems. Marcello Traiola, Salvatore Pappalardo, Ali Piri, Annachiara Ruospo, Bastien Deveautour, Ernesto Sánchez, Alberto Bosio, Sepide Saeedi, Alessio Carpegna, Anil Bayram Gogebakan, Enrico Magliano, Alessandro Savino |
| 2024 | Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test. Riccardo Cantoro, Michelangelo Grosso, Iacopo Guglielminetti, Reza Khoshzaban, Matteo Sonza Reorda |
| 2024 | CGAN-based Automated Fault Injection. Troya Çagil Köylü, Cornelis Christiaan Berg, Praveen Kumar Vadnala |
| 2024 | Characterization of Ultra-low Random Jitter Reduction Methods up to 36 GHz. David C. Keezer, Dany Minier, Hongjie Li |
| 2024 | Combining Built-In Redundancy Analysis with ECC for Memory Testing. Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim |
| 2024 | Counteracting Rowhammer by Data Alternation. Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil |
| 2024 | Cross-Layer Reliability Analysis of NVDLA Accelerators: Exploring the Configuration Space. Alessandro Veronesi, Alessandro Nazzari, Dario Passarello, Milos Krstic, Michele Favalli, Luca Cassano, Antonio Miele, Davide Bertozzi, Cristiana Bolchini |
| 2024 | Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V. Seyedeh Maryam Ghasemi, Jonas Krautter, Tara Gheshlaghi, Sergej Meschkov, Dennis R. E. Gnad, Mehdi B. Tahoori |
| 2024 | Design-for-Test for Intermittent Faults in STT-MRAMs. Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | Detection of Stealthy Bitstreams in Cloud FPGAs using Graph Convolutional Networks. Jayeeta Chaudhuri, Krishnendu Chakrabarty |
| 2024 | Error Detection and Correction Codes for Safe In-Memory Computations. Luca Parrini, Taha Soliman, Benjamin Hettwer, Jan Micha Borrmann, Simranjeet Singh, Ankit Bende, Vikas Rana, Farhad Merchant, Norbert Wehn |
| 2024 | Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2024 | Fault Sensitivity Analysis of Printed Bespoke Multilayer Perceptron Classifiers. Priyanjana Pal, Florentia Afentaki, Haibin Zhao, Gurol Saglam, Michael Hefenbrock, Georgios Zervakis, Michael Beigl, Mehdi B. Tahoori |
| 2024 | Faulty Function Extraction for Defective Circuits. Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton |
| 2024 | Formal Resilience Metric Characterization in Complex Digital Systems. Damiano Zuccalà, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory |
| 2024 | GNN-Based INC and IVC Co-Optimization for Aging Mitigation. Yu-Guang Chen, Hsiu-Yi Yang, Ing-Chao Lin |
| 2024 | Hardening Bus-Encoders with Power-Aware Single Error Correcting Codes. Shlomo Engelberg, Osnat Keren |
| 2024 | Hardware-Independent ATE Software for SLT. Ric Dokken |
| 2024 | Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling. Tolga Aksoy, Nikhil Sagar Modala, Lakshmanan Balasubramanian, Rubin A. Parekhji, Sule Ozev |
| 2024 | IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs. Juan Suzano, Antoine Chastand, Emanuele Valea, Giorgio Di Natale, Anthony Philippe, Fady Abouzeid, Philippe Roche |
| 2024 | IEEE European Test Symposium, ETS 2024, The Hague, Netherlands, May 20-24, 2024 |
| 2024 | It is All About Trust: The Road to Autonomous Driving Will Connect Test, Reliability and Safety. Juergen Alt |
| 2024 | Keynote 2 - Sustainability and the Outlook of Semiconductor Industry. Cheng-Wen Wu, Shi-Yu Huang |
| 2024 | Lifecycle Management of Emerging Memories. Moritz Fieback, Letícia Maria Veiras Bolzani Poehls |
| 2024 | MBIST-based weak bit screening method for embedded MRAM. Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Münch, Martin Keim |
| 2024 | Modeling Thermal Effects For Biasing PUFs. Aghiles Douadi, Elena-Ioana Vatajelu, Paolo Maistri, David Hély, Vincent Beroulle, Giorgio Di Natale |
| 2024 | New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra |
| 2024 | On-chip Built-In Self-Calibration of Thermal Variations for Mixed-Signal In-Memory Computing. Gaurav Singh, Omar Numan, Dipesh C. Monga, Martin Andraud, Kari Halonen |
| 2024 | Online Detection of Unique Faults in RRAMs. Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | Optimizing System-Level Test Program Generation via Genetic Programming. Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian |
| 2024 | Parallel-Check Trimming Test Approach for Selecting the Reference Resistance of STT-MRAMs. Pei-Yun Lin, Jin-Fu Li |
| 2024 | Polynomial Formal Verification of Approximate Adders with Constant Cutwidth. Mohamed A. Nadeem, Chandan Kumar Jha, Rolf Drechsler |
| 2024 | Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery. Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2024 | Power Analysis Attack Against post-SAT Logic Locking schemes. Nassim Riadi, Florent Bruguier, Pascal Benoit, Sophie Dupuis, Marie-Lise Flottes |
| 2024 | Relation Coverage: A New Paradigm for Hardware/Software Testing. Christoph Hazott, Daniel Große |
| 2024 | Reliability and Security of AI Hardware. Dennis Gnad, Martin Gotthard, Jonas Krautter, Angeliki Kritikakou, Vincent Meyers, Paolo Rech, Josie E. Rodriguez Condia, Annachiara Ruospo, Ernesto Sánchez, Fernando Fernandes dos Santos, Olivier Sentieys, Mehdi B. Tahoori, Russell Tessier, Marcello Traiola |
| 2024 | Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact. Sandeep Kumar Goel, Ankita Patidar, Frank Lee |
| 2024 | Semiconductor Application Fail Root Causes And Secure Test Remedy. Heguo Yin, Peter Poechmueller |
| 2024 | Silent Data Corruption Errors in VLSI Circuits: Implications, Challenges, and Opportunities. Rama Govindaraju |
| 2024 | Silent Data Corruption from Timing Marginalities Due to Process Variations. Adit D. Singh |
| 2024 | Silent Data Corruption: Test or Reliability Problem? Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen |
| 2024 | Silent Data Corruptions in Computing Systems: Early Predictions and Large-Scale Measurements. Dimitris Gizopoulos, George Papadimitriou, Odysseas Chatzopoulos, Nikos Karystinos, Harish Dattatraya Dixit, Sriram Sankar |
| 2024 | Test Compression for Neuromorphic Chips. Xin-Ping Chen, Hsu-Yu Huang, Chu-Yun Hsiao, Jennifer Shueh-Inn Hu, James Chien-Mo Li |
| 2024 | Test and Repair Improvements for UCIe. Tsung-Hsuan Wang, Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen |
| 2024 | Test-Fleet Optimization Using Machine Learning. Aniruddha Datta, Bhanu Vikas Yaganti, Andrew Dove, Arik Peltz, Krishnendu Chakrabarty |
| 2024 | Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks. Soyed Tuhin Ahmed, Kamal Danouchi, Michael Hefenbrock, Guillaume Prenat, Lorena Anghel, Mehdi B. Tahoori |
| 2024 | Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2024 | Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties. Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian |
| 2024 | Transcoders: A Better Alternative To Denoising Autoencoders. Pushpak Raj Gautam, Alex Orailoglu |
| 2024 | What Would Interactive Testing With 1687 Look Like? Michele Portolan, Martin Keim, J. F. Coté, Hans-Martin Von Staud |