| 2023 | A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks. Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2023 | A Side-Channel Attack on a Hardware Implementation of CRYSTALS-Kyber. Yanning Ji, Ruize Wang, Kalle Ngo, Elena Dubrova, Linus Backlund |
| 2023 | A Single-Event Latchup setup for high-precision AMS circuits. Gildas Léger, Antonio J. Ginés, Eduardo J. Peralías, Valentin Gutierrez, Carlos M. Domínguez-Matas, Maria Angeles Jalón, L. Carranza |
| 2023 | A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, Nusa Zidaric |
| 2023 | An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds? Bruno E. Forlin, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis, Marco Ottavi |
| 2023 | Approximate Communication: Balancing Performance, Power, Reliability, and Safety. Abdalrhman Badran, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand |
| 2023 | Attacking Memristor-Mapped Graph Neural Network by Inducing Slow-to-Write Errors. Ching-Yuan Chen, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty |
| 2023 | Automating Greybox System-Level Test Generation. Denis Schwachhofer, Maik Betka, Steffen Becker, Stefan Wagner, Matthias Sauer, Ilia Polian |
| 2023 | Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda |
| 2023 | BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu |
| 2023 | BitFREE: On Significant Speedup and Security Applications of FPGA Bitstream Format Reverse Engineering. Tao Zhang, Mark Tehranipoor, Farimah Farahmandi |
| 2023 | Constraint-Based Automatic SBST Generation for RISC-V Processor Families. Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwörer, Matteo Sonza Reorda, Bernd Becker |
| 2023 | Counterfeit Detection by Semiconductor Process Technology Inspection. Matthias Ludwig, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl |
| 2023 | Criticality Analysis of Ring Oscillators in FPGA Bitstreams Jayeeta Chaudhuri, Krishnendu Chakrabarty |
| 2023 | DEV-PIM: Dynamic Execution Validation with Processing-in-Memory. Alperen Bolat, Yahya Can Tugrul, Seyyid Hikmet Çelik, Sakir Sezer, Marco Ottavi, Oguz Ergin |
| 2023 | Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs' Reliability Assessment. Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin |
| 2023 | Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, Pierre Scaramuzza, Rudolf Ullmann |
| 2023 | Dependability of Future Edge-AI Processors: Pandora's Box. Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui |
| 2023 | EUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS. Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena-Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino |
| 2023 | Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression. Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2023 | Evaluating the Prevalence of SFUs in the Reliability of GPUs. Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda |
| 2023 | FINaL: Driving High-Level Fault Injection Campaigns with Natural Language. Khaled Galal Abdelwahab Abdelaziz, Ralph Görgen, Görschwin Fey |
| 2023 | Global Tuning for System Performance Optimization of RF MIMO Radars. Ferhat Can Ataman, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev |
| 2023 | Harvesting Wasted Clock Cycles for Efficient Online Testing. Eslam Yassien, Yongjia Xu, Hui Jiang, Thach Nguyen, Jennifer Dworak, Theodore W. Manikas, Kundan Nepal |
| 2023 | High Throughput and Energy Efficient SHA-2 ASIC Design for Continuous Integrity Checking Applications. Asimina Koutra, Vasileios Tenentes |
| 2023 | High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2023 | Hybrid Ring Generators for In-System Test Applications. Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak |
| 2023 | IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023 |
| 2023 | Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs. Annachiara Ruospo, Gabriele Gavarini, A. Porsia, Matteo Sonza Reorda, Ernesto Sánchez, Riccardo Mariani, Joseph Aribido, Jyotika Athavale |
| 2023 | Increasing SAT-Resilience of Logic Locking Mechanisms using Formal Methods. Marcel Merten, Sebastian Huhn, Rolf Drechsler |
| 2023 | Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC Architecture. Lila Ammoura, Marie-Lise Flottes, Patrick Girard, Jean-Philippe Noel, Arnaud Virazel |
| 2023 | Learn to Tune: Robust Performance Tuning in Post-Silicon Validation. Peter Domanski, Dirk Pflüger, Raphaël Latty |
| 2023 | Learning Electrical Behavior of Core Interconnects for System-Level Crosstalk Prediction. Katayoon Basharkhah, Raheleh Sadat Mirhashemi, Nooshin Nosrati, Mohammad-Javad Zare, Zainalabedin Navabi |
| 2023 | Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies. Xhesila Xhafa, Patrick Girard, Arnaud Virazel |
| 2023 | Micro-Architectural features as soft-error markers in embedded safety-critical systems: preliminary study. Deniz Kasap, Alessio Carpegna, Alessandro Savino, Stefano Di Carlo |
| 2023 | Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors. Ferhat Can Ataman, Mohammed Aladsani, Georgios Trichopoulos, Y. B. Chethan Kumar, Sule Ozev |
| 2023 | On Using Cell-Aware Methodology for SRAM Bit Cell Testing. Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard, Arnaud Virazel |
| 2023 | On-Line Testing of Neuromorphic Hardware. Theofilos Spyrou, Haralampos-G. Stratigopoulos |
| 2023 | On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | Online Fault Detection and Diagnosis in RRAM. Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation. Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori |
| 2023 | Online Performance Monitoring of Neuromorphic Computing Systems. Abhishek Kumar Mishra, Anup Das, Nagarajan Kandasamy |
| 2023 | Online Reliability Evaluation Design: Select Reliable CRPs for Arbiter PUF and Its Variants. Chaofang Ma, Jianan Mu, Jing Ye, Shuai Chen, Yuan Cao, Huawei Li, Xiaowei Li |
| 2023 | PSC-Watermark: Power Side Channel Based IP Watermarking Using Clock Gates. Upoma Das, M. Sazadur Rahman, N. Nalla Anandakumar, Kimia Zamiri Azar, Fahim Rahman, Mark Tehranipoor, Farimah Farahmandi |
| 2023 | PULP Fiction No More - Dependable PULP Systems for Space. Markus Ulbricht, Yvan Tortorella, Michael Rogenmoser, Li Lu, Junchao Chen, Francesco Conti, Milos Krstic, Luca Benini |
| 2023 | Physical-aware Interconnect Testing and Repairing of Chiplets. Changming Cui, Tuanhui Xu, Haitao Fu, Junlin Huang |
| 2023 | Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies. Brojogopal Sapui, Jonas Krautter, Mahta Mayahinia, Atousa Jafari, Dennis Gnad, Sergej Meschkov, Mehdi B. Tahoori |
| 2023 | SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks. Gabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez |
| 2023 | SET Effects on Quasi Delay Insensitive and Synchronous Circuits. Zaheer Tabassam, Andreas Steininger |
| 2023 | Secrets Leaking Through Quicksand: Covert Channels in Approximate Computing. Lorenzo Masciullo, Roberto Passerone, Francesco Regazzoni, Ilia Polian |
| 2023 | Semi-Supervised Deep Learning for Microcontroller Performance Screening. Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero |
| 2023 | SiCBit-PUF: Strong in-Cache Bitflip PUF Computation for Trusted SoCs. Athanasios Xynos, Vasileios Tenentes, Yiorgos Tsiatouhas |
| 2023 | Spotlight: An Impairing Packet Transmission Attack Targeting Specific Node in NoC-based TCMP. Jiaoyan Yao, Ying Zhang, Yifeng Hua, Yuanxiang Li, Jizhong Yang, Xin Chen |
| 2023 | Stimuli Generation for IC Design Verification using Reinforcement Learning with an Actor-Critic Model. S. L. Tweehuysen, G. L. A. Adriaans, M. Gomony |
| 2023 | Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications. Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen |
| 2023 | Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips. Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn, Rolf Drechsler |
| 2023 | Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2023 | Understanding Permanent Hardware Failures in Deep Learning Training Accelerator Systems. Yi He, Yanjing Li |
| 2023 | Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation. Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech |
| 2023 | Validation, Verification, and Testing (VVT) of future RISC-V powered cloud infrastructures: the Vitamin-V Horizon Europe Project perspective. Marti Alonso, David Andreu, Ramon Canal, Stefano Di Carlo, Cristiano Pegoraro Chenet, Juanjo Costa, Andreu Girones, Dimitris Gizopoulos, Vasileios Karakostas, Beatriz Otero, George Papadimitriou, Eva Rodríguez, Alessandro Savino |
| 2023 | harDNNing: a machine-learning-based framework for fault tolerance assessment and protection of DNNs. Marcello Traiola, Angeliki Kritikakou, Olivier Sentieys |