| 2022 | A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems. Arunkumar Vijayan, Mehdi B. Tahoori, Ewald Kintzli, Timm Lohmann, Juergen Hans Handl |
| 2022 | A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors. Julia Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel |
| 2022 | A Lightweight, Plug-and-Play and Autonomous JTAG Authentication IP for Secure Device Testing. S. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel |
| 2022 | A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage. Gyohun Jeong, Sangmin Kim, Hyelyun Kim, Sunghee Lee |
| 2022 | AMS Test Vector Generation using AMS Verification and IEEE P1687.2. Vladimir A. Zivkovic, Michele Palazzi, Ming Chuen Alvan Lam, Mogens Isager |
| 2022 | An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | CNN-based Data-Model Co-Design for Efficient Test-termination Prediction. Hongfei Wang, Zhanfei Wu, Wei Liu |
| 2022 | Concurrent Error Detection for LSTM Accelerators. Nooshin Nosrati, Seyedeh Maryam Ghasemi, Mahboobe Sadeghipour Roodsari, Zainalabedin Navabi |
| 2022 | Detection of Malicious FPGA Bitstreams using CNN-Based Learning. Jayeeta Chaudhuri, Krishnendu Chakrabarty |
| 2022 | Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. Riccardo Cantoro, Francesco Garau, Patrick Girard, Nima Kolahimahmoudi, Sandro Sartoni, Matteo Sonza Reorda, Arnaud Virazel |
| 2022 | Enabling Coverage-Based Verification in Chisel. Andrew Dobis, Hans Jakob Damsgaard, Enrico Tolotto, Kasper Hesse, Tjark Petersen, Martin Schoeberl |
| 2022 | Evaluating Security of New Locking SIB-based Architectures. Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Sk Subidh Ali |
| 2022 | FPGA Design Deobfuscation by Iterative LUT Modifications at Bitstream Level. Michail Moraitis, Elena Dubrova |
| 2022 | Graph Theory Approach for Multi-site ATE Board Parameter Extraction. Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen |
| 2022 | Hierarchical Memory Diagnosis. Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui |
| 2022 | IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022 |
| 2022 | Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices. Lucas Matana Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo |
| 2022 | Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization. Hussam Amrouch, Krishnendu Chakrabarty, Dirk Pflüger, Ilia Polian, Matthias Sauer, Matteo Sonza Reorda |
| 2022 | Machine learning based soft error rate estimation of pass transistor logic in high-speed communication. Zhe Zhang, Jan Lappas, André Lucas Chinazzo, Christian Weis, Zhihang Wu, Leibin Ni, Norbert Wehn, Mehdi B. Tahoori |
| 2022 | Memristor-based security primitives. Sergio Vinagrero Gutierrez |
| 2022 | Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices. Alexander Stephan Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, Robert Weigel |
| 2022 | Novel Method to Measure Common Mode Transient Immunity of Isolators. Mohamed Thouabtia, Alexander Stephan Oleszczuk, Thomas Girg, Martin Allinger |
| 2022 | On Extracting Reliability Information from Speed Binning. Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich |
| 2022 | On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks. Florian Neugebauer, Stefan Holst, Ilia Polian |
| 2022 | On-Chip Training of Crosstalk Predictors to Fit Uncertainties. Rezgar Sadeghi, Ehsan Akbari, Mohamad Ali Saber |
| 2022 | On-Line Reliability Estimation of Ring Oscillator PUF. Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu |
| 2022 | Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann |
| 2022 | PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori |
| 2022 | Power Aware Test. Likith Kumar Manchukonda, Karthikeyan Natarajan, Manish Arora |
| 2022 | Prediction of Thermally Accelerated Aging Process at 28nm. Parvez Anwar Chanawala, Ian Hill, S. Arash Sheikholeslam, André Ivanov |
| 2022 | Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric. Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori |
| 2022 | Quality Assessment of RFET-based Logic Locking Protection Mechanisms using Formal Methods. Marcel Merten, Sebastian Huhn, Rolf Drechsler |
| 2022 | RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs). Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui |
| 2022 | Real-Time Control-Flow Integrity for Multicore Mixed-Criticality IoT Systems. Vahid Eftekhari Moghadam, Paolo Prinetto, Gianluca Roascio |
| 2022 | Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators. Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann |
| 2022 | Research on Path Delay with BTI Recovery Effect. Jiebing Wu, Yongsheng Sun, Yuan Wang, Yukai Lin, Mingna Fan, Junlin Huang |
| 2022 | Smart Redundancy Schemes for ANNs Against Fault Attacks. Troya Çagil Köylü, Said Hamdioui, Mottaqiallah Taouil |
| 2022 | Special Session on RF/5G Test. William R. Eisenstadt, Mark Roos, Devin Morris, José Luis González-Jiménez, Christopery Mounet, Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière |
| 2022 | SpinalFuzz: Coverage-Guided Fuzzing for SpinalHDL Designs. Katharina Ruep, Daniel Große |
| 2022 | Super Acceleration of Dilithium in MPSoCs Critical Environments. Johanna Sepúlveda, Dominik Winkler |
| 2022 | TaintLock: Preventing IP Theft through Lightweight Dynamic Scan Encryption using Taint Bits Jonti Talukdar, Arjun Chaudhuri, Krishnendu Chakrabarty |
| 2022 | Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli |
| 2022 | Trojan Insertions of Fully Programmable Valve Arrays. Nadun Sinhabahu, Jian-De Li, Katherine Shu-Min Li, Sying-Jyan Wang, Tsung-Yi Ho |
| 2022 | WLAN Rx PER Test Implementation in ATE. Alban Haynse Immanuel, Jeyendran Nithyanadam |
| 2022 | X-Masking for In-System Deterministic Test. Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak |