ETS B

45 papers

YearTitle / Authors
202126th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021
2021A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit.
Changming Cui, Junlin Huang
2021A Plug and Play Digital ABIST Controller for Analog Sensors in Secure Devices.
S. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel
2021A Survey and Tutorial on Security and Resilience of Quantum Computing.
Abdullah Ash-Saki, Mahabubul Alam, Koustubh Phalak, Aakarshitha Suresh, Rasit Onur Topaloglu, Swaroop Ghosh
2021A Tutorial of How to Ensure High Automotive Microcontroller Quality.
Ralf Arnold
2021An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation.
Ankush Mamgain, Manuel J. Barragán, Salvador Mir
2021Analyzing the Impact of Approximate Adders on the Reliability of FPGA Accelerators.
Ioannis Tsounis, Athanasios Papadimitriou, Mihalis Psarakis
2021Applying IEEE Std 1838 to the 3DIC Design Trishul - A Case Study.
Teresa L. McLaurin, Frank Frederick, Heath Perry, Shawn Hung, Saurabh Sinha
2021Arithmetic Circuit Correction by Adding Optimized Correctors Based on Groebner Basis Computation.
Negar Aghapour Sabbagh, Bijan Alizadeh
2021ArsoNISQ: Analyzing Quantum Algorithms on Near-Term Architectures.
Sebastian Brandhofer, Simon J. Devitt, Ilia Polian
2021Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering.
Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu
2021BIST-Assisted Analog Fault Diagnosis.
Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos
2021Chill Out: Freezing Attacks on Capacitors and DC/DC Converters.
Obi Nnorom, Jalil Morris, Ilias Giechaskiel, Jakub Szefer
2021Compact Protection Codes for protecting memory from malicious data and address manipulations.
Gilad Dar, Avihay Grigiac, David Peled, Yagel Ashkenazi, Menachem Goldzweig, Yoav Weizman, Osnat Keren
2021Convolutional Compaction-Based MRAM Fault Diagnosis.
Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2021Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata.
Syed Farah Naz, Ambika Prasad Shah, Suhaib Ahmed, Patrick Girard, Michael Waltl
2021Designing Recurrent Neural Networks for Monitoring Embedded Devices.
Fin Hendrik Bahnsen, Jan Kaiser, Görschwin Fey
2021Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui
2021ESD-PCM: Constructing Reliable Super Dense Phase Change Memory Under Write Disturbance.
Wenke Jin, Siqi Lu, Xiaojun Cai
2021Emerging Computing Devices: Challenges and Opportunities for Test and Reliability
Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels
2021Exploiting Active Learning for Microcontroller Performance Prediction.
Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero
2021Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli.
Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre
2021Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces.
Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
2021GPU-based ATPG System by Scaling Memory Usage and Reducing Data Transfer.
Hua-Ren Li, Hsing-Chung Liang
2021Hierarchical Fault Simulation of Deep Neural Networks on Multi-Core Systems.
Masoomeh Karami, Mohammad Hashem Haghbayan, Masoumeh Ebrahimi, Antonio Miele, Hannu Tenhunen, Juha Plosila
2021Intermittent Undefined State Fault in RRAMs.
Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
2021MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM.
Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori
2021NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.
Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori
2021Online Testing of a Row-Stationary Convolution Accelerator.
Mohammad Rasoul Roshanshah, Katayoon Basharkhah, Zainalabedin Navabi
2021Opacity preserving Countermeasure using Finite State Machines against Differential Scan Attacks.
Sk Subidh Ali, Yogendra Sao, Santosh Biswas
2021RHAT: Efficient RowHammer-Aware Test for Modern DRAM Modules.
Mohammad Farmani, Mark Tehranipoor, Fahim Rahman
2021Recent Advances in Photonic Physical Unclonable Functions.
Fabio Pavanello, Ian O'Connor, Ulrich Rührmair, Amy C. Foster, Dimitris Syvridis
2021Run Time Management of Faulty Data Caches.
Michail Mavropoulos, Georgios Keramidas, Dimitris Nikolos
2021SafeSU: an Extended Statistics Unit for Multicore Timing Interference.
Guillem Cabo, Francisco Bas, Ruben Lorenzo, David Trilla, Sergi Alcaide, Miquel Moretó, Carles Hernández, Jaume Abella
2021Security, Reliability and Test Aspects of the RISC-V Ecosystem.
Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Gürkaynak, Helena Handschuh, Carles Hernández, Michael Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, Francesco Regazzoni
2021Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis.
Francesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen
2021Synergies Between Delay Test and Post-silicon Speed Path Validation: A Tutorial Introduction.
Sandip Ray, Arani Sinha
2021System-Level Access to On-Chip Instruments.
Erik Larsson, Shashi Kiran Gangaraju, Prathamesh Murali
2021TDMS Test Scheduler: An Integrated Framework for Test Scheduling of DVFS-based SoCs with Multiple Voltage Islands.
Fotios Vartziotis
2021Test Data-Driven Machine Learning Models for Reliable Quantum Circuit Output.
Vedika Saravanan, Samah Mohamed Saeed
2021Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring.
Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen
2021Transit-Guard: An OS-based Defense Mechanism Against Transient Execution Attacks.
Maria Mushtaq, David Novo, Florent Bruguier, Pascal Benoit, Muhammad Khurram Bhatti
2021Trustworthy computing on untrustworthy and Trojan-infected on-chip interconnects.
Heba A. Salem, Nigel P. Topham
2021Unsupervised Learning in Test Generation for Digital Integrated Circuits.
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal