| 2020 | A Built-In Self-Test Method For MEMS Piezoresistive Sensor. Manhong Zhu, Jia Li, Weibing Wang, Dapeng Chen |
| 2020 | A New Monitor Insertion Algorithm for Intermittent Fault Detection. Hassan Ebrahimi, Hans G. Kerkhoff |
| 2020 | A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification. Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz |
| 2020 | Accurate Measurements of Small Resistances in Vertical Interconnects with Small Aspect Ratios. Michele Stucchi, Ferenc Fodor, Erik Jan Marinissen |
| 2020 | Analog Fault Simulation - a Hot Topic! Stephen Sunter |
| 2020 | Anomaly Detection in Embedded Systems Using Power and Memory Side Channels. Jiho Park, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Siddharth Garg, Ramesh Karri, Farshad Khorrami |
| 2020 | Automated Graph-Based Fault Injection Into Virtual Prototypes for Robustness Evaluation. Jo Laufenberg, Thomas Kropf, Oliver Bringmann |
| 2020 | Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen |
| 2020 | Built-In Predictors for Dynamic Crosstalk Avoidance. Rezgar Sadeghi, Zainalabedin Navabi |
| 2020 | Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori |
| 2020 | Design Obfuscation versus Test. Farimah Farahmandi, Ozgur Sinanoglu, Ronald D. Blanton, Samuel Pagliarini |
| 2020 | Design, Verification, Test and In-Field Implications of Approximate Computing Systems. Alberto Bosio, Stefano Di Carlo, Patrick Girard, Ernesto Sánchez, Alessandro Savino, Lukás Sekanina, Marcello Traiola, Zdenek Vasícek, Arnaud Virazel |
| 2020 | Detection of Rowhammer Attacks in SoCs with FPGAs. Rana Elnaggar, Siyuan Chen, Peilin Song, Krishnendu Chakrabarty |
| 2020 | Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs. Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer |
| 2020 | Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators. Mehmet Ince, Sule Ozev |
| 2020 | Dynamic Authentication-Based Secure Access to Test Infrastructure. Michele Portolan, Vincent Reynaud, Paolo Maistri, Régis Leveugle |
| 2020 | Efficient Prognostication of Pattern Count with Different Input Compression Ratios. Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski |
| 2020 | Failure and Attack Detection by Digital Sensors. Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi |
| 2020 | Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model. Ching-Yuan Chen, Ching-Hong Cheng, Jiun-Lang Huang, Krishnendu Chakrabarty |
| 2020 | G-PUF: An Intrinsic PUF Based on GPU Error Signatures. Bruno Endres Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism. Mohamed Elshamy, Giorgio Di Natale, Antonios Pavlidis, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos |
| 2020 | IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020 |
| 2020 | IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks. Erik Larsson, Zehang Xiang, Prathamesh Murali |
| 2020 | Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen |
| 2020 | Learning-Based Cell-Aware Defect Diagnosis of Customer Returns. Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar |
| 2020 | LiD-CAT: A Lightweight Detector for Cache ATtacks. Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Sepúlveda |
| 2020 | Linking Chip, Board, and System Test via Standards. Michele Portolan, Jeff Rearick, Martin Keim |
| 2020 | MBIST Support for Reliable eMRAM Sensing. Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa |
| 2020 | Minimal Witnesses for Security Weaknesses in Reconfigurable Scan Networks. Pascal Raiola, Tobias Paxian, Bernd Becker |
| 2020 | Modeling Static Noise Margin for FinFET based SRAM PUFs. Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | Monitoring of BTI and HCI Aging in SRAM Decoders. Helen-Maria Dounavi, Yiorgos Tsiatouhas |
| 2020 | Nonlinear Codes for Control Flow Checking. Giorgio Di Natale, Osnat Keren |
| 2020 | On-chip reduced-code static linearity test of V Renato S. Feitoza, Manuel J. Barragán, Antonio J. Ginés, Salvador Mir |
| 2020 | PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. Amir Alipour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, David Hély, Sylvain Guilley, Naghmeh Karimi |
| 2020 | PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques. Katherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han |
| 2020 | QAMR: an Approximation-Based Fully Reliable TMR Alternative for Area Overhead Reduction. Bastien Deveautour, Marcello Traiola, Arnaud Virazel, Patrick Girard |
| 2020 | Test Sequence-Optimized BIST for Automotive Applications. Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer |
| 2020 | Testing Scouting Logic-Based Computation-in-Memory Architectures. Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | The Risk of Outsourcing: Hidden SCA Trojans in Third-Party IP-Cores Threaten Cryptographic ICs. David Knichel, Thorben Moos, Amir Moradi |
| 2020 | Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech |
| 2020 | Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen |
| 2020 | Variation-Aware Defect Characterization at Cell Level. Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich |