| 2018 | 23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018 |
| 2018 | A software reconfigurable assertion checking unit for run-time error detection. Yumin Zhou, Sebastian Burg, Oliver Bringmann, Wolfgang Rosenstiel |
| 2018 | ADC test methods using an impure stimulus: A survey. Jan Schat |
| 2018 | An efficient fault-tolerant valve-based microfluidic routing fabric for single-cell analysis. Yasamin Moradi, Krishnendu Chakrabarty, Ulf Schlichtmann |
| 2018 | Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits. Florent Cilici, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel |
| 2018 | Automatic generation of in-circuit tests for board assembly defects. Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen |
| 2018 | BISTs for post-bond test and electrical analysis of high density 3D interconnect defects. Imed Jani, Didier Lattard, Pascal Vivet, Lucile Arnaud, Edith Beigné |
| 2018 | Challenges in Cell-Aware Test. Shreyas Pramod Dixit, Divyeshkumar Dhanjibhai Vora, Ke Peng |
| 2018 | Covering hard-to-detect defects by thermal quorum sensing. Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen |
| 2018 | Covering undetected transition fault sites with optimistic unspecified transition faults under multicycle tests. Irith Pomeranz |
| 2018 | Design and testing methodologies for true random number generators towards industry certification. Josep Balasch, Florent Bernard, Viktor Fischer, Milos Grujic, Marek Laban, Oto Petura, Vladimir Rozic, Gerard van Battum, Ingrid Verbauwhede, Marnix Wakker, Bohan Yang |
| 2018 | Design of fault-tolerant neuromorphic computing systems. Mengyun Liu, Lixue Xia, Yu Wang, Krishnendu Chakrabarty |
| 2018 | Detection of IJTAG attacks using LDPC-based feature reduction and machine learning. Xuanle Ren, R. D. (Shawn) Blanton, Vítor Grade Tavares |
| 2018 | Device aging: A reliability and security concern. Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
| 2018 | Extending post-silicon coverage measurement using time-multiplexed FPGA overlays. Fatemeh Eslami, Eddie Hung, Steven J. E. Wilton |
| 2018 | Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262. Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima |
| 2018 | Hardware Trojan detection using path delay order encoding with process variation tolerance. Xiaotong Cui, Kaijie Wu, Ramesh Karri |
| 2018 | IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers. Yu Li, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen |
| 2018 | Interconnect-aware tests to complement gate-exhaustive tests. Irith Pomeranz, Srikanth Venkataraman |
| 2018 | Locking of biochemical assays for digital microfluidic biochips. Sukanta Bhattacharjee, Jack Tang, Mohamed Ibrahim, Krishnendu Chakrabarty, Ramesh Karri |
| 2018 | Machine learning applications in IC testing. Haralampos-G. D. Stratigopoulos |
| 2018 | Measuring mixed-signal test stimulus quality. Krzysztof Jurga, Stephen Sunter |
| 2018 | Methodology for determining the influencing factors of lifetime variation for power devices. Ciprian V. Pop, Andi Buzo, Georg Pelz, Horia Cucu, Corneliu Burileanu |
| 2018 | Model-based avionic systems testing for the airbus family. Jan Peleska |
| 2018 | Modeling and testing comparison faults of memristive ternary content addressable memories. Li-Wei Deng, Jin-Fu Li, Yong-Xiao Chen |
| 2018 | On no-reference on-line error-tolerability testing for videos. Tong-Yu Hsieh, Shang-En Chan, Chi-Hsuan Ho |
| 2018 | On the mitigation of single event transients on flash-based FPGAs. Sarah Azimi, Boyang Du, Luca Sterpone |
| 2018 | Online prevention of security violations in reconfigurable scan networks. Ahmed Atteya, Michael A. Kochte, Matthias Sauer, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich |
| 2018 | Recycled IC detection through aging sensor. Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy |
| 2018 | ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2018 | Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nm. Dhruv Patel, Derek Wright, Manoj Sachdev |
| 2018 | The impact of production defects on the soft-error tolerance of hardened latches. Stefan Holst, Ruijun Ma, Xiaoqing Wen |
| 2018 | Towards the formal verification of security properties of a Network-on-Chip router. Johanna Sepúlveda, Damian Aboul-Hassan, Georg Sigl, Bernd Becker, Matthias Sauer |