| 2017 | 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017 |
| 2017 | A built-in self-test scheme for classifying refresh periods of DRAMs. Chia-Ming Chang, Yong-Xiao Chen, Jin-Fu Li |
| 2017 | A homogeneous framework for AMS languages instrumentation, abstraction and simulation. Enrico Fraccaroli, Luca Piccolboni, Franco Fummi |
| 2017 | A phase locking test solution for MEMS devices. Tareq Muhammad Supon, Rashid Rashidzadeh |
| 2017 | A very low cost and highly parallel DfT method for analog and mixed-signal circuits. Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | Aging-aware coding scheme for memory arrays. Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori |
| 2017 | An efficient test technique to prevent scan-based side-channel attacks. Satyadev Ahlawat, Darshit Vaghani, Virendra Singh |
| 2017 | Application-aware lifetime estimation of power devices. Ciprian V. Pop, Corneliu Burileanu, Andi Buzo, Georg Pelz |
| 2017 | Automated area and coverage optimization of minimal latency checkers. Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein |
| 2017 | Automatic testing of analog ICs for latent defects using topology modification. Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | Best paper. Bernd Becker, Adit D. Singh |
| 2017 | Bridge over troubled waters: Critical area based pattern generation. Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh |
| 2017 | Contact-less near-field measurement of RF phased array antenna mismatches. Maryam Shafiee, Sule Ozev |
| 2017 | Counteracting malicious faults in cryptographic circuits. Ilia Polian, Francesco Regazzoni |
| 2017 | Coverage-driven mixed-signal verification of smart power ICs in a UVM environment. Sebastian Simon, Deeksha Bhat, Alexander W. Rath, Jérôme Kirscher, Linus Maurer |
| 2017 | Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. Tong Guan, Zhaobo Zhang, Wen Dong, Chunming Qiao, Xinli Gu |
| 2017 | Derivation of the reliability metric for digital circuits. Mohamed A. Abufalgha, Alex Bystrov |
| 2017 | Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology. Hani Malloug, Manuel J. Barragan Asian, Salvador Mir, Laurent Basteres, Hervé Le Gall |
| 2017 | Detecting hardware Trojans without a Golden IC through clock-tree defined circuit partitions. Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue, Alex Orailoglu |
| 2017 | Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh |
| 2017 | Exploiting STT-MRAM for approximate computing. Nour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2017 | Extended binary nonlinear codes and their application in testing and compression. Ondrej Novák |
| 2017 | Extension of power supply impedance emulation method on ATE for multiple power domain. Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada |
| 2017 | Foreword. Maria K. Michael, Rolf Drechsler, Stephan Eggersglüß, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken |
| 2017 | ISO26262-compliant soft-error mitigation in register banks. Jan Schat |
| 2017 | Impact of the switching activity on the aging of delay-PUFs. Naghmeh Karimi, Jean-Luc Danger, Mariem Slimani, Sylvain Guilley |
| 2017 | Improving the dependability of AMR sensors used in automotive applications. Andreina Zambrano, Hans G. Kerkhoff |
| 2017 | Integrated circuits' characterization for non-normal data in semiconductor quality analysis. Ingrid Kovacs, Marina Dana Topa, Andi Buzo, Georg Pelz |
| 2017 | Low power probabilistic online monitoring of systematic erroneous behaviour. Mauricio D. Gutierrez, Vasileios Tenentes, Tom J. Kazmierski, Daniele Rossi |
| 2017 | Mitigating read & write errors in STT-MRAM memories under DVS. Elena-Ioana Vatajelu, Rosa Rodríguez-Montañés, Michel Renovell, Joan Figueras |
| 2017 | Mixed-signal BIST computation offloading using IEEE 1687. Michele Portolan, Manuel J. Barragán, Rshdee Alhakim, Salvador Mir |
| 2017 | Multiple-defect diagnosis for Logic Characterization Vehicles. Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton |
| 2017 | Online Profiling for cluster-specific variable rate refreshing in high-density DRAM systems. Rasool Sharifi, Zainalabedin Navabi |
| 2017 | Periodic Bias-Temperature Instability monitoring in SRAM cells. Yiorgos Tsiatouhas |
| 2017 | Probabilistic sensitization analysis for variation-aware path delay fault test evaluation. Marcus Wagner, Hans-Joachim Wunderlich |
| 2017 | ROM fault diagnosis for O(n Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2017 | Real-time self-learning for control law adaptation in nonlinear systems using encoded check states. Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps. Marcelino Seif, Emna Farjallah, Franck Badets, Emna Chabchoub, Christophe Layer, Jean-Marc Armani, Francis Joffre, Costin Anghel, Luigi Dilillo, Valentin Gherman |
| 2017 | Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs. Amir Charif, Nacer-Eddine Zergainoh, Alexandre Coelho, Michael Nicolaidis |
| 2017 | SIC pair generation in optimal time using rotatable counters. Ioannis Voyiatzis |
| 2017 | Scan chain encryption for the test, diagnosis and debug of secure circuits. Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo |
| 2017 | Security and trust in the analog/mixed-signal/RF domain: A survey and a perspective. Angelos Antonopoulos, Christiana Kapatsori, Yiorgos Makris |
| 2017 | Specification and verification of security in reconfigurable scan networks. Michael A. Kochte, Matthias Sauer, Laura Rodríguez Gómez, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich |
| 2017 | Volume diagnosis data mining. Wu-Tung Cheng, Yue Tian, Sudhakar M. Reddy |