| 2016 | 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016 |
| 2016 | A 40Gbps economic extension board and FPGA-based testing platform. Te-Hui Chen, David C. Keezer |
| 2016 | A built-in method for measuring the delay of TSVs in 3D ICs. Han-Yu Wu, Yong-Xiao Chen, Jin-Fu Li |
| 2016 | A design-for-test solution for monolithic 3D integrated circuits. Ran Wang, Krishnendu Chakrabarty |
| 2016 | A fast sweep-line-based failure pattern extractor for memory diagnosis. Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu |
| 2016 | A hybrid algorithm to conservatively check the robustness of circuits. Niels Thole, Lorena Anghel, Görschwin Fey |
| 2016 | A low-cost susceptibility analysis methodology to selectively harden logic circuits. Imran Wali, Bastien Deveautour, Arnaud Virazel, Alberto Bosio, Patrick Girard, Matteo Sonza Reorda |
| 2016 | A new EDA flow for the mitigation of SEUs in dynamic reconfigurable FPGAs. Boyang Du, Luca Sterpone, David Merodio Codinachs |
| 2016 | A novel test generation and application flow for functional access to IEEE 1687 instruments. Michele Portolan |
| 2016 | A novel threshold voltage defined switch for circuit camouflaging. Ithihasa Reddy Nirmala, Deepak Vontela, Swaroop Ghosh, Anirudh Iyengar |
| 2016 | A scheduling method for hierarchical testability based on test environment generation results. Jun Nishimaki, Toshinori Hosokawa, Hideo Fujiwara |
| 2016 | A self-reconfiguring IEEE 1687 network for fault monitoring. Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson |
| 2016 | Addressing transient routing errors in fault-tolerant Networks-on-Chips. Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2016 | An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. Tasuku Fujibe, Kazuki Shirahata, Takeshi Mizushima, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda |
| 2016 | Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. Ahmed Ibrahim, Hans G. Kerkhoff |
| 2016 | Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing. Abhishek Koneru, Krishnendu Chakrabarty |
| 2016 | Automotive embedded software architecture in the multi-core age. Paolo Gai, Massimo Violante |
| 2016 | Behavior and test of open-gate defects in FinFET based cells. Francisco Mesalles, Hector Villacorta, Michel Renovell, Víctor H. Champac |
| 2016 | Bit-flip detection-driven selection of trace signals. Amin Vali, Nicola Nicolici |
| 2016 | CPE: Codeword Prediction Encoder. Satish Grandhi, Elsa Dupraz, Christian Spagnol, Valentin Savin, Emanuel M. Popovici |
| 2016 | Cell Aware and stuck-open tests. Adit D. Singh |
| 2016 | Cell-aware diagnosis: Defective inmates exposed in their cells. Peter C. Maxwell, Friedrich Hapke, Huaxing Tang |
| 2016 | Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing. Weida Chen, Yongxin Zhu, Xinyi Liu, Xinyang Li, Dongyu Ou |
| 2016 | Component fault localization using switching current measurements. Seetal Potluri, Satya Trinadh, Siddhant Saraf, Kamakoti Veezhinathan |
| 2016 | Compressor design for silicon debug. Jing Zhang, Lars-Johan Fritz, Liang Liu, Erik Larsson |
| 2016 | Cross-layer resilience. Subhasish Mitra |
| 2016 | ETS 2015 best paper. Hans-Joachim Wunderlich, Peter C. Maxwell |
| 2016 | ETS 2016 foreword. Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos |
| 2016 | Failure mechanisms and test methods for the SRAM TVC write-assist technique. Josef Kinseher, Moritz Völker, Leonardo Bonet Zordan, Ilia Polian |
| 2016 | Formal verification of secure reconfigurable scan network infrastructure. Michael A. Kochte, Rafal Baranowski, Matthias Sauer, Bernd Becker, Hans-Joachim Wunderlich |
| 2016 | Group delay filter measurement using a chirp. Peter Sarson |
| 2016 | IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs. Erik Jan Marinissen, Teresa L. McLaurin, Hailong Jiao |
| 2016 | IJTAG supported 3D DFT using chiplet-footprints for testing multi-chips active interposer system. Jean Durupt, Pascal Vivet, Juergen Schloeffel |
| 2016 | In situ measurement of aging-induced performance degradation in digital circuits. Nasim Pour Aryan, Christian Funke, Jens Bargfrede, Cenk Yilmaz, Doris Schmitt-Landsiedel, Georg Georgakos |
| 2016 | IoT: Source of test challenges. Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singelée, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes |
| 2016 | Is IoT coming to the rescue of semiconductor? Cheng-Wen Wu |
| 2016 | Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator. Antonio J. Ginés, Eduardo J. Peralías, Gildas Léger, Adoración Rueda, Guillaume Renaud, Manuel J. Barragán, Salvador Mir |
| 2016 | Measuring defect tolerance within mixed-signal ICs. Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |
| 2016 | On coverage of timing related faults at board level. Artur Jutman, Igor Aleksejev, Sergei Devadze |
| 2016 | On the diagnostic analysis of IEEE 1687 networks. Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson |
| 2016 | Practices in High-Speed IO testing. Salem Abdennadher, Saghir A. Shaikh |
| 2016 | Questioning the reliability of Monte Carlo simulation for machine learning test validation. Gildas Léger, Manuel J. Barragán |
| 2016 | Read path degradation analysis in SRAM. Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2016 | Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue |
| 2016 | SAT-based post-processing for regional capture power reduction in at-speed scan test generation. Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen |
| 2016 | Securely connected vehicles - what it takes to make self-driving cars a reality. Lars Reger |
| 2016 | Study of a delayed single-event effect in the Muller C-element. Varadan Savulimedu Veeravalli, Andreas Steininger |
| 2016 | Test-station for flexible semi-automatic wafer-level silicon photonics testing. Jeroen De Coster, Peter De Heyn, Marianna Pantouvaki, Brad Snyder, Hongtao Chen, Erik Jan Marinissen, Philippe Absil, Joris Van Campenhout, Bryan Bolt |
| 2016 | Testing in the year 2024 - big changes are coming. Phil Nigh |
| 2016 | Testing of small delay faults in a clock network. Shaofu Yang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2016 | The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator. Illani Mohd Nawi, Basel Halak, Mark Zwolinski |
| 2016 | Transistor stuck-on fault detection tests for digital CMOS circuits. Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski |
| 2016 | Two-dimensional time-division multiplexing for 3D-SoCs. Panagiotis Georgiou, Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2016 | Utilizing shared memory multi-cores to speed-up the ATPG process. Stavros Hadjitheophanous, Stelios N. Neophytou, Maria K. Michael |
| 2016 | VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers. Sebastian Huhn, Stephan Eggersglüß, Rolf Drechsler |