| 2015 | 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015 |
| 2015 | A Bayesian model for system level reliability estimation. Alessandro Vallero, Alessandro Savino, Sotiris Tselonis, Nikos Foutris, Manolis Kaliorakis, Gianfranco Politano, Dimitris Gizopoulos, Stefano Di Carlo |
| 2015 | A branch-&-bound algorithm for TAM optimization in multi-Vdd SoCs. Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2015 | A fault tolerant response analyzer with self-error-correction capability. Yuki Fukazawa, Hideyuki Ichihara, Tomoo Inoue |
| 2015 | A low capture power test generation method using capture safe test vectors. Atsushi Hirai, Yukari Yamauchi, Toshinori Hosokawa, Masayuki Arai |
| 2015 | A new technique for low-cost phase noise production testing from 1-bit signal acquisition. Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre |
| 2015 | A practical approach for logic simplification based on fault acceptability for error tolerant application. Hideyuki Ichihara, Junpei Kamei, Tsuyoshi Iwagaki, Tomoo Inoue |
| 2015 | A soft-error tolerant TCAM using partial don't-care keys. Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase |
| 2015 | Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies. Yu Huang, Wu Yang, Wu-Tung Cheng |
| 2015 | Aging guardband reduction through selective flip-flop optimization. Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
| 2015 | An ECC-based memory architecture with online self-repair capabilities for reliability enhancement. Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato |
| 2015 | An FPGA-based ATE extension module for low-cost multi-GHz memory test. David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo |
| 2015 | An effective hybrid fault-tolerant architecture for pipelined cores. Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard |
| 2015 | Analog test: Why still "à la mode" after more than 25 years of research? Florence Azaïs |
| 2015 | Automatic generation of autonomous built-in observability structures for analog circuits. Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2015 | Boundary cost optimization for Alternate Test. Gildas Léger |
| 2015 | Branch guided functional test generation at the RTL. Vineeth V. Acharya, Sharad Bagri, Michael S. Hsiao |
| 2015 | Compact test set generation for test compression-based designs. Stephan Eggersglüß |
| 2015 | Cyber-physical systems: A security perspective. Charalambos Konstantinou, Michail Maniatakos, Fareena Saqib, Shiyan Hu, Jim Plusquellic, Yier Jin |
| 2015 | Designing area-efficient controllers for multi-cycle transient fault tolerant systems. Tsuyoshi Iwagaki, Yutaro Ishimori, Hideyuki Ichihara, Tomoo Inoue |
| 2015 | Diagnosis of power switches with power-distribution-network consideration. Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi |
| 2015 | Efficient diagnosis technique for aging defects on automotive semiconductor chips. Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park |
| 2015 | Evaluating the self-testing property of AES' finite field inversion units. Flavius Opritoiu, Mircea Vladutiu |
| 2015 | Expanding the boundaries of test and diagnostics: Prognostics and Health Management (PHM) for complex systems. Douglas Goodman |
| 2015 | High frequency jitter estimator for SoCs. Hervé Le Gall, Rshdee Alhakim, Miroslav Valka, Salvador Mir, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu |
| 2015 | Identification of high power consuming areas with gate type and logic level information. Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara |
| 2015 | Improve the compression ratios for code-based test vector compressions by decomposing. Jishun Kuang, Liang Zhang, Zhiqiang You, Yingbo Zhou |
| 2015 | Improving RO-PUF quality on FPGAs by incorporating design-dependent frequency biases. Linus Feiten, Tobias Martin, Matthias Sauer, Bernd Becker |
| 2015 | Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. Karsten Scheibler, Dominik Erb, Bernd Becker |
| 2015 | Is adaptive testing the panacea for the future test problems? Zebo Peng |
| 2015 | LSI aging estimation using ring oscillators. Yukiya Miura, Tatsunori Ikeda |
| 2015 | Microfluidic very large-scale integration for biochips: Technology, testing and fault-tolerant design. Ismail Emre Araci, Paul Pop, Krishnendu Chakrabarty |
| 2015 | NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating. Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi |
| 2015 | New drain current model for nano-meter MOS transistors on-chip threshold voltage test. Jinbo Wan, Hans G. Kerkhoff |
| 2015 | On resistive open defect detection in DRAMs: The charge accumulation effect. Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui |
| 2015 | On test program compaction. Marco Gaudesi, Matteo Sonza Reorda, Irith Pomeranz |
| 2015 | Power-aware voltage tuning for STT-MRAM reliability. Elena I. Vatajelu, Rosa Rodríguez-Montañés, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras |
| 2015 | Protecting caches against multi-bit errors using embedded erasure coding. Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt |
| 2015 | Re-using BIST for circuit aging monitoring. Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori |
| 2015 | Reliability analysis for power MOSFET based on multi-physics simulation. Shuo Li, Hong Wang, Shiyuan Yang |
| 2015 | Reliability-aware operation chaining in high level synthesis. Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
| 2015 | Robust amplitude measurement for RF BIST applications. Jae Woong Jeong, Jennifer Kitchen, Sule Ozev |
| 2015 | Session-less based thermal-aware 3D-SIC test scheduling. Marie-Lise Flottes, Joao Azevedo, Giorgio Di Natale, Bruno Rouzeyre |
| 2015 | Software-based repair for memories in tiny embedded systems. Mario Schölzel, Patryk Skoncej |
| 2015 | Software-based self-test techniques of computational modules in dual issue embedded processors. Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Sánchez, Alessandro Sansonetti |
| 2015 | Symmetric transparent on-line BIST of word-organized memories with binary adders. Ioannis Voyiatzis |
| 2015 | Tackling the complexity of exact path delay fault grading for path intensive circuits. Stelios N. Neophytou, Maria K. Michael |
| 2015 | Testing of Analog/Mixed Signal ICs: Past, present and future. Bram Kruseman |
| 2015 | Testing of digital microfluidic biochips with arbitrary layouts. Trung Anh Dinh, Shigeru Yamashita, Tsung-Yi Ho, Krishnendu Chakrabarty |
| 2015 | Testing visions. Hans-Joachim Wunderlich |
| 2015 | Variability-aware aging modeling for reliability analysis of an analog neural measurement system. Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen |