| 2014 | 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014 Giorgio Di Natale |
| 2014 | A collision resistant deterministic random bit generator with fault attack detection possibilities. Eberhard Böhl, Matthew Lewis, Klaus Damm |
| 2014 | A distance-based test cube merging procedure for compatible and incompatible test cubes. Irith Pomeranz |
| 2014 | A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis. Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2014 | A new efficiency criterion for security oriented error correcting codes. Yaara Neumeier, Osnat Keren |
| 2014 | A novel adaptive fault tolerant flip-flop architecture based on TMR. Luca Cassano, Alberto Bosio, Giorgio Di Natale |
| 2014 | A true random number generator with on-line testability. Eberhard Böhl, Matthew Lewis, S. Galkin |
| 2014 | Accumulator-based test-per-clock scheme for low-power on-chip application of test patterns. Ioannis Voyiatzis |
| 2014 | Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost |
| 2014 | An off-line MDSI interconnect BIST incorporated in BS 1149.1. Marzieh Mohammadi, Somayeh Sadeghi Kohan, Nasser Masoumi, Zainalabedin Navabi |
| 2014 | Analysis and mitigation of single event effects on flash-based FPGAS. Luca Sterpone, Boyang Du |
| 2014 | Analysis of cell-aware test pattern effectiveness - A case study using a 32-bit automotive microcontroller. Athul Prabhu, Vlado Vorisek, Helmut Lang, Thomas Schumann |
| 2014 | Automatic correction of certain design errors using mutation technique. Payman Behnam, Bijan Alizadeh, Zainalabedin Navabi |
| 2014 | Avoiding burnt probe tips: Practical solutions for testing internally regulated power supplies. Richard Swanson, Anna Wong, Suraj Ethirajan, Amitava Majumdar |
| 2014 | Built-in self-calibration of CMOS-compatible thermopile sensor with on-chip electrical stimulus. Jia Li, Zhuolei Huang, Weibing Wang |
| 2014 | Cell-aware experiences in a high-quality automotive test suite. Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski |
| 2014 | Concurrent online BIST for sequential circuits exploiting input reduction and output space compaction. Ioannis Voyiatzis |
| 2014 | Design of low cost fault tolerant analog circuits using real-time learned error compensation. Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee |
| 2014 | Detection conditions for errors in self-adaptive better-than-worst-case designs. Ilia Polian, Jie Jiang, Adit D. Singh |
| 2014 | Diagnosis of multiple faults with highly compacted test responses. Alejandro Cook, Hans-Joachim Wunderlich |
| 2014 | Error detection and recovery in better-than-worst-case timing designs. Adit D. Singh |
| 2014 | Factoring variability in the Design/Technology Co Optimisation (DTCO) in advanced CMOS. Asen Asenov |
| 2014 | Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation. Dan Alexandrescu, Luca Sterpone, Celia López-Ongil |
| 2014 | GPU-based timing-aware test generation for small delay defects. Kuan-Yu Liao, Po-Juei Chen, Ang-Feng Lin, James Chien-Mo Li, Michael S. Hsiao, Laung-Terng Wang |
| 2014 | Homogeneous many-core processor system test distribution and execution mechanism. Arezoo Kamran, Zainalabedin Navabi |
| 2014 | INL systematic reduced-test technique for Pipeline ADCs. Eduardo J. Peralías, Antonio Jose Ginés, Adoración Rueda |
| 2014 | Improving polynomial datapath debugging with HEDs. Somayeh Sadeghi Kohan, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, Zainalabedin Navabi |
| 2014 | Incremental computation of delay fault detection probability for variation-aware test generation. Marcus Wagner, Hans-Joachim Wunderlich |
| 2014 | Interleaved scrambling technique: A novel low-power security layer for cache memories. Madalin Neagu, Liviu Miclea, Salvador Manich |
| 2014 | Logic simulation and fault collapsing with shared structurally synthesized bdds. Dmitri Mironov, Raimund Ubar, Jaan Raik |
| 2014 | M-S specification binning based on digitally coded indirect measurements. Álvaro Gómez-Pau, Luz Balado, Joan Figueras |
| 2014 | Major eras of Design for Test. Walden C. Rhines |
| 2014 | Model based generation of high coverage test suites for embedded systems. Orlando Ferrante, Alberto Ferrari, Marco Marazza |
| 2014 | On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial). Marco Indaco, Paolo Prinetto, Elena I. Vatajelu |
| 2014 | On-the-fly timing-aware built-in self-repair for high-speed interposer wires in 2.5-D ICs. Shi-Yu Huang, Zeng-Fu Zeng, Kun-Han Tsai, Wu-Tung Cheng |
| 2014 | Optimization of analog fault coverage by exploiting defect-specific masking. Anthony Coyette, Georges G. E. Gielen, Ronny Vanhooren, Wim Dobbelaere |
| 2014 | Optimization-based multiple target test generation for highly compacted test sets. Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler |
| 2014 | Output-bit selection with X-avoidance using multiple counters for test-response compaction. Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh |
| 2014 | Post-bond test of Through-Silicon Vias with open defects. Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras |
| 2014 | Power efficient scan testing by exploiting existing error tolerance circuitry in a design. Anthi Anastasiou, Yiorgos Tsiatouhas |
| 2014 | Property-checking based LBIST for improved diagnosability. Sarvesh Prabhu, Vineeth V. Acharya, Sharad Bagri, Michael S. Hsiao |
| 2014 | Quantified contribution of design for manufacturing to yield at 28nm. Thomas Herrmann, Shobhit Malik, Sriram Madhavan |
| 2014 | Quantitative evaluation of register vulnerabilities in RTL control paths. Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
| 2014 | Reconfigurable high performance architectures: How much are they ready for safety-critical applications? Davide Sabena, Luca Sterpone, Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus, S. Wong, Robért Glein, Florian Rittner, C. Stender, Mario Porrmann, Jens Hagemeyer |
| 2014 | Reducing embedded software radiation-induced failures through cache memories. Thiago Santini, Paolo Rech, Gabriel L. Nazar, Luigi Carro, Flávio Rech Wagner |
| 2014 | Sat-based speedpath debugging using waveforms. Mehdi Dehbashi, Görschwin Fey |
| 2014 | Secure and efficient LBIST for feedback shift register-based cryptographic systems. Elena Dubrova, Mats Näslund, Göran Selander |
| 2014 | Shadow-scan design with low latency overhead and in-situ slack-time monitoring. Sébastien Sarrazin, Samuel Evain, Ivan Miro Panades, Alexandre Valentian, Suresh Pajaniradja, Lirida Alves de Barros Naviner, Valentin Gherman |
| 2014 | Site dependencies in a multisite testing environment. Thomas Lehner, Andreas Kuhr, Michael G. Wahl, Rainer Brück |
| 2014 | Smart-hopping: Highly efficient ISA-level fault injection on real hardware. Horst Schirmeier, Lars Rademacher, Olaf Spinczyk |
| 2014 | Systematic generation of diagnostic software-based self-test routines for processor components. Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus |
| 2014 | Test-mode-only scan attack using the boundary scan chain. Sk Subidh Ali, Ozgur Sinanoglu, Ramesh Karri |
| 2014 | Towards a general purpose mixed-signal instrumentation layer in the die stack of a 3D-SIC. Shudong Lin, Gordon W. Roberts |
| 2014 | Triple error detection for Imai-Kamiyanagi codes based on subsyndrome computations. Christian Badack, Michael Gössel |
| 2014 | Two soft-error mitigation techniques for functional units of DSP processors. Alireza Rohani, Hans G. Kerkhoff |
| 2014 | Using dynamic shift to reduce test data volume in high-compression designs. Xijiang Lin, Mark Kassab, Janusz Rajski |
| 2014 | Variation-aware deterministic ATPG. Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker |
| 2014 | Verification of the decimal floating-point square root operation. Amr A. R. Sayed-Ahmed, Hossam A. H. Fahmy, Ulrich Kühne |
| 2014 | iBoX - Jitter based Power Supply Noise sensor. Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot |