| 2013 | 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013 |
| 2013 | A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing. Saman Kiamehr, Farshad Firouzi, Mehdi Baradaran Tahoori |
| 2013 | A minimum MSE sensor fusion algorithm with tolerance to multiple faults. Omid Sarbishei, Atena Roshan Fekr, Majid Janidarmian, Benjamin Nahill, Katarzyna Radecka |
| 2013 | A mutual characterization based SAR ADC self-testing technique. H.-J. Lin, Xuan-Lun Huang, Jiun-Lang Huang |
| 2013 | A software-based self test of CUDA Fermi GPUs. Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Ippazio Martella, Paolo Prinetto, Daniele Rolfo, Pascal Trotta |
| 2013 | Adaptive quality binning for analog circuits. Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2013 | Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2013 | An error-detection and self-repairing method for dynamically and partially reconfigurable systems. Matteo Sonza Reorda, Luca Sterpone, Anees Ullah |
| 2013 | Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion. Afsaneh Nassery, Sule Ozev, Mustapha Slamani |
| 2013 | Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | Approximate computing: An emerging paradigm for energy-efficient design. Jie Han, Michael Orshansky |
| 2013 | Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. Christos Papameletis, Brion L. Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui |
| 2013 | BIST architecture to detect defects in tsvs during pre-bond testing. Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
| 2013 | Bias temperature instability analysis in SRAM decoder. Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor |
| 2013 | Computing detection probability of delay defects in signal line tsvs. Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Pascal Vivet, Marc Belleville |
| 2013 | Current testing: Dead or alive? Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello |
| 2013 | Efficient fault simulation through dynamic binary translation for dependability analysis of embedded software. Giuseppe Di Guglielmo, Davide Ferraretto, Franco Fummi, Graziano Pravadelli |
| 2013 | Efficient minimization of test frequencies for linear analog circuits. Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir |
| 2013 | Efficient selection of signatures for analog/RF alternate test. Manuel J. Barragan Asian, Gildas Léger |
| 2013 | Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters. Shyam Kumar Devarakond, Debashis Banerjee, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee |
| 2013 | Error-correction schemes with erasure information for fast memories. Samuel Evain, Valentin Gherman |
| 2013 | Experimental evaluation of thread distribution effects on multiple output errors in GPUs. Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro |
| 2013 | Extracting device-parameter variations using a single sensitivity-configurable ring oscillator. Yuma Higuchi, Kenichi Shinkai, Masanori Hashimoto, Rahul M. Rao, Sani R. Nassif |
| 2013 | Generation of compact multi-cycle diagnostic test sets. Irith Pomeranz |
| 2013 | Hybrid 3D pre-bonding test framework design. Unni Chandran, Dan Zhao, Rathish Jayabharathi |
| 2013 | Implementing model redundancy in predictive alternate test to improve test confidence. Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell |
| 2013 | Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis. Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu |
| 2013 | M-S test based on specification validation using octrees in the measure space. Álvaro Gómez-Pau, Luz Balado, Joan Figueras |
| 2013 | Magical thinking applied to test engineering reality (and vice versa). Jeff Rearick |
| 2013 | New test compression scheme based on low power BIST. Jerzy Tyszer, Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski |
| 2013 | Novel approach to reduce power droop during scan-based logic BIST. Martin Omaña, Daniele Rossi, Filippo Fuzzi, Cecilia Metra, Chandra Tirumurti, R. Galivache |
| 2013 | On combining alternate test with spatial correlation modeling in analog/RF ICs. Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2013 | Optimization for timing-speculated circuits by redundancy addition and removal. Yuxi Liu, Rong Ye, Feng Yuan, Qiang Xu |
| 2013 | Outlook for many-core systems: Cloudy with a chance of virtualization. Nikil D. Dutt |
| 2013 | Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
| 2013 | PinPoint: An algorithm for enhancing diagnostic resolution using capture cycle power information. Seetal Potluri, Satya Trinadh, Roopashree Baskaran, Nitin Chandrachoodan, V. Kamakoti |
| 2013 | RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology. Christophe Kelma, Sébastien Darfeuille, Andreas Neuburger, Andreas Lobnig |
| 2013 | Reconciling the IC test and security dichotomy. Ozgur Sinanoglu, Naghmeh Karimi, Jeyavijayan Rajendran, Ramesh Karri, Yier Jin, Ke Huang, Yiorgos Makris |
| 2013 | Reducing power dissipation in memory repair for high defect densities. Panagiota Papavramidou, Michael Nicolaidis |
| 2013 | Robust optimization of test-architecture designs for core-based SoCs. Sergej Deutsch, Krishnendu Chakrabarty |
| 2013 | Run-time detection of hardware Trojans: The processor protection unit. Jeremy Dubeuf, David Hély, Ramesh Karri |
| 2013 | Scan pattern retargeting and merging with reduced access time. Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2013 | Semiconductor failure modes and mitigation for critical systems embedded tutorial. Hans A. R. Manhaeve, Esko Mikkola |
| 2013 | Test generation for circuits with embedded memories using SMT. Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram |
| 2013 | Utilizing circuit structure for scan chain diagnosis. Wei-Hen Lo, Ang-Chih Hsieh, Chien-Ming Lan, Min-Hsien Lin, TingTing Hwang |
| 2013 | Variability-aware and fault-tolerant self-adaptive applications for many-core chips. Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |